SE7705500L - Skyddsanordning for halvledardon av mos-typ - Google Patents
Skyddsanordning for halvledardon av mos-typInfo
- Publication number
- SE7705500L SE7705500L SE7705500A SE7705500A SE7705500L SE 7705500 L SE7705500 L SE 7705500L SE 7705500 A SE7705500 A SE 7705500A SE 7705500 A SE7705500 A SE 7705500A SE 7705500 L SE7705500 L SE 7705500L
- Authority
- SE
- Sweden
- Prior art keywords
- mos
- circuit
- leader
- protective device
- nodes
- Prior art date
Links
- 230000001681 protective effect Effects 0.000 title abstract 3
- 230000015556 catabolic process Effects 0.000 abstract 1
- 230000001066 destructive effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0744—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common without components of the field effect type
- H01L27/075—Bipolar transistors in combination with diodes, or capacitors, or resistors, e.g. lateral bipolar transistor, and vertical bipolar transistor and resistor
- H01L27/0755—Vertical bipolar transistor in combination with diodes, or capacitors, or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Protection Of Static Devices (AREA)
- Amplifiers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Emergency Protection Circuit Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/689,269 US4100561A (en) | 1976-05-24 | 1976-05-24 | Protective circuit for MOS devices |
Publications (1)
Publication Number | Publication Date |
---|---|
SE7705500L true SE7705500L (sv) | 1977-11-25 |
Family
ID=24767729
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7705500A SE7705500L (sv) | 1976-05-24 | 1977-05-11 | Skyddsanordning for halvledardon av mos-typ |
Country Status (5)
Country | Link |
---|---|
US (1) | US4100561A (sv) |
JP (1) | JPS52144282A (sv) |
DE (1) | DE2722892A1 (sv) |
GB (1) | GB1555155A (sv) |
SE (1) | SE7705500L (sv) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2374742A1 (fr) * | 1976-12-20 | 1978-07-13 | Radiotechnique Compelec | Transistor multicouche pour tensions elevees et son procede de fabrication |
JPS574431Y2 (sv) * | 1977-05-20 | 1982-01-27 | ||
US4276555A (en) * | 1978-07-13 | 1981-06-30 | International Business Machines Corporation | Controlled avalanche voltage transistor and magnetic sensor |
US4264941A (en) * | 1979-02-14 | 1981-04-28 | National Semiconductor Corporation | Protective circuit for insulated gate field effect transistor integrated circuits |
US4295176A (en) * | 1979-09-04 | 1981-10-13 | Bell Telephone Laboratories, Incorporated | Semiconductor integrated circuit protection arrangement |
SE8105041L (sv) * | 1981-08-25 | 1983-02-26 | Ericsson Telefon Ab L M | Planartransistor med integrerat overspenningsskydd |
JPS5967670A (ja) * | 1982-10-12 | 1984-04-17 | Toshiba Corp | 半導体装置 |
JPS6010765A (ja) * | 1983-06-30 | 1985-01-19 | Fujitsu Ltd | 半導体装置 |
JPS6068721A (ja) * | 1983-09-22 | 1985-04-19 | Fujitsu Ltd | Ecl回路 |
JPS60231356A (ja) * | 1984-04-28 | 1985-11-16 | Mitsubishi Electric Corp | 相補形金属酸化膜半導体集積回路装置 |
JPS6153761A (ja) * | 1984-08-24 | 1986-03-17 | Hitachi Ltd | 半導体装置 |
US4757363A (en) * | 1984-09-14 | 1988-07-12 | Harris Corporation | ESD protection network for IGFET circuits with SCR prevention guard rings |
GB2185621B (en) * | 1985-10-29 | 1988-12-14 | Plessey Co Plc | Protection structures |
US4990976A (en) * | 1987-11-24 | 1991-02-05 | Nec Corporation | Semiconductor device including a field effect transistor having a protective diode between source and drain thereof |
US5072273A (en) * | 1990-05-04 | 1991-12-10 | David Sarnoff Research Center, Inc. | Low trigger voltage SCR protection device and structure |
US5274262A (en) * | 1989-05-17 | 1993-12-28 | David Sarnoff Research Center, Inc. | SCR protection structure and circuit with reduced trigger voltage |
JP2505652B2 (ja) * | 1989-05-17 | 1996-06-12 | デイビッド サーノフ リサーチ センター,インコーポレイテッド | 低トリガ電圧scr保護装置及び構造 |
