KR950013981A - Silicon carbide coated graphite jig for semiconductor wafer processing with improved thermal shock resistance and manufacturing method thereof - Google Patents

Silicon carbide coated graphite jig for semiconductor wafer processing with improved thermal shock resistance and manufacturing method thereof Download PDF

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KR950013981A
KR950013981A KR1019930025547A KR930025547A KR950013981A KR 950013981 A KR950013981 A KR 950013981A KR 1019930025547 A KR1019930025547 A KR 1019930025547A KR 930025547 A KR930025547 A KR 930025547A KR 950013981 A KR950013981 A KR 950013981A
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South Korea
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silicon carbide
graphite
layer
composite material
coating layer
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KR1019930025547A
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Korean (ko)
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KR970003829B1 (en
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김영욱
이준근
박성훈
김인섭
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김은영
한국과학기술연구원
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    • H01L21/205

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Abstract

본 발명은 흑연 기재와 탄화규소 피복층 사이에, 흑연 기재로부터 탄화규소 피복층에 이르기까지 탄화규소의 함량이 점진적으로 증가하는 구배를 갖는 흑연-탄화규소 복합 재료층을 갖는 특징으로 하는 탄화규소 피복 흑연 치구 및 그의 제조 방법을 기재하고 있다. 본 발명의 흑연 치구는 흑연-탄화규소 복합 재료층을 가지고 있어 흑연 기재로부터 탄화규소층에 이르기까지 열팽창 계수가 점진적으로 변화하게 되므로 급열 및 급냉의 사용 조건에서 장기간 사용하여도 피복층의 박리 및 균열이 발생하지 않아 우수한 열출격 내성을 나타낸다.The present invention is a silicon carbide coated graphite fixture characterized by having a graphite-silicon carbide composite material layer having a gradient in which the content of silicon carbide gradually increases from the graphite substrate to the silicon carbide coating layer between the graphite substrate and the silicon carbide coating layer. And a method for producing the same. Since the graphite jig of the present invention has a graphite-silicon carbide composite layer, the coefficient of thermal expansion gradually changes from the graphite substrate to the silicon carbide layer, so that peeling and cracking of the coating layer is prevented even when used for a long time under the conditions of rapid quenching and quenching. It does not occur and shows excellent thermal splat resistance.

Description

열충격 내성이 개량된 반도체 웨이퍼 처리용 탄화규소 피복 흑연 치구 및 그의 제조 방법Silicon carbide coated graphite jig for semiconductor wafer processing with improved thermal shock resistance and manufacturing method thereof

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

Claims (8)

