NO993446L - System for scanning av store objekters geometri - Google Patents

System for scanning av store objekters geometri

Info

Publication number
NO993446L
NO993446L NO993446A NO993446A NO993446L NO 993446 L NO993446 L NO 993446L NO 993446 A NO993446 A NO 993446A NO 993446 A NO993446 A NO 993446A NO 993446 L NO993446 L NO 993446L
Authority
NO
Norway
Prior art keywords
objects
scanning large
large geometry
geometry
scanning
Prior art date
Application number
NO993446A
Other languages
English (en)
Other versions
NO993446D0 (no
NO313113B1 (no
Inventor
Alf Ettersen
Original Assignee
Metronor Asa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metronor Asa filed Critical Metronor Asa
Priority to NO19993446A priority Critical patent/NO313113B1/no
Publication of NO993446D0 publication Critical patent/NO993446D0/no
Priority to EP00963149A priority patent/EP1200798A1/en
Priority to JP2001512250A priority patent/JP2003505682A/ja
Priority to AU74599/00A priority patent/AU7459900A/en
Priority to PCT/NO2000/000235 priority patent/WO2001007866A1/en
Publication of NO993446L publication Critical patent/NO993446L/no
Publication of NO313113B1 publication Critical patent/NO313113B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
NO19993446A 1999-07-13 1999-07-13 System for scanning av store objekters geometri NO313113B1 (no)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NO19993446A NO313113B1 (no) 1999-07-13 1999-07-13 System for scanning av store objekters geometri
EP00963149A EP1200798A1 (en) 1999-07-13 2000-07-10 System for scanning of the geometry of large objects
JP2001512250A JP2003505682A (ja) 1999-07-13 2000-07-10 大きな物体の幾何学的形状を走査するシステム
AU74599/00A AU7459900A (en) 1999-07-13 2000-07-10 System for scanning of the geometry of large objects
PCT/NO2000/000235 WO2001007866A1 (en) 1999-07-13 2000-07-10 System for scanning of the geometry of large objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO19993446A NO313113B1 (no) 1999-07-13 1999-07-13 System for scanning av store objekters geometri

Publications (3)

Publication Number Publication Date
NO993446D0 NO993446D0 (no) 1999-07-13
NO993446L true NO993446L (no) 2001-01-15
NO313113B1 NO313113B1 (no) 2002-08-12

Family

ID=19903575

Family Applications (1)

Application Number Title Priority Date Filing Date
NO19993446A NO313113B1 (no) 1999-07-13 1999-07-13 System for scanning av store objekters geometri

Country Status (5)

