JPWO2005071733A1 - Semiconductor device, power conversion device using the same, motor using the same, hybrid vehicle using the same, and motor drive system using the same - Google Patents
Semiconductor device, power conversion device using the same, motor using the same, hybrid vehicle using the same, and motor drive system using the same Download PDFInfo
- Publication number
- JPWO2005071733A1 JPWO2005071733A1 JP2005517178A JP2005517178A JPWO2005071733A1 JP WO2005071733 A1 JPWO2005071733 A1 JP WO2005071733A1 JP 2005517178 A JP2005517178 A JP 2005517178A JP 2005517178 A JP2005517178 A JP 2005517178A JP WO2005071733 A1 JPWO2005071733 A1 JP WO2005071733A1
- Authority
- JP
- Japan
- Prior art keywords
- power
- motor
- semiconductor device
- power semiconductor
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60K—ARRANGEMENT OR MOUNTING OF PROPULSION UNITS OR OF TRANSMISSIONS IN VEHICLES; ARRANGEMENT OR MOUNTING OF PLURAL DIVERSE PRIME-MOVERS IN VEHICLES; AUXILIARY DRIVES FOR VEHICLES; INSTRUMENTATION OR DASHBOARDS FOR VEHICLES; ARRANGEMENTS IN CONNECTION WITH COOLING, AIR INTAKE, GAS EXHAUST OR FUEL SUPPLY OF PROPULSION UNITS IN VEHICLES
- B60K6/00—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00
- B60K6/20—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00 the prime-movers consisting of electric motors and internal combustion engines, e.g. HEVs
- B60K6/22—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00 the prime-movers consisting of electric motors and internal combustion engines, e.g. HEVs characterised by apparatus, components or means specially adapted for HEVs
- B60K6/26—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00 the prime-movers consisting of electric motors and internal combustion engines, e.g. HEVs characterised by apparatus, components or means specially adapted for HEVs characterised by the motors or the generators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60K—ARRANGEMENT OR MOUNTING OF PROPULSION UNITS OR OF TRANSMISSIONS IN VEHICLES; ARRANGEMENT OR MOUNTING OF PLURAL DIVERSE PRIME-MOVERS IN VEHICLES; AUXILIARY DRIVES FOR VEHICLES; INSTRUMENTATION OR DASHBOARDS FOR VEHICLES; ARRANGEMENTS IN CONNECTION WITH COOLING, AIR INTAKE, GAS EXHAUST OR FUEL SUPPLY OF PROPULSION UNITS IN VEHICLES
- B60K6/00—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00
- B60K6/20—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00 the prime-movers consisting of electric motors and internal combustion engines, e.g. HEVs
- B60K6/42—Arrangement or mounting of plural diverse prime-movers for mutual or common propulsion, e.g. hybrid propulsion systems comprising electric motors and internal combustion engines ; Control systems therefor, i.e. systems controlling two or more prime movers, or controlling one of these prime movers and any of the transmission, drive or drive units Informative references: mechanical gearings with secondary electric drive F16H3/72; arrangements for handling mechanical energy structurally associated with the dynamo-electric machine H02K7/00; machines comprising structurally interrelated motor and generator parts H02K51/00; dynamo-electric machines not otherwise provided for in H02K see H02K99/00 the prime-movers consisting of electric motors and internal combustion engines, e.g. HEVs characterised by the architecture of the hybrid electric vehicle
- B60K6/48—Parallel type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/492—Bases or plates or solder therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L24/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05639—Silver [Ag] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05644—Gold [Au] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/37001—Core members of the connector
- H01L2224/37025—Plural core members
- H01L2224/3703—Stacked arrangements
- H01L2224/37033—Three-layer arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/4005—Shape
- H01L2224/4009—Loop shape
- H01L2224/40095—Kinked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/401—Disposition
- H01L2224/40151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/40221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/40225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48475—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball
- H01L2224/48476—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area
- H01L2224/48491—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being an additional member attached to the bonding area through an adhesive or solder, e.g. buffer pad
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49111—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73221—Strap and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
- H01L2224/84801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01028—Nickel [Ni]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01042—Molybdenum [Mo]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0105—Tin [Sn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01058—Cerium [Ce]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/62—Hybrid vehicles
Abstract
発電モータ(オルタネータ)に半導体装置を内蔵し、力行機能を付加する場合のように、エンジン近傍の高温環境に半導体装置が位置する場合において、高温環境に対する長期信頼性を向上できる半導体装置を提供することができる。半導体装置は、主電流の入出に上下2面の電極を用いるパワー半導体素子(13a)と、パワー半導体素子(12a)の下面電極を支持する絶縁基板(9)とを有する。線膨張率が8から12ppm/℃の範囲の導体板(15a)を用い、パワー半導体素子(13a)の上面電極と導体板(5a)を半田或いけ、金または銀のいずれかの材料を用いて接合した。Provided is a semiconductor device capable of improving long-term reliability against a high-temperature environment when the semiconductor device is located in a high-temperature environment near the engine as in a case where a power generation function is added by incorporating a semiconductor device in a generator motor (alternator). be able to. The semiconductor device includes a power semiconductor element (13a) that uses two upper and lower electrodes for input and output of a main current, and an insulating substrate (9) that supports the lower electrode of the power semiconductor element (12a). A conductor plate (15a) having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. is used, the upper electrode of the power semiconductor element (13a) and the conductor plate (5a) are soldered, or either gold or silver is used. And joined.
Description
本発明は、半導体装置、それを用いた電力変換装置,それを用いたモータ,それを用いたハイブリッド自動車及びそれを用いたモータ駆動システムに係り、特に、エンジンルーム等の高温環境下でも充分に性能を発揮できる半導体装置、それを用いた電力変換装置,それを用いたモータ,それを用いたハイブリッド自動車及びそれを用いたモータ駆動システムに関する。 The present invention relates to a semiconductor device, a power conversion device using the semiconductor device, a motor using the semiconductor device, a hybrid vehicle using the semiconductor device, and a motor driving system using the semiconductor device. The present invention relates to a semiconductor device capable of exhibiting performance, a power conversion device using the same, a motor using the same, a hybrid vehicle using the same, and a motor drive system using the same.
ハイブリッド電気自動車のように走行駆動力をエンジンと電気モータから取り出し、動力を併用して用いる自動車では、電気モータへ交流電力を供給する電力変換器が必要であることは広く知られている。
そして、この種電力変換器のパワー半導体モジュールの半導体チップとAIワイヤボンドとの熱膨張差により生ずるパワー半導体チップとワイヤボンドとの接合面の剥離を防止するため、例えば、特開2000−183249号公報に記載のように、低熱膨張材を貼り付けたブスバー配線をパワー半導体素子の上面電極に導電性樹脂を用いて接合することが知られている。It is well known that a power converter that supplies AC power to an electric motor is necessary in a vehicle that uses driving power extracted from an engine and an electric motor and uses the power together, such as a hybrid electric vehicle.
In order to prevent peeling of the joint surface between the power semiconductor chip and the wire bond caused by the difference in thermal expansion between the semiconductor chip of the power semiconductor module of this kind of power converter and the AI wire bond, for example, Japanese Patent Application Laid-Open No. 2000-183249. As described in the publication, it is known that a bus bar wiring with a low thermal expansion material attached thereto is joined to a top electrode of a power semiconductor element using a conductive resin.
