KR860002139A - 반도체 봉합용 에폭시수지조성물과 그것을 이용한 수지 봉합형 반도체장치 - Google Patents

반도체 봉합용 에폭시수지조성물과 그것을 이용한 수지 봉합형 반도체장치 Download PDF

Info

Publication number
KR860002139A
KR860002139A KR1019850004418A KR850004418A KR860002139A KR 860002139 A KR860002139 A KR 860002139A KR 1019850004418 A KR1019850004418 A KR 1019850004418A KR 850004418 A KR850004418 A KR 850004418A KR 860002139 A KR860002139 A KR 860002139A
Authority
KR
South Korea
Prior art keywords
epoxy resin
curing agent
antimony
weight
resin
Prior art date
Application number
KR1019850004418A
Other languages
English (en)
Other versions
KR900000376B1 (ko
Inventor
히로또시 이께야 (외 1)
Original Assignee
사바 쇼오이찌
가부시끼 가이샤 도오시바
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 사바 쇼오이찌, 가부시끼 가이샤 도오시바 filed Critical 사바 쇼오이찌
Publication of KR860002139A publication Critical patent/KR860002139A/ko
Application granted granted Critical
Publication of KR900000376B1 publication Critical patent/KR900000376B1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • H01L23/295Organic, e.g. plastic containing a filler
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • C08G59/62Alcohols or phenols
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301Thyristor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/23Sheet including cover or casing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/23Sheet including cover or casing
    • Y10T428/239Complete cover or casing

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Epoxy Resins (AREA)
  • Compositions Of Macromolecular Compounds (AREA)

Abstract

내용 없음

Description

반도체 봉합용 에폭시수지조성물과 그것을 이용한 수지봉합형 반도체장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 수지봉합형 반도체장치의 단면도.
*도면의 주요부분에 대한 부호의 설명
1 : 반도체 2 : 베드(bed)
3 : 결속 와이어(wire) 4 : 리이드 핀(lead pin)
5 : 수지봉합체

Claims (10)

  1. 에폭시수지 및 페놀성 수산기를 갖는 경화제와 경화촉진제를 함유한 반도체봉합용 에폭시수지조성물에 있어서, (가) 에폭시수지가 90 내지 30중량%이고, (나) 1분자중에 적어도 2개이상의 페놀성수산기를 함유하는 경화제 10 내지 70중량%이고, (다) 유기포스핀화합물 0.01 내지 20중량%이며, (라) 4-산화 2-안티몬, 13-산화 6-안티몬 및 5-산화 2-안티몬중에서 선택되는 적어도 하나의 산화안티몬 0.1내지 30중량%로 이루어진 것을 특징으로 하는 반도체봉합용 에폭시수지조성물.
  2. 제1항에 있어서, 에폭시수지는 에폭시당량이 170 내지 300정도인 노블락형 에폭시수지로된 것을 특징으로 하는 조성물.
  3. 제1항에 있어서, 경화제는 노블락형 페놀수지로된 것을 특징으로 하는 조성물.
  4. 제1항에 있어서, 경화제는 할로겐 화합물을 포함하는 것을 특징으로 하는 조성물.
  5. 제1항에 있어서, 경화제는 용융실리카 또는 결정성실리카를 포함하고 있는 것을 특징으로 하는 조성물.
  6. 반도체소자와 이를 봉합하는 에폭시수지 및 페놀성수산기를 갖는 경화제 및 경화촉진제를 함유하는 반도체봉합용 에폭시수지조성물인 수지봉합체를 구비한 수지봉합형 반도체장치에 있어서, 이 수지봉합체가, (가) 에폭시수지 90 내지 30중량%, (나) 1분자중에 적어도 2개이상의 페놀성수산기를 함유하는 경화제 10 내지 70중량%, (다) 유기포스핀화합물 0.01 내지 20중량%, (라) 4-산화 2-안티몬, 13-산화 6-안티몬 및 5-산화 2-안티몬중에서 선택되는 적어도 하나이상의 산화안티몬 0.1내지 30중량%로 이루어진 반도체봉합용 에폭시수지조성물의 경화물을 사용한 것을 특징으로 하는 수지봉합형 반도체장치.
  7. 제6항에 있어서, 에폭시수지는 에폭시당량이 170 내지 300정도인 노블락형 에폭시수지인 것을 사용한 것을 특징으로 하는 장치.
  8. 제6항에 있어서, 경화제는 노블락형 수지를 사용하는 것을 특징으로 하는 장치.
  9. 제6항에 있어서, 경화제는 할로겐화합물을 포함하고 있는 것을 사용한 것을 특징으로 하는 장치.
  10. 제6항에 있어서, 경화제는 용융실리카 또는 결정성실리카를 포함하는 것을 사용한 것을 특징으로 하는 장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850004418A 1984-08-23 1985-06-21 반도체 봉합용 에폭시수지조성물과 그것을 이용한 수지봉합형 반도체장치 KR900000376B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP174148 1984-08-23
JP59-174148 1984-08-23
JP59174148A JPS6153321A (ja) 1984-08-23 1984-08-23 半導体封止用エポキシ樹脂組成物及びそれを用いた樹脂封止型半導体装置

