JPS6413477A - Testing device for integrated circuit - Google Patents
Testing device for integrated circuitInfo
- Publication number
- JPS6413477A JPS6413477A JP62170043A JP17004387A JPS6413477A JP S6413477 A JPS6413477 A JP S6413477A JP 62170043 A JP62170043 A JP 62170043A JP 17004387 A JP17004387 A JP 17004387A JP S6413477 A JPS6413477 A JP S6413477A
- Authority
- JP
- Japan
- Prior art keywords
- test
- pattern
- control part
- item selection
- test item
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To collect test programs to one by reading part of a stored test pattern as test item selection information by a tester control part, and selecting a test item among the test programs and sending it to the tester control part. CONSTITUTION:When the contents of a terminal number are 0, a test pattern with, for example, a line number 0 indicates that a test with the same number as that of the terminal number is not conducted, but when the contents are 1, the pattern means that the test is conducted. At the start of the test, test item selection information on the test pattern with the line number 0 is read out of a pattern storage part 4 by the tester control part 1 through a data bus 6. Then this is sent to a test item selection part 9 and then when a test program stored in the storage part 3 is read out by the control part 1, the selection part 9 selects a test item matching with an IC to be tested among test items described in a test program according to the test item selection information.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62170043A JPS6413477A (en) | 1987-07-07 | 1987-07-07 | Testing device for integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62170043A JPS6413477A (en) | 1987-07-07 | 1987-07-07 | Testing device for integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6413477A true JPS6413477A (en) | 1989-01-18 |
Family
ID=15897552
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62170043A Pending JPS6413477A (en) | 1987-07-07 | 1987-07-07 | Testing device for integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6413477A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0317575A (en) * | 1989-06-14 | 1991-01-25 | Mitsubishi Electric Corp | Lsi testing apparatus |
JPH0843053A (en) * | 1994-07-26 | 1996-02-16 | Matsushita Electric Works Ltd | Apparatus for inspecting appearance |
-
1987
- 1987-07-07 JP JP62170043A patent/JPS6413477A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0317575A (en) * | 1989-06-14 | 1991-01-25 | Mitsubishi Electric Corp | Lsi testing apparatus |
JPH0843053A (en) * | 1994-07-26 | 1996-02-16 | Matsushita Electric Works Ltd | Apparatus for inspecting appearance |
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