ところで、燃費向上を目的に、信号待ち等の停車状態でエンジンを止め、発車時にエンジンを再始動させるモータを内蔵したアイドルストップ車(例えば、特開2003−113763号公報)の普及には、低コストで多種多様な車両への実装を容易にするアイドルストップシステムが必要である。
このようなアイドルストップ機能を、低コストでかつ容易に多種多様な車両に持たせる一方法として、殆どの車両に搭載されている発電モータ(オルタネータ)に半導体装置を内蔵し、力行機能を付加する方法が検討されている。このモータに内蔵する半導体装置の課題としては、1)モータに内蔵するための小型化と、2)モータが高発熱体であるエンジンの傍に配置されることから、半導体装置の高温環境に対する長期信頼性の向上の2点である。
長期信頼性に関して、特開2000−183249号公報に記載のものでは、エンジン近傍の高温環境を想定していないため、1)パワー半導体素子の温度が導電性樹脂材の硬化温度近傍まで上昇するため、硬化が進み、接合部がストレスに弱くなる。2)環境が高温であるため、発熱を減らしてパワー半導体素子の温度を抑制する必要があるが、導電性樹脂材の電気抵抗値が大きいと言う問題点がある。例えば、導電性樹脂材の体積抵抗率1Ω・cm(特開2000−183249号公報より)に対して、接合材として使用される鉛錫半田の体積抵抗率は約15μΩ・cmであり、導電性樹脂材の抵抗は鉛錫半田の抵抗の約7万倍と大きい。また、3)低熱膨張材を銅バスバー配線に貼り付けた構造では、その線膨張率の違いから、バスバー配線は低熱膨張材より高温で伸び、低温で縮むことになる。この現象は高温環境において顕著であり、特開2000−183249号公報に記載の構造では、バスバー配線が弓形に変形し、パワー半導体素子からブスバー配線を引き剥がす方向の力が、アイドルストップ車の運転、休止のサイクルによって、繰り返し発生することになる。そのため、前記接合部に剥離がより生じ易くなる。4)バスバー配線が弓形に変形するとそれに接続しているパワー半導体素子も弓形に変形する。パワー半導体素子と絶縁基板は、特開2000−183249号公報にあるように、はんだ等の塑性変形しやすい材料で接合しているため、パワー半導体素子と絶縁基板の接合部にも3)と同様の引き剥がす方向の力に生じさせることになる。
尚、ここでいうパワー半導体素子において絶縁基板と接続する面電極が正極側であり、もう一方の面が負極側の電極である。また、以下では、パワー半導体素子の電極を、MOSFET(Metal Oxide Semiconductor Field Effect Transistor)の電極の呼称に準じ、正極側をドレイン電極、負極側をソース電極と称する。
本発明の目的は、発電モータ(オルタネータ)に半導体装置を内蔵し、力行機能を付加する場合のように、エンジン近傍の高温環境に半導体装置が位置する場合において、高温環境に対する長期信頼性を向上できる半導体装置を提供することにある。
本発明の他の目的は、高温環境に対する長期信頼性を向上させた半導体装置を内蔵した電力変換装置を提供することにある。
本発明のその他の目的は、高温環境に対する長期信頼性を向上させた半導体装置を内蔵して力行動作を可能とした発電モータを提供することにある。
本発明のさらに他の目的は、高温環境に対する長期信頼性を向上させた半導体装置を内蔵してアイドルストップ動作の可能なハイブリッド自動車を提供することにある。
(1)上記第1の目的を達成するために、本発明は、主電流の入出力に上下2面の電極を設けたパワー半導体素子と、前記一方の下面電極を支持する絶縁基板と、前記他方の上面電極に接合される積層導体板とを備えた半導体装置であって、前記積層導体板は線膨張率を8から12ppm/℃の範囲とし、半田或いは、金或は銀のいずれかのナノ粒子を用いて上面電極に接合したものである。
かかる構成により、高温環境に対する長期信頼性を向上できるものとなる。
(2)上記第1の目的を達成するために、本発明は、主電流の入出力に上下2面の電極を設けたパワー半導体素子と、前記一方の下面電極を支持する絶縁基板と、前記他方の上面電極に接合される積層導体板とを備えた半導体装置であって、前記積層導体板はそれぞれの板厚の比率が1:(1〜2):1となるように銅板、鉄ニッケル合金板、銅板で構成したものである。
かかる構成により、高温環境に対する長期信頼性を向上できるものとなる。
(3)上記第2の目的を達成するために、本発明は、主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有するパワーモジュール部と、前記パワー半導体素子の駆動を制御する制御部とを備えた電力変換装置であって、線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合したものである。
(4)上記第3の目的を達成するために、本発明は、固定子と、回転子とからなるモータであって、主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を備え、線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置のパワー半導体素子と放熱板を電気接続し、前記放熱板をブラケットに電気的かつ機械的に固定したものである。
かかる構成により、高温環境に対する長期信頼性を向上させた半導体装置を内蔵してモータを力行動作を可能とする。
(5)上記第4の目的を達成するために、本発明は、エンジンと、モータにより車輪が駆動されるハイブリット自動車であって、主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を備え、それぞれの厚さが1:(1〜2):1の銅板、鉄ニッケル合金板、銅板からなる積層導体板を用い、前記パワー半導体の上面電極と前記積層導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置のパワー半導体素子と放熱板を電気接続し、前記モータは、前記放熱板がブラケットに電気的かつ機械的に固定されて、エンジンルームに搭載されているものである。
掛かる構成により、高温環境に対する長期信頼性を向上させた半導体装置を内蔵してアイドルストップ動作の可能なハイブリッド自動車を得ることができる。By the way, for the purpose of improving fuel efficiency, the spread of an idle stop vehicle (for example, Japanese Patent Application Laid-Open No. 2003-113763) with a built-in motor that stops the engine in a stop state such as waiting for a signal and restarts the engine at the time of departure is low. There is a need for an idle stop system that is easy to implement in a wide variety of vehicles at a low cost.
As a method of providing such an idle stop function to a wide variety of vehicles easily at low cost, a power generation function is added by incorporating a semiconductor device in a generator motor (alternator) mounted on most vehicles. A method is being considered. The problems of the semiconductor device built in the motor are as follows: 1) downsizing for incorporation in the motor, and 2) the motor being disposed beside the engine that is a high heating element. This is two points of improvement in reliability.
Regarding long-term reliability, the one described in JP 2000-183249 does not assume a high-temperature environment near the engine. 1) Because the temperature of the power semiconductor element rises to near the curing temperature of the conductive resin material. Curing progresses and the joint becomes weak against stress. 2) Since the environment is high temperature, it is necessary to reduce the heat generation and suppress the temperature of the power semiconductor element, but there is a problem that the electrical resistance value of the conductive resin material is large. For example, the volume resistivity of lead tin solder used as a bonding material is about 15 μΩ · cm, whereas the volume resistivity of conductive resin material is 1 Ω · cm (from JP 2000-183249 A). The resistance of the resin material is as large as about 70,000 times that of lead tin solder. 3) In the structure in which the low thermal expansion material is attached to the copper bus bar wiring, the bus bar wiring extends at a higher temperature than the low thermal expansion material and contracts at a low temperature due to the difference in the linear expansion coefficient. This phenomenon is conspicuous in a high temperature environment. In the structure described in Japanese Patent Laid-Open No. 2000-183249, the bus bar wiring is deformed into an arcuate shape, and the force in the direction of peeling the bus bar wiring from the power semiconductor element causes the operation of the idle stop vehicle It will occur repeatedly due to the pause cycle. For this reason, peeling is more likely to occur at the joint. 4) When the bus bar wiring is deformed into a bow shape, the power semiconductor element connected thereto is also deformed into a bow shape. Since the power semiconductor element and the insulating substrate are bonded with a material that is easily plastically deformed, such as solder, as disclosed in Japanese Patent Application Laid-Open No. 2000-183249, the joint between the power semiconductor element and the insulating substrate is the same as in 3). This is caused by the force in the direction of peeling.
