KR940012499A - How to Form Contact Holes - Google Patents

How to Form Contact Holes Download PDF

Info

Publication number
KR940012499A
KR940012499A KR1019920021278A KR920021278A KR940012499A KR 940012499 A KR940012499 A KR 940012499A KR 1019920021278 A KR1019920021278 A KR 1019920021278A KR 920021278 A KR920021278 A KR 920021278A KR 940012499 A KR940012499 A KR 940012499A
Authority
KR
South Korea
Prior art keywords
contact hole
forming
insulating layer
photoresist pattern
etch
Prior art date
Application number
KR1019920021278A
Other languages
Korean (ko)
Inventor
신철호
신찬수
김상용
안용국
Original Assignee
김주용
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김주용, 현대전자산업 주식회사 filed Critical 김주용
Priority to KR1019920021278A priority Critical patent/KR940012499A/en
Publication of KR940012499A publication Critical patent/KR940012499A/en

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

본 발명은 고집적 반도체 소자의 콘택홀 형성 방법에 관한 것으로, 소자가 고집적화됨에 따라 콘택홀의 에스펙트비가 증가하여 금속 스텝 커버리지가 저하되는 것을 방지하기 위헤 웬에치 및 드라이 에치를 반복 실시하여 2단계로 라운드된 측벽을 갖는 콘택홀을 형성하는 기술이다.The present invention relates to a method for forming a contact hole of a highly integrated semiconductor device, and in order to prevent the metal step coverage from deteriorating due to an increase in the aspect ratio of the contact hole as the device is integrated, in two steps, the process is repeated. It is a technique of forming a contact hole having a rounded sidewall.

Description

콘택홀 형성방법How to Form Contact Holes

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제2A도 내지 제2D도는 본 발명에 의해 콘택홀을 형성하는 상태를 도시한 단면도.2A to 2D are sectional views showing a state of forming a contact hole according to the present invention.

Claims (4)

콘택홀 형성 방법에 있어서, 하층 도전층 상부에 절연층을 형성하고, 절연층 상부에 콘택홀용 제1감광막 패턴을 형성하고, 1차 웬에치와 1차 드라이에치로 절연층의 소정 두께를 순차적으로 소정 두께식 식각하여 상부가 라운드된 홈을 형성하는 단계와, 상기 제1 감광막 패턴을 제거한 다음, 다시 상기 절연층 상부에 콘택홀용 제2감광막 패턴을 형성하는 단계와, 상기 제2감광막 패턴을 마스크로 이용하여 2차 웬에치와 2차 드라이에치로 노출되는 절연층을 각각 소정 두께 식각하여 하부 도전층이 노출된 콘택홀을 형성하되 2단계로 라운드된 측벽을 갖는 콘택홀로 형성하는 단계를 포함하는 것을 특징으로 하는 콘택홀 형성방법.In the contact hole forming method, an insulating layer is formed on the lower conductive layer, a first photoresist pattern for the contact hole is formed on the insulating layer, and a predetermined thickness of the insulating layer is sequentially formed by the first ween etch and the first dry etch. Forming a groove having a rounded upper portion by etching a predetermined thickness, removing the first photoresist pattern, and again forming a second photoresist pattern for a contact hole on the insulating layer, and forming the second photoresist pattern Etching the insulating layers exposed by the secondary wench and the secondary dry etch using a mask to a predetermined thickness, respectively, to form a contact hole having the lower conductive layer exposed thereto, and forming a contact hole having a sidewall rounded in two steps. Contact hole forming method comprising a. 제1항에 있어서, 상기 콘택홀을 형성한 다음, 열처리 공정을 실시하여 콘택홀의 측벽이 완만하게 라운드되도록 하는 것을 특징으로 하는 콘택홀 형성방법.The method of claim 1, wherein after forming the contact hole, a heat treatment process is performed to smoothly round the sidewalls of the contact hole. 콘택홀을 제조하는 방법에 있어서, 하부 도전층 상부에 절연층을 형성하고 절연층 상부에 콘택홀용 제1감광막 패턴을 형성하고, 제1차 웬에치 및 제1차 드라이에치로 절연층의 소정 두께를 순차적으로 식각하여 홈을 형성하는 단계와, 2차 웬에치와 2차 드라이에치로 절연층의 소정 두께를 순차적으로 식각하여 하부 도전층이 노출된 콘택홀을 형성하되, 2단계로 라운드된 콘택홀을 형성하는 단계를 포함하는 콘택홀 형성 방법.In the method for manufacturing a contact hole, an insulating layer is formed on the lower conductive layer, a first photoresist pattern for the contact hole is formed on the insulating layer, and the first wen etch and the first dry etch are used to define the insulating layer. Etching the thickness sequentially to form a groove, and sequentially etching a predetermined thickness of the insulating layer using a secondary ween etch and a secondary dry etch to form a contact hole exposing the lower conductive layer, and rounding in two steps Forming a contact hole comprising the step of forming a contact hole. 제3항에 있어서, 상기 콘택홀을 형성하는 단계후에 열처리 공정을 실시하여 콘택홀이 측벽이 완만하게 라운드되도록 하는 것을 특징으로 하는 콘택홀 형성 방법.The method of claim 3, wherein after the forming of the contact hole, a heat treatment is performed to smoothly round the sidewalls of the contact hole. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application. 제3항에 있어서, 상기 콘택홀을 형성하는 단계후에 열처리 공정을 실시하여 콘택홀이 측벽이 완만하게 라운드 되도록 하는 것을 특징으로 하는 콘택홀 형성 방법.The method of claim 3, wherein after the forming of the contact hole, a heat treatment is performed to smoothly round the sidewalls of the contact hole. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019920021278A 1992-11-13 1992-11-13 How to Form Contact Holes KR940012499A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019920021278A KR940012499A (en) 1992-11-13 1992-11-13 How to Form Contact Holes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019920021278A KR940012499A (en) 1992-11-13 1992-11-13 How to Form Contact Holes

