JPS6472309A - Manufacture of thin film magnetic head - Google Patents

Manufacture of thin film magnetic head

Info

Publication number
JPS6472309A
JPS6472309A JP22850687A JP22850687A JPS6472309A JP S6472309 A JPS6472309 A JP S6472309A JP 22850687 A JP22850687 A JP 22850687A JP 22850687 A JP22850687 A JP 22850687A JP S6472309 A JPS6472309 A JP S6472309A
Authority
JP
Japan
Prior art keywords
resist
swell
pattern
exposure
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22850687A
Other languages
Japanese (ja)
Inventor
Shoichi Tsutsumi
Yoshio Takahashi
Kazuo Nakamura
Ikuo Ozasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP22850687A priority Critical patent/JPS6472309A/en
Publication of JPS6472309A publication Critical patent/JPS6472309A/en
Pending legal-status Critical Current

Links

Landscapes

  • Magnetic Heads (AREA)

Abstract

PURPOSE:To prevent the pattern transfer accuracy from being deteriorated due to a swell-up of resist coating by performing an exposure for eliminating a resist swell-up part before an exposure transfer process of a thin film pattern. CONSTITUTION:When a resist 2 is brought to coating on a substrate 1, a swell-up part 2a is formed on the resist 2, in the peripheral edge part of the substrate. Subsequently, by exposing the resist 2 by using a mask 3 having a mask pattern 4 for eliminating this swell-up part 2a and executing a development, the swell-up part is eliminated from the resist 2 on the wafer 1. Next, by executing an exposure by using a mask 5 having a pattern 6 to be formed on the resist 2, and executing a development, a desired pattern 2b is formed on the resist. In such a way, since an exposure process for eliminating the resist swell-up part is contained, the surface of the resist 2 becomes a uniform flat surface and the mask pattern 6 adheres closely to the surface of the resist 2. In such a way, deterioration of the pattern transfer accuracy based on the swell-up of the resist can be prevented.
JP22850687A 1987-09-14 1987-09-14 Manufacture of thin film magnetic head Pending JPS6472309A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22850687A JPS6472309A (en) 1987-09-14 1987-09-14 Manufacture of thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22850687A JPS6472309A (en) 1987-09-14 1987-09-14 Manufacture of thin film magnetic head

Publications (1)

Publication Number Publication Date
JPS6472309A true JPS6472309A (en) 1989-03-17

Family

ID=16877510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22850687A Pending JPS6472309A (en) 1987-09-14 1987-09-14 Manufacture of thin film magnetic head

Country Status (1)

Country Link
JP (1) JPS6472309A (en)

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