KR950003122Y1 - In-circuit tster system apparatus - Google Patents
In-circuit tster system apparatus Download PDFInfo
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- KR950003122Y1 KR950003122Y1 KR92024476U KR920024476U KR950003122Y1 KR 950003122 Y1 KR950003122 Y1 KR 950003122Y1 KR 92024476 U KR92024476 U KR 92024476U KR 920024476 U KR920024476 U KR 920024476U KR 950003122 Y1 KR950003122 Y1 KR 950003122Y1
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- floppy disk
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/0882—Control systems for mounting machines or assembly lines, e.g. centralized control, remote links, programming of apparatus and processes as such
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/10—Office automation; Time management
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
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- Tests Of Electronic Circuits (AREA)
Abstract
내용 없음.No content.
Description
제1도는 본 고안의 블럭도.1 is a block diagram of the present invention.
제2도는 종래의 블럭도.2 is a conventional block diagram.
* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings
1 : 전원부1: power supply
2,2',2″ : 메져보드(MEASURE BOARD)2,2 ', 2 ″: MEASURE BOARD
3,4 : 다중교환장치 5 : 컴퓨터3,4 multi-exchange device 5 computer
5,5 ″: 중앙처리장치(CPU) 6 : 모니터5,5 ″: CPU 6: Monitor
7 : 키보드 8 : 프린터7: keyboard 8: printer
9 : 프레스 10 : 1KHz보드9: press 10: 1 KHz board
11 : 플로피디스크콘트롤 12 : 플로피디스크11: Floppy Disk Control 12: Floppy Disk
13 : 서보보드콘트롤13: Servo Board Control
14 : 확장기억장치(EXTENSION MEMORY UNIT)14: EXTENSION MEMORY UNIT
15 : 입,출력(I/O)보드15: I / O board
본 고안은 피씨비자동검사기(IN-CIRCUIT TSTER : ICT)시스템장치에 관한 것이다.The present invention relates to an IN-CIRCUIT TSTER (ICT) system device.
일반적인 PCB자동검사장치는 기능상 구성이 많고 적고에 관계없이 PCB기판상에 형성된 부품을 검사하여 불량 유무를 판정한다.The general PCB automatic inspection device has a large number of functional configurations and inspects the parts formed on the PCB substrate to determine whether there are any defects.
종래의 피씨비자동검사기(ICT)시스템 구성은 제2도에 도시한 바와 같이 플로피디스크콘트롤(11)에서 플로피디스크(12)의 명령을 메모리에 저장하고 프로그램화된 명령들을 플로피디스크(12)에 메모리시키는 기능을 가지고 있으므로 서보보드콘트롤(13)에서 자동PCB테스터 내의 모든 보드를 제어함과 아울러 모니터(6)의 정보교환장치와 내부프린터를 동작시키고 확장메모리장치(14)를 서보보드콘트롤(13)에 장착하여 메모리의 용량을 증대하므로서 플로피디스크(12)에 주어진 명령을 로드기능에 의해 확장메모리장치(14)로 데이타를 전송하고 명령을 수행하여 입,출력보드(15)를 통해 중앙처리장치(5 ″)에 인가하면 상기 중앙처리장치(5 ″)는 서브보드콘트롤(13)에서 받은 명령을 프레스(9)에 전달하여 이의 동작을 제어하고 중앙처리장치(5')는 서브보드콘트롤(13)으로부터의 수행명령을 종류에 따라 메져보드(2')로 전송한다.In the conventional PCT automatic tester (ICT) system configuration, as shown in FIG. 2, the floppy disk control 11 stores the instructions of the floppy disk 12 in memory and the programmed instructions are stored in the floppy disk 12. Since the servo board control 13 controls all the boards in the automatic PCB tester, the information exchange device and the internal printer of the monitor 6 are operated, and the expansion memory device 14 is operated by the servo board control 13. By transferring the data given to the floppy disk 12 to the expansion memory device 14 by the load function and increasing the capacity of the memory by mounting the memory card 14 on the input / output board 15 through the central processing unit ( 5 ″) transmits a command received from the subboard control 13 to the press 9 to control its operation, and the central processing unit 5 'controls the subboard control (5 ″). The execution command from 13) is transmitted to the motherboard 2 'according to the type.