Publications (1)

Publication Number Publication Date
KR940012499A true KR940012499A (en) 1994-06-23

Family

ID=67210705

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920021278A KR940012499A (en) 1992-11-13 1992-11-13 How to Form Contact Holes

Country Status (1)

Country Link
KR (1) KR940012499A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100414949B1 (en) * 1996-12-28 2004-03-31 주식회사 하이닉스반도체 Method for forming contact hole of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100414949B1 (en) * 1996-12-28 2004-03-31 주식회사 하이닉스반도체 Method for forming contact hole of semiconductor device

Similar Documents

Publication Publication Date Title
KR940012499A (en) How to Form Contact Holes
KR960026804A (en) Stack capacitor manufacturing method of semiconductor device
KR960015741A (en) Contact hole formation method of semiconductor device
KR960005791A (en) Contact hole formation method of semiconductor device
KR970030678A (en) Method of manufacturing capacitors in semiconductor devices
KR970054008A (en) Capacitor Manufacturing Method of Semiconductor Device
KR960042958A (en) Contact hole formation method of semiconductor device
KR970053571A (en) Semiconductor device and manufacturing method thereof
KR940012572A (en) Contact Forming Method in Semiconductor Device
KR960026741A (en) Capacitor Manufacturing Method of Semiconductor Device
KR960012324A (en) Gate electrode contact of semiconductor device and manufacturing method thereof
KR950015587A (en) Contact hole formation method of semiconductor device
KR970052248A (en) Contact hole formation method of semiconductor device
KR960026793A (en) Capacitor Manufacturing Method of Semiconductor Device
KR960002565A (en) How to Form Contact Holes
KR960026270A (en) How to Form Contact Holes
KR980005466A (en) Metal wiring formation method of semiconductor device
KR960005793A (en) Mask rom and method of making the same.
KR970052761A (en) Pattern formation method of semiconductor device
KR970052385A (en) Method for forming contact hole in semiconductor device
KR970051992A (en) Manufacturing method of semiconductor device
KR960026164A (en) Method for manufacturing storage electrode of semiconductor device
KR940004836A (en) Contact hole formation method of semiconductor device
KR980005475A (en) Via contact hole formation method of semiconductor device
KR970018496A (en) Method for forming storage electrode of semiconductor device

Legal Events

Date Code Title Description
WITN Withdrawal due to no request for examination