KR100771345B1 - 압전 박막 공진자 및 필터 - Google Patents
압전 박막 공진자 및 필터 Download PDFInfo
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- KR100771345B1 KR100771345B1 KR20060041026A KR20060041026A KR100771345B1 KR 100771345 B1 KR100771345 B1 KR 100771345B1 KR 20060041026 A KR20060041026 A KR 20060041026A KR 20060041026 A KR20060041026 A KR 20060041026A KR 100771345 B1 KR100771345 B1 KR 100771345B1
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- film
- lower electrode
- piezoelectric
- upper electrode
- thin film
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- 239000010409 thin film Substances 0.000 title claims abstract description 93
- 239000010408 film Substances 0.000 claims abstract description 137
- 239000000758 substrate Substances 0.000 claims abstract description 24
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 9
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 9
- 229910052707 ruthenium Inorganic materials 0.000 claims description 9
- 239000010949 copper Substances 0.000 claims description 7
- 239000010931 gold Substances 0.000 claims description 7
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 6
- 239000010948 rhodium Substances 0.000 claims description 6
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 5
- 229910052750 molybdenum Inorganic materials 0.000 claims description 5
- 239000011733 molybdenum Substances 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical group Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 229910052741 iridium Inorganic materials 0.000 claims description 3
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- 229910052702 rhenium Inorganic materials 0.000 claims description 3
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 claims description 3
- 229910052703 rhodium Inorganic materials 0.000 claims description 3
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 229910052715 tantalum Inorganic materials 0.000 claims description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 3
- 239000011787 zinc oxide Substances 0.000 claims description 2
- 230000008878 coupling Effects 0.000 abstract description 47
- 238000010168 coupling process Methods 0.000 abstract description 47
- 238000005859 coupling reaction Methods 0.000 abstract description 47
- 238000000034 method Methods 0.000 abstract description 6
- 230000000593 degrading effect Effects 0.000 abstract description 3
- 239000000463 material Substances 0.000 description 12
- 238000005530 etching Methods 0.000 description 8
- 238000003780 insertion Methods 0.000 description 8
- 230000037431 insertion Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000007687 exposure technique Methods 0.000 description 4
- 239000012528 membrane Substances 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- 230000002542 deteriorative effect Effects 0.000 description 3
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000003014 reinforcing effect Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- NKZSPGSOXYXWQA-UHFFFAOYSA-N dioxido(oxo)titanium;lead(2+) Chemical compound [Pb+2].[O-][Ti]([O-])=O NKZSPGSOXYXWQA-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000010897 surface acoustic wave method Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/24—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezoelectric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/564—Monolithic crystal filters implemented with thin-film techniques
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/13—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials
- H03H9/131—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials consisting of a multilayered structure
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/13—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials
- H03H9/132—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials characterized by a particular shape
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/174—Membranes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezoelectric or electrostrictive material
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezoelectric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/566—Electric coupling means therefor
- H03H9/568—Electric coupling means therefor consisting of a ladder configuration
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
Claims (9)
- 삭제
- 삭제
- 기판 위에 형성된 하부 전극과,그 하부 전극 위에 형성된 압전막과,그 압전막 위에 형성된 상부 전극을 구비하고,상기 상부 전극의 막 두께는 상기 하부 전극의 막 두께보다 두꺼우며,상기 상부 전극 및 상기 하부 전극은, 루테늄(Ru)을 주로 포함하고,상기 상부 전극과 상기 하부 전극의 막 두께의 합을 d1, 상기 압전막의 막 두께를 d2로 하였을 때,0.1<d1/d2<1인 것을 특징으로 하는 압전 박막 공진자.
