DE3233013A1
(de)
*
|
1982-09-06 |
1984-03-08 |
Siemens AG, 1000 Berlin und 8000 München |
Optische anordnung zur erkennung und auswertung der lage eines objekts
|
US4520388A
(en)
*
|
1982-11-01 |
1985-05-28 |
General Electric Company |
Optical signal projector
|
US4491719A
(en)
*
|
1982-12-20 |
1985-01-01 |
General Electric Company |
Light pattern projector especially for welding
|
EP0129062A3
(de)
*
|
1983-05-18 |
1986-04-30 |
Gerd Prof. Dipl.-Ing. Selbach |
Lasermesssystem, insbesondere zum Ausmessen von Einspann- und Richtvorgängen an Werkzeugmaschinen sowie zur Schwingungsmessung
|
NL8302228A
(nl)
*
|
1983-06-22 |
1985-01-16 |
Optische Ind De Oude Delft Nv |
Meetstelsel voor het onder gebruikmaking van een op driehoeksmeting berustend principe, contactloos meten van een door een oppervlakcontour van een objectvlak gegeven afstand tot een referentieniveau.
|
US4692690A
(en)
*
|
1983-12-26 |
1987-09-08 |
Hitachi, Ltd. |
Pattern detecting apparatus
|
DE3413605A1
(de)
*
|
1984-04-11 |
1985-10-17 |
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München |
Optisches verfahren zur messung des profils von oberflaechen mit oertlich stark schwankendem reflexionsfaktor
|
US4650333A
(en)
*
|
1984-04-12 |
1987-03-17 |
International Business Machines Corporation |
System for measuring and detecting printed circuit wiring defects
|
US4664470A
(en)
*
|
1984-06-21 |
1987-05-12 |
General Electric Company |
Method and system for structured radiation production including a composite filter and method of making
|
DE3428718A1
(de)
*
|
1984-08-03 |
1986-02-06 |
Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch |
Optisches geraet zur bestimmung der welligkeit von materialoberflaechen
|
US4641972A
(en)
*
|
1984-09-14 |
1987-02-10 |
New York Institute Of Technology |
Method and apparatus for surface profilometry
|
US4657394A
(en)
*
|
1984-09-14 |
1987-04-14 |
New York Institute Of Technology |
Apparatus and method for obtaining three dimensional surface contours
|
US4664514A
(en)
*
|
1984-11-06 |
1987-05-12 |
General Electric Company |
Method of enhancing surface features and detecting same
|
US4634879A
(en)
*
|
1985-03-21 |
1987-01-06 |
General Electric Company |
Method and system for determining surface profile information
|
US4687325A
(en)
*
|
1985-03-28 |
1987-08-18 |
General Electric Company |
Three-dimensional range camera
|
US4658368A
(en)
*
|
1985-04-30 |
1987-04-14 |
Canadian Patents And Development Limited-Societe Canadienne Des Brevets Et D'exploitation Limitee |
Peak position detector
|
US4645917A
(en)
*
|
1985-05-31 |
1987-02-24 |
General Electric Company |
Swept aperture flying spot profiler
|
FR2589242B1
(fr)
*
|
1985-10-25 |
1988-11-25 |
Oreal |
Procede pour examiner la surface d'un echantillon et appareil pour sa mise en oeuvre
|
US4687326A
(en)
*
|
1985-11-12 |
1987-08-18 |
General Electric Company |
Integrated range and luminance camera
|
GB8615197D0
(en)
*
|
1986-06-21 |
1986-07-23 |
Renishaw Plc |
Opto-electronic scale reading apparatus
|
JPH0615968B2
(ja)
*
|
1986-08-11 |
1994-03-02 |
伍良 松本 |
立体形状測定装置
|
US4868404A
(en)
*
|
1987-04-23 |
1989-09-19 |
Hajime Industries, Ltd. |
Surface inspection apparatus using a mask system to monitor uneven surfaces
|
US4850712A
(en)
*
|
1988-02-01 |
1989-07-25 |
Caterpillar Inc. |
Method and system for determining surface profile information
|
US4946275A
(en)
*
|
1988-03-31 |
1990-08-07 |
General Dynamics Corporation Convair Division |
Fiber optic position transducer
|
US5011960A
(en)
*
|
1988-05-20 |
1991-04-30 |
Fujitsu Limited |
Wiring pattern detection method and apparatus
|
DE3907430C1
(ja)
*
|
1988-12-23 |
1991-03-21 |
Klaus 8206 Bruckmuehl De Pfister |