Country Link
EP (1) EP1200798A1 (no)
JP (1) JP2003505682A (no)
AU (1) AU7459900A (no)
NO (1) NO313113B1 (no)
WO (1) WO2001007866A1 (no)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10156431B4 (de) * 2001-11-16 2005-12-22 Dantec Ettemeyer Gmbh Verfahren zur Lagebestimmung von Meßpunkten auf einem Objekt
BE1014484A3 (nl) 2001-11-22 2003-11-04 Krypton Electronic Eng Nv Werkwijze en inrichting voor het vergroten van het meetvolume van een optisch meetsysteem.
WO2003069277A1 (en) * 2002-02-14 2003-08-21 Faro Technologies, Inc. Portable coordinate measurement machine with integrated line laser scanner
EP1361414B1 (en) * 2002-05-08 2011-01-26 3D Scanners Ltd Method for the calibration and qualification simultaneously of a non-contact probe
US6944564B2 (en) 2002-05-08 2005-09-13 Metris N.V. Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe
US7009717B2 (en) 2002-08-14 2006-03-07 Metris N.V. Optical probe for scanning the features of an object and methods therefor
JP3817530B2 (ja) 2003-06-30 2006-09-06 本田技研工業株式会社 ３次元形状測定方法及びその測定装置
DE10341042A1 (de) 2003-09-03 2005-03-31 Claas Fertigungstechnik Gmbh Vorrichtung und Verfahren zur Vermessung von Bauteilen
DE102004017172A1 (de) 2004-04-02 2005-10-20 Jan Bernd Lugtenburg Verfahren und Vorrichtung zur Vermessung eines Messobjekts
WO2006114216A1 (en) * 2005-04-25 2006-11-02 Metris N.V. Method and device for scanning an object using robot manipulated non-contact scannering means and separate position and orientation detection means
DE102005043912B4 (de) * 2005-05-18 2011-08-18 Steinbichler Optotechnik GmbH, 83115 Verfahren zum Bestimmen der 3D-Koordinaten der Oberfläche eines Objekts
JP2006349547A (ja) * 2005-06-17 2006-12-28 Kanto Auto Works Ltd 非接触式三次元形状計測方法及び計測機
US7299145B2 (en) 2005-08-16 2007-11-20 Metris N.V. Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
ATE494527T1 (de) 2005-08-16 2011-01-15 3D Scanners Ltd Verfahren zur simultanen kalibrierung, qualifizierung und synchronisierung einer berührungslosen sonde
DE102006003569A1 (de) 2006-01-25 2007-07-26 Axios 3D Services Gmbh Positionsbestimmungssystem
JP4657275B2 (ja) * 2007-10-29 2011-03-23 パナソニック株式会社 光学的測定装置
DE102008022338B4 (de) * 2008-04-09 2015-02-19 Waldemar Knittel Glasbearbeitungs Gmbh Verfahren zum Erfassen eines Kantenverlaufs einer Kante einer Platte
DE102011011360A1 (de) * 2011-02-16 2012-08-16 Steinbichler Optotechnik Gmbh Vorrichtung und Verfahren zur Bestimmung der 3-D-Koordinaten eines Objekts und zum Kalibrieren eines Industrieroboters
CN103033183B (zh) * 2012-12-14 2015-07-01 中国航空工业集团公司北京长城航空测控技术研究所 工业机器人室内精确定位***及方法
DE102014105456B4 (de) * 2014-04-16 2020-01-30 Minikomp Bogner GmbH Verfahren zur Vermessung der Außenkontur von dreidimensionalen Messobjekten und zugehöriges Messsystem
DE202016106062U1 (de) 2016-10-27 2016-11-07 LPKF SolarQuipment GmbH Druckmaschine mit einer Vorrichtung zur Erfassung zumindest einer Glaskante einer Glasplatte
WO2019176118A1 (ja) * 2018-03-16 2019-09-19 三菱電機株式会社 重畳表示システム
CN110849267B (zh) * 2019-12-02 2021-02-26 南京航空航天大学 一种基于局部基准孔的移动式自动化***在产品上定位和坐标系转换的方法
DE102021105176A1 (de) 2021-03-04 2022-09-08 Dr. Ing. H.C. F. Porsche Aktiengesellschaft Vorrichtung und Verfahren zur Ermittlung und Darstellung einer Relativorientierung eines Gegenstandes

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE464322B (sv) * 1989-11-09 1991-04-08 Johansson Ab C E Beroeringsfri maetprob
US5198877A (en) * 1990-10-15 1993-03-30 Pixsys, Inc. Method and apparatus for three-dimensional non-contact shape sensing
JPH05312521A (ja) * 1992-05-13 1993-11-22 Nec Corp ターゲットマーク
DE4325269A1 (de) * 1993-07-28 1995-02-02 Zeiss Carl Jena Gmbh Anordnung zur koordinatenmäßigen Ermittlung der Form und Lage von Strukturen, Kanten und Formelementen
GB2292605B (en) * 1994-08-24 1998-04-08 Guy Richard John Fowler Scanning arrangement and method
AU3621795A (en) * 1994-09-28 1996-04-19 William Richard Fright Arbitrary-geometry laser surface scanner
JPH09166410A (ja) * 1995-12-14 1997-06-24 Toshiba Corp 位置計測装置
NO303595B1 (no) * 1996-07-22 1998-08-03 Metronor Asa System og fremgangsmÕte for bestemmelse av romlige koordinater
JP3373367B2 (ja) * 1996-08-09 2003-02-04 松下電器産業株式会社 ３次元計測装置及び３次元計測方法
FR2770317B1 (fr) * 1997-10-24 2000-12-08 Commissariat Energie Atomique Procede d'etalonnage de la position et de l'orientation d'origine d'une ou plusieurs cameras mobiles et son application a la mesure de position tridimentionnelle d'objets fixes

Also Published As

Publication number Publication date
NO993446D0 (no) 1999-07-13
EP1200798A1 (en) 2002-05-02
AU7459900A (en) 2001-02-13
JP2003505682A (ja) 2003-02-12
WO2001007866A1 (en) 2001-02-01
NO313113B1 (no) 2002-08-12

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