- 기판 위에 형성된 하부 전극과,그 하부 전극 위에 형성된 압전막과,그 압전막 위에 형성된 상부 전극을 구비하고,상기 상부 전극의 막 두께는 상기 하부 전극의 막 두께보다 두꺼우며,상기 상부 전극 및 상기 하부 전극은, 이리듐(Ir), 레늄(Re), 텅스텐(W), Ru(루테늄), 로듐(Rh), 백금(Pt), 탄탈(Ta), 몰리브덴(Mo), 은(Ag), 구리(Cu), 금(Au) 및 알루미늄(Al) 중 적어도 1개를 주로 포함하는 것을 특징으로 하는 압전 박막 공진자.
- 기판 위에 형성된 하부 전극과,그 하부 전극 위에 형성된 압전막과,그 압전막 위에 형성된 상부 전극을 구비하고,상기 상부 전극의 막 두께는 상기 하부 전극의 막 두께보다 두꺼우며,상기 하부 전극 아래에는 박막층을 갖고, 상기 상부 전극 위에는 박막층을 갖지 않는 것을 특징으로 하는 압전 박막 공진자.
- 기판 위에 형성된 하부 전극과,그 하부 전극 위에 형성된 압전막과,그 압전막 위에 형성된 상부 전극을 구비하고,상기 상부 전극의 막 두께는 상기 하부 전극의 막 두께보다 두꺼우며,상기 하부 전극 아래 및 상기 상부 전극 위 중 적어도 한쪽에 박막층을 갖는 것을 특징으로 하는 압전 박막 공진자.
- 기판 위에 형성된 하부 전극과,그 하부 전극 위에 형성된 압전막과,그 압전막 위에 형성된 상부 전극을 구비하고,상기 상부 전극의 막 두께는 상기 하부 전극의 막 두께보다 두꺼우며,상기 압전막은, (002) 방향을 주축으로 하는 배향성을 갖는 질화알루미늄 또는 산화아연인 것을 특징으로 하는 압전 박막 공진자.
- 기판 위에 형성된 하부 전극과,그 하부 전극 위에 형성된 압전막과,그 압전막 위에 형성된 상부 전극을 구비하고,상기 상부 전극의 막 두께는 상기 하부 전극의 막 두께보다 두꺼우며,상기 압전막을 사이에 두고, 상기 상부 전극과 상기 하부 전극이 대향하는 영역이 타원 형상인 것을 특징으로 하는 압전 박막 공진자.
- 제3항 내지 제8항 중 어느 한 항의 압전 박막 공진자를 복수 구비하는 것을 특징으로 하는 필터.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005137877A JP4629492B2 (ja) | 2005-05-10 | 2005-05-10 | 圧電薄膜共振子およびフィルタ |
JPJP-P-2005-00137877 | 2005-05-10 |
Publications (2)
Publication Number | Publication Date |
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KR20060116712A KR20060116712A (ko) | 2006-11-15 |
KR100771345B1 true KR100771345B1 (ko) | 2007-10-29 |
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Application Number | Title | Priority Date | Filing Date |
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KR20060041026A KR100771345B1 (ko) | 2005-05-10 | 2006-05-08 | 압전 박막 공진자 및 필터 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7579761B2 (ko) |
JP (1) | JP4629492B2 (ko) |
KR (1) | KR100771345B1 (ko) |
CN (1) | CN1862959B (ko) |
DE (1) | DE102006020992A1 (ko) |
Families Citing this family (17)
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JP2005073175A (ja) * | 2003-08-27 | 2005-03-17 | Fujitsu Media Device Kk | 圧電薄膜共振子及びその製造方法 |
US7737612B1 (en) * | 2005-05-25 | 2010-06-15 | Maxim Integrated Products, Inc. | BAW resonator bi-layer top electrode with zero etch undercut |
US7612488B1 (en) | 2007-01-16 | 2009-11-03 | Maxim Integrated Products, Inc. | Method to control BAW resonator top electrode edge during patterning |
JP4917481B2 (ja) * | 2007-06-13 | 2012-04-18 | 太陽誘電株式会社 | フィルタ |
WO2009066380A1 (ja) * | 2007-11-21 | 2009-05-28 | Fujitsu Limited | フィルタ、それを用いたデュプレクサおよびそのデュプレクサを用いた通信機 |
JP5220503B2 (ja) * | 2008-07-23 | 2013-06-26 | 太陽誘電株式会社 | 弾性波デバイス |
JP5322597B2 (ja) * | 2008-11-13 | 2013-10-23 | 太陽誘電株式会社 | 共振子、フィルタ、デュープレクサおよび電子装置 |
