JPS61229549A - Manufacture of ceramic multilayer wiring substrate - Google Patents

Manufacture of ceramic multilayer wiring substrate

Info

Publication number
JPS61229549A
JPS61229549A JP7121785A JP7121785A JPS61229549A JP S61229549 A JPS61229549 A JP S61229549A JP 7121785 A JP7121785 A JP 7121785A JP 7121785 A JP7121785 A JP 7121785A JP S61229549 A JPS61229549 A JP S61229549A
Authority
JP
Japan
Prior art keywords
multilayer wiring
silver
copper
ceramic
cavity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7121785A
Other languages
Japanese (ja)
Inventor
栄田 正孝
徹 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP7121785A priority Critical patent/JPS61229549A/en
Publication of JPS61229549A publication Critical patent/JPS61229549A/en
Pending legal-status Critical Current

Links

Landscapes

  • Laminated Bodies (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (産業上の利用分野)1 コンピュータや、テレビ等の電子装置の演算↑5各。[Detailed description of the invention] (Industrial application field) 1 Calculation of electronic devices such as computers and televisions ↑ 5 each.

!外環の操作を行なうための半導体素子用セラミックパ
ッケージやセラミック多層配線基板の製造方法に関する
ものである。
! The present invention relates to a method of manufacturing a ceramic package for a semiconductor element and a ceramic multilayer wiring board for operating an outer ring.

(従来の技術) 近年I jC+LSI等の各種半導体素子を、コンピュ
ータやテレビ等の、電子装置に用いることによシ機能Q
充実や演算その他の処理の多様化やさらに装置自体の小
型化が進められている。特に、4セラミツク多層配線基
板(以下配線基板と略17)は信頼性の高さおよび放熱
性の良好さという面で大量に用いられている。
(Prior art) In recent years, various semiconductor devices such as IjC+LSI have been used in electronic devices such as computers and televisions to improve function Q.
Progress is being made in increasing the number of devices, diversifying calculations and other processing, and downsizing the devices themselves. In particular, 4-ceramic multilayer wiring boards (hereinafter referred to as wiring boards) are widely used because of their high reliability and good heat dissipation.

従来や興線基板は、アルミナグリーンの上に。Conventional and wire board are on alumina green.

タングステンやモリブデンの金属粉末を印刷し九グリー
ンシー)!、数枚交互に重ねて積層化を行ない1.51
還元!囲気中で焼結し、一体化を行なりて製造さ些てい
た。が、焼結温度が1500〜1600℃と高温であり
前記焼結に長時間を要し、還元雰囲気を長時間保つため
の窒素ガスや水素ガスの消□費量が膨大なものでTo?
た。また、アルミナとの 。
Printed with tungsten or molybdenum metal powder (nine green seas)! , laminated by stacking several sheets alternately, 1.51
reduction! It was manufactured by sintering and integrating in an atmosphere. However, the sintering temperature is as high as 1500 to 1600°C, and the sintering process takes a long time, and the consumption of nitrogen gas and hydrogen gas to maintain the reducing atmosphere for a long time is enormous.
Ta. Also with alumina.

焼結温度の関係で、配置用材料としてタン夛ステンやモ
リブデンを用いることを余儀なく畜れてい□た。
Due to the sintering temperature, it was necessary to use tantalum or molybdenum as the material for placement.

