JPS6489337A - Semiconductor device and manufacture thereof - Google Patents
Semiconductor device and manufacture thereofInfo
- Publication number
- JPS6489337A JPS6489337A JP24541087A JP24541087A JPS6489337A JP S6489337 A JPS6489337 A JP S6489337A JP 24541087 A JP24541087 A JP 24541087A JP 24541087 A JP24541087 A JP 24541087A JP S6489337 A JPS6489337 A JP S6489337A
- Authority
- JP
- Japan
- Prior art keywords
- groove
- film
- covered
- isolating
- sio2 film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Element Separation (AREA)
- Local Oxidation Of Silicon (AREA)
Abstract
PURPOSE:To prevent a crystal defect from occurring and to accurately form an element isolating region by opening an isolating groove between semiconductor elements when the elements formed on a semiconductor substrate are isolated by the groove, and burying a material having small dielectric constant in the bottom of the groove while covering the inner face with an SiO2 film and a material having large permittivity in the upper part. CONSTITUTION:An SiO2 film 12 and an Si3N4 film 13 are laminated on an Si substrate 11, a window is opened corresponding to the forming region of a semiconductor element isolating groove 14, and an isolating groove 14 is opened by etching. Then, with the remaining film 13 as a mask boron ions are implanted only to the bottom of the groove 14 to generate an inversion preventing layer 15, the inner face of the groove 14 is covered with an SiO2 film 16, and the bottom to the sidewall of the groove 14 and further to the film 13 are covered with silica glass 17 containing B and P. Thereafter, the glass 17 is softened by heat treating in an N2 atmosphere, fed to substantially the half of the depth of the groove 14, a polycrystalline Si layer 18 is grown on a whole surface while burying the groove, all the layers on the film 12 are removed while allowing it to remain only in the groove 14, and the face of the layer 18 exposed in the groove 14 is covered with an SiO2 film 19.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24541087A JPS6489337A (en) | 1987-09-29 | 1987-09-29 | Semiconductor device and manufacture thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24541087A JPS6489337A (en) | 1987-09-29 | 1987-09-29 | Semiconductor device and manufacture thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6489337A true JPS6489337A (en) | 1989-04-03 |
Family
ID=17133239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24541087A Pending JPS6489337A (en) | 1987-09-29 | 1987-09-29 | Semiconductor device and manufacture thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6489337A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04217343A (en) * | 1990-12-19 | 1992-08-07 | Matsushita Electron Corp | Semiconductor device and fabrication thereof |
-
1987
- 1987-09-29 JP JP24541087A patent/JPS6489337A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04217343A (en) * | 1990-12-19 | 1992-08-07 | Matsushita Electron Corp | Semiconductor device and fabrication thereof |
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