또한 메져보드(2')는 중앙처리장치(5')로부터 받은 디지탈신호를 아날로그신호로 변환하여 다중교환장치(3)(4)를 거쳐 실장된 기판을 테스트하는 기능을 가지고 있어 저항값을 조정하여 흐르는 직류를 변화시켜 다양한 종류의 저항을 측정하고 콘덴서와 인덕턴스를 측정할 수있는 P-ROM을 내장으로 시상수와 관계되는 부분의 측정을 용이하게 해주고 1KHZ보드 (10)는 메져보드(2')의 보조기능을 가지며 다중교환장치(3)(4)는 호스트 컴퓨터와 실자된 기판의 중간다리역활을 하는 것으로 호스트에서 측정하고자 하는 핀들을 선택하여 각각의 핀을 측정하므로 구성이 복잡하고 각각의 PCB간에 상호 연결이 미비하고 가격이 비싸고 신뢰성이 떨어지는 결점이 야기되었던 것이다.In addition, the measuring board 2 'has a function of converting a digital signal received from the central processing unit 5' into an analog signal and testing a board mounted through the multi-switching device 3 and 4 to adjust the resistance value. by varying the direct current flowing haejugo facilitate the measurement of the portion related to the time constant to the built-in P-ROM capable of measuring a wide range of resistance and measure the capacitor and the inductance 1KH Z board 10 is mejyeo board (2 ' The multi-switching device (3) (4) acts as a middle bridge between the host computer and the printed board, and selects the pins to be measured in the host and measures each pin. The shortcomings between the PCBs resulted in inadequate interconnections, high cost, and low reliability.
따라서, 본 고안은 상기와 바와 같이 복잡한 구성으로 된 피씨비 자동검사시스템의 파트별 가능성 분류를 최대한 줄여 구성은 간단하게 하여 가격을 저렴하게 하고 시스템 선능은 배가되도록 하는데 그 목적이 있다.Therefore, the present invention aims to reduce the possibility classification for each part of the PCB automatic inspection system having a complex configuration as described above, simplify the configuration, reduce the price, and double the system performance.
이와 같은 목적을 가진 본 고안의 구성을 첨부된 도면에 의해 상세히 설명하면 다음과 같다.When described in detail by the accompanying drawings the configuration of the subject innovation having such a purpose as follows.
제2도의 플로피디스크 명령들을 메모리에 옮기는 플로디스크콘트롤(11)과 테스터내의 모든 보드를 제어하는 서보보드콘트롤(13)과 메모리의 용량을 증대하는 확장메모리장치(14)와 입,출력보드(15)를 제1도의 컴퓨커(5)가 기능을 수행할 수 있게 하고, 서보보드콘트롤(13)로부터 받은 명령을 프레스(9)에 전달하여 이의 동작을 제어하는 중앙처리장치(5')(5″)와 메져보드(2')(2″) 1KHZ보드(10)를 제1도의 메져보드(2)가 그 기능을 수행할 수 있게한 피씨비 자동검사시스템장치인 것이다.Floppy disk control 11 for transferring the floppy disk commands of FIG. 2 to the memory, servo board control 13 for controlling all boards in the tester, expansion memory device 14 for increasing the capacity of the memory, and input / output boards 15 ) Allows the computer 5 of FIG. 1 to perform its function, and transmits the command received from the servo board control 13 to the press 9 to control its operation. ″) And the measurer board 2 '(2 ″) 1KH Z board 10 is a PCB automatic inspection system apparatus that allows the measurer board 2 of FIG. 1 to perform its function.
이하 첨부된 도면에 의해 본 고안은 작용 및 효과를 설명하면 다음과 같다.Hereinafter, the present invention by the accompanying drawings will be described the operation and effect.
