SG10202101865RA - Electronic Component Handling Apparatus And Electronic Component Testing Apparatus - Google Patents

Electronic Component Handling Apparatus And Electronic Component Testing Apparatus

Info

Publication number
SG10202101865RA
SG10202101865RA SG10202101865RA SG10202101865RA SG 10202101865R A SG10202101865R A SG 10202101865RA SG 10202101865R A SG10202101865R A SG 10202101865RA SG 10202101865R A SG10202101865R A SG 10202101865RA
Authority
SG
Singapore
Prior art keywords
electronic component
testing apparatus
handling apparatus
component testing
component handling
Prior art date
Application number
Inventor
Masataka Onozawa
Mitsunori Aizawa
Aritomo Kikuchi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG10202101865RA publication Critical patent/SG10202101865RA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG10202101865R 2020-03-12 2021-02-24 Electronic Component Handling Apparatus And Electronic Component Testing Apparatus SG10202101865RA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020000875U JP3227434U (en) 2020-03-12 2020-03-12 Electronic component handling device and electronic component testing device

Publications (1)

Publication Number Publication Date
SG10202101865RA true SG10202101865RA (en) 2021-10-28

Family

ID=72145572

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202101865R SG10202101865RA (en) 2020-03-12 2021-02-24 Electronic Component Handling Apparatus And Electronic Component Testing Apparatus

Country Status (3)

Country Link
US (1) US11353502B2 (en)
JP (1) JP3227434U (en)
SG (1) SG10202101865RA (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11573267B1 (en) 2021-11-12 2023-02-07 Advantest Corporation Electronic component handling apparatus and electronic component testing apparatus

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1058367A (en) 1996-08-23 1998-03-03 Advantest Corp Ic carrying device
WO2006059360A1 (en) * 2004-11-30 2006-06-08 Advantest Corporation Electronic component handling apparatus
KR101104291B1 (en) 2006-10-12 2012-01-12 가부시키가이샤 아드반테스트 Tray transfer apparatus and electronic component testing apparatus provided with the same
JP5119744B2 (en) 2007-05-28 2013-01-16 セイコーエプソン株式会社 Component detection method, component detection device, IC handler component detection method, and IC handler
JP4539685B2 (en) * 2007-06-22 2010-09-08 セイコーエプソン株式会社 Component conveyor and IC handler
JP5137965B2 (en) 2007-11-06 2013-02-06 株式会社アドバンテスト Conveying device and electronic component handling device
JP5040829B2 (en) 2008-06-25 2012-10-03 パナソニック株式会社 Component mounting apparatus and component mounting method
JP2011232275A (en) 2010-04-30 2011-11-17 Seiko Epson Corp Tray inspection apparatus and electronic component inspection apparatus
JP5637734B2 (en) 2010-05-31 2014-12-10 富士機械製造株式会社 Electronic component mounting apparatus and electronic component mounting method
JP2012042407A (en) * 2010-08-23 2012-03-01 Renesas Electronics Corp Semiconductor integrated circuit inspection apparatus, inspection method of semiconductor integrated circuit, and control program for inspection apparatus for semiconductor integrated circuit
JP2014025723A (en) 2012-07-24 2014-02-06 Seiko Epson Corp Handler, controller, notification method and inspection device
JP6903268B2 (en) 2016-12-27 2021-07-14 株式会社Ｎｓテクノロジーズ Electronic component transfer device and electronic component inspection device

Also Published As

Publication number Publication date
US11353502B2 (en) 2022-06-07
JP3227434U (en) 2020-08-27
US20210285999A1 (en) 2021-09-16

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