In the power semiconductor element here, the surface electrode connected to the insulating substrate is the positive electrode side, and the other surface is the electrode on the negative electrode side. Hereinafter, the electrode of the power semiconductor element is referred to as a MOSFET (Metal Oxide Semiconductor Field Effect Transistor) electrode, and the positive electrode side is referred to as a drain electrode and the negative electrode side is referred to as a source electrode.
The object of the present invention is to improve the long-term reliability for a high-temperature environment when the semiconductor device is located in a high-temperature environment near the engine, such as when a power generation function is added by incorporating a semiconductor device in a generator motor (alternator). An object of the present invention is to provide a semiconductor device that can be used.
Another object of the present invention is to provide a power conversion device incorporating a semiconductor device with improved long-term reliability against a high temperature environment.
Another object of the present invention is to provide a power generation motor capable of performing a power running operation by incorporating a semiconductor device with improved long-term reliability against a high temperature environment.
Still another object of the present invention is to provide a hybrid vehicle capable of performing an idle stop operation by incorporating a semiconductor device with improved long-term reliability against a high temperature environment.
(1) In order to achieve the first object, the present invention provides a power semiconductor element having upper and lower electrodes for input and output of a main current, an insulating substrate for supporting the one lower electrode, A semiconductor device comprising a laminated conductor plate joined to the other upper surface electrode, wherein the laminated conductor plate has a linear expansion coefficient in the range of 8 to 12 ppm / ° C, and is either solder, gold or silver The nano-particles are joined to the top electrode.
With this configuration, long-term reliability against a high temperature environment can be improved.
(2) In order to achieve the first object, the present invention provides a power semiconductor element in which upper and lower electrodes are provided for input and output of a main current, an insulating substrate that supports the one lower electrode, A semiconductor device comprising a laminated conductor plate joined to the other upper surface electrode, wherein the laminated conductor plate is a copper plate, iron-nickel so that the ratio of the respective plate thicknesses is 1: (1-2): 1 It consists of an alloy plate and a copper plate.
With this configuration, long-term reliability against a high temperature environment can be improved.
(3) In order to achieve the second object, the present invention provides a power module unit having power semiconductor elements in upper and lower arms that use upper and lower electrodes for main current input and output, and the power semiconductor element. And a control unit for controlling the driving of the power converter, using a conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C., and soldering the upper electrode of the power semiconductor element and the conductor plate, or Joined using either gold or silver.
(4) In order to achieve the above third object, the present invention provides a motor comprising a stator and a rotor, wherein a power semiconductor element using upper and lower electrodes for main current input / output is provided on the upper arm. And a power conversion device that is provided in the lower arm, converts power from a battery and supplies power to the motor, and uses a conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. The power semiconductor element of the semiconductor device in which the upper surface electrode of the semiconductor device and the conductor plate are joined using solder or any material of gold or silver and the heat radiating plate are electrically connected, and the heat radiating plate is electrically and mechanically connected to the bracket. It is fixed.
With such a configuration, a semiconductor device with improved long-term reliability against a high-temperature environment is incorporated, and the motor can be powered.
(5) In order to achieve the fourth object, the present invention provides a hybrid vehicle in which wheels are driven by an engine and a motor, and includes a power semiconductor element using upper and lower electrodes for main current input and output. A power conversion device that is provided in the upper arm and the lower arm, converts power from the battery, and supplies power to the motor, each having a thickness of 1: (1-2): 1, copper plate, iron nickel A power semiconductor element and a heat sink of a semiconductor device in which a laminated conductor plate made of an alloy plate or a copper plate is used, and the upper electrode of the power semiconductor and the laminated conductor plate are joined using solder, or a material of gold or silver. The motor is electrically connected, and the heat radiating plate is electrically and mechanically fixed to the bracket and mounted in the engine room.
With this configuration, it is possible to obtain a hybrid vehicle capable of performing an idle stop operation by incorporating a semiconductor device with improved long-term reliability against a high temperature environment.
図1は、本発明の一実施形態による半導体装置を内蔵したモータでエンジンを再始動させるアイドルストップ機能を有するハイブリッド自動車の構成を示すブロック図である。
図2は、本発明の一実施形態による半導体装置を内蔵したモータの構成を示すブロック図である。
図3は、本発明の一実施形態による半導体装置を内蔵したモータの構成を示す断面図である。
図4は、本発明の一実施形態による半導体装置を内蔵したモータ半導体装置である電力変換装置の構成を示す斜視図である。
図5は、本発明の一実施形態による半導体装置である電力変換装置の構成を示す断面図である。
図6は、本発明の他の実施形態による半導体装置である電力変換装置の構成を示す断面図である。FIG. 1 is a block diagram showing a configuration of a hybrid vehicle having an idle stop function for restarting an engine with a motor incorporating a semiconductor device according to an embodiment of the present invention.
FIG. 2 is a block diagram showing a configuration of a motor incorporating a semiconductor device according to an embodiment of the present invention.
FIG. 3 is a cross-sectional view showing a configuration of a motor incorporating a semiconductor device according to an embodiment of the present invention.
FIG. 4 is a perspective view showing a configuration of a power conversion device which is a motor semiconductor device incorporating a semiconductor device according to an embodiment of the present invention.
FIG. 5 is a cross-sectional view showing a configuration of a power conversion device which is a semiconductor device according to an embodiment of the present invention.
FIG. 6 is a cross-sectional view showing a configuration of a power conversion device which is a semiconductor device according to another embodiment of the present invention.
