JPS62193123A - パタ−ン位置合わせ方法 - Google Patents

パタ−ン位置合わせ方法

Info

Publication number
JPS62193123A
JPS62193123A JP61034228A JP3422886A JPS62193123A JP S62193123 A JPS62193123 A JP S62193123A JP 61034228 A JP61034228 A JP 61034228A JP 3422886 A JP3422886 A JP 3422886A JP S62193123 A JPS62193123 A JP S62193123A
Authority
JP
Japan
Prior art keywords
manual alignment
pattern
target
alignment marks
marks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61034228A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0222532B2 (zh
Inventor
Mamoru Kaneko
守 金子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP61034228A priority Critical patent/JPS62193123A/ja
Publication of JPS62193123A publication Critical patent/JPS62193123A/ja
Publication of JPH0222532B2 publication Critical patent/JPH0222532B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP61034228A 1986-02-19 1986-02-19 パタ−ン位置合わせ方法 Granted JPS62193123A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61034228A JPS62193123A (ja) 1986-02-19 1986-02-19 パタ−ン位置合わせ方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61034228A JPS62193123A (ja) 1986-02-19 1986-02-19 パタ−ン位置合わせ方法

Publications (2)

Publication Number Publication Date
JPS62193123A true JPS62193123A (ja) 1987-08-25
JPH0222532B2 JPH0222532B2 (zh) 1990-05-18

Family

ID=12408287

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61034228A Granted JPS62193123A (ja) 1986-02-19 1986-02-19 パタ−ン位置合わせ方法

Country Status (1)

Country Link
JP (1) JPS62193123A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0276214A (ja) * 1988-09-12 1990-03-15 Oki Electric Ind Co Ltd ホトリソグラフィー工程におけるガラスマスク

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0276214A (ja) * 1988-09-12 1990-03-15 Oki Electric Ind Co Ltd ホトリソグラフィー工程におけるガラスマスク

Also Published As

Publication number Publication date
JPH0222532B2 (zh) 1990-05-18

Similar Documents

Publication Publication Date Title
TWI302341B (en) Improved overlay mark
KR102633183B1 (ko) 포토리소그래피 마스크의 정렬 방법 및 반도체 재료의 웨이퍼에서 집적 회로를 제조하기 위한 대응 공정 방법
US8440372B2 (en) Single field zero mask for increased alignment accuracy in field stitching
JP2003257828A (ja) 半導体装置の製造方法
JPH0450730B2 (zh)
EP0459737A2 (en) Reticle for a reduced projection exposure apparatus
TW200809392A (en) Overlay mark
JPS62193123A (ja) パタ−ン位置合わせ方法
JP3580992B2 (ja) フォトマスク
JPH1069059A (ja) レチクルマスクの作成方法
JPS62193124A (ja) パタ−ン位置合わせ方法
JP2001102285A (ja) 位置合わせマーク
JPH0276214A (ja) ホトリソグラフィー工程におけるガラスマスク
JPS62193121A (ja) パタ−ン位置合わせ方法
JPH01191416A (ja) パターン形成方法
JPS62193122A (ja) パタ−ン位置合わせ方法
JP2647835B2 (ja) ウェハーの露光方法
JPH06342745A (ja) アライメント精度測定用マーク
JPH0387013A (ja) 半導体装置の製造方法
JP2977471B2 (ja) ウエハのアラインメントマークの配置方法
JPS59161033A (ja) フオトマスク
JPS62229923A (ja) 半導体チツプにマ−クを形成する方法
JPS58173832A (ja) ウエ−ハアラインメント方法
JP2002328461A (ja) マスク及びそれを用いた露光方法
JPH04148529A (ja) 半導体ウエハとフォトマスクとの位置合せ方法

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term