JPS6410619A - Vapor phase epitaxial growth method - Google Patents

Vapor phase epitaxial growth method

Info

Publication number
JPS6410619A
JPS6410619A JP16596787A JP16596787A JPS6410619A JP S6410619 A JPS6410619 A JP S6410619A JP 16596787 A JP16596787 A JP 16596787A JP 16596787 A JP16596787 A JP 16596787A JP S6410619 A JPS6410619 A JP S6410619A
Authority
JP
Japan
Prior art keywords
single crystal
gaas
temperature
carrier gas
crystal substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16596787A
Other languages
Japanese (ja)
Inventor
Tatsuhiko Kawakami
Hideki Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Kasei Polytec Co
Mitsubishi Kasei Corp
Original Assignee
Mitsubishi Kasei Corp
Mitsubishi Monsanto Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Kasei Corp, Mitsubishi Monsanto Chemical Co filed Critical Mitsubishi Kasei Corp
Priority to JP16596787A priority Critical patent/JPS6410619A/en
Publication of JPS6410619A publication Critical patent/JPS6410619A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To avoid a deterioration in an FET characteristic due to a pileup of Si, the roughened surface or the like by a method wherein a temperature of a substrate is raised in a stream of a carrier gas containing arsine (AsH3). CONSTITUTION:In a method to grow a GaAs crystal layer on a single crystal substrate whose temperature is kept at a prescribed value bg a VPE method by using AsCl3 as an As source, metal Ga as a Ga source and H2 as a carrier gas, a temperature of the single crystal substrate is raised to a prescribed temperature value in a stream of the carrier gas containing AsH3. If the single crystal substrate whose lattice constant does not differ from that of GaAs or differs from that of GaAs slightly is used, it is possible to favorably obtain a GaAs single crystal layer whose crystallinity is good. When the GaAs single crystal layer is grown, the temperature of the single crystal substrate is usually kept at 700-750 deg.C.
JP16596787A 1987-07-02 1987-07-02 Vapor phase epitaxial growth method Pending JPS6410619A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16596787A JPS6410619A (en) 1987-07-02 1987-07-02 Vapor phase epitaxial growth method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16596787A JPS6410619A (en) 1987-07-02 1987-07-02 Vapor phase epitaxial growth method

Publications (1)

Publication Number Publication Date
JPS6410619A true JPS6410619A (en) 1989-01-13

Family

ID=15822411

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16596787A Pending JPS6410619A (en) 1987-07-02 1987-07-02 Vapor phase epitaxial growth method

Country Status (1)

Country Link
JP (1) JPS6410619A (en)

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