KR20020057032A - 박막트랜지스터 액정표시장치의 제조방법 - Google Patents
박막트랜지스터 액정표시장치의 제조방법 Download PDFInfo
- Publication number
- KR20020057032A KR20020057032A KR1020000087264A KR20000087264A KR20020057032A KR 20020057032 A KR20020057032 A KR 20020057032A KR 1020000087264 A KR1020000087264 A KR 1020000087264A KR 20000087264 A KR20000087264 A KR 20000087264A KR 20020057032 A KR20020057032 A KR 20020057032A
- Authority
- KR
- South Korea
- Prior art keywords
- thin film
- film transistor
- data electrode
- mask
- mask process
- Prior art date
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- 238000000034 method Methods 0.000 title claims abstract description 79
- 239000010409 thin film Substances 0.000 title claims abstract description 41
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 18
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 18
- 229910052751 metal Inorganic materials 0.000 claims abstract description 21
- 239000002184 metal Substances 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 21
- 238000002161 passivation Methods 0.000 claims abstract description 16
- 239000010408 film Substances 0.000 claims description 39
- 230000001681 protective effect Effects 0.000 claims description 12
- 238000000059 patterning Methods 0.000 claims description 8
- 238000005530 etching Methods 0.000 claims description 5
- 150000004767 nitrides Chemical class 0.000 claims description 3
- 238000005229 chemical vapour deposition Methods 0.000 claims description 2
- 238000004544 sputter deposition Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 28
- 238000000151 deposition Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- 239000002131 composite material Substances 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000009832 plasma treatment Methods 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005984 hydrogenation reaction Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/13439—Electrodes characterised by their electrical, optical, physical properties; materials therefor; method of making
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136231—Active matrix addressed cells for reducing the number of lithographic steps
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (6)
- 절연기판 상부에 금속막을 형성하고, 제 1 마스크 공정으로 상기 금속막을 패터닝하여 게이트 전극을 형성하는 단계;상기 게이트 전극이 형성된 절연기판 상부에 게이트 절연막, 액티브층 및 데이터 전극을 순차적으로 형성하고, 제 2 마스크 공정으로 상기 데이터 전극 및 액티브층을 패터닝하는 단계;상기 데이터 전극을 포함하여 게이트 절연막 전면상에 보호막을 형성하고, 제 3 마스크 공정으로 상기 보호막을 식각하여, 상기 데이터전극의 박막트랜지스터 채널부 예정영역 및 화소전극과 데이터 전극을 노출시키는 콘택홀을 형성하는 단계;상기 콘택홀을 포함한 보호막상에 화소전극용 금속막을 형성한 후, 제 4 마스크 공정으로 상기 화소전극용 금속막을 선택적으로 패터닝하는 단계;상기 데이터 전극 및 액티브층을 선택적으로 식각하여 박막트랜지스터 채널부를 형성하는 단계; 및상기 전체구조의 상면에 상기 박막트랜지스터 채널부 보호막을 형성하는 단계를 포함하여 구성되는 것을 특징으로 하는 박막트랜지스터 액정표시장치의 제조방법.
- 제 1 항에 있어서,상기 제 1 내지 제 4 마스크 공정은 노르말톤 마스크로 수행하는 것을 특징으로 하는 박막트랜지스터 액정표시장치의 제조방법.
- 제 1 항에 있어서,상기 제 2 마스크 공정은 상기 데이터 전극 및 액티브층을 단일의 마스크 공정으로 수행하는 것을 특징으로 하는 박막트랜지스터 액정표시장치의 제조방법.
- 제 1 항에 있어서,상기 제 4 마스크 공정은 상기 화소전극용 금속막, 데이터 전극 및 액티브층의 소정부분을 단일의 마스크 공정으로 연속하여 식각하는 것을 특징으로 하는 박막트랜지스터 액정표시장치의 제조방법.
- 제 1 항에 있어서,상기 박막트랜지스터의 채널부 보호막 형성방법은 플라즈마 처리공정으로 수행되거나, 또는 스퍼터링 또는 화학기상증착 방법으로 수행되는 것을 특징으로 하는 박막트랜지스터 액정표시장치의 제조방법.