(発明が解決しようとする問題点) 前記のような構成の製造方法では、還元雰囲気を保つた
めの窒素ガスや水素ガスの消費が多く、経済性において
多大な欠点があると共に1還元雰 囲気を保つための特
殊電気炉、ガス静置設備等の1製造設備の効率が悪かり
た。□ ■ 畜らに大きな欠点は、配線用材料i用−られるタングス
テンやモリブデンの電気抵抗率が室温において約5.5
 X 10−6Ω1であり、銀や銅の電気抵抗本釣2X
10−’Ω儂と比較して2倍以上も高いために、信号伝
送損失や伝達時間の遅れが大きく、電子回路の設計上大
きな問題となりていた。
(Problems to be Solved by the Invention) The manufacturing method configured as described above consumes a large amount of nitrogen gas and hydrogen gas to maintain a reducing atmosphere, and has a great disadvantage in terms of economy. The efficiency of manufacturing equipment, such as a special electric furnace and gas stationary equipment, was poor. □ ■ The biggest drawback is that the electrical resistivity of tungsten and molybdenum, which are used for wiring materials, is about 5.5 at room temperature.
X 10-6Ω1, and the electrical resistance of silver or copper is 2X
Since it is more than twice as high as 10-'Ω, it causes large signal transmission loss and transmission time delay, which has been a major problem in the design of electronic circuits.

(問題点を解決するための手段) 本発明は、前記問題点を解決するために、銀や鋼を配線
材料とし、901以上の高純度アルミナ1絶縁体用材料
としている。ti、製造方法としては、所要、の多層配
線回路と同一のパターンを、焼成段階で燃焼または昇華
によって飛散する材料を用いて、セラミ、、ツク生シー
トの中に形成、し、前記セラミックシートを空気中で焼
成してセラミック基板の中に所要の多層配線回路と同一
の空洞を形成し、前記空洞の中に高温液体状態の銀や銅
を高圧力で圧入した後に、前詰銀や鋼を冷□却して配線
基板を構成した。
(Means for Solving the Problems) In order to solve the above problems, the present invention uses silver or steel as a wiring material, and uses high purity alumina 1 of 901 or higher as an insulator material. The manufacturing method involves forming a pattern identical to the required multilayer wiring circuit in a raw ceramic sheet using a material that scatters by combustion or sublimation during the firing step, and then forming the ceramic sheet. A cavity identical to the required multilayer wiring circuit is formed in the ceramic substrate by firing in air, and after high-temperature liquid silver or copper is press-fitted into the cavity under high pressure, prefilling silver or steel is formed. After cooling, a wiring board was formed.

(作用辷 ■−′発明は、前記構成によシ、焼成を空気中で行なう
yために、窒−ガ5ス、お、よび水素ガスを使用する必
要がな≦、雰囲、隼、焼成炉;↑大規模な、窒素ガスお
よび水素ガス用タンクが不要となり、しかも焼成が簡単
になるので、配線基板の製造において経済的に有利にな
る。
(Actions ■-'The invention has the above-mentioned structure, and since the firing is performed in the air, there is no need to use nitrogen gas or hydrogen gas. Furnace: ↑ Large-scale tanks for nitrogen gas and hydrogen gas are not required, and firing is simple, making it economically advantageous in manufacturing wiring boards.

を九、従来の印刷した金属粉末とアルミナとを一体焼結
する方法では、アルミナと金属粉末の焼結性のため、配
線材料として高融点のタングステンやモリブデン表どじ
か用いることができなかりたが、本発明は、空気中の焼
成によって空洞を形成し、前記空洞の中に液体金属を圧
入すする方法であるため、12000以下の□温度で液
体1属とな〕圧入できる釡属であれば、′どんな金属で
′も勘線材□料として使用することができる°。  (
実□施例]″□′□ 第1図は、アルミナグリーンシート1に□X□ルーホー
ルを形成シ、前詰スルーホール上にカー1ン(−スト2
を印刷じJ前記構□成のアルミチグリニンシード″1t
−複数′枚圧着した□、生の状態の′1線基板の□断面
図を示す◇□ パ□ −□ □第2′図は、1記生め状態の配線基板を、大気雰囲蝋
中に□て1660t”;1時藺の焼成を行□がりパ□た
後に冷却した配線基板の断面図を示す。第2因□にボす
ように、アル電ナグリニンレー□ト1は焼成−′シiて
アル著す17になり、カーがン(−スト2は燃mルて、
ぞ′の後に外部と連続する空−2′が形成され□でらる
9. In the conventional method of integrally sintering printed metal powder and alumina, it was not possible to use high melting point tungsten or molybdenum as wiring materials due to the sinterability of alumina and metal powder. However, since the present invention is a method in which a cavity is formed by firing in the air and the liquid metal is press-fitted into the cavity, any pot metal that can be press-fitted into a liquid metal at a temperature of 12,000 degrees or less can be used. For example, ``any metal'' can be used as a wire material. (
[Example] ″□′□ Figure 1 shows the formation of □X□ through-holes in the alumina green sheet 1, and the car 1 (-stack 2) formed on the front filling through holes.
1 ton of aluminum tigrinin seeds with the above composition
◇□ Paper □ -□ □Figure 2' shows a cross-sectional view of a 1-wire board in which a plurality of boards are crimped together and a 1-wire board in a raw state. □The cross-sectional view of the wiring board that has been cooled after being fired for 1660t'' is shown. I'm 17 years old, and Karan (-Strike 2 is Burning).
After zo', a void -2' which is continuous with the outside is formed and □ appears.

