NL2021649B1 - Exposure device for a photolithography method, assembly having an exposure device and method for exposing a substrate coated with a photoresist - Google Patents
Exposure device for a photolithography method, assembly having an exposure device and method for exposing a substrate coated with a photoresist Download PDFInfo
- Publication number
- NL2021649B1 NL2021649B1 NL2021649A NL2021649A NL2021649B1 NL 2021649 B1 NL2021649 B1 NL 2021649B1 NL 2021649 A NL2021649 A NL 2021649A NL 2021649 A NL2021649 A NL 2021649A NL 2021649 B1 NL2021649 B1 NL 2021649B1
- Authority
- NL
- Netherlands
- Prior art keywords
- lens mask
- substrate
- light source
- holder
- lens
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/7005—Production of exposure light, i.e. light sources by multiple sources, e.g. light-emitting diodes [LED] or light source arrays
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70158—Diffractive optical elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL2021649A NL2021649B1 (en) | 2018-09-17 | 2018-09-17 | Exposure device for a photolithography method, assembly having an exposure device and method for exposing a substrate coated with a photoresist |
PCT/EP2019/074711 WO2020058194A1 (de) | 2018-09-17 | 2019-09-16 | Belichtungsvorrichtung für ein fotolithographieverfahren, baugruppe mit einer belichtungsvorrichtung sowie verfahren zur belichtung eines mit einem fotolack beschichteten substrats |
TW108133275A TW202032274A (zh) | 2018-09-17 | 2019-09-16 | 用於光微影方法的曝光裝置、具有曝光裝置的總成、以及用於將塗有光阻的基板曝光的方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL2021649A NL2021649B1 (en) | 2018-09-17 | 2018-09-17 | Exposure device for a photolithography method, assembly having an exposure device and method for exposing a substrate coated with a photoresist |
Publications (1)
Publication Number | Publication Date |
---|---|
NL2021649B1 true NL2021649B1 (en) | 2020-05-07 |
Family
ID=64744895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL2021649A NL2021649B1 (en) | 2018-09-17 | 2018-09-17 | Exposure device for a photolithography method, assembly having an exposure device and method for exposing a substrate coated with a photoresist |
Country Status (3)
Country | Link |
---|---|
NL (1) | NL2021649B1 (de) |
TW (1) | TW202032274A (de) |
WO (1) | WO2020058194A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114682910A (zh) * | 2022-05-13 | 2022-07-01 | 东莞市中麒光电技术有限公司 | 采用透镜阵列的晶粒焊接装置及焊接方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5900637A (en) * | 1997-05-30 | 1999-05-04 | Massachusetts Institute Of Technology | Maskless lithography using a multiplexed array of fresnel zone plates |
US20070019070A1 (en) * | 2003-08-27 | 2007-01-25 | Koninklijke Philips Electronics N.V. | Method of forming optical images, an array of converging elements and an array of light valves for use in this method, apparatus for carrying out this method and a process for manufacturing a device using this method |
EP2253997A2 (de) | 2009-05-18 | 2010-11-24 | Süss MicroTec Lithography GmbH | Beleuchtungssystem für einen mikrolithografischen Kontakt und Nähenbelichtungsvorrichtung |
US20120140194A1 (en) * | 2010-12-01 | 2012-06-07 | Samsung Electronics Co., Ltd. | Maskless Exposure Apparatus |
US20150097914A1 (en) * | 2012-04-20 | 2015-04-09 | Koninklijke Philips N.V. | Lighting apparatus for providing light for processing an object |
-
2018
- 2018-09-17 NL NL2021649A patent/NL2021649B1/en not_active IP Right Cessation
-
2019
- 2019-09-16 TW TW108133275A patent/TW202032274A/zh unknown
- 2019-09-16 WO PCT/EP2019/074711 patent/WO2020058194A1/de active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5900637A (en) * | 1997-05-30 | 1999-05-04 | Massachusetts Institute Of Technology | Maskless lithography using a multiplexed array of fresnel zone plates |
US20070019070A1 (en) * | 2003-08-27 | 2007-01-25 | Koninklijke Philips Electronics N.V. | Method of forming optical images, an array of converging elements and an array of light valves for use in this method, apparatus for carrying out this method and a process for manufacturing a device using this method |
EP2253997A2 (de) | 2009-05-18 | 2010-11-24 | Süss MicroTec Lithography GmbH | Beleuchtungssystem für einen mikrolithografischen Kontakt und Nähenbelichtungsvorrichtung |
US20120140194A1 (en) * | 2010-12-01 | 2012-06-07 | Samsung Electronics Co., Ltd. | Maskless Exposure Apparatus |
US20150097914A1 (en) * | 2012-04-20 | 2015-04-09 | Koninklijke Philips N.V. | Lighting apparatus for providing light for processing an object |
Also Published As
Publication number | Publication date |
---|---|
WO2020058194A1 (de) | 2020-03-26 |
TW202032274A (zh) | 2020-09-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM | Lapsed because of non-payment of the annual fee |
Effective date: 20211001 |