흑연 기재, 흑연-탄화규소 복합 재료층 및 탄화규소 피복층으로 이루어지고, 상기 흑연 기재와 탄화규소 피복층 사이에 있는 흑연-탄화규소 복합 재료층 중의 탄화규소의 함량이 흑연 기재로부터 표면의 탄화규소 피복층에 이르기까지 점진적으로 증가하는 구배를 갖는 것이 특징인 반도체 웨이퍼 처리용 탄화규소 피복 흑연 치구.The content of silicon carbide in the graphite-silicon carbide composite layer, which is composed of a graphite substrate, a graphite-silicon carbide composite layer and a silicon carbide coating layer, is between the graphite substrate and the silicon carbide coating layer. Silicon carbide coated graphite jig for semiconductor wafer processing characterized by having a gradually increasing gradient up to. 제1항에 있어서, 상기 흑연-탄화규소 복합 재료층의 두께가 전체 피복층 두께의 25 내지 75%인 흑연 치구.The graphite jig according to claim 1, wherein the graphite-silicon carbide composite material layer has a thickness of 25 to 75% of the total coating layer thickness. 제2항에 있어서, 상기 흑연-탄화규소 복합 재료층의 두께가 약 17 내지 900㎛이고, 탄화규소 피복층의 두께가 50 내지 300㎛인 흑연 치구.The graphite jig according to claim 2, wherein the graphite-silicon carbide composite material layer has a thickness of about 17 to 900 mu m and a silicon carbide coating layer has a thickness of 50 to 300 mu m. 제1 내지 3항 중 어느 하나의 항에 있어서, 상기 흑연-탄화규소 복합 재료층이 복합 재료 중의 탄화규소 함량이 흑연 기재로부터 탄화규소층에 이르기까지 20% 이하로부터 80% 이상으로까지 점진적으로 증가하는 구배를 갖는 것인 흑연 치구.4. The graphite-silicon carbide composite material layer according to any one of claims 1 to 3, wherein the silicon carbide content of the composite material is gradually increased from 20% or less to 80% or more from the graphite substrate to the silicon carbide layer. Graphite fixture that has a gradient to. a) 적절한 형상으로 가공된 흑연 기재를 고온에서 할로겐화 기체를 사용하여 고순도화시키는 단계, b) 흑연 전구체로서 메탄(CH4)을, 그리고 탄화규소의 전구체로서 메틸트리클로로실렌(CH3SiCl3)을 사용하는 화학 증착법으로 흑연-탄화규소 복합 재료를 탄화규소의 함량이 흑연 기재로부터 표면의 탄화규소층에 이르기까지 점진적으로 증가하도록 증착시키는 단계, c) 그 위에 탄화규소층을 다시 화학 증착법으로 증착시키는 단계로 이루어진 것이 특징인 반도체 웨이퍼 처리용 탄화규소 피복 흑연 치구의 제조 방법.a) high purity of the graphite substrate processed into a suitable shape using a halogenated gas at a high temperature, b) methane (CH 4 ) as the graphite precursor and methyltrichlorosilane (CH 3 SiCl 3 ) as the precursor of silicon carbide Depositing the graphite-silicon carbide composite material such that the silicon carbide content gradually increases from the graphite substrate to the surface silicon carbide layer; c) depositing the silicon carbide layer thereon again by chemical vapor deposition. A method for producing a silicon carbide coated graphite jig for semiconductor wafer processing, comprising the steps. 제5항에 있어서, 상기 단계 a)를 1250℃ 이상의 온도에서 HCl 기체를 사용하여 열처리함으로써 행하는 것이 특징인 방법.6. The method of claim 5, wherein step a) is carried out by heat treatment with HCl gas at a temperature of at least 1250 ° C. 제5항에 있어서, 상기 단계 b)를 1050 내지 1500℃의 온도 및 10 내지 360 Torr의 압력에서, 공급 기체의 조성을 CH42 내지 24%, CH3SiCl32 내지 13% 및 H245 내지 90%로 하되, 증착이 진행됨에 따라 점차적으로 CH4의 농도는 낮추고 CH3SiCl3의 농도는 증가시켜 복합 재료 중의 탄화규소 함량이 점차적으로 증가하도록 증착시킴으로써 행하는 것이 특징인 방법.The process according to claim 5, wherein step b) is carried out at a temperature of 1050 to 1500 ° C and a pressure of 10 to 360 Torr, the composition of the feed gas is CH 4 2 to 24%, CH 3 SiCl 3 2 to 13% and H 2 45 to 90%, wherein the deposition is carried out by gradually lowering the concentration of CH 4 and increasing the concentration of CH 3 SiCl 3 so as to gradually increase the silicon carbide content in the composite material. 제5항에 있어서, 상기 단계 c)를 1050 내지 1500℃의 온도 및 10 내지 360 Torr의 압력에서, 공급 기체의 조성을 CH3SiCl35 내지 15% 및 H285 내지 95%로 하여 탄화규소층을 상기 흑연-탄화규소 복합 재료층 상에 증착시킴으로써 행하는 것이 특징인 방법.The silicon carbide layer according to claim 5, wherein the step c) is carried out at a temperature of 1050 to 1500 ° C. and a pressure of 10 to 360 Torr, with the composition of the feed gas as CH 3 SiCl 3 5 to 15% and H 2 85 to 95%. Characterized in that it is carried out by depositing on the graphite-silicon carbide composite material layer. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930025547A 1993-11-27 1993-11-27 Graphite tool coated by sic and manufacturing method for semiconductor wafer KR970003829B1 (en)

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