Publications (2)

Publication Number Publication Date
KR860002139A true KR860002139A (ko) 1986-03-26
KR900000376B1 KR900000376B1 (ko) 1990-01-25

Family

ID=15973511

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850004418A KR900000376B1 (ko) 1984-08-23 1985-06-21 반도체 봉합용 에폭시수지조성물과 그것을 이용한 수지봉합형 반도체장치

Country Status (5)

Country Link
US (1) US4710796A (ko)
EP (1) EP0172324B1 (ko)
JP (1) JPS6153321A (ko)
KR (1) KR900000376B1 (ko)
DE (1) DE3582535D1 (ko)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3675321D1 (de) * 1985-08-16 1990-12-06 Dai Ichi Seiko Co Ltd Halbleiteranordnung mit packung vom steckerstifttyp.
JPS62212422A (ja) * 1986-03-14 1987-09-18 Matsushita Electric Works Ltd エポキシ樹脂組成物
JPS62217645A (ja) * 1986-03-19 1987-09-25 Fujitsu Ltd 半導体装置の製造方法
JPH0684422B2 (ja) * 1986-05-20 1994-10-26 住友化学工業株式会社 電子部品の封止材
JP2514981B2 (ja) * 1987-05-28 1996-07-10 日東電工株式会社 半導体装置
JPH0648710B2 (ja) * 1987-08-03 1994-06-22 株式会社日立製作所 樹脂封止型半導体装置
JP2684677B2 (ja) * 1988-05-25 1997-12-03 株式会社日立製作所 半導体装置の製造方法
US5192995A (en) * 1988-08-26 1993-03-09 Semiconductor Energy Laboratory Co., Ltd. Electric device utilizing antioxidation film between base pad for semiconductor chip and organic encapsulating material
US5154976A (en) * 1988-10-17 1992-10-13 Dexter Corporation Flame retardant epoxy molding compound, method and encapsulated device
US5041254A (en) * 1988-10-17 1991-08-20 Dexter Corporation Method of encapsulating a semiconductor device with a flame retardant epoxy molding compound
US5413861A (en) * 1988-10-17 1995-05-09 Dextor Corporation Semiconductor device encapsulated with a flame retardant epoxy molding compound
US5104604A (en) * 1989-10-05 1992-04-14 Dexter Electronic Materials Div. Of Dexter Corp. Flame retardant epoxy molding compound, method and encapsulated device method of encapsulating a semiconductor device with a flame retardant epoxy molding compound
US5476716A (en) * 1988-10-17 1995-12-19 The Dexter Corporation Flame retardant epoxy molding compound, method and encapsulated device
JPH07119275B2 (ja) * 1988-11-17 1995-12-20 サンスター技研株式会社 二液型エポキシ樹脂組成物
US5194930A (en) * 1991-09-16 1993-03-16 International Business Machines Dielectric composition and solder interconnection structure for its use
JPH06196603A (ja) * 1992-12-23 1994-07-15 Shinko Electric Ind Co Ltd リードフレームの製造方法
JP3121020B2 (ja) * 1995-03-07 2000-12-25 日東電工株式会社 半導体装置の製法およびそれに用いる封止用ペレット
US6099783A (en) * 1995-06-06 2000-08-08 Board Of Trustees Operating Michigan State University Photopolymerizable compositions for encapsulating microelectronic devices
US6297332B1 (en) * 1998-04-28 2001-10-02 Mitsui Chemicals, Inc. Epoxy-resin composition and use thereof
JP3926141B2 (ja) * 2000-12-27 2007-06-06 日本特殊陶業株式会社 配線基板
WO2002090434A1 (en) 2001-04-23 2002-11-14 Sumitomo Bakelite Company Limited Epoxy resin composition and semiconductor device
US7163973B2 (en) * 2002-08-08 2007-01-16 Henkel Corporation Composition of bulk filler and epoxy-clay nanocomposite

