PT104140A - INSERTION ELEMENT, TRAY AND ELECTRONIC DEVICE TEST EQUIPMENT - Google Patents

INSERTION ELEMENT, TRAY AND ELECTRONIC DEVICE TEST EQUIPMENT Download PDF

Info

Publication number
PT104140A
PT104140A PT104140A PT10414008A PT104140A PT 104140 A PT104140 A PT 104140A PT 104140 A PT104140 A PT 104140A PT 10414008 A PT10414008 A PT 10414008A PT 104140 A PT104140 A PT 104140A
Authority
PT
Portugal
Prior art keywords
tray
electronic device
insertion element
test equipment
device test
Prior art date
Application number
PT104140A
Other languages
Portuguese (pt)
Inventor
Akihiro Osakabe
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of PT104140A publication Critical patent/PT104140A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

UM ELEMENTO (710) DE INSERÇÃO COMPREENDE: UM CORPO (720) DO ELEMENTO DE INSERÇÃO TENDO UM ORIFÍCIO (721) DE ACOMODAÇÃO DE DISPOSITIVO PARA ACOMODAR UM DISPOSITIVO IC; E UM SUPORTE (760) DE DISPOSITIVO PARA PRENDER O DISPOSITIVO IC ACOMODADO NO ORIFÍCIO (721) DE ACOMODAÇÃO DE DISPOSITIVO, ESTANDO O SUPORTE (760) DE DISPOSITIVO APTO A MOVER-SE FINAMENTE EM RELAÇÃO AO CORPO (720) DO ELEMENTO DE INSERÇÃO.An insert element (710) comprises: a body (720) of the insert element having a device accommodating bracket (721) for accommodating an IC device; And a device support (760) for holding the device IC accommodated in the device accommodating hole (721), the device (760) being able to move in a relative manner to the body (720) of the insertion element.

PT104140A 2007-11-26 2008-07-25 INSERTION ELEMENT, TRAY AND ELECTRONIC DEVICE TEST EQUIPMENT PT104140A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072789 WO2009069190A1 (en) 2007-11-26 2007-11-26 Insert, tray and electronic component testing apparatus

Publications (1)

Publication Number Publication Date
PT104140A true PT104140A (en) 2008-09-17

Family

ID=40678108

Family Applications (1)

Application Number Title Priority Date Filing Date
PT104140A PT104140A (en) 2007-11-26 2008-07-25 INSERTION ELEMENT, TRAY AND ELECTRONIC DEVICE TEST EQUIPMENT

Country Status (6)

Country Link
JP (1) JPWO2009069190A1 (en)
KR (1) KR101149747B1 (en)
CN (1) CN101842712B (en)
PT (1) PT104140A (en)
TW (1) TWI396847B (en)
WO (1) WO2009069190A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (en) * 2011-09-06 2013-03-21 Seiko Epson Corp Handler and component inspection device
KR101488488B1 (en) * 2013-07-09 2015-02-02 주식회사 오킨스전자 LED module testing device
TW201610444A (en) * 2014-09-11 2016-03-16 Motech Taiwan Automatic Corp Open/close device of electronic component test module
KR101887071B1 (en) * 2016-09-01 2018-09-10 리노공업주식회사 A slider operating mechanism of the testing device
CN116643065B (en) * 2023-07-26 2023-11-07 中国电子科技集团公司第十研究所 Flexible clamping device for simulation module

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
JP4279413B2 (en) * 1999-07-16 2009-06-17 株式会社アドバンテスト Insert for electronic component testing equipment
US6636060B1 (en) * 1999-07-16 2003-10-21 Advantest Corporation Insert for electric devices testing apparatus
JP4222442B2 (en) * 1999-07-16 2009-02-12 株式会社アドバンテスト Insert for electronic component testing equipment
AU2002236231A1 (en) * 2002-03-06 2003-09-16 Advantest Corporation Insert and electronic component handler comprising it
WO2004095038A1 (en) * 2003-04-23 2004-11-04 Advantest Corporation Insert and tray respectively for electronic component handling device and electronic component handling device

Also Published As

Publication number Publication date
CN101842712B (en) 2013-01-30
WO2009069190A1 (en) 2009-06-04
TWI396847B (en) 2013-05-21
KR20100052564A (en) 2010-05-19
KR101149747B1 (en) 2012-06-01
CN101842712A (en) 2010-09-22
TW200946917A (en) 2009-11-16
JPWO2009069190A1 (en) 2011-04-07

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Legal Events

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BB1A Laying open of patent application

Effective date: 20080909

FC3A Refusal

Effective date: 20090422