以下、図1〜図5を用いて、本発明の一実施形態による半導体装置の構成について説明する。
最初に、図1を用いて、本実施形態による半導体装置を内蔵したモータでエンジンを再始動させるアイドルストップ機能を有するハイブリッド自動車の構成について説明する。
図1は、本発明の一実施形態による半導体装置を内蔵したモータでエンジンを再始動させるアイドルストップ機能を有するハイブリッド自動車の構成を示すブロック図である。
エンジン53が十分に暖気されている状態で車両が停車すると、制御装置51はエンジン53を停止させる。その後、制御装置51は、運転者がブレーキペダルから足を離す等の発進に移行する動作や、バッテリ電圧低下等の発電が必要な状態を検知すると、半導体装置内蔵モータ60の駆動力をベルトBによりエンジン53に伝達して、エンジン53を再始動をさせる。この時、半導体装置内蔵モータ60の電源は、バッテリー等の直流電源31である。また、本車両において、半導体装置内蔵モータ60は、走行時のエンジン回転により発電を行い、その電力を直流電源31に充電する発電モータの機能も兼ね備えている。
エンジンの再始動と発電を効率良く行うためには、エンジン53とモータ60の回転軸を直結する場合やベルト駆動の場合のいずれにしても、半導体装置内蔵モータ60は、従来発電モータ(オルタネータ)が配置されていたエンジン53の近傍に配置する必要がある。即ち、半導体装置内蔵モータ60は高温環境に置かれることになるが、半導体装置内蔵モータ60は後述するように、高温環境に対して信頼性を向上させるた構造を有している。半導体内蔵モータ60は、半導体装置の放熱板に放熱機能に加え電気配線の機能を持たせる等の機能集約により、寸法・信頼性の点で、エンジン近傍の高温環境に搭載されていた発電モータと置換え可能なものとなっている。そのため、半導体内蔵モータ60は既設計の車両に対しても適用可能であり、よって、本実施形態により、低コストで容易にアイドルストップシステムを実現できるものである。なお、このように、オルタネータのような発電機に力行動作機能をもたせ、モータとして使用し、エンジン再始動を行う自動車を、一般に、マイルドハイブリッド自動車と称されている。
次に、図2を用いて、本実施形態による半導体装置を内蔵したモータ60の電気的構成について説明する。
図2は、本発明の一実施形態による半導体装置を内蔵したモータの構成を示すブロック図である。
半導体装置内蔵モータ60は、交流電動機(モータ/ジェネレータ)61と、モータ制御装置63とから構成される。交流電動機61は、ロータの回転位置を検知するための磁極位置検出手段61MDを備えている。
モータ制御装置3は、電力変換装置63Pと、モータコントローラ63Cと、励磁駆動回路63EDとを有する。
電力変換装置63Pは、スイッチング素子(UP〜WN)と各スイッチング素子に逆並列に接続された整流素子を含む3相ブリッジ回路として構成されている。本例では、スイッチング素子として電解効果型トランジスタ(MOSFET)を使用し、整流素子としてダイオードを使用する。スイッチング素子として、IGBTを使用することもできる。
交流電動機61はステータとロータとを有し、巻線界磁式の3相交流モータとして構成されている。動力伝達手段2に駆動連結されたロータには、励磁コイル61RCが装着され、ステータには、U相、V相、W相の電機子コイル61SCが設けられている。
交流電動機61のロータの励磁コイル61RCは、励磁駆動回路63EDによって給電される。また、励磁コイル61RCへの印加電圧も、この励磁駆動回路63EDによって調整される。交流電動機61のステータの電機子コイル61SCの各相の出力線は、電力変換装置63Pの3相のスイッチング素子(UP〜WN)及び整流素子を介して、直流電源31の高電位側端子及び低電位側端子に接続された電源ラインに接続されている。
電力変換装置63Pは、交流電動機61をモータとして力行制御するときには、直流電源31に蓄電された直流電力を直流/交流変換して電機子コイル61SCに給電するインバータ回路として作動する。また、電力変換装置63Pは、交流電動機61を発電機として発電制御するときには、発電によって電機子コイル61SCから出力される交流電力を交流/直流変換して電源ラインに給電するコンバータ(整流器)回路として作動する。こうした電力変換装置63Pの作動に係るスイッチング素子(UP〜WN)のオン/オフ操作は、モータコントローラ63Cによって操作されている。モータコントローラ63Cには、制御装置51からの指令に基づいて、力行モードと発電モードを切替える切替え手段を有し、力行制御と発電制御を行う。
モータ制御装置63は、交流電動機61をモータとして力行制御するときには、直流電源31からの直流電力を交流電力に変換するインバータ回路として作動し、交流電動機61を発電機として発電制御するときには、交流電動機61からの交流電力を直流電力に変換するコンバータ(整流器)回路として作動する。
エンジンを起動するとき、モータ制御装置63は、交流電動機61を力行制御する。即ち、交流電動機61には、直流電源31からモータ制御装置63を介して交流電力が供給される。交流電動機61の出力軸は、力行トルクを発生し、動力伝達手段を介してエンジンのクランクシャフトを回転させる。エンジンが所定の回転数に達すると、自力回転を開始する。本例では、交流電動機61は、スタータモータとしての役割を果たすことになる。
エンジンが安定して自立運転をしているとき、モータ制御装置63は、交流電動機61への力行制御を停止し、発電制御を行う。即ち、交流電動機61は、エンジンの動力によって駆動され、発電を行う。発電によって発生した交流電力は、モータ制御装置63によって直流電力に変換され直流電源31へ充電される。
このように、交流電動機61は、直流電源31からの電力供給によって動力を発生するモータとして機能すると共に、エンジンからの動力供給によって発電を行う発電機として機能する。
次に、図3を用いて、本実施形態による半導体装置を内蔵したモータ60の機械的構成について説明する。
図3は、本発明の一実施形態による半導体装置を内蔵したモータの構成を示す断面図である。
交流電動機61は、2個のブラケット61BF,61BRによって固定されたステータ61Sと、ステータ61Sの内側に回転可能に保持されたロータ61Rとを備えている。ロータ61Rのシャフト61RSは、2つのブラケットに取り付けられた軸受61BE1,61BE2によって回転可能に支持されている。ステータ61Sは、固定子鉄芯61SCと、固定子コイル61SOとから構成される。ロータ61Rは、回転子鉄芯61RCと、回転子コイル61ROとから構成される。ブラケット61BRには、図2に示したモータ制御装置63が取り付けられている。
モータ制御装置63の中の電力変換装置63Pは、その放熱板にてリアブラケット61BRに面固定されている。リアブラケット61BRには、空冷フィン61CFが一体的に設けられている。半導体装置内蔵モータ60では、バッテリ端子61BTが正極端子、リアブラケット61BRが負極端子(グランド端子)である。リアブラケット61BRに半導体装置である電力変換装置63Pの冷却器と電気配線の二つの機能を持たせることで、半導体装置内蔵モータ60は、半導体装置内蔵モータ60の内部において専用のグランド配線を省くことができた。その部品削減効果により、本実施形態の半導体装置内蔵モータでは、そのモータを大きくすること無く、半導体装置を内蔵することを可能にした。なお、リアブラケット61BRは、配線として使用するために、アルミニウム等の良導体が用いられている。
次に、図4を用いて、本実施形態による半導体装置を内蔵したモータ60に用いる半導体装置である電力変換装置63Pの構成について説明する。
図4は、本発明の一実施形態による半導体装置を内蔵したモータ半導体装置である電力変換装置の構成を示す斜視図である。
リアブラケット61BRに二つの機能を持たせるためには、半導体装置である電力変換装置63Pの配線構造もそれを可能とする構造にする必要がある。そこで、本実施形態では、半導体装置である電力変換装置63Pの構造を、図4に示す構成としている。図4は、モータに内蔵する半導体装置において、本発明に直接係わる配線構造を図示したものである。
図4に示す構造では、リアブラケット61BRへ電流を流すために、まず、放熱板7を銅や銅−モリブデン等の良導体で構成し、ブリッジ回路ロウサイド側のパワー半導体素子13b(図2のスイッチング素子UN,VN,WN)のソース電極と接続している積層導体板15bをそのもう一端で放熱板7と接続している。これにより、放熱板はグランド配線としての機能を持つことになる。放熱板7をリアブラケット61BRと導体のネジ8等で面固定すると、放熱板7との接触面から熱を、導体ネジから電気をリアブラケット61BRへ伝えることになり、即ち、リアブラケット61BRは、電力変換装置である半導体装置の冷却器と電気配線の二つの機能を持つことになる。
