JPS6488516A - Detector for quantity of fluctuation of optical beam of optical scanner - Google Patents

Detector for quantity of fluctuation of optical beam of optical scanner

Info

Publication number
JPS6488516A
JPS6488516A JP62246228A JP24622887A JPS6488516A JP S6488516 A JPS6488516 A JP S6488516A JP 62246228 A JP62246228 A JP 62246228A JP 24622887 A JP24622887 A JP 24622887A JP S6488516 A JPS6488516 A JP S6488516A
Authority
JP
Japan
Prior art keywords
fluctuation
photodetector
slit
light beam
scan line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62246228A
Other languages
Japanese (ja)
Inventor
Takemi Karasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shaken Co Ltd
Photo Composing Machine Manufacturing Co Ltd
Original Assignee
Shaken Co Ltd
Photo Composing Machine Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shaken Co Ltd, Photo Composing Machine Manufacturing Co Ltd filed Critical Shaken Co Ltd
Priority to JP62246228A priority Critical patent/JPS6488516A/en
Publication of JPS6488516A publication Critical patent/JPS6488516A/en
Pending legal-status Critical Current

Links

Landscapes

  • Dot-Matrix Printers And Others (AREA)
  • Laser Beam Printer (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Fax Reproducing Arrangements (AREA)

Abstract

PURPOSE:To heighten the measuring accuracy of a quantity of fluctuation in an optical scanner with high density by detecting the quantity of fluctuation from a time difference generated when a light beam from each plane of a rotary polygonal mirror passes through a slit. CONSTITUTION:A photodetector arranged at an arbitrary position on a main scan line and a triangular light transmissive slit 21 arranged on the photoreceiving plane 22 of the photodetector are provided. Such photodetector is assembled in a fluctuation quantity detector 7, and it is arranged so that the main scan line can pass the triangular slit 21. Next, the time difference generated when the light beam from each plane of the rotary polygonal mirror passes through the slit is found, and it is converted to a voltage equivalent to a relative quantity of fluctuation between light beams, then, it is detected. In such a way, not only no measuring value changes due to the secular change of an optical beam oscillator or the temperature change of the photodetector, but it is possible to detect the quantity of fluctuation of the light beam to be scanned at high speed in a subscan direction by the relative difference of each scan line with high accuracy, and to correct the fluctuation of the light beam in the subscan direction.
JP62246228A 1987-09-30 1987-09-30 Detector for quantity of fluctuation of optical beam of optical scanner Pending JPS6488516A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62246228A JPS6488516A (en) 1987-09-30 1987-09-30 Detector for quantity of fluctuation of optical beam of optical scanner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62246228A JPS6488516A (en) 1987-09-30 1987-09-30 Detector for quantity of fluctuation of optical beam of optical scanner

Publications (1)

Publication Number Publication Date
JPS6488516A true JPS6488516A (en) 1989-04-03

Family

ID=17145421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62246228A Pending JPS6488516A (en) 1987-09-30 1987-09-30 Detector for quantity of fluctuation of optical beam of optical scanner

Country Status (1)

Country Link
JP (1) JPS6488516A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5245181A (en) * 1991-06-24 1993-09-14 Dainippon Screen Mfg. Co., Ltd. Method and apparatus of detecting deviation of scanning line of light beam
EP0718659A1 (en) * 1994-12-21 1996-06-26 Eastman Kodak Company Apparatus and method for measuring dimensions of scanning spot of light
JPH09164720A (en) * 1995-12-15 1997-06-24 Nec Corp Optical scanning device
US9971273B2 (en) 2015-11-30 2018-05-15 Canon Kabushiki Kaisha Image forming apparatus
JP2018189765A (en) * 2017-05-01 2018-11-29 キヤノン株式会社 Image formation apparatus
WO2022014076A1 (en) * 2020-07-14 2022-01-20 株式会社日立製作所 Position detection device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55144206A (en) * 1979-04-27 1980-11-11 Mitsubishi Electric Corp Laser light deflector
JPS59148023A (en) * 1983-02-15 1984-08-24 Nec Corp Correction system for surface inclination of rotary polygon mirror

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55144206A (en) * 1979-04-27 1980-11-11 Mitsubishi Electric Corp Laser light deflector
JPS59148023A (en) * 1983-02-15 1984-08-24 Nec Corp Correction system for surface inclination of rotary polygon mirror

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5245181A (en) * 1991-06-24 1993-09-14 Dainippon Screen Mfg. Co., Ltd. Method and apparatus of detecting deviation of scanning line of light beam
EP0718659A1 (en) * 1994-12-21 1996-06-26 Eastman Kodak Company Apparatus and method for measuring dimensions of scanning spot of light
JPH09164720A (en) * 1995-12-15 1997-06-24 Nec Corp Optical scanning device
US9971273B2 (en) 2015-11-30 2018-05-15 Canon Kabushiki Kaisha Image forming apparatus
JP2018189765A (en) * 2017-05-01 2018-11-29 キヤノン株式会社 Image formation apparatus
WO2022014076A1 (en) * 2020-07-14 2022-01-20 株式会社日立製作所 Position detection device

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