US5247201A (en) * | 1990-02-15 | 1993-09-21 | Siemens Aktiengesellschaft | Input protection structure for integrated circuits |
KR960002094B1 (ko) * | 1990-11-30 | 1996-02-10 | 가부시키가이샤 도시바 | 입력보호회로를 갖춘 반도체장치 |
US5359211A (en) * | 1991-07-18 | 1994-10-25 | Harris Corporation | High voltage protection using SCRs |
FR2687009B1 (fr) * | 1992-01-31 | 1994-04-29 | Sgs Thomson Microelectronics | Composant de protection pour circuit automobile. |
US5446302A (en) * | 1993-12-14 | 1995-08-29 | Analog Devices, Incorporated | Integrated circuit with diode-connected transistor for reducing ESD damage |
JPH07283405A (ja) * | 1994-04-13 | 1995-10-27 | Toshiba Corp | 半導体装置の保護回路 |
US5607867A (en) * | 1994-07-15 | 1997-03-04 | Texas Instruments Incorporated | Method of forming a controlled low collector breakdown voltage transistor for ESD protection circuits |
JP3332123B2 (ja) * | 1994-11-10 | 2002-10-07 | 株式会社東芝 | 入力保護回路及びこれを用いた半導体装置 |
US5789785A (en) * | 1995-02-28 | 1998-08-04 | Sgs-Thomson Microelectronics S.R.L. | Device for the protection of an integrated circuit against electrostatic discharges |
US5629544A (en) * | 1995-04-25 | 1997-05-13 | International Business Machines Corporation | Semiconductor diode with silicide films and trench isolation |
US5731941A (en) * | 1995-09-08 | 1998-03-24 | International Business Machines Corporation | Electrostatic discharge suppression circuit employing trench capacitor |
WO1997010615A1 (en) * | 1995-09-11 | 1997-03-20 | Analog Devices, Inc. (Adi) | Electrostatic discharge protection network and method |
US5663860A (en) * | 1996-06-28 | 1997-09-02 | Harris Corporation | High voltage protection circuits |
KR100214566B1 (ko) * | 1997-04-22 | 1999-08-02 | 구본준 | 입력 보호회로 |
TW399337B (en) * | 1998-06-09 | 2000-07-21 | Koninkl Philips Electronics Nv | Semiconductor device |
US20040028675A1 (en) * | 2001-12-07 | 2004-02-12 | Zarlink Semiconductor Ab | Compositions for the treatment of lupus |
GB2388259B (en) * | 2002-04-30 | 2006-03-29 | Zarlink Semiconductor Inc | Compact high voltage ESD protection diode |
DE102004007972B3 (de) * | 2004-02-18 | 2005-09-01 | Infineon Technologies Ag | Halbleiterstruktur zum Schutz von integrierten Schaltungen vor ESD-Pulsen |
US8557657B1 (en) * | 2012-05-18 | 2013-10-15 | International Business Machines Corporation | Retrograde substrate for deep trench capacitors |
US10411086B2 (en) * | 2014-04-07 | 2019-09-10 | Semiconductor Components Industries, Llc | High voltage capacitor and method |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS468254B1 (sv) * | 1967-11-13 | 1971-03-02 | ||
US3739238A (en) * | 1969-09-24 | 1973-06-12 | Tokyo Shibaura Electric Co | Semiconductor device with a field effect transistor |
US3806773A (en) * | 1971-07-17 | 1974-04-23 | Sony Corp | Field effect transistor having back-to-back diodes connected to the gate electrode and having a protective layer between the source and the diodes to prevent thyristor action |
US3787717A (en) * | 1971-12-09 | 1974-01-22 | Ibm | Over voltage protection circuit lateral bipolar transistor with gated collector junction |
-
1976
- 1976-05-24 US US05/689,269 patent/US4100561A/en not_active Expired - Lifetime
-
1977
- 1977-05-11 SE SE7705500A patent/SE7705500L/sv not_active Application Discontinuation
- 1977-05-12 GB GB19956/77A patent/GB1555155A/en not_active Expired
- 1977-05-20 DE DE19772722892 patent/DE2722892A1/de not_active Withdrawn
- 1977-05-23 JP JP5970577A patent/JPS52144282A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS52144282A (en) | 1977-12-01 |
GB1555155A (en) | 1979-11-07 |
JPS5519069B2 (sv) | 1980-05-23 |
DE2722892A1 (de) | 1977-12-08 |
US4100561A (en) | 1978-07-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NAV | Patent application has lapsed |
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