JPS5799789A - Semiconductor thermo-sensitive element - Google Patents

Semiconductor thermo-sensitive element

Info

Publication number: JPS5799789A
Authority: JP; Japan
Prior art keywords: emitter; base; transistor; collector; current
Prior art date: 1980-12-12
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP55175606A

Other languages

English (en)

Other versions

JPS6322475B2 (ja

Inventor

Masaaki Kamiya

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Seiko Instruments Inc

Original Assignee

Seiko Instruments Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1980-12-12

Filing date

1980-12-12

Publication date

1982-06-21

1980-12-12 Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc

1980-12-12 Priority to JP55175606A priority Critical patent/JPS5799789A/ja

1982-06-21 Publication of JPS5799789A publication Critical patent/JPS5799789A/ja

1988-05-12 Publication of JPS6322475B2 publication Critical patent/JPS6322475B2/ja

Status Granted legal-status Critical Current

Links

239000004065 semiconductor Substances 0.000 title abstract 2
230000003321 amplification Effects 0.000 abstract 1
230000003247 decreasing effect Effects 0.000 abstract 1
238000009792 diffusion process Methods 0.000 abstract 1
238000003199 nucleic acid amplification method Methods 0.000 abstract 1
230000008542 thermal sensitivity Effects 0.000 abstract 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Bipolar Transistors (AREA)
Semiconductor Integrated Circuits (AREA)

JP55175606A 1980-12-12 1980-12-12 Semiconductor thermo-sensitive element Granted JPS5799789A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP55175606A JPS5799789A (en)	1980-12-12	1980-12-12	Semiconductor thermo-sensitive element

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP55175606A JPS5799789A (en)	1980-12-12	1980-12-12	Semiconductor thermo-sensitive element

Publications (2)

Publication Number	Publication Date
JPS5799789A true JPS5799789A (en)	1982-06-21
JPS6322475B2 JPS6322475B2 (ja)	1988-05-12

Family

ID=15999027

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP55175606A Granted JPS5799789A (en)	1980-12-12	1980-12-12	Semiconductor thermo-sensitive element

Country Status (1)

Country	Link
JP (1)	JPS5799789A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5930029A (ja) *	1982-08-12	1984-02-17	Seiko Instr & Electronics Ltd	温度検出装置
US7997794B2 (en) *	2006-08-29	2011-08-16	Seiko Instruments Inc.	Temperature sensor circuit
CN103460367A (zh) *	2011-04-04	2013-12-18	富士电机株式会社	功率开关的晶片测试方法

1980
- 1980-12-12 JP JP55175606A patent/JPS5799789A/ja active Granted

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5930029A (ja) *	1982-08-12	1984-02-17	Seiko Instr & Electronics Ltd	温度検出装置
JPH0126493B2 (ja) *	1982-08-12	1989-05-24	Seiko Denshi Kogyo Kk
US7997794B2 (en) *	2006-08-29	2011-08-16	Seiko Instruments Inc.	Temperature sensor circuit
CN103460367A (zh) *	2011-04-04	2013-12-18	富士电机株式会社	功率开关的晶片测试方法
US9541599B2 (en)	2011-04-04	2017-01-10	Fuji Electric Co., Ltd.	Power switch wafer test method

Also Published As

Publication number	Publication date
JPS6322475B2 (ja)	1988-05-12

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