- 제 5 항에 있어서,상기 박막트랜지스터의 채널부 보호막은 산화막 또는 질화막을 포함하여 구성되는 것을 특징으로 하는 박막트랜지스터 액정표시장치의 제조방법.
Priority Applications (1)
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KR1020000087264A KR100705616B1 (ko) | 2000-12-30 | 2000-12-30 | 박막트랜지스터 액정표시장치의 제조방법 |
Applications Claiming Priority (1)
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KR1020000087264A KR100705616B1 (ko) | 2000-12-30 | 2000-12-30 | 박막트랜지스터 액정표시장치의 제조방법 |
Publications (2)
Publication Number | Publication Date |
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KR20020057032A true KR20020057032A (ko) | 2002-07-11 |
KR100705616B1 KR100705616B1 (ko) | 2007-04-11 |
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KR1020000087264A KR100705616B1 (ko) | 2000-12-30 | 2000-12-30 | 박막트랜지스터 액정표시장치의 제조방법 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7342631B2 (en) | 2003-06-27 | 2008-03-11 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device and method of fabricating the same |
US7459323B2 (en) | 2003-08-28 | 2008-12-02 | Samsung Electronics Co., Ltd. | Method of manufacturing a thin film transistor array panel |
KR100920483B1 (ko) * | 2007-07-20 | 2009-10-08 | 엘지디스플레이 주식회사 | 액정표시장치용 어레이 기판 및 그 제조방법 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101051586B1 (ko) * | 2009-06-11 | 2011-07-22 | 한양대학교 산학협력단 | 2개의 포토 마스크를 이용한 박막 트랜지스터의 제조 방법 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2873119B2 (ja) * | 1991-10-23 | 1999-03-24 | 京セラ株式会社 | アクティブマトリックス基板の製造方法 |
JP2530990B2 (ja) * | 1992-10-15 | 1996-09-04 | 富士通株式会社 | 薄膜トランジスタ・マトリクスの製造方法 |
DE4339721C1 (de) * | 1993-11-22 | 1995-02-02 | Lueder Ernst | Verfahren zur Herstellung einer Matrix aus Dünnschichttransistoren |
KR100188107B1 (ko) * | 1995-10-30 | 1999-06-01 | 김광호 | 액정 표시 장치용 박막 트랜지스터 기판의 제조 방법 |
KR100502813B1 (ko) * | 1998-10-13 | 2005-12-01 | 삼성전자주식회사 | 박막트랜지스터의제조방법,박막트랜지스터기판및그제조방법 |
KR100321925B1 (ko) * | 1998-11-26 | 2002-10-25 | 삼성전자 주식회사 | 4장의마스크를이용한액정표시장치용박막트랜지스터기판의제조방법및액정표시장치용박막트랜지스터기판 |
KR100348995B1 (ko) * | 1999-09-08 | 2002-08-17 | 엘지.필립스 엘시디 주식회사 | 4 마스크를 이용한 액정표시소자의 제조방법 및 그에 따른 액정표시소자 |
-
2000
- 2000-12-30 KR KR1020000087264A patent/KR100705616B1/ko active IP Right Grant
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7342631B2 (en) | 2003-06-27 | 2008-03-11 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device and method of fabricating the same |
US7567311B2 (en) | 2003-06-27 | 2009-07-28 | Lg Display Co., Ltd. | Liquid crystal display device |
US7459323B2 (en) | 2003-08-28 | 2008-12-02 | Samsung Electronics Co., Ltd. | Method of manufacturing a thin film transistor array panel |
KR100920483B1 (ko) * | 2007-07-20 | 2009-10-08 | 엘지디스플레이 주식회사 | 액정표시장치용 어레이 기판 및 그 제조방법 |
US8045078B2 (en) | 2007-07-20 | 2011-10-25 | Lg Display Co., Ltd. | Array substrate for liquid crystal display device and method of fabricating the same |
Also Published As
Publication number | Publication date |
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KR100705616B1 (ko) | 2007-04-11 |
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