|
US4981360A
(en)
*
|
1989-05-10 |
1991-01-01 |
Grumman Aerospace Corporation |
Apparatus and method for projection moire mapping
|
US5025285A
(en)
*
|
1989-05-10 |
1991-06-18 |
Grumman Aerospace Corporation |
Apparatus and method for shadow moire mapping
|
DE3938714A1
(de)
*
|
1989-11-23 |
1991-05-29 |
Bernd Dr Breuckmann |
Verfahren zur optischen erfassung von formen von objekten
|
US5257184A
(en)
*
|
1990-04-10 |
1993-10-26 |
Mushabac David R |
Method and apparatus with multiple data input stylii for collecting curvilinear contour data
|
US5347454A
(en)
*
|
1990-04-10 |
1994-09-13 |
Mushabac David R |
Method, system and mold assembly for use in preparing a dental restoration
|
US5224049A
(en)
*
|
1990-04-10 |
1993-06-29 |
Mushabac David R |
Method, system and mold assembly for use in preparing a dental prosthesis
|
US5562448A
(en)
*
|
1990-04-10 |
1996-10-08 |
Mushabac; David R. |
Method for facilitating dental diagnosis and treatment
|
US5569578A
(en)
*
|
1990-04-10 |
1996-10-29 |
Mushabac; David R. |
Method and apparatus for effecting change in shape of pre-existing object
|
US5545039A
(en)
*
|
1990-04-10 |
1996-08-13 |
Mushabac; David R. |
Method and apparatus for preparing tooth or modifying dental restoration
|
US5343391A
(en)
*
|
1990-04-10 |
1994-08-30 |
Mushabac David R |
Device for obtaining three dimensional contour data and for operating on a patient and related method
|
CA2017518A1
(en)
*
|
1990-05-24 |
1991-11-24 |
Her Majesty The Queen, In Right Of Canada, As Represented By The Ministe R Of The National Research Council Of Canada |
Colour-range imaging
|
US5134303A
(en)
*
|
1990-08-14 |
1992-07-28 |
Flexus, Inc. |
Laser apparatus and method for measuring stress in a thin film using multiple wavelengths
|
US5248889A
(en)
*
|
1990-08-14 |
1993-09-28 |
Tencor Instruments, Inc. |
Laser apparatus and method for measuring stress in a thin film using multiple wavelengths
|
US5390118A
(en)
*
|
1990-10-03 |
1995-02-14 |
Aisin Seiki Kabushiki Kaisha |
Automatic lateral guidance control system
|
EP0479271B1
(en)
*
|
1990-10-03 |
1998-09-09 |
Aisin Seiki Kabushiki Kaisha |
Automatic lateral guidance control system
|
US5202742A
(en)
*
|
1990-10-03 |
1993-04-13 |
Aisin Seiki Kabushiki Kaisha |
Laser radar for a vehicle lateral guidance system
|
DE4134546A1
(de)
*
|
1991-09-26 |
1993-04-08 |
Steinbichler Hans |
Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objektes
|
US5636025A
(en)
*
|
1992-04-23 |
1997-06-03 |
Medar, Inc. |
System for optically measuring the surface contour of a part using more fringe techniques
|
US5461226A
(en)
*
|
1993-10-29 |
1995-10-24 |
Loral Infrared & Imaging Systems, Inc. |
Photon counting ultraviolet spatial image sensor with microchannel photomultiplying plates
|
US7218448B1
(en)
|
1997-03-17 |
2007-05-15 |
The Regents Of The University Of Colorado |
Extended depth of field optical systems
|
US20020195548A1
(en)
*
|
2001-06-06 |
2002-12-26 |
Dowski Edward Raymond |
Wavefront coding interference contrast imaging systems
|
US6911638B2
(en)
|
1995-02-03 |
2005-06-28 |
The Regents Of The University Of Colorado, A Body Corporate |
Wavefront coding zoom lens imaging systems
|
US20020118457A1
(en)
*
|
2000-12-22 |
2002-08-29 |
Dowski Edward Raymond |
Wavefront coded imaging systems
|
JPH0961132A
(ja)
*
|
1995-08-28 |
1997-03-07 |
Olympus Optical Co Ltd |
3次元形状計測装置
|
DE19536294C2
(de)
*
|
1995-09-29 |
2003-12-18 |
Daimler Chrysler Ag |
Verfahren zur geometrischen Navigation von optischen 3D-Sensoren zum dreidimensionalen Vermessen von Objekten
|
US6690474B1
(en)
*
|
1996-02-12 |
2004-02-10 |
Massachusetts Institute Of Technology |
Apparatus and methods for surface contour measurement
