KR20210057698A - 3차원 계측 장치 및 3차원 계측 방법 - Google Patents
3차원 계측 장치 및 3차원 계측 방법 Download PDFInfo
- Publication number
- KR20210057698A KR20210057698A KR1020200151162A KR20200151162A KR20210057698A KR 20210057698 A KR20210057698 A KR 20210057698A KR 1020200151162 A KR1020200151162 A KR 1020200151162A KR 20200151162 A KR20200151162 A KR 20200151162A KR 20210057698 A KR20210057698 A KR 20210057698A
- Authority
- KR
- South Korea
- Prior art keywords
- imaging
- image data
- pattern
- dimensional shape
- imaging device
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2019-204927 | 2019-11-12 | ||
JP2019204927A JP2021076531A (ja) | 2019-11-12 | 2019-11-12 | 3次元計測装置及び3次元計測方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20210057698A true KR20210057698A (ko) | 2021-05-21 |
Family
ID=75898459
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020200151162A KR20210057698A (ko) | 2019-11-12 | 2020-11-12 | 3차원 계측 장치 및 3차원 계측 방법 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2021076531A (ja) |
KR (1) | KR20210057698A (ja) |
CN (1) | CN112857259A (ja) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003202296A (ja) | 2002-01-07 | 2003-07-18 | Canon Inc | 画像入力装置、三次元測定装置および三次元画像処理システム |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010276607A (ja) * | 2009-05-27 | 2010-12-09 | Koh Young Technology Inc | 3次元形状測定装置および測定方法 |
JP5728699B2 (ja) * | 2010-03-01 | 2015-06-03 | 学校法人福岡工業大学 | 表面検査装置、表面検査方法および表面検査プログラム |
JP5818341B2 (ja) * | 2010-12-13 | 2015-11-18 | 国立大学法人 和歌山大学 | 形状計測装置および形状計測方法 |
JP5709009B2 (ja) * | 2011-11-17 | 2015-04-30 | Ckd株式会社 | 三次元計測装置 |
JP6320051B2 (ja) * | 2014-01-17 | 2018-05-09 | キヤノン株式会社 | 三次元形状計測装置、三次元形状計測方法 |
JP6357949B2 (ja) * | 2014-07-29 | 2018-07-18 | セイコーエプソン株式会社 | 制御システム、ロボットシステム、及び制御方法 |
KR101659302B1 (ko) * | 2015-04-10 | 2016-09-23 | 주식회사 고영테크놀러지 | 3차원 형상 측정장치 |
JP6823985B2 (ja) * | 2016-09-28 | 2021-02-03 | Juki株式会社 | 3次元形状計測方法及び3次元形状計測装置 |
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2019
- 2019-11-12 JP JP2019204927A patent/JP2021076531A/ja active Pending
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2020
- 2020-11-12 CN CN202011259614.3A patent/CN112857259A/zh active Pending
- 2020-11-12 KR KR1020200151162A patent/KR20210057698A/ko active Search and Examination
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003202296A (ja) | 2002-01-07 | 2003-07-18 | Canon Inc | 画像入力装置、三次元測定装置および三次元画像処理システム |
Also Published As
Publication number | Publication date |
---|---|
CN112857259A (zh) | 2021-05-28 |
JP2021076531A (ja) | 2021-05-20 |
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