次に、前記配線基板を、金属鋼の塊ど共に、第3図に示
す苓うミ□ツク製めカブ93の中に人孔−て真空に吸引
して前記□空洞2′の中を除去した後J”−起上ラミッ
ク製のカブ3を電気炉4に入れて加熱する。第3図は、
電気炉内の温度が1200℃に達し時の状態を示し、こ
の時点では、液体金属イピした鋼5は、表面張九のた□
め、前記空洞2′へは浸入していない。。
Next, the wiring board, together with the lump of metal steel, is vacuum-suctioned into a hollow hole 93 made by Reiu Mitsuku shown in FIG. 3 to remove the inside of the cavity 2'. After that, the turnip 3 made of ramic is placed in the electric furnace 4 and heated.
This shows the state when the temperature inside the electric furnace reaches 1200°C, and at this point, the steel 5 coated with liquid metal has a surface thickness of 9 □
Therefore, it has not penetrated into the cavity 2'. .

前記′の状態で、第′3図に示す窒素がンペ6のコ □
ツク!7t!開1、電′気炉′4の内圧t−80気圧ま
で高める1ことにより、空洞2′に液体□金属銅gt−
圧入した。その状態E第4図□に示す。
In the above state, the nitrogen gas shown in Figure 3 is in the tank 6 □
Tsuku! 7t! 1. By increasing the internal pressure of the electric furnace 4 to t-80 atmospheres, liquid □metallic copper gt-
It was press-fitted. The state E is shown in Figure 4 □.

その後、セラミック製力f31電気炉4から取り出しそ
冷却し九。 、、 □最後遺、)冷却した配線基板に外部電極を、活性処理
により、□ニッケル堵金”を無電解メッキして形成した
□。完成した配線基板の斜視図を第5図”に示 。
After that, it was taken out from the ceramic manufacturing force F31 electric furnace 4 and cooled. ,, □Last remains,) External electrodes were formed on the cooled wiring board by electroless plating of □nickel-plated gold through activation treatment.A perspective view of the completed wiring board is shown in Figure 5.

すす第一図□中め8は外部電極を示している。Soot Figure 1 □ Middle part 8 shows the external electrode.

1′茨に、液3体金属全圧入するときの適正圧′力を試
験調査じた結果として、−入窒素ガスの圧力と液体金属
鋼の浸入度合の関係を第1表に、また、金′1銀を′l
′050)℃lモ液体金属化して空洞に圧入″し死時の
、注入窒素ガスの圧力と液体金属銀の浸入度合の関係を
第2表に示す。
As a result of testing and investigating the appropriate pressure when all three liquid metals are press-fitted into 1' brambles, Table 1 shows the relationship between the pressure of -nitrogen gas and the degree of penetration of liquid metal steel. '1 silver'l
Table 2 shows the relationship between the pressure of the nitrogen gas injected and the degree of infiltration of the liquid metal silver at the time of death after turning it into a liquid metal and pressurizing it into the cavity.