|
US6229619B1
(en)
|
1996-02-12 |
2001-05-08 |
Massachusetts Institute Of Technology |
Compensation for measurement uncertainty due to atmospheric effects
|
US6031612A
(en)
*
|
1996-02-12 |
2000-02-29 |
Massachusetts Institute Of Technology |
Apparatus and methods for contour measurement using movable sources
|
US5708498A
(en)
*
|
1996-03-04 |
1998-01-13 |
National Research Council Of Canada |
Three dimensional color imaging
|
FR2748322A1
(fr)
*
|
1996-05-02 |
1997-11-07 |
Cohen Sabban Joseph |
Dispositif optoelectronique de triangulation spatiochromatique
|
JP3417222B2
(ja)
*
|
1996-08-07 |
2003-06-16 |
松下電器産業株式会社 |
実時間レンジファインダ
|
FR2758076A1
(fr)
*
|
1997-01-09 |
1998-07-10 |
Sabban Joseph Cohen |
Procede et dispositif optoelectroniques de retrodigitalisation en odontologie
|
US6252623B1
(en)
|
1998-05-15 |
2001-06-26 |
3Dmetrics, Incorporated |
Three dimensional imaging system
|
JP2002544510A
(ja)
*
|
1999-05-14 |
2002-12-24 |
3ディーメトリックス,インコーポレイテッド |
カラー構造化された光3d撮像システム
|
JP2001174409A
(ja)
*
|
1999-12-15 |
2001-06-29 |
Internatl Business Mach Corp <Ibm> |
2波長管、検査用照明装置、検査装置及び該方法
|
US6888640B2
(en)
|
2000-02-04 |
2005-05-03 |
Mario J. Spina |
Body spatial dimension mapper
|
US6639685B1
(en)
|
2000-02-25 |
2003-10-28 |
General Motors Corporation |
Image processing method using phase-shifted fringe patterns and curve fitting
|
EP1306646A4
(en)
*
|
2000-06-07 |
2006-08-16 |
Citizen Watch Co Ltd |
BAND PATTERN PROJECTOR WITH A LIQUID CRYSTAL ASSEMBLY
|
US6417950B1
(en)
|
2000-08-28 |
2002-07-09 |
University Technology Corporation |
Three-color imaging on each pixel for increased resolution
|
US6536898B1
(en)
*
|
2000-09-15 |
2003-03-25 |
The Regents Of The University Of Colorado |
Extended depth of field optics for human vision
|
US6369879B1
(en)
|
2000-10-24 |
2002-04-09 |
The Regents Of The University Of California |
Method and apparatus for determining the coordinates of an object
|
US6504605B1
(en)
|
2000-10-24 |
2003-01-07 |
The Regents Of The University Of California |
Method and apparatus for determining the coordinates of an object
|
US6873733B2
(en)
|
2001-01-19 |
2005-03-29 |
The Regents Of The University Of Colorado |
Combined wavefront coding and amplitude contrast imaging systems
|
US6842297B2
(en)
|
2001-08-31 |
2005-01-11 |
Cdm Optics, Inc. |
Wavefront coding optics
|
US20030067537A1
(en)
*
|
2001-10-04 |
2003-04-10 |
Myers Kenneth J. |
System and method for three-dimensional data acquisition
|
US20050110868A1
(en)
*
|
2001-10-04 |
2005-05-26 |
Myers Kenneth J. |
System and method for inputting contours of a three-dimensional subject to a computer
|
DE10212364A1
(de)
*
|
2002-03-20 |
2003-10-16 |
Steinbichler Optotechnik Gmbh |
Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objekts
|
US6700668B2
(en)
*
|
2002-06-25 |
2004-03-02 |
General Electric Company |
Method of measuring a part with a wide range of surface reflectivities
|
US7103212B2
(en)
*
|
2002-11-22 |
2006-09-05 |
Strider Labs, Inc. |
Acquisition of three-dimensional images by an active stereo technique using locally unique patterns
|
US6969821B2
(en)
*
|
2003-06-30 |
2005-11-29 |
General Electric Company |
Airfoil qualification system and method
|
ATE406850T1
(de)
|
2004-06-17 |
2008-09-15 |
Cadent Ltd |
Verfahren und gerät zur farbbildformung einer dreidimensionalen struktur
|
US7433058B2
(en)
*
|
2004-07-12 |
2008-10-07 |
Solvision Inc. |
System and method for simultaneous 3D height measurements on multiple sides of an object
|
US8238661B2
(en)
*
|
2004-08-12 |
2012-08-07 |
Bioscrypt, Inc. |
Device for contactlessly controlling the surface profile of objects
|
WO2006031147A1
(fr)
*
|
2004-08-12 |