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4248920A (en) * 1978-04-26 1981-02-03 Tokyo Shibaura Denki Kabushiki Kaisha Resin-sealed semiconductor device
US4282136A (en) * 1979-04-09 1981-08-04 Hunt Earl R Flame retardant epoxy molding compound method and encapsulated device
JPS56129245A (en) * 1980-03-14 1981-10-09 Mitsubishi Gas Chem Co Inc Flame-retardant epoxy resin composition
JPS5933125B2 (ja) * 1980-03-17 1984-08-14 信越化学工業株式会社 半導体装置封止用エポキシ樹脂組成物
DE3163054D1 (en) * 1980-06-05 1984-05-17 Toshiba Kk Resin encapsulation type semiconductor device
US4572853A (en) * 1980-06-05 1986-02-25 Tokyo Shibaura Denki Kabushiki Kaisha Resin encapsulation type semiconductor device
JPS5875854A (ja) * 1981-10-30 1983-05-07 Toshiba Corp 樹脂封止型半導体装置
JPS5896755A (ja) * 1981-12-03 1983-06-08 Toshiba Corp 樹脂封止型半導体装置
JPS5948943A (ja) * 1982-09-14 1984-03-21 Toshiba Corp 樹脂封止型半導体装置

Also Published As

Publication number Publication date
KR900000376B1 (ko) 1990-01-25
EP0172324A2 (en) 1986-02-26
EP0172324B1 (en) 1991-04-17
DE3582535D1 (de) 1991-05-23
US4710796A (en) 1987-12-01
EP0172324A3 (en) 1986-10-08
JPS6153321A (ja) 1986-03-17

Similar Documents

Publication Publication Date Title
KR860002139A (ko) 반도체 봉합용 에폭시수지조성물과 그것을 이용한 수지 봉합형 반도체장치
KR910016067A (ko) 반도체 장치의 봉지재
DE3578616D1 (de) Epoxydharzhaerter und diese enthaltende zusammensetzungen
DE3578523D1 (de) Epoxydharzzusammensetzung.
JPS56136816A (en) Epoxy resin composition
DE3568451D1 (en) Epoxy resin composition for encapsulation of semiconductor device
KR900009849A (ko) 반도체 밀봉용 에폭시 수지 조성물
DE68924521D1 (de) Epoxy-harzzusammensetzung zum abdichten von halbleiteranordnungen.
FR2429240A1 (fr) Composition a mouler siloxane/resine epoxy ayant une resistance amelioree a la fissuration
DE69032151D1 (de) Epoxydharzzusammensetzungen für die Versiegelung von Halbleitern
ATE146305T1 (de) Tropfenabdeckmassen für elektrische und elektronische bauelemente
JPS52112698A (en) Curable resin compositions
DE3681776D1 (de) Fuellstoff aus kieselerde und diesen enthaltende epoxidharzzusammensetzungen.
JPS649214A (en) Epoxy resin composition for sealing semiconductor
KR910016854A (ko) 반도체 봉지용 에폭시 수지 조성물
JPS5723625A (en) Epoxy resin composition and resin-sealed semiconductor device
ES524157A0 (es) Procedimiento para encapsular componentes electronicos
EP0294148A3 (en) Epoxy resin composition
JPS5721844A (en) Resin composition for sealing electronic parts
KR940011518A (ko) 에폭시수지조성물 및 수지봉지형 반도체장치
JPS53299A (en) Epoxy resin composition
JPS52135673A (en) Resin composition for semiconductor sealing
TW430685B (en) Epoxy resin liquid composition for semiconductor encapsulation
KR960017774A (ko) 반도체 소자 밀봉용 에폭시 수지 조성물
JPS57184241A (en) Resin sealing type semiconductor device

Legal Events

Date Code Title Description
A201 Request for examination
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 19930111

Year of fee payment: 4

LAPS Lapse due to unpaid annual fee