前記表中の、熱シ嘗ツクによる破壊の欄は、完成された
配線基板を、−25℃から+450℃まで100℃/m
inの速度で、連続して1000回昇温および降温を繰
り返したときに、配線基板に発生した亀裂、まえは破壊
の現象を、サンプル100個に対する発生数で示したも
のである。
In the table above, the column for damage due to heat shock indicates that the completed wiring board was heated at 100°C/m from -25°C to +450°C.
The figure shows the number of cracks, or destruction, that occurred in the wiring board when the temperature was repeatedly raised and lowered 1000 times at a rate of 100 in. for 100 samples.

第1表および第2表で明らかなように、圧入する窒素ガ
スの圧力を80〜400気圧とすれば、液体金属の浸入
度合も、配線基板の耐熱性も良好である。
As is clear from Tables 1 and 2, when the pressure of the nitrogen gas to be injected is 80 to 400 atmospheres, both the degree of penetration of the liquid metal and the heat resistance of the wiring board are good.

オた、液体金属の正合によるアルミナへの、影響を調査
するために、絶縁材料アルミナの組成t一種種変えて、
カーがンを印刷し、焼成を行ない、高。
Additionally, in order to investigate the influence of liquid metal alignment on alumina, the composition of the insulating material alumina was changed by one type.
The carton is printed, fired, and produced at a high price.

温高圧の液体金属を圧入した時におけるアルミナの変形
の有無を試験した。その結果を第3表に示す。
A test was conducted to determine whether or not alumina deformed when high-temperature, high-pressure liquid metal was injected. The results are shown in Table 3.

第3表 第3表で明らかな通シ、鋼を圧入する九め忙は9096
以上のアルミナ組成が、銀を圧入するためには8596
以上のアルミナ組成が必要である。
Table 3 The number of passes and press-fitting steel clearly shown in Table 3 is 9096.
The above alumina composition is 8596 for injecting silver.
The above alumina composition is required.

□これは、銅を圧入するときに1200℃の温度が必要
であり、1200℃、80気圧という圧力に9G%未満
の組成のアルミナが耐えられず、変形してしまったから
である。また、銀の圧入の場合は、1050℃の一度が
必要で6!0,1050℃、180気圧という、圧力に
、859G以よの組成のア′ルミナが耐1 *、、られ
な卆、りたためでやる。。
□This is because a temperature of 1200°C is required when press-fitting copper, and alumina with a composition of less than 9G% could not withstand the pressure of 1200°C and 80 atm and was deformed. In addition, in the case of silver intrusion, a single cycle of 1050°C is required, and alumina with a composition of 859G or higher can withstand a pressure of 6!0,1050°C and 180 atm. I'll do it just for fun. .

なお、アルミナ−板の焼成温度社、アルiす□の組成に
よつて異なり、801の場合は138’O℃、□ S 
、 □ 属二、として門人できる。もの、例えば銀と、銅め谷金
で、あ、れば本抛明の配線用材料として使用す、ること
ができる。ただし、前記は、電気信号め伝i速痩にかな
シの高さt−要求する高速演算用LSIなどに用いられ
る場合であシ、伝達速度が低くてもよい場合は、アルミ
ニウム、黄銅などでも配線材料として十分に使用可能で
ある。
Note that the firing temperature of the alumina plate varies depending on the composition of the aluminum □, and in the case of 801 it is 138'O℃, □S
, □ You can become a disciple as a Gen2. For example, silver and copper metal can be used as wiring materials for this work. However, the above method is applicable to LSIs for high-speed calculations that require electrical signal transmission speed (i speed) and thin height (t).If the transmission speed can be low, aluminum, brass, etc. may also be used. It can be fully used as a wiring material.

