JPS5787138A - Manufacture of semiconductor - Google Patents
Manufacture of semiconductorInfo
- Publication number
- JPS5787138A JPS5787138A JP55163558A JP16355880A JPS5787138A JP S5787138 A JPS5787138 A JP S5787138A JP 55163558 A JP55163558 A JP 55163558A JP 16355880 A JP16355880 A JP 16355880A JP S5787138 A JPS5787138 A JP S5787138A
- Authority
- JP
- Japan
- Prior art keywords
- film
- density
- opening
- making
- phosphoric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Weting (AREA)
- Formation Of Insulating Films (AREA)
Abstract
PURPOSE:To prevent breaking of a circuit wiring by making gentle the slopes of an opening and making the density of impurity or the quality of a film ununiform in forming the opening in order to accelerate etching speed of the surface layer of CVD film to be used for interlayer insulation films. CONSTITUTION:A PSG film to be deposited on an Si substrate 3 as a interlayer film is formed with ununformity of the density of phosphoric acid in the film by, for instance, changing the flow of growing phosphoric compound (such as PH3). For example, the lower layer 2 is formed with the thickness of 9,000Angstrom and the phosphoric density of 2mol and the upper layer is laminated to the thichness of 1,000 Angstrom with the density of 4mol. After densifying the film 1, 2 by heat treatment, an opening is formed by photo etching and an electrode layer is formed by vaporating a metallic film 4. This makes the opening wider and the slopes gentle making the metallic films cover the level difference uniformly, preventing circuit breaking and improving yield rate and reliability.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55163558A JPS5787138A (en) | 1980-11-20 | 1980-11-20 | Manufacture of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55163558A JPS5787138A (en) | 1980-11-20 | 1980-11-20 | Manufacture of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5787138A true JPS5787138A (en) | 1982-05-31 |
Family
ID=15776175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55163558A Pending JPS5787138A (en) | 1980-11-20 | 1980-11-20 | Manufacture of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5787138A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4412132A (en) * | 1981-07-08 | 1983-10-25 | Jeol Ltd. | Electron lens equipped with three magnetic pole pieces |
-
1980
- 1980-11-20 JP JP55163558A patent/JPS5787138A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4412132A (en) * | 1981-07-08 | 1983-10-25 | Jeol Ltd. | Electron lens equipped with three magnetic pole pieces |
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