JPS5630630A - Foreign matter detector - Google Patents
Foreign matter detectorInfo
- Publication number
- JPS5630630A JPS5630630A JP10661079A JP10661079A JPS5630630A JP S5630630 A JPS5630630 A JP S5630630A JP 10661079 A JP10661079 A JP 10661079A JP 10661079 A JP10661079 A JP 10661079A JP S5630630 A JPS5630630 A JP S5630630A
- Authority
- JP
- Japan
- Prior art keywords
- laser light
- wafer
- light
- foreign matter
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To improve the foreign matter detection accuracy by providing a cylindrical lens on the light path of laser light. CONSTITUTION:A cylindrical lens 13 is provided on the light path of laser light 30 between a laser oscillator 20 and a foreign matter detecting points on a wafer 1. By this arrangement, when laser light 30 from the laser oscillator 20 is irradiated on the wafer 1, laser light can be throttled without varying its width, and the laser light irradiated surface 15 on the wafer 1 is extremely narrowed. Accordingly, even when an angle formed by the wafer 1 and laser light 30 is small, the quantity of light per unit area of the laser light irradiated surface 15, is increased, the detected quantity obtained by photoelectrically converting reflected light rays from the foreign matters and patterns is increased, thus enabling the use of a low-pass filter of a high cutoff frequency and achieving a desired object.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10661079A JPS5630630A (en) | 1979-08-23 | 1979-08-23 | Foreign matter detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10661079A JPS5630630A (en) | 1979-08-23 | 1979-08-23 | Foreign matter detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5630630A true JPS5630630A (en) | 1981-03-27 |
JPH0228803B2 JPH0228803B2 (en) | 1990-06-26 |
Family
ID=14437878
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10661079A Granted JPS5630630A (en) | 1979-08-23 | 1979-08-23 | Foreign matter detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5630630A (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58130256U (en) * | 1982-02-25 | 1983-09-02 | 日本電気ホームエレクトロニクス株式会社 | Pellet appearance inspection equipment |
JPS61117433A (en) * | 1984-11-14 | 1986-06-04 | Hitachi Ltd | Method and device for detecting foreign matter |
JPS61162738A (en) * | 1985-01-11 | 1986-07-23 | Hitachi Ltd | Inspection of foreign matter |
JPS61253448A (en) * | 1985-05-07 | 1986-11-11 | Hitachi Ltd | Foreign matter inspecting device |
JPS6269150A (en) * | 1985-09-24 | 1987-03-30 | Hitachi Electronics Eng Co Ltd | Inspecting device for foreign matter in wafer |
JPS6326559A (en) * | 1986-07-21 | 1988-02-04 | Hitachi Ltd | Foreign matter inspection device |
JPS63241343A (en) * | 1988-02-24 | 1988-10-06 | Nikon Corp | Defect inspector |
US5134962A (en) * | 1989-09-29 | 1992-08-04 | Hitachi, Ltd. | Spin coating apparatus |
JPH0650903A (en) * | 1992-06-11 | 1994-02-25 | Internatl Business Mach Corp <Ibm> | Apparatus and method for detecting surface particle |
JP2001512237A (en) * | 1997-08-01 | 2001-08-21 | ケーエルエー−テンカー コーポレイション | System for detecting surface anomalies and / or features |
US6366690B1 (en) | 1998-07-07 | 2002-04-02 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
JP2012533756A (en) * | 2009-07-22 | 2012-12-27 | ケーエルエー−テンカー・コーポレーション | Dark field inspection system with ring illumination |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50137784A (en) * | 1974-04-20 | 1975-11-01 |
-
1979
- 1979-08-23 JP JP10661079A patent/JPS5630630A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50137784A (en) * | 1974-04-20 | 1975-11-01 |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58130256U (en) * | 1982-02-25 | 1983-09-02 | 日本電気ホームエレクトロニクス株式会社 | Pellet appearance inspection equipment |
JPS61117433A (en) * | 1984-11-14 | 1986-06-04 | Hitachi Ltd | Method and device for detecting foreign matter |
JPS61162738A (en) * | 1985-01-11 | 1986-07-23 | Hitachi Ltd | Inspection of foreign matter |
JPS61253448A (en) * | 1985-05-07 | 1986-11-11 | Hitachi Ltd | Foreign matter inspecting device |
JPS6269150A (en) * | 1985-09-24 | 1987-03-30 | Hitachi Electronics Eng Co Ltd | Inspecting device for foreign matter in wafer |
JPS6326559A (en) * | 1986-07-21 | 1988-02-04 | Hitachi Ltd | Foreign matter inspection device |
JPS63241343A (en) * | 1988-02-24 | 1988-10-06 | Nikon Corp | Defect inspector |
US5134962A (en) * | 1989-09-29 | 1992-08-04 | Hitachi, Ltd. | Spin coating apparatus |
JPH0650903A (en) * | 1992-06-11 | 1994-02-25 | Internatl Business Mach Corp <Ibm> | Apparatus and method for detecting surface particle |
JP2001512237A (en) * | 1997-08-01 | 2001-08-21 | ケーエルエー−テンカー コーポレイション | System for detecting surface anomalies and / or features |
US7869023B2 (en) | 1997-08-01 | 2011-01-11 | Kla-Tencor Corporation | System for detecting anomalies and/or features of a surface |
US6366690B1 (en) | 1998-07-07 | 2002-04-02 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
US6810139B2 (en) | 1998-07-07 | 2004-10-26 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
US7016526B2 (en) | 1998-07-07 | 2006-03-21 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
US7454052B2 (en) | 1998-07-07 | 2008-11-18 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
JP2012533756A (en) * | 2009-07-22 | 2012-12-27 | ケーエルエー−テンカー・コーポレーション | Dark field inspection system with ring illumination |
US9176072B2 (en) | 2009-07-22 | 2015-11-03 | Kla-Tencor Corporation | Dark field inspection system with ring illumination |
Also Published As
Publication number | Publication date |
---|---|
JPH0228803B2 (en) | 1990-06-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS57108811A (en) | Optical focus position detector | |
JPS5630630A (en) | Foreign matter detector | |
JPS52479A (en) | Optical scanning instrument | |
JPS5295221A (en) | Detector for focusing | |
JPS55149829A (en) | Detector for foreign matter in wafer | |
JPS55119006A (en) | Displacement measuring instrument | |
JPS5689005A (en) | Position detector | |
JPS56138206A (en) | Displacement measuring equipment | |
JPS55154402A (en) | Shape measuring apparatus | |
JPS5629112A (en) | Distance measurement unit | |
JPS5694248A (en) | Detector for foreign matter on surface | |
JPS5669505A (en) | Laser position detecting device | |
JPS55117945A (en) | Defect detection unit | |
JPS57208405A (en) | Device for measuring surface roughness | |
JPS5726704A (en) | Measuring instrument for three-dimensional shape | |
JPS54136888A (en) | Surface defect detecting device | |
JPS5686357A (en) | Direction detector | |
JPS571906A (en) | Discriminator for surface and reverse side of article | |
JPS5648544A (en) | Crack detector | |
JPS57182112A (en) | Range detector | |
JPS5642131A (en) | Method and device for inspecting surface of material | |
JPS56158907A (en) | Shape inspection machine | |
JPS5544926A (en) | Article surface fault detector | |
JPS57116310A (en) | Focus detecting system | |
JPS5576967A (en) | Range detector |