(発明の効果)  以上のように°、本発明は、銀や銅またはそれらの合金
を多層配線用材料とし、90%以上の高純度ア、ル、。
(Effects of the Invention) As described above, the present invention uses silver, copper, or an alloy thereof as a material for multilayer wiring, and has a high purity of 90% or more.

ミtを絶縁用材料とし、所要の多層配線回路と同一の臂
ターンを、焼成段階において燃、銚またけ昇華に!v飛
散する材料を用いて、セラミツ 。
Mitt is used as an insulating material, and the same arm turn as the required multilayer wiring circuit is burnt and sublimated during the firing stage! v Using scattering materials, ceramics.

り生シート、□のiに形成し、前記セラミツクシ、−ゝ
ト1を空気中で□、焼成したセラミック基板の中に、′
、所喪の多層配線′、回路と同一の空洞を形成し、前些
空−の中に高温′一体状態の→や銅ま九はそれらd合釡
を高圧力で用人し、死後に、前記銀↑銅を1冷m’+4
配線基板を−成する製造方法であるため、(、来倒のよ
うに還元雰囲気中で焼成を行なう必要j’t<、□ ′ 電気抵抗率の低い銀や銅を配線材料に使用じ′て、
電気信号伝達速度の高いセラミック多層配線基板管製造
することができる。
Form the raw sheet i in □, place the ceramic comb □ in the air, and place it in a fired ceramic substrate.
The same cavity as the missing multi-layer wiring and the circuit was formed, and the high-temperature copper and copper pots were heated at high pressure, and after death, the above-mentioned Silver ↑ Copper 1 cold m'+4
Since this is a manufacturing method for manufacturing wiring boards, it is necessary to perform baking in a reducing atmosphere as in the past, and silver and copper with low electrical resistivity are used as wiring materials. ,
Ceramic multilayer wiring board tubes with high electrical signal transmission speed can be manufactured.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は生の状態の配線基板の断面図、第2図は焼成後
の配線基板の断面■、第3図は電気炉内を1200℃に
したときの一造段一〇断面図、第4図は電気炉内圧t−
80気圧にしたときの製造段階め断面図、第5図は完成
した配線基板の斜視図を示す。 1−アルミナグリーンシート、1′アルミナ、2カーぎ
ンペースト、2’−空洞、3カー/、4電気炉、5液体
金属、6窒素ガスがンペ、7コック、8外部電極。 第1図 卜アl■ナデソーシシート 2方−メンマースト 1″ トレミナ 2″望浦 第5図 第3図い 第4v!J
Figure 1 is a cross-sectional view of the wiring board in its raw state, Figure 2 is a cross-sectional view of the wiring board after firing, Figure 3 is a cross-sectional view of the 1st stage 10 when the temperature inside the electric furnace is 1200°C, Figure 4 shows the electric furnace internal pressure t-
FIG. 5 shows a cross-sectional view of the manufacturing stage when the pressure is 80 atm, and a perspective view of the completed wiring board. 1 - alumina green sheet, 1' alumina, 2 cargin paste, 2' - cavity, 3 car /, 4 electric furnace, 5 liquid metal, 6 nitrogen gas pump, 7 cock, 8 external electrode. Figure 1 Al ■Nade Soshi Sheet 2 sides - Menmurst 1'' Toremina 2'' Noboura Figure 5 Figure 3 Figure 4V! J

Claims (2)