以上の説明のように、本実施形態では、高温環境における信頼性を向上させた半導体装置に半導体装置の放熱板とモータのリアブラケットに放熱と電気配線の機能を持たせる等の機能集約による省スペース化を実現している。それにより、半導体装置を内蔵したモータは、寸法・信頼性の点で、エンジン近傍の高温環境に搭載されていた発電モータと置換え可能なものとなっている。
次に、図5を用いて、本実施形態による半導体装置である電力変換装置の構成について説明する。
図5は、本発明の一実施形態による半導体装置である電力変換装置の構成を示す断面図である。
パワー半導体素子13aと積層導体板15aは、接合材18aによって接合している。積層導体板15aと導体板10bは、接合材18bによって接合している。接合材18a,18bは電流が流れる部位であるため、その材料には半田またはAu,Agを主成分としたナノ粒子材の高電気伝導材を用いている。また、積層導体板15aは、ほぼ同じ厚さの銅板16a,16bで鉄ニッケル合金板17を両側から挟んだ部品であり、その板厚の比は銅板16a,16bを1とすると、鉄ニッケル合金17は1〜2である。ここで、積層導体板15aの等価線膨張率を計算すると、以下のように求められる。式(1)は、材質の異なる板を張り合わせた積層板の等価線膨張率を概算する式である。
等価線膨張率=Σ(線膨張率×ヤング率×板厚)/Σ(ヤング率×板厚) …(1)
式(1)より、積層導体板15aの等価線膨張率は約8〜12ppm/℃と求めることができる。ここで、銅の線膨張率は約18ppm/℃、鉄ニッケル合金の線膨張率は約1.5ppm/℃、銅のヤング率は118Gpa、鉄ニッケル合金のヤング率は144Gpaである。
次に、本実施形態に直接係わる各構成物とそれらの接続関係を説明する。パワー半導体素子13aと導体板10aは、半田12bによって接合している。絶縁基板9と放熱板7は、半田12aによって接合している。絶縁基板9は、第1層目に導体板10aと10bを、第2層目に絶縁体11を、第3層目に導体板10cを積層した部材である。導体板10a,10b,10cに銅を、絶縁体11に窒化シリコンを用いて、各層の厚さを第1層と第3層は0.4mmに、第2層を0.32mmにした場合、式(1)より絶縁基板9の等価線膨張率は約10ppm/℃である。ここで窒化シリコンの線膨張率は2.7ppm/℃、ヤング率は303Gpa、銅の物性値は前述の値を用いた。前述で示した本実施形態に直接係わる各構成物には、エンジン近傍の高温環境で使用するため、耐熱性のある材料が用いられる。
次に、本実施形態の構造の作用について説明する。本実施形態の構造はパワー半導体素子13aを等価線膨張率10ppm/℃の絶縁基板9と等価線膨張率8〜12ppm/℃の積層導体板15aのほぼ同じ線膨張率の部材で挟んでいるため、高温環境で顕著になる各部材の膨張差を小さくすることができる。理想的には積層導体板15aの線膨張率を絶縁基板9に一致させることで、半田12bと接合材18aに生じる熱応力が最小になり、最も長期信頼性を向上させることができる。前述の絶縁基板9の等価線膨張率は、具体的な値で計算した一例であるが、絶縁基板に使われる材料と厚さの範囲から等価線膨張率の範囲を計算すると次のようになる。絶縁基板において、第1層と第3層の銅板厚さは凡そ0.4mmから0.5mmの範囲であり、第2層が窒化シリコン板の場合はその厚さが0.32mmから0.64mmの範囲、第2層が窒化アルミ板の場合はその厚さは凡そ0.64mmである。式(1)を用いて計算すると、前述の板材と厚さの組み合せから絶縁基板の等価線膨張率は8〜12ppm/℃の範囲にあることが分かる。ここで、窒化アルミの線膨張率は4.4ppm/℃、ヤング率は160GPaとして計算した。の分析により、積層導体板15aは、銅板16a、16bの厚さ1に対して鉄ニッケル合金17の厚さを1〜2の範囲にすると絶縁基板の線膨張率に近い値にすることができることが分かる。なお、前述の説明は、各部品が熱膨張しても平坦なままであることとを前提としているが、本構造では、積層導体板15aを同じ材料かつ同じ厚さの板で異なる材料の板を挟み込む構造にすることで、熱膨張した場合でも弓形に変形せず、パワー半導体素子との接合面を平坦に保つことが出来る構造になっている。
以上説明したように、本実施形態による半導体装置は、発電モータ(オルタネータ)に半導体装置を内蔵し、力行機能を付加する場合のように、エンジン近傍の高温環境に半導体装置が位置する場合において、高温環境に対する長期信頼性を向上できる。
また、本実施形態による半導体装置を内蔵した電力変換装置の高温環境に対する長期信頼性を向上できる。
さらに、本実施形態による発電モータは、高温環境に対する長期信頼性を向上させた半導体装置を内蔵して力行動作が可能となる。
また、本実施形態によるハイブリッド自動車は、高温環境に対する長期信頼性を向上させた半導体装置を内蔵してアイドルストップ動作が可能となる。
次に、図6を用いて、本発明の他の実施形態による半導体装置である電力変換装置の構成について説明する。なお、図1〜図4の構成は、本実施形態でも共通である。
図6は、本発明の他の実施形態による半導体装置である電力変換装置の構成を示す断面図である。
図5の実施形態において、積層導体板15aはその一方を導体板10bと接合しているが、本発明は積層導体板15aの一方を導体板10bと接合した構成に限定するものではなく、他の実施形態について図6を用いて説明する。
本実施形態では、積層配線板18aにワイヤ14dが接合し、そしてワイヤ14dが導体板10bと接合している点が図5の実施形態と異なる。なお、ワイヤ14dはアルミニウムを主成分した配線である。その他は同じ構造であるため、本実施形態では、図5の実施形態と同様、高温環境で接合材18aと半田12bに生じる熱応力を小さくする効果がある。
積層配線板18aとワイヤ14dの接合部の信頼性について説明すれば、積層配線板18aの第2層に使用されている鉄ニッケル合金は熱伝導率が11W/m℃(参考値:銅の熱伝導率380W/m℃、アルミの熱伝導率233W/m℃)と小さく、パワー半導体素子13aからワイヤ14dまでの熱抵抗を大きくする効果がある。半導体装置において、電流スイチッングをするパワー半導体素子が最も高温になる部品であるが、熱抵抗の増大により、前述の積層配線板18aとワイヤ14dの接合部の温度を、従来のワイヤをパワー半導体素子と直接接合した場合と比べ、低くすることができる。接合部の温度低減はその部分の熱膨張の低減を意味し、よって、ワイヤをパワー半導体素子と直接接合した場合と比べ、長期的信頼性が向上することを示している。
以上説明したように、本実施形態による半導体装置は、発電モータ(オルタネータ)に半導体装置を内蔵し、力行機能を付加する場合のように、エンジン近傍の高温環境に半導体装置が位置する場合において、高温環境に対する長期信頼性を向上できる。
また、本実施形態では、半導体装置の配線レイアウトの自由度を上げることができるワイヤ配線を高温環境で使用する半導体装置に適用可能にしたものである。
また、本実施形態による半導体装置を内蔵した電力変換装置の高温環境に対する長期信頼性を向上できる。
さらに、本実施形態による発電モータは、高温環境に対する長期信頼性を向上させた半導体装置を内蔵して力行動作が可能となる。
また、本実施形態によるハイブリッド自動車は、高温環境に対する長期信頼性を向上させた半導体装置を内蔵してアイドルストップ動作が可能となる。
なお、本発明における半導体装置において、パワー半導体素子はMOSFETに限定したものはなく、IGBT(Insulated Gate Bipolar Transistor)等の主電流の入出に上下2面の電極を持っている半導体素子ならば、同様に適用することができる。
また、本発明の半導体装置はモータに内蔵する半導体装置に限定したものではなく、電力変換装置にも適用することができる。電力変換装置に本半導体装置を適用することによって、高温環境の場所に搭載できて、かつ専用の冷却器を持たなくても長期的な信頼性を確保可能な電力変換装置を提供することが可能になる。
以上のように、本発明の各実施形態によれば、パワー半導体素子の電極に接合される積層導体板の線膨張率を8から12ppm/℃の範囲とし、半田或いは、金或は銀のいずれかのナノ粒子を用いて上面電極に接合することによって、高温環境に対するパワー半導体素子の接合部の長期信頼性を向上させることができる。
また、本実施形態の半導体内蔵モータは、半導体装置の放熱板に放熱機能に加え電気配線の機能を持たせる等の機能集約により、寸法・信頼性の点で、エンジン近傍の高温環境に搭載されていた発電モータと置換え可能なものとなっているため、低コストで容易に多種多様な車両への適用可能なアイドルストップシステムを実現できる。Hereinafter, the configuration of a semiconductor device according to an embodiment of the present invention will be described with reference to FIGS.