JP5709368B2 (ja) * | 2009-11-04 | 2015-04-30 | キヤノン株式会社 | 生体情報取得装置 |
JP5296113B2 (ja) * | 2010-02-25 | 2013-09-25 | 日本電波工業株式会社 | 圧電振動片の製造方法、圧電振動片及び圧電デバイス |
US8438924B2 (en) * | 2011-02-03 | 2013-05-14 | Inficon, Inc. | Method of determining multilayer thin film deposition on a piezoelectric crystal |
CN102545827B (zh) * | 2012-01-04 | 2015-09-09 | 华为技术有限公司 | 薄膜体声波谐振器、通信器件和射频模块 |
US9548438B2 (en) * | 2014-03-31 | 2017-01-17 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator comprising acoustic redistribution layers |
US9853626B2 (en) | 2014-03-31 | 2017-12-26 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator comprising acoustic redistribution layers and lateral features |
US9862592B2 (en) * | 2015-03-13 | 2018-01-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | MEMS transducer and method for manufacturing the same |
US10483943B2 (en) | 2017-06-27 | 2019-11-19 | Globalfoundries Inc. | Artificially oriented piezoelectric film for integrated filters |
WO2019028288A1 (en) * | 2017-08-03 | 2019-02-07 | Akoustis, Inc. | ELLIPTICAL STRUCTURE FOR VOLUME ACOUSTIC WAVE RESONATOR |
JP7491408B2 (ja) | 2020-12-11 | 2024-05-28 | 株式会社村田製作所 | 圧電振動子、圧電発振器、及び圧電振動子製造方法 |
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JP4550658B2 (ja) * | 2005-04-28 | 2010-09-22 | 富士通メディアデバイス株式会社 | 圧電薄膜共振器およびフィルタ |
JP4756461B2 (ja) * | 2005-10-12 | 2011-08-24 | 宇部興産株式会社 | 窒化アルミニウム薄膜およびそれを用いた圧電薄膜共振子 |
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2005
- 2005-05-10 JP JP2005137877A patent/JP4629492B2/ja active Active
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2006
- 2006-05-04 DE DE200610020992 patent/DE102006020992A1/de not_active Ceased
- 2006-05-08 KR KR20060041026A patent/KR100771345B1/ko active IP Right Grant
- 2006-05-09 US US11/430,184 patent/US7579761B2/en active Active
- 2006-05-10 CN CN2006100801804A patent/CN1862959B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020014808A1 (en) | 1998-01-16 | 2002-02-07 | Koichiro Misu | Thin film pietoelectric element |
JP2001211052A (ja) | 2000-01-26 | 2001-08-03 | Murata Mfg Co Ltd | 圧電共振子 |
JP2004120494A (ja) | 2002-09-27 | 2004-04-15 | Tdk Corp | 薄膜圧電共振子、それを用いたフィルタ及びデュプレクサ並びに薄膜圧電共振子の製造方法 |
KR20050034226A (ko) * | 2003-10-08 | 2005-04-14 | 황갑순 | 한 파장의 음파를 이용하는 fbar. |
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CN1862959A (zh) | 2006-11-15 |
DE102006020992A1 (de) | 2006-11-23 |
JP4629492B2 (ja) | 2011-02-09 |
CN1862959B (zh) | 2011-12-07 |
US7579761B2 (en) | 2009-08-25 |
US20060255693A1 (en) | 2006-11-16 |
KR20060116712A (ko) | 2006-11-15 |
JP2006319479A (ja) | 2006-11-24 |
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