【特許請求の範囲】[Claims] (1)多層配線用材料として銀または銅またはそれらの
合金を使用し、基板用の絶縁体用材料として90%以上
の高純度アルミナを使用することを特徴とするセラミッ
ク多層配線基板の製造方法。
(1) A method for manufacturing a ceramic multilayer wiring board, characterized in that silver, copper, or an alloy thereof is used as a material for multilayer wiring, and high purity alumina of 90% or more is used as a material for an insulator for a board.
(2)所要の多層配線回路と同一のパターンを、焼成段
階で燃焼または昇華によって飛散する材料を用いて、セ
ラミック生シートの中に形成し、前記セラミックシート
を空気中で焼成してセラミック基板の中に所要の多層配
線回路と同一の空洞を形成し、前記空洞の中に高温液体
状態の銀や銅またはそれらの合金を高圧力で圧入した後
に、前記銀や銅またはそれらの合金を冷却して所要の多
層配線回路を構成することを特徴とする特許請求の範囲
第(1)項記載のセラミック多層配線基板の製造方法。
(2) A pattern identical to the desired multilayer wiring circuit is formed in a green ceramic sheet using a material that scatters by combustion or sublimation during the firing step, and the ceramic sheet is fired in air to form a ceramic substrate. A cavity identical to the required multilayer wiring circuit is formed in the cavity, and silver, copper, or an alloy thereof in a high temperature liquid state is press-fitted into the cavity under high pressure, and then the silver, copper, or alloy thereof is cooled. A method of manufacturing a ceramic multilayer wiring board according to claim (1), wherein a required multilayer wiring circuit is constructed using the following steps.
JP7121785A 1985-04-05 1985-04-05 Manufacture of ceramic multilayer wiring substrate Pending JPS61229549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7121785A JPS61229549A (en) 1985-04-05 1985-04-05 Manufacture of ceramic multilayer wiring substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7121785A JPS61229549A (en) 1985-04-05 1985-04-05 Manufacture of ceramic multilayer wiring substrate

Publications (1)

Publication Number Publication Date
JPS61229549A true JPS61229549A (en) 1986-10-13

Family

ID=13454284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7121785A Pending JPS61229549A (en) 1985-04-05 1985-04-05 Manufacture of ceramic multilayer wiring substrate

Country Status (1)

Country Link
JP (1) JPS61229549A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
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WO2007023531A1 (en) * 2005-08-23 2007-03-01 Fujitsu Limited Liquid-like body filling device and liquid-like body filling method
JP2007067189A (en) * 2005-08-31 2007-03-15 Shinko Electric Ind Co Ltd Wiring board and its manufacturing method
JP2007081053A (en) * 2005-09-13 2007-03-29 Fujikura Ltd Composite substrate and manufacturing method thereof, and electronic apparatus
JP2011066449A (en) * 2010-12-20 2011-03-31 Fujikura Ltd Method for manufacturing passing wiring substrate, method for manufacturing complex substrate, and method for manufacturing electronic device using passing wiring substrate and complex substrate formed by those manufacturing methods
JP2015076436A (en) * 2013-10-07 2015-04-20 日本特殊陶業株式会社 Wiring board and manufacturing method of the same
US10499506B2 (en) 2016-03-11 2019-12-03 Murata Manufacturing Co., Ltd. Composite substrate and method for manufacturing composite substrate

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WO2007023531A1 (en) * 2005-08-23 2007-03-01 Fujitsu Limited Liquid-like body filling device and liquid-like body filling method
JPWO2007023531A1 (en) * 2005-08-23 2009-02-26 富士通株式会社 Liquid filling apparatus and liquid filling method
JP2007067189A (en) * 2005-08-31 2007-03-15 Shinko Electric Ind Co Ltd Wiring board and its manufacturing method
JP2007081053A (en) * 2005-09-13 2007-03-29 Fujikura Ltd Composite substrate and manufacturing method thereof, and electronic apparatus
JP2011066449A (en) * 2010-12-20 2011-03-31 Fujikura Ltd Method for manufacturing passing wiring substrate, method for manufacturing complex substrate, and method for manufacturing electronic device using passing wiring substrate and complex substrate formed by those manufacturing methods
JP2015076436A (en) * 2013-10-07 2015-04-20 日本特殊陶業株式会社 Wiring board and manufacturing method of the same
US10499506B2 (en) 2016-03-11 2019-12-03 Murata Manufacturing Co., Ltd. Composite substrate and method for manufacturing composite substrate

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