먼저 메져보드(2)는 각 측정파트의 직류정전압과 정전류 및 교류정전압을 제어하는 릴레이에 신호를 단속하며 검사대상에 따라 단락(SHORT/OPEN)시켜 저항 콘덴서, 코일 ,다이오드, 트랜지스터 검사등으로 분류되며 컴퓨터(5)를 보호하기 위해 장비와 컴퓨터(5)사이에 삽입된 버퍼는 어드레스, 데이타, 제어신호버스로 사용하고 모드를 0으로 사용하여 입려포트로 하고 나머지는 모두 출력포트를 이용하여 입,출력회로 설계에서 데이타병렬전송을 하기 위해 PPI를 사용하였으므로 컴퓨터(5)에서는 디지탈신호만을 인식하여 아날로그신호를 상기 컴퓨터(5)가 인식하고 처리하려면 반드시 아날로그신호를 디지탈신호로 변환해야 하므로 아날로그/디지탈변환에 의한 순차비교방식으로 하기 위해 1개의 입력포트를 사용하여 각 검사신호가 샘플/홀드의 제어에 의해 아날로그신호가 입력된다.First, the measuring board (2) interrupts the signal to the relay that controls the DC constant voltage, constant current, and AC constant voltage of each measurement part, and short-circuits (SHORT / OPEN) according to the inspection object to classify it into resistance capacitor, coil, diode, and transistor inspection. In order to protect the computer 5, the buffer inserted between the equipment and the computer 5 is used as an address, data, and control signal bus, and the mode is set to 0, and the input port is used for the rest. Since the PPI is used for data parallel transmission in the output circuit design, the computer 5 only recognizes the digital signal and the analog signal must be converted into the digital signal in order for the computer 5 to recognize and process the analog signal. In order to achieve the sequential comparison method by digital conversion, each test signal is controlled by the sample / hold control using one input port. The analog signal is input.
따라서 컴퓨터(5)에서 변환종료신호를 검사하여 하이(HIGH)상태이면 변환이 종료되었음을 알리고 출력기능단에 “하이”신호를 주어 디지탈출력단자를 통해 변화결과를 데이타버퍼를 통해 컴퓨터(5)로 전달하고 컴퓨터(5)는 이를 처리하여 필요한 정보 즉 검사결과치를 얻는다.Therefore, when the conversion completion signal is checked by the computer 5 and the HIGH state, it informs that the conversion is completed and gives a "high" signal to the output function terminal, and transmits the result of the change through the data buffer to the computer 5 through the digital output terminal. The computer 5 processes this to obtain necessary information, that is, inspection result value.
상기와 같은 작용으로 인해 검사결과치가 다중교환장치(3)(4)를 통해 동일 종류의 부품이 다수 장착되어 이를 전기적으로 적절히 선택하기 위한 검사장치이며 많은 릴레이의 단속이 적정시간에 이루어지므로 원하는 검사결과를 얻을 수 있어 가격이 저렴하고 신뢰성 및 기기 제작이 쉽고 배가되도록 한 유용한 고안이다.Due to the above-mentioned action, the inspection result is the inspection device for selecting the appropriate parts electrically by mounting a large number of parts of the same type through the multi-exchange device (3) and (4). The result is a useful design that is inexpensive, reliable, and easy and doubles in machine construction.
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR92024476U KR950003122Y1 (en) | 1992-12-05 | 1992-12-05 | In-circuit tster system apparatus |
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KR92024476U KR950003122Y1 (en) | 1992-12-05 | 1992-12-05 | In-circuit tster system apparatus |
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KR940018697U KR940018697U (en) | 1994-07-30 |
KR950003122Y1 true KR950003122Y1 (en) | 1995-04-21 |
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KR92024476U KR950003122Y1 (en) | 1992-12-05 | 1992-12-05 | In-circuit tster system apparatus |
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KR100401542B1 (en) * | 1996-07-27 | 2004-01-28 | 삼성탈레스 주식회사 | Apparatus for testing pcb |
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