JPS5787149A - Large-scale integrated circuit - Google Patents

Large-scale integrated circuit

Info

Publication number
JPS5787149A
JPS5787149A JP16363980A JP16363980A JPS5787149A JP S5787149 A JPS5787149 A JP S5787149A JP 16363980 A JP16363980 A JP 16363980A JP 16363980 A JP16363980 A JP 16363980A JP S5787149 A JPS5787149 A JP S5787149A
Authority
JP
Japan
Prior art keywords
circuit
block
pins
output
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16363980A
Other languages
Japanese (ja)
Inventor
Yoriyasu Takeguchi
Takanori Senoo
Kazuo Nomura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16363980A priority Critical patent/JPS5787149A/en
Publication of JPS5787149A publication Critical patent/JPS5787149A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To turn out the output signal of desired block as well as to simplify the operational check of each block for the subject integrated circuit by a method wherein, in the LDI containing a plurality of circuit blocks, the output circuit of each block is controlled by the logical level which will be given to the pin to be used for a test. CONSTITUTION:The circuits 14-17 to be used for testing and the control circuit 9, which will be driven by the logical level of pins (pads) 2 and 3 to be used for testing, are provided for each block on the functional unit such as a shift resistor, a counter and the like, for example. In this example, the control of four modes can be performed by the circuit 9 using two pins, and one of the four output circuits is turned to L-level (output condition). When the integrated cir cuit is operated under normal condition, signals are inputted to the pin 1, the circuit 9 outputs signals to the circuit 17 only and the output signals are sent to pins 4-8. When the block 10 is tested, for example, the circuit 14 alone outputs signals, and the output signal of the block 10 is sent to the pins 4-6. Through these procedures, the evaluation of an experimental article and the functional test of each block performed in the manufacturing process can be simplified.
JP16363980A 1980-11-19 1980-11-19 Large-scale integrated circuit Pending JPS5787149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16363980A JPS5787149A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16363980A JPS5787149A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Publications (1)

Publication Number Publication Date
JPS5787149A true JPS5787149A (en) 1982-05-31

Family

ID=15777756

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16363980A Pending JPS5787149A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Country Status (1)

Country Link
JP (1) JPS5787149A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593967A (en) * 1982-06-29 1984-01-10 Nec Corp Integrated circuit memory tester
JPS60150662A (en) * 1984-01-18 1985-08-08 Hitachi Ltd Semiconductor integrated logic device
JPS61260173A (en) * 1985-05-15 1986-11-18 Toshiba Corp Large-scale integrated circuit device
EP0352910A2 (en) * 1988-07-28 1990-01-31 Digital Equipment Corporation Finding faults in circuit boards
US6119250A (en) * 1996-05-07 2000-09-12 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593967A (en) * 1982-06-29 1984-01-10 Nec Corp Integrated circuit memory tester
JPS60150662A (en) * 1984-01-18 1985-08-08 Hitachi Ltd Semiconductor integrated logic device
JPS61260173A (en) * 1985-05-15 1986-11-18 Toshiba Corp Large-scale integrated circuit device
EP0352910A2 (en) * 1988-07-28 1990-01-31 Digital Equipment Corporation Finding faults in circuit boards
US6119250A (en) * 1996-05-07 2000-09-12 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit

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