JPS649376A - Timing calibration system - Google Patents

Timing calibration system

Info

Publication number
JPS649376A
JPS649376A JP62162306A JP16230687A JPS649376A JP S649376 A JPS649376 A JP S649376A JP 62162306 A JP62162306 A JP 62162306A JP 16230687 A JP16230687 A JP 16230687A JP S649376 A JPS649376 A JP S649376A
Authority
JP
Japan
Prior art keywords
value
time difference
voltage
time
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62162306A
Other languages
Japanese (ja)
Inventor
Ryozo Yoshino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62162306A priority Critical patent/JPS649376A/en
Publication of JPS649376A publication Critical patent/JPS649376A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To shorten the executing time of calibration and to make it possible to perform highly accurate timing calibration, by using the same device for a DA converter, which converts a time difference into a digital (D) value, and for a DA converter, which converts a time value for setting a delay time into an analog (A) voltage value. CONSTITUTION:At first, a delay time for a switch circuit 6 is obtained as a time difference with respect to a reference clock in a phase comparator 14. The time difference is converted into a D value. Namely, the time difference with respect to the reference clock, which is obtained in the comparator 14, is converted into a DC voltage. A D input value of a DAC 17 is controlled so that the DC voltage and the A output of a DA converter (C) 17 become equal. The output of the time difference from comparator 14 undergoes D conversion. When the time difference correction is set, the D value obtained by the D conversion of the delay time is added to the correcting value. The result is inputted into the DAC 17 as the D value. A variable D delay circuit 4 is controlled so that the A output of the DAC 17 agrees with the DC voltage, which is obtained by converting the output of the comparator into the DC voltage. Thus the time difference correction is set.
JP62162306A 1987-07-01 1987-07-01 Timing calibration system Pending JPS649376A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62162306A JPS649376A (en) 1987-07-01 1987-07-01 Timing calibration system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62162306A JPS649376A (en) 1987-07-01 1987-07-01 Timing calibration system

Publications (1)

Publication Number Publication Date
JPS649376A true JPS649376A (en) 1989-01-12

Family

ID=15752001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62162306A Pending JPS649376A (en) 1987-07-01 1987-07-01 Timing calibration system

Country Status (1)

Country Link
JP (1) JPS649376A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7094067B2 (en) 2002-10-21 2006-08-22 Hosiden Corporation Connection structure between printed circuit board and flexible circuit board
JP2008286524A (en) * 2007-05-15 2008-11-27 Yokogawa Electric Corp Apparatus for testing semiconductor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7094067B2 (en) 2002-10-21 2006-08-22 Hosiden Corporation Connection structure between printed circuit board and flexible circuit board
JP2008286524A (en) * 2007-05-15 2008-11-27 Yokogawa Electric Corp Apparatus for testing semiconductor

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