PT104140A - Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos - Google Patents
Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos Download PDFInfo
- Publication number
- PT104140A PT104140A PT104140A PT10414008A PT104140A PT 104140 A PT104140 A PT 104140A PT 104140 A PT104140 A PT 104140A PT 10414008 A PT10414008 A PT 10414008A PT 104140 A PT104140 A PT 104140A
- Authority
- PT
- Portugal
- Prior art keywords
- tray
- electronic device
- insertion element
- test equipment
- device test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
UM ELEMENTO (710) DE INSERÇÃO COMPREENDE: UM CORPO (720) DO ELEMENTO DE INSERÇÃO TENDO UM ORIFÍCIO (721) DE ACOMODAÇÃO DE DISPOSITIVO PARA ACOMODAR UM DISPOSITIVO IC; E UM SUPORTE (760) DE DISPOSITIVO PARA PRENDER O DISPOSITIVO IC ACOMODADO NO ORIFÍCIO (721) DE ACOMODAÇÃO DE DISPOSITIVO, ESTANDO O SUPORTE (760) DE DISPOSITIVO APTO A MOVER-SE FINAMENTE EM RELAÇÃO AO CORPO (720) DO ELEMENTO DE INSERÇÃO.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/072789 WO2009069190A1 (ja) | 2007-11-26 | 2007-11-26 | インサート、トレイ及び電子部品試験装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
PT104140A true PT104140A (pt) | 2008-09-17 |
Family
ID=40678108
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PT104140A PT104140A (pt) | 2007-11-26 | 2008-07-25 | Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPWO2009069190A1 (pt) |
KR (1) | KR101149747B1 (pt) |
CN (1) | CN101842712B (pt) |
PT (1) | PT104140A (pt) |
TW (1) | TWI396847B (pt) |
WO (1) | WO2009069190A1 (pt) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013053991A (ja) * | 2011-09-06 | 2013-03-21 | Seiko Epson Corp | ハンドラー及び部品検査装置 |
KR101488488B1 (ko) * | 2013-07-09 | 2015-02-02 | 주식회사 오킨스전자 | 엘이디모듈 테스트장치 |
TW201610444A (zh) * | 2014-09-11 | 2016-03-16 | Motech Taiwan Automatic Corp | 電子元件測試模組之啓閉裝置(三) |
KR101887071B1 (ko) | 2016-09-01 | 2018-09-10 | 리노공업주식회사 | 검사장치의 슬라이더 조작기구 |
CN116643065B (zh) * | 2023-07-26 | 2023-11-07 | 中国电子科技集团公司第十研究所 | 一种模拟类模块用柔性装夹装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6369595B1 (en) * | 1999-01-21 | 2002-04-09 | Micron Technology, Inc. | CSP BGA test socket with insert and method |
JP4279413B2 (ja) * | 1999-07-16 | 2009-06-17 | 株式会社アドバンテスト | 電子部品試験装置用インサート |
JP4222442B2 (ja) * | 1999-07-16 | 2009-02-12 | 株式会社アドバンテスト | 電子部品試験装置用インサート |
US6636060B1 (en) * | 1999-07-16 | 2003-10-21 | Advantest Corporation | Insert for electric devices testing apparatus |
AU2002236231A1 (en) * | 2002-03-06 | 2003-09-16 | Advantest Corporation | Insert and electronic component handler comprising it |
WO2004095038A1 (ja) * | 2003-04-23 | 2004-11-04 | Advantest Corporation | 電子部品ハンドリング装置用インサート、トレイおよび電子部品ハンドリング装置 |
-
2007
- 2007-11-26 KR KR1020107008080A patent/KR101149747B1/ko active IP Right Grant
- 2007-11-26 JP JP2009543597A patent/JPWO2009069190A1/ja not_active Ceased
- 2007-11-26 CN CN200780101442.3A patent/CN101842712B/zh active Active
- 2007-11-26 WO PCT/JP2007/072789 patent/WO2009069190A1/ja active Application Filing
-
2008
- 2008-07-25 PT PT104140A patent/PT104140A/pt not_active Application Discontinuation
- 2008-11-24 TW TW097145327A patent/TWI396847B/zh active
Also Published As
Publication number | Publication date |
---|---|
KR101149747B1 (ko) | 2012-06-01 |
TWI396847B (zh) | 2013-05-21 |
JPWO2009069190A1 (ja) | 2011-04-07 |
TW200946917A (en) | 2009-11-16 |
WO2009069190A1 (ja) | 2009-06-04 |
CN101842712B (zh) | 2013-01-30 |
KR20100052564A (ko) | 2010-05-19 |
CN101842712A (zh) | 2010-09-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1996955A4 (en) | METHOD AND APPARATUS FOR INTERROGATION OF ELECTRONIC COMPONENT | |
MY148803A (en) | Electronic component pressing device and electronic component test apparatus | |
TWI339730B (en) | Prober for electronic device testing on large area substrates | |
DE502004005579D1 (de) | INSERTIONSVORRICHTUNG FüR DURCHSTECHVORRICHTUNGEN | |
PT104140A (pt) | Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos | |
BRPI0700101A (pt) | grampo de retenção para um sensor, e, conjunto | |
ATE462360T1 (de) | Einführsystem für ein chirurgisches instrument | |
BRPI0519814A2 (pt) | dispositivo para fixação mútua de um suporte longitudinal com um elemento de fixação óssea | |
BRPI0812057A2 (pt) | Aparelho de retenção de cartão de ic, método de exibição para um aparelho de retenção de cartão de ic que está retendo um cartão de ic sem contato, sistema de fornecimento de dados, aparelho servidor, e, método de fornecimento de dados | |
TWI372431B (en) | Semiconductor device, semiconductor device testing method, and probe card | |
DE502007000602D1 (de) | Verpackungsvorrichtung für Implantatschrauben | |
BRPI0709105A8 (pt) | Sistemas de teste de diagnóstico e método de suprimento de dados de diagnóstico para um computador | |
DE10309263B8 (de) | Geberträger für ein innerhalb von Rohren einsetzbares Inspektionsgerät (Ausführungsformen) | |
DE602005006378D1 (de) | Anschlusselemente für eine automatische Testeinrichtung zur Prüfung von integrierten Schaltungen | |
TW200634321A (en) | Insert for electronic-parts-handling device, pusher, socket guide for test head, and electronic-parts-handling device | |
EP2015089A4 (en) | TEST UNIT, CIRCUIT AND ELECTRONIC DEVICE | |
WO2010042385A3 (en) | Storage device emulator and method of use thereof | |
TW200734665A (en) | Electronic component testing apparatus and electronic component testing method | |
WO2008139579A1 (ja) | 電子部品試験装置、電子部品試験システム及び電子部品の試験方法 | |
EP1806589A4 (en) | SONDER TO WAFER INSPECTION, WAFER INSPECTION SAMPLE CARD AND WAFER INSPECTION DEVICES | |
BRPI0820069A2 (pt) | dispositivo e método para encaixes de placas de circuito impresso em pinos de contato | |
DE502007004990D1 (de) | Dosiervorrichtung mit einer Aufnahmevorrichtung für eine einsetzbare Einheit | |
FR2905176B1 (fr) | Dispositif et procede de test d'etancheite d'articles. | |
TWI371817B (en) | Test tray for test handler | |
ATE480132T1 (de) | Halter für eine flexible leiterplatte |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
BB1A | Laying open of patent application |
Effective date: 20080909 |
|
FC3A | Refusal |
Effective date: 20090422 |