KR970030026A - Floor Plan Measuring Device for Electron Gun Electrode for Cathode Ray Tube - Google Patents
Floor Plan Measuring Device for Electron Gun Electrode for Cathode Ray Tube Download PDFInfo
- Publication number
- KR970030026A KR970030026A KR1019950043579A KR19950043579A KR970030026A KR 970030026 A KR970030026 A KR 970030026A KR 1019950043579 A KR1019950043579 A KR 1019950043579A KR 19950043579 A KR19950043579 A KR 19950043579A KR 970030026 A KR970030026 A KR 970030026A
- Authority
- KR
- South Korea
- Prior art keywords
- moving means
- direction moving
- slider
- electron gun
- measuring device
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/42—Measurement or testing during manufacture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
음극선관용 전자총의 전극 평면도를 측정하기 위하여, 작업대와 ; 상기한 작업대 상에 Z축방향으로 제공되어 슬라이더의 Z축방향 이동을 가능하게 하는 Z방향 이동수단과 ; 상기한 Z방향 이동수단의 아래측으로 위치하여 슬라이더의 X방향 이동을 가능하게 하는 X방향 이동수단과 ; 상기한 X방향 이동수단에 대하여 직교하는 방향으로 위치하여 Y방향 이동을 가능하게 하는 Y방향 이동수단을 포함하며, 상기한 Z방향 이동수단에는 변위계측 수단이 제공되는 음극선관용 전자총 전극의 평면도 측정장치를 제공한다.A work table for measuring an electrode plan view of an electron gun for a cathode ray tube; Z-direction moving means provided in the Z-axis direction on the worktable to enable the Z-axis movement of the slider; An X-direction moving means positioned below the Z-direction moving means to enable the slider to move in the X direction; And a Y-direction moving means positioned in a direction orthogonal to the X-direction moving means and allowing a Y-direction movement, wherein the Z-direction moving means is provided with a displacement measuring means. To provide.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제1도는 본 발명에 의한 평면도 측정장치의 사시도.1 is a perspective view of a plan view measuring apparatus according to the present invention.
Claims (6)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950043579A KR970030026A (en) | 1995-11-24 | 1995-11-24 | Floor Plan Measuring Device for Electron Gun Electrode for Cathode Ray Tube |
JP8029770A JPH09152329A (en) | 1995-11-24 | 1996-02-19 | Flatness measuring device |
DE19607513A DE19607513A1 (en) | 1995-11-24 | 1996-02-28 | Electrode flatness measuring device for electrode of electron gun of cathode ray tube |
CN96104233A CN1151518A (en) | 1995-11-24 | 1996-03-06 | Device for measuring flatness of electrode of electron gun for cathode-ray tube |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950043579A KR970030026A (en) | 1995-11-24 | 1995-11-24 | Floor Plan Measuring Device for Electron Gun Electrode for Cathode Ray Tube |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970030026A true KR970030026A (en) | 1997-06-26 |
Family
ID=19435631
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950043579A KR970030026A (en) | 1995-11-24 | 1995-11-24 | Floor Plan Measuring Device for Electron Gun Electrode for Cathode Ray Tube |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPH09152329A (en) |
KR (1) | KR970030026A (en) |
CN (1) | CN1151518A (en) |
DE (1) | DE19607513A1 (en) |
Cited By (1)
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---|---|---|---|---|
CN106996731A (en) * | 2017-05-09 | 2017-08-01 | 镇江成泰自动化技术有限公司 | Battery pole ear dislocation detection means |
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1995
- 1995-11-24 KR KR1019950043579A patent/KR970030026A/en not_active Application Discontinuation
-
1996
- 1996-02-19 JP JP8029770A patent/JPH09152329A/en active Pending
- 1996-02-28 DE DE19607513A patent/DE19607513A1/en not_active Withdrawn
- 1996-03-06 CN CN96104233A patent/CN1151518A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106996731A (en) * | 2017-05-09 | 2017-08-01 | 镇江成泰自动化技术有限公司 | Battery pole ear dislocation detection means |
Also Published As
Publication number | Publication date |
---|---|
CN1151518A (en) | 1997-06-11 |
JPH09152329A (en) | 1997-06-10 |
DE19607513A1 (en) | 1997-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |