MX360696B - Dispositivo y método de inspección de defectos superficiales para chapas de acero revestidas por inmersión en caliente. - Google Patents

Dispositivo y método de inspección de defectos superficiales para chapas de acero revestidas por inmersión en caliente.

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Publication number
MX360696B
MX360696B MX2017012698A MX2017012698A MX360696B MX 360696 B MX360696 B MX 360696B MX 2017012698 A MX2017012698 A MX 2017012698A MX 2017012698 A MX2017012698 A MX 2017012698A MX 360696 B MX360696 B MX 360696B
Authority
MX
Mexico
Prior art keywords
image
reflection
surface defect
site
capture unit
Prior art date
Application number
MX2017012698A
Other languages
English (en)
Other versions
MX2017012698A (es
Inventor
Fukui Keita
SHIGA Syunsuke
Original Assignee
Nisshin Steel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nisshin Steel Co Ltd filed Critical Nisshin Steel Co Ltd
Publication of MX2017012698A publication Critical patent/MX2017012698A/es
Publication of MX360696B publication Critical patent/MX360696B/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/208—Coatings, e.g. platings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G01N2021/8825—Separate detection of dark field and bright field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Textile Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

La presente invención clasifica, con alta precisión, una pluralidad de tipos de defectos superficiales en los cuales se produce fácilmente una variación, sin depender de información tal como el área o forma de los defectos superficiales. La luz de reflexión desde un sitio a ser la imagen capturada en una placa de acero 2 es la imagen capturada simultáneamente mediante una unidad de captura de imagen de luz de reflexión regular 4 y una unidad de captura de imagen de luz de reflexión difusa 5. Una unidad de procesamiento de señales de imagen 6, a partir de una señal de imagen de reflexión regular se obtiene T1 a través de la captura de imagen realizada por la unidad de captura de imágenes de luz de reflexión regular 4, un sitio que tiene una luminancia por debajo de un umbral prescrito como sitio de defecto superficial. Se lleva a cabo un procesamiento de umbral sobre una señal de imagen de reflexión difusa T2 obtenida a través de la captura de imagen realizada por la unidad de captura de imágenes de luz de reflexión difusa 5 en relación con un sitio correspondiente al sitio de defecto superficial extraído, mediante lo cual se clasifica el tipo de defecto en el sitio del+ defecto superficial extraído.
MX2017012698A 2015-03-31 2016-03-28 Dispositivo y método de inspección de defectos superficiales para chapas de acero revestidas por inmersión en caliente. MX360696B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015070692 2015-03-31
PCT/JP2016/059963 WO2016158873A1 (ja) 2015-03-31 2016-03-28 溶融めっき鋼板の表面欠陥検査装置および表面欠陥検査方法

Publications (2)

Publication Number Publication Date
MX2017012698A MX2017012698A (es) 2018-01-11
MX360696B true MX360696B (es) 2018-11-14

Family

ID=57005108

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2017012698A MX360696B (es) 2015-03-31 2016-03-28 Dispositivo y método de inspección de defectos superficiales para chapas de acero revestidas por inmersión en caliente.

Country Status (10)

Country Link
US (1) US10041888B2 (es)
EP (1) EP3279645A4 (es)
JP (1) JP6027295B1 (es)
KR (1) KR101800597B1 (es)
CN (1) CN107533012B (es)
BR (1) BR112017021163A2 (es)
MX (1) MX360696B (es)
MY (1) MY165130A (es)
TW (1) TWI627399B (es)
WO (1) WO2016158873A1 (es)

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BR112017021163A2 (pt) 2015-03-31 2018-07-17 Nisshin Steel Co., Ltd. dispositivo e método de inspeção de defeito de superfície para chapas de aço revestidas por imersão a quente
JP6117398B1 (ja) 2016-03-30 2017-04-19 日新製鋼株式会社 鋼板の表面欠陥検査装置および表面欠陥検査方法
TWI630366B (zh) * 2017-04-28 2018-07-21 中國鋼鐵股份有限公司 鋼板寬度量測系統及其方法
CN111295251B (zh) * 2018-10-01 2021-09-03 富山住友电工株式会社 镀敷线材的制造方法和镀敷线材的制造装置
CN109557084A (zh) * 2019-01-17 2019-04-02 南通市产品质量监督检验所 以镀层铁元素含量鉴定制绳镀锌钢丝镀锌方式的检测方法
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DE102019210727A1 (de) * 2019-07-19 2021-01-21 Thyssenkrupp Steel Europe Ag Verfahren zum Bestimmen eines Reinigungszustands einer Oberfläche eines Flachprodukts und Flachprodukt
CN110738237A (zh) * 2019-09-16 2020-01-31 深圳新视智科技术有限公司 缺陷分类的方法、装置、计算机设备和存储介质
CN112345555A (zh) * 2020-10-30 2021-02-09 凌云光技术股份有限公司 外观检查机高亮成像光源***
JP7495163B1 (ja) 2023-03-08 2024-06-04 株式会社ヒューテック 欠点撮像装置およびそこで用いられる詳細撮像装置

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BR112017021163A2 (pt) 2015-03-31 2018-07-17 Nisshin Steel Co., Ltd. dispositivo e método de inspeção de defeito de superfície para chapas de aço revestidas por imersão a quente

Also Published As

Publication number Publication date
EP3279645A1 (en) 2018-02-07
BR112017021163A2 (pt) 2018-07-17
US10041888B2 (en) 2018-08-07
KR20170117600A (ko) 2017-10-23
CN107533012B (zh) 2019-07-19
KR101800597B1 (ko) 2017-11-22
JPWO2016158873A1 (ja) 2017-04-27
US20180017503A1 (en) 2018-01-18
MX2017012698A (es) 2018-01-11
WO2016158873A1 (ja) 2016-10-06
CN107533012A (zh) 2018-01-02
JP6027295B1 (ja) 2016-11-16
TWI627399B (zh) 2018-06-21
MY165130A (en) 2018-02-28
TW201640101A (zh) 2016-11-16
EP3279645A4 (en) 2018-09-26

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