First, the configuration of a hybrid vehicle having an idle stop function for restarting the engine with the motor incorporating the semiconductor device according to the present embodiment will be described with reference to FIG.
FIG. 1 is a block diagram showing a configuration of a hybrid vehicle having an idle stop function for restarting an engine with a motor incorporating a semiconductor device according to an embodiment of the present invention.
When the vehicle stops while the
In order to efficiently restart the engine and generate power, the semiconductor device built-in
Next, the electrical configuration of the
FIG. 2 is a block diagram showing a configuration of a motor incorporating a semiconductor device according to an embodiment of the present invention.
The semiconductor device built-in
The
The
The
The excitation coil 61RC of the rotor of the
The
The
When starting the engine, the
When the engine is stably operating independently, the
As described above, the
Next, the mechanical configuration of the
FIG. 3 is a cross-sectional view showing a configuration of a motor incorporating a semiconductor device according to an embodiment of the present invention.
The
The
Next, the configuration of the
FIG. 4 is a perspective view showing a configuration of a power conversion device which is a motor semiconductor device incorporating a semiconductor device according to an embodiment of the present invention.
In order to provide the rear bracket 61BR with two functions, the wiring structure of the
In the structure shown in FIG. 4, in order to pass a current to the rear bracket 61BR, first, the
As described above, in this embodiment, the semiconductor device with improved reliability in a high-temperature environment saves power by integrating functions such as providing the heat sink of the semiconductor device and the function of the electric wiring to the rear bracket of the motor. Realization of space. As a result, a motor incorporating a semiconductor device can be replaced with a generator motor mounted in a high-temperature environment near the engine in terms of size and reliability.
Next, the configuration of the power converter as the semiconductor device according to the present embodiment will be described with reference to FIG.
FIG. 5 is a cross-sectional view showing a configuration of a power conversion device which is a semiconductor device according to an embodiment of the present invention.
The power semiconductor element 13a and the laminated conductor plate 15a are joined together by a joining material 18a. The laminated conductor plate 15a and the conductor plate 10b are joined together by a joining material 18b. Since the bonding materials 18a and 18b are portions through which current flows, a high electrical conductive material of a nanoparticle material mainly composed of solder or Au or Ag is used as the material. The laminated conductor plate 15a is a component in which the iron-
Equivalent linear expansion coefficient = Σ (Linear expansion coefficient × Young's modulus × plate thickness) / Σ (Young's modulus × plate thickness) (1)
From equation (1), the equivalent linear expansion coefficient of the laminated conductor plate 15a can be determined to be about 8 to 12 ppm / ° C. Here, the linear expansion coefficient of copper is about 18 ppm / ° C., the linear expansion coefficient of iron-nickel alloy is about 1.5 ppm / ° C., the Young's modulus of copper is 118 Gpa, and the Young's modulus of iron-nickel alloy is 144 Gpa.
Next, each component directly related to the present embodiment and their connection relationship will be described. The power semiconductor element 13a and the
Next, the operation of the structure of this embodiment will be described. In the structure of this embodiment, the power semiconductor element 13a is sandwiched between members of the insulating
As described above, the semiconductor device according to the present embodiment incorporates the semiconductor device in the generator motor (alternator), and when the semiconductor device is located in a high-temperature environment near the engine, as in the case of adding a power running function, Long-term reliability against high temperature environment can be improved.
In addition, the long-term reliability of the power conversion device incorporating the semiconductor device according to the present embodiment against a high temperature environment can be improved.
Furthermore, the power generation motor according to the present embodiment incorporates a semiconductor device with improved long-term reliability against a high-temperature environment and can perform a power running operation.
In addition, the hybrid vehicle according to the present embodiment incorporates a semiconductor device with improved long-term reliability against a high temperature environment, and can perform an idle stop operation.
Next, the configuration of a power conversion device that is a semiconductor device according to another embodiment of the present invention will be described with reference to FIG. 1 to 4 is common to the present embodiment.
FIG. 6 is a cross-sectional view showing a configuration of a power conversion device which is a semiconductor device according to another embodiment of the present invention.
In the embodiment of FIG. 5, one of the laminated conductor plates 15a is joined to the conductor plate 10b, but the present invention is not limited to the configuration in which one of the laminated conductor plates 15a is joined to the conductor plate 10b. This embodiment will be described with reference to FIG.
This embodiment is different from the embodiment of FIG. 5 in that the
The reliability of the joint between the laminated wiring board 18a and the
As described above, the semiconductor device according to the present embodiment incorporates the semiconductor device in the generator motor (alternator), and when the semiconductor device is located in a high-temperature environment near the engine, as in the case of adding a power running function, Long-term reliability against high temperature environment can be improved.
In the present embodiment, the wire wiring that can increase the degree of freedom of the wiring layout of the semiconductor device can be applied to a semiconductor device that uses it in a high temperature environment.
In addition, the long-term reliability of the power conversion device incorporating the semiconductor device according to the present embodiment against a high temperature environment can be improved.
Furthermore, the power generation motor according to the present embodiment incorporates a semiconductor device with improved long-term reliability against a high-temperature environment and can perform a power running operation.
In addition, the hybrid vehicle according to the present embodiment incorporates a semiconductor device with improved long-term reliability against a high temperature environment, and can perform an idle stop operation.
In the semiconductor device according to the present invention, the power semiconductor element is not limited to the MOSFET, and any semiconductor element having upper and lower electrodes for input / output of the main current such as IGBT (Insulated Gate Bipolar Transistor) is the same. Can be applied to.
The semiconductor device of the present invention is not limited to a semiconductor device built in a motor, and can also be applied to a power conversion device. By applying this semiconductor device to a power conversion device, it is possible to provide a power conversion device that can be installed in a place with a high temperature environment and can ensure long-term reliability without having a dedicated cooler. become.
