JPS6413477A - Testing device for integrated circuit - Google Patents

Testing device for integrated circuit

Info

Publication number
JPS6413477A
JPS6413477A JP62170043A JP17004387A JPS6413477A JP S6413477 A JPS6413477 A JP S6413477A JP 62170043 A JP62170043 A JP 62170043A JP 17004387 A JP17004387 A JP 17004387A JP S6413477 A JPS6413477 A JP S6413477A
Authority
JP
Japan
Prior art keywords
test
pattern
control part
item selection
test item
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62170043A
Other languages
Japanese (ja)
Inventor
Sadaaki Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62170043A priority Critical patent/JPS6413477A/en
Publication of JPS6413477A publication Critical patent/JPS6413477A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To collect test programs to one by reading part of a stored test pattern as test item selection information by a tester control part, and selecting a test item among the test programs and sending it to the tester control part. CONSTITUTION:When the contents of a terminal number are 0, a test pattern with, for example, a line number 0 indicates that a test with the same number as that of the terminal number is not conducted, but when the contents are 1, the pattern means that the test is conducted. At the start of the test, test item selection information on the test pattern with the line number 0 is read out of a pattern storage part 4 by the tester control part 1 through a data bus 6. Then this is sent to a test item selection part 9 and then when a test program stored in the storage part 3 is read out by the control part 1, the selection part 9 selects a test item matching with an IC to be tested among test items described in a test program according to the test item selection information.
JP62170043A 1987-07-07 1987-07-07 Testing device for integrated circuit Pending JPS6413477A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62170043A JPS6413477A (en) 1987-07-07 1987-07-07 Testing device for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62170043A JPS6413477A (en) 1987-07-07 1987-07-07 Testing device for integrated circuit

Publications (1)

Publication Number Publication Date
JPS6413477A true JPS6413477A (en) 1989-01-18

Family

ID=15897552

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62170043A Pending JPS6413477A (en) 1987-07-07 1987-07-07 Testing device for integrated circuit

Country Status (1)

Country Link
JP (1) JPS6413477A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0317575A (en) * 1989-06-14 1991-01-25 Mitsubishi Electric Corp Lsi testing apparatus
JPH0843053A (en) * 1994-07-26 1996-02-16 Matsushita Electric Works Ltd Apparatus for inspecting appearance

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0317575A (en) * 1989-06-14 1991-01-25 Mitsubishi Electric Corp Lsi testing apparatus
JPH0843053A (en) * 1994-07-26 1996-02-16 Matsushita Electric Works Ltd Apparatus for inspecting appearance

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