JPS5787149A - Large-scale integrated circuit - Google Patents
Large-scale integrated circuitInfo
- Publication number
- JPS5787149A JPS5787149A JP16363980A JP16363980A JPS5787149A JP S5787149 A JPS5787149 A JP S5787149A JP 16363980 A JP16363980 A JP 16363980A JP 16363980 A JP16363980 A JP 16363980A JP S5787149 A JPS5787149 A JP S5787149A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- block
- pins
- output
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To turn out the output signal of desired block as well as to simplify the operational check of each block for the subject integrated circuit by a method wherein, in the LDI containing a plurality of circuit blocks, the output circuit of each block is controlled by the logical level which will be given to the pin to be used for a test. CONSTITUTION:The circuits 14-17 to be used for testing and the control circuit 9, which will be driven by the logical level of pins (pads) 2 and 3 to be used for testing, are provided for each block on the functional unit such as a shift resistor, a counter and the like, for example. In this example, the control of four modes can be performed by the circuit 9 using two pins, and one of the four output circuits is turned to L-level (output condition). When the integrated cir cuit is operated under normal condition, signals are inputted to the pin 1, the circuit 9 outputs signals to the circuit 17 only and the output signals are sent to pins 4-8. When the block 10 is tested, for example, the circuit 14 alone outputs signals, and the output signal of the block 10 is sent to the pins 4-6. Through these procedures, the evaluation of an experimental article and the functional test of each block performed in the manufacturing process can be simplified.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16363980A JPS5787149A (en) | 1980-11-19 | 1980-11-19 | Large-scale integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16363980A JPS5787149A (en) | 1980-11-19 | 1980-11-19 | Large-scale integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5787149A true JPS5787149A (en) | 1982-05-31 |
Family
ID=15777756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16363980A Pending JPS5787149A (en) | 1980-11-19 | 1980-11-19 | Large-scale integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5787149A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS593967A (en) * | 1982-06-29 | 1984-01-10 | Nec Corp | Integrated circuit memory tester |
JPS60150662A (en) * | 1984-01-18 | 1985-08-08 | Hitachi Ltd | Semiconductor integrated logic device |
JPS61260173A (en) * | 1985-05-15 | 1986-11-18 | Toshiba Corp | Large-scale integrated circuit device |
EP0352910A2 (en) * | 1988-07-28 | 1990-01-31 | Digital Equipment Corporation | Finding faults in circuit boards |
US6119250A (en) * | 1996-05-07 | 2000-09-12 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit |
-
1980
- 1980-11-19 JP JP16363980A patent/JPS5787149A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS593967A (en) * | 1982-06-29 | 1984-01-10 | Nec Corp | Integrated circuit memory tester |
JPS60150662A (en) * | 1984-01-18 | 1985-08-08 | Hitachi Ltd | Semiconductor integrated logic device |
JPS61260173A (en) * | 1985-05-15 | 1986-11-18 | Toshiba Corp | Large-scale integrated circuit device |
EP0352910A2 (en) * | 1988-07-28 | 1990-01-31 | Digital Equipment Corporation | Finding faults in circuit boards |
US6119250A (en) * | 1996-05-07 | 2000-09-12 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit |
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