As described above, according to each embodiment of the present invention, the coefficient of linear expansion of the laminated conductor plate joined to the electrode of the power semiconductor element is in the range of 8 to 12 ppm / ° C., and either solder, gold or silver is used. By bonding such a nanoparticle to the upper surface electrode, the long-term reliability of the bonded portion of the power semiconductor element with respect to a high temperature environment can be improved.
In addition, the semiconductor built-in motor of this embodiment is mounted in a high-temperature environment near the engine in terms of size and reliability by integrating functions such as providing a heat dissipation function in addition to a heat dissipation function to the heat sink of the semiconductor device. Since the generator motor can be replaced, it is possible to realize an idle stop system that can be easily applied to various vehicles at low cost.
本発明によれば、発電モータ(オルタネータ)に半導体装置を内蔵し、力行機能を付加する場合のように、エンジン近傍の高温環境に半導体装置が位置する場合において、高温環境に対する長期信頼性を向上できる半導体装置を提供することができる。
また、高温環境に対する長期信頼性を向上させた半導体装置を内蔵した電力変換装置を提供することができる。
さらに、高温環境に対する長期信頼性を向上させた半導体装置を内蔵して力行動作を可能とした発電モータを提供することができる。
また、高温環境に対する長期信頼性を向上させた半導体装置を内蔵してアイドルストップ動作の可能なハイブリッド自動車を提供することができる。According to the present invention, when a semiconductor device is built in a generator motor (alternator) and a power running function is added, when the semiconductor device is located in a high-temperature environment near the engine, long-term reliability with respect to the high-temperature environment is improved. A semiconductor device that can be provided can be provided.
Further, it is possible to provide a power conversion device incorporating a semiconductor device with improved long-term reliability against a high temperature environment.
Furthermore, it is possible to provide a generator motor that incorporates a semiconductor device with improved long-term reliability against a high temperature environment and enables a power running operation.
In addition, it is possible to provide a hybrid vehicle that incorporates a semiconductor device with improved long-term reliability against a high temperature environment and can perform an idle stop operation.
Claims (11)
このパワー半導体素子の下面電極を支持する絶縁基板とを有する半導体装置であって、
線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合したことを特徴とする半導体装置。A power semiconductor device using upper and lower electrodes for input and output of the main current;
A semiconductor device having an insulating substrate for supporting a lower electrode of the power semiconductor element,
A conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. is used, and the upper electrode of the power semiconductor element and the conductor plate are joined using solder, or any material of gold or silver. Semiconductor device.
このパワー半導体素子の下面電極を支持する絶縁基板を有する半導体装置であって、
それぞれの厚さが1:(1〜2):1の銅板、鉄ニッケル合金板、銅板からなる積層導体板を用い、前記パワー半導体の上面電極と前記積層導体板を半田或いは、金または銀のいずれかの材料を用いて接合したことを特徴とする半導体装置。A power semiconductor device using upper and lower electrodes for input and output of the main current;
A semiconductor device having an insulating substrate that supports a lower electrode of the power semiconductor element,
A laminated conductor plate made of a copper plate, an iron-nickel alloy plate, and a copper plate having a thickness of 1: (1-2): 1 is used, and the upper electrode of the power semiconductor and the laminated conductor plate are made of solder, gold, or silver. A semiconductor device which is bonded using any material.
線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合したことを特徴とする電力変換装置。A power conversion device comprising: a power module unit having upper and lower arm power semiconductor elements that use upper and lower electrodes for main current input and output; and a control unit that controls driving of the power semiconductor element,
A conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. is used, and the upper electrode of the power semiconductor element and the conductor plate are joined using solder, or any material of gold or silver. Power conversion device.
このパワー半導体素子の下面電極を支持する絶縁基板を有する半導体装置であって、
それぞれの厚さが1:(1〜2):1の銅板、鉄ニッケル合金板、銅板からなる積層導体板を用い、前記パワー半導体の上面電極と前記積層導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置を内蔵していることを特徴とする電力変換装置。A power semiconductor device using upper and lower electrodes for input and output of the main current;
A semiconductor device having an insulating substrate that supports a lower electrode of the power semiconductor element,
A laminated conductor plate made of a copper plate, an iron-nickel alloy plate, and a copper plate having a thickness of 1: (1-2): 1 is used, and the upper electrode of the power semiconductor and the laminated conductor plate are made of solder, gold, or silver. A power conversion device comprising a semiconductor device bonded using any material.
主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を備え、
線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置のパワー半導体素子と放熱板を電気接続し、前記放熱板をブラケットに電気的かつ機械的に固定したことを特徴とするモータ。A motor composed of a stator and a rotor,
A power semiconductor device that uses electrodes on the upper and lower surfaces for input and output of the main current is provided in the upper arm and the lower arm, and includes a power conversion device that converts power from the battery and supplies power to the motor.
A power semiconductor of a semiconductor device in which a conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. is used, and the upper electrode of the power semiconductor element and the conductor plate are joined using solder, gold, or silver. A motor characterized in that an element and a heat radiating plate are electrically connected and the heat radiating plate is electrically and mechanically fixed to a bracket.
主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を備え、
それぞれの厚さが1:(1〜2):1の銅板、鉄ニッケル合金板、銅板からなる積層導体板を用い、前記パワー半導体素子の上面電極と積層導体板を半田或いは、金または銀のいずれかの材料を用いて接合したパワー半導体素子と放熱板を電気接続し、前記放熱板をブラケットに電気的かつ機械的に固定したことを特徴とするモータ。A motor composed of a stator and a rotor,
A power semiconductor device that uses electrodes on the upper and lower surfaces for input and output of the main current is provided in the upper arm and the lower arm, and includes a power conversion device that converts power from the battery and supplies power to the motor.
A laminated conductor plate made of a copper plate, iron-nickel alloy plate, or copper plate having a thickness of 1: (1-2): 1 is used, and the upper electrode and the laminated conductor plate of the power semiconductor element are soldered or made of gold or silver. A motor characterized in that a power semiconductor element and a heat radiating plate joined using any material are electrically connected, and the heat radiating plate is electrically and mechanically fixed to a bracket.
主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を備え、
線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置のパワー半導体素子と放熱板を電気接続し、
前記モータは、前記放熱板がブラケットに電気的かつ機械的に固定されて、エンジンルームに搭載されていることを特徴とするハイブリット自動車。A hybrid vehicle in which wheels are driven by an engine and a motor,
A power semiconductor device that uses electrodes on the upper and lower surfaces for input and output of the main current is provided in the upper arm and the lower arm, and includes a power conversion device that converts power from the battery and supplies power to the motor.
A power semiconductor of a semiconductor device in which a conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. is used, and the upper electrode of the power semiconductor element and the conductor plate are joined using solder, gold, or silver. Electrical connection between the element and the heat sink
The hybrid motor according to claim 1, wherein the motor is mounted in an engine room with the heat dissipation plate electrically and mechanically fixed to a bracket.
主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を備え、
それぞれの厚さが1:(1〜2):1の銅板、鉄ニッケル合金板、銅板からなる積層導体板を用い、前記パワー半導体の上面電極と前記積層導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置のパワー半導体素子と放熱板を電気接続し、
前記モータは、前記放熱板がブラケットに電気的かつ機械的に固定されて、エンジンルームに搭載されていることを特徴とするハイブリット自動車。A hybrid vehicle in which wheels are driven by an engine and a motor,
A power semiconductor device that uses electrodes on the upper and lower surfaces for input and output of the main current is provided in the upper arm and the lower arm, and includes a power conversion device that converts power from the battery and supplies power to the motor.