2006-03-23 |
A4 Vision S.A. |
Dispositif de controle biometrique de la surface d'un visage
|
US7646896B2
(en)
*
|
2005-08-02 |
2010-01-12 |
A4Vision |
Apparatus and method for performing enrollment of user biometric information
|
US7436524B2
(en)
*
|
2004-11-26 |
2008-10-14 |
Olympus Corporation |
Apparatus and method for three-dimensional measurement and program for allowing computer to execute method for three-dimensional measurement
|
DE102005014525B4
(de)
*
|
2005-03-30 |
2009-04-16 |
Siemens Ag |
Vorrichtung zur Bestimmung von Raumkoordinaten von Objektoberflächen
|
JP2007114071A
(ja)
|
2005-10-20 |
2007-05-10 |
Omron Corp |
三次元形状計測装置、プログラム、コンピュータ読み取り可能な記録媒体、及び三次元形状計測方法
|
US20070090310A1
(en)
*
|
2005-10-24 |
2007-04-26 |
General Electric Company |
Methods and apparatus for inspecting an object
|
CA2528791A1
(en)
*
|
2005-12-01 |
2007-06-01 |
Peirong Jia |
Full-field three-dimensional measurement method
|
JP4801457B2
(ja)
*
|
2006-02-02 |
2011-10-26 |
株式会社リコー |
表面欠陥検査装置、表面欠陥検査方法及び表面欠陥検査プログラム
|
WO2008044096A1
(en)
*
|
2006-10-13 |
2008-04-17 |
Yeditepe Üniversitesi |
Method for three-dimensionally structured light scanning of shiny or specular objects
|
CA2597891A1
(en)
*
|
2007-08-20 |
2009-02-20 |
Marc Miousset |
Multi-beam optical probe and system for dimensional measurement
|
FI20075975L
(fi)
*
|
2007-12-31 |
2009-07-01 |
Metso Automation Oy |
Rainan mittaus
|
US8094321B2
(en)
*
|
2008-02-26 |
2012-01-10 |
Caterpillar Inc. |
Photogrammetric target and related method
|
JP2009300263A
(ja)
*
|
2008-06-13 |
2009-12-24 |
Mitsutoyo Corp |
2波長レーザ干渉計および2波長レーザ干渉計の光軸調整方法
|
EP2159538A1
(de)
|
2008-08-28 |
2010-03-03 |
Omnitron AG |
Vorrichtung und Verfahren zur Orts- und/oder Formbestimmung eines Objekts
|
US8723118B2
(en)
*
|
2009-10-01 |
2014-05-13 |
Microsoft Corporation |
Imager for constructing color and depth images
|
EP2496910A4
(en)
|
2009-11-04 |
2016-11-16 |
Technologies Numetrix Inc |
DEVICE AND METHOD FOR OBTAINING THREE-DIMENSIONAL OBJECT SURFACE DATA
|
KR101207198B1
(ko)
|
2010-01-18 |
2012-12-03 |
주식회사 고영테크놀러지 |
기판 검사장치
|
DE102010030435A1
(de)
*
|
2010-06-23 |
2011-12-29 |
Carl Zeiss Smt Gmbh |
Metrologiesystem
|
US8760499B2
(en)
*
|
2011-04-29 |
2014-06-24 |
Austin Russell |
Three-dimensional imager and projection device
|
CN102679908A
(zh)
*
|
2012-05-10 |
2012-09-19 |
天津大学 |
一种双波长光纤干涉条纹投射三维形貌动态测量方法
|
US20140085426A1
(en)
*
|
2012-09-24 |
2014-03-27 |
Alces Technology, Inc. |
Structured light systems with static spatial light modulators
|
DE102012021185A1
(de)
|
2012-10-30 |
2014-04-30 |
Smart Optics Sensortechnik Gmbh |
Verfahren zur optischen 3D-Vermessung von Zähnen mit verkleinerter Point-Spread-Funktion
|
US10412280B2
(en)
|
2016-02-10 |
2019-09-10 |
Microsoft Technology Licensing, Llc |
Camera with light valve over sensor array
|
DE102018115673A1
(de)
*
|
2018-06-28 |
2020-02-13 |
Carl Zeiss Ag |
Verfahren und Vorrichtungen zur Musterprojektion
|
DE102018005506B4
(de)
*
|
2018-07-12 |
2021-03-18 |
Wenzel Group GmbH & Co. KG |
Optisches Sensorsystem für ein Koordinatenmessgerät, Verfahren zum Erfassen eines Messpunkts auf einer Oberfläche eines Messobjekts sowie Koordinatenmessgerät
|
US11467507B2
(en)
*
|
2018-09-21 |
2022-10-11 |
Asml Netherlands B.V. |
Radiation system
|
CN112930468B
(zh)
*
|
2018-11-08 |
2022-11-18 |
成都频泰鼎丰企业管理中心(有限合伙) |
三维测量设备
|
DE102020008179B4
(de)
|
2020-10-22 |
2023-10-26 |
Smart Optics Sensortechnik Gmbh |
Verfahren und Vorrichtung zur optischen dreidimensionalen Vermessung von Objekten
|
DE102020127894B4
(de)
|
2020-10-22 |
2022-09-22 |
Smart Optics Sensortechnik Gmbh |
Verfahren und Vorrichtung zur optischen dreidimensionalen Vermessung von Objekten
|