A laminated conductor plate made of a copper plate, an iron-nickel alloy plate, and a copper plate having a thickness of 1: (1-2): 1 is used, and the upper electrode of the power semiconductor and the laminated conductor plate are made of solder, gold, or silver. Electrical connection between the power semiconductor element and the heat sink of the semiconductor device joined using any material,
The hybrid motor according to claim 1, wherein the motor is mounted in an engine room with the heat dissipation plate electrically and mechanically fixed to a bracket.
主電流の入出に上下2面の電極を用いるパワー半導体素子を上アーム及び下アームに有し、バッテリーからの電力を変換して、前記モータに電力を供給する電力変換装置を有するモータ駆動システムであって、
線膨張率が8から12ppm/℃の範囲の導体板を用い、前記パワー半導体素子の上面電極と前記導体板を半田或いは、金または銀のいずれかの材料を用いて接合した半導体装置のパワー半導体素子と放熱板を電気接続し、
前記モータは、前記放熱板がブラケットに電気的かつ機械的に固定されて、エンジンルームに搭載されていることを特徴とするモータ駆動システム。A motor composed of a stator and a rotor;
A motor drive system having power semiconductor devices using upper and lower electrodes for input and output of a main current in an upper arm and a lower arm, and converting power from a battery and supplying power to the motor. There,
A power semiconductor of a semiconductor device in which a conductor plate having a linear expansion coefficient in the range of 8 to 12 ppm / ° C. is used, and the upper electrode of the power semiconductor element and the conductor plate are joined using solder, gold, or silver. Electrical connection between the element and the heat sink
The motor drive system according to claim 1, wherein the heat radiating plate is electrically and mechanically fixed to a bracket and mounted in an engine room.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2004/000660 WO2005071733A1 (en) | 2004-01-26 | 2004-01-26 | Semiconductor device, power converter employing it, motor employing it, hybrid automobile employing it, and motor drive system employing it |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2005071733A1 true JPWO2005071733A1 (en) | 2007-07-26 |
Family
ID=34805298
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005517178A Pending JPWO2005071733A1 (en) | 2004-01-26 | 2004-01-26 | Semiconductor device, power conversion device using the same, motor using the same, hybrid vehicle using the same, and motor drive system using the same |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2005071733A1 (en) |
WO (1) | WO2005071733A1 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010062453A1 (en) * | 2010-12-06 | 2012-06-06 | Robert Bosch Gmbh | Semiconductor device with increased stability to thermo-mechanical influences and method for contacting a semiconductor |
JP2012145489A (en) * | 2011-01-13 | 2012-08-02 | Sankei Engineering:Kk | Manufacturing method of inspection probe |
DE102012208251A1 (en) * | 2012-05-16 | 2013-11-21 | Robert Bosch Gmbh | Electrical contacting for semiconductors |
JP6494178B2 (en) * | 2014-05-22 | 2019-04-03 | 三菱電機株式会社 | Power semiconductor device |
JP6576108B2 (en) * | 2015-06-08 | 2019-09-18 | 三菱電機株式会社 | Power semiconductor device |
JP6460160B2 (en) * | 2017-06-27 | 2019-01-30 | 日立金属株式会社 | Electrical connection member, electrical connection structure, and method of manufacturing electrical connection member |
US20210257327A1 (en) * | 2018-11-30 | 2021-08-19 | Hitachi Metals, Ltd. | Electrical connection member, electrical connection structure, and method for manufacturing electrical connection member |
US20220302071A1 (en) | 2019-06-20 | 2022-09-22 | Rohm Co., Ltd. | Semiconductor device and production method for semiconductor device |
JP7392558B2 (en) * | 2020-04-13 | 2023-12-06 | 住友電気工業株式会社 | optical module |
CN112410178B (en) * | 2020-12-04 | 2023-07-04 | 中国科学院青藏高原研究所 | Microorganism preservation device of control by temperature change |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0936186A (en) * | 1995-07-24 | 1997-02-07 | Hitachi Ltd | Power semiconductor module and its mounting method |
JP2001036001A (en) * | 1999-07-21 | 2001-02-09 | Toyota Central Res & Dev Lab Inc | Power semiconductor module |
JP2004128264A (en) * | 2002-10-03 | 2004-04-22 | Toyota Industries Corp | Semiconductor module and flat lead |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11163045A (en) * | 1997-11-26 | 1999-06-18 | Toshiba Corp | Semiconductor device and its manufacture |
JP3664650B2 (en) * | 2000-12-18 | 2005-06-29 | 三菱電機株式会社 | Control device integrated motor |
JP3744431B2 (en) * | 2002-01-31 | 2006-02-08 | トヨタ自動車株式会社 | Semiconductor device and manufacturing method thereof |
JP3869755B2 (en) * | 2002-05-16 | 2007-01-17 | 三洋電機株式会社 | Semiconductor device |
-
2004
- 2004-01-26 WO PCT/JP2004/000660 patent/WO2005071733A1/en active Application Filing
- 2004-01-26 JP JP2005517178A patent/JPWO2005071733A1/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0936186A (en) * | 1995-07-24 | 1997-02-07 | Hitachi Ltd | Power semiconductor module and its mounting method |
JP2001036001A (en) * | 1999-07-21 | 2001-02-09 | Toyota Central Res & Dev Lab Inc | Power semiconductor module |
JP2004128264A (en) * | 2002-10-03 | 2004-04-22 | Toyota Industries Corp | Semiconductor module and flat lead |
Also Published As
Publication number | Publication date |
---|---|
WO2005071733A1 (en) | 2005-08-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4293246B2 (en) | Power converter | |
EP1843453B1 (en) | Rotary electric machine | |
JP4054137B2 (en) | Power semiconductor element power supply and heat dissipation device | |
JP4378239B2 (en) | A semiconductor device, a power conversion device using the semiconductor device, and a hybrid vehicle using the power conversion device. | |
JP4147987B2 (en) | Multi-phase AC rotating electric machine | |
US20140151146A1 (en) | Mold module utilized as power unit of electric power steering apparatus and electric power steering apparatus | |
US8552283B2 (en) | Thermoelectric application for waste heat recovery from semiconductor devices in power electronics systems | |
US7362001B2 (en) | Generator-motor | |
JP2008029093A (en) | Power conversion equipment | |
JP4166804B2 (en) | Controller-integrated rotating electrical machine | |
WO2015112691A1 (en) | B+ mounted integrated active rectifier electronics | |
JPWO2005071733A1 (en) | Semiconductor device, power conversion device using the same, motor using the same, hybrid vehicle using the same, and motor drive system using the same | |
JP4015634B2 (en) | Semiconductor device | |
JP2009130201A (en) | Semiconductor device | |
JP2004031590A (en) | Semiconductor device | |
JP2006165409A (en) | Power conversion equipment | |
JP2007081155A (en) | Semiconductor device | |
JP3972855B2 (en) | Inverter module | |
JP2008041851A (en) | Power semiconductor device | |
CN106165280B (en) | It is molded module | |
US20070108855A1 (en) | Vehicle alternator | |
JP5083665B2 (en) | Rotating electric machine for vehicles | |
JP4227987B2 (en) | Rotating electric machine and manufacturing method thereof | |
US20230148137A1 (en) | Semiconductor Device, Power Module, Inverter Device, and Electric Vehicle | |
JP2019160969A (en) | Power conversion device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090224 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20090714 |