JPS5724810A - Method of and apparatus for measuring contour of surface - Google Patents

Method of and apparatus for measuring contour of surface

Info

Publication number
JPS5724810A
JPS5724810A JP8831181A JP8831181A JPS5724810A JP S5724810 A JPS5724810 A JP S5724810A JP 8831181 A JP8831181 A JP 8831181A JP 8831181 A JP8831181 A JP 8831181A JP S5724810 A JPS5724810 A JP S5724810A
Authority
JP
Japan
Prior art keywords
measuring contour
contour
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8831181A
Other languages
English (en)
Other versions
JPH0330802B2 (ja
Inventor
Regurando Mundei Jiyosefu
Buraketsuto Pootaa Girubaato
Hario Shiipora Toomasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JPS5724810A publication Critical patent/JPS5724810A/ja
Publication of JPH0330802B2 publication Critical patent/JPH0330802B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Measurement Of Optical Distance (AREA)
JP8831181A 1980-06-11 1981-06-10 Method of and apparatus for measuring contour of surface Granted JPS5724810A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/158,372 US4349277A (en) 1980-06-11 1980-06-11 Non-contact measurement of surface profile

Publications (2)

Publication Number Publication Date
JPS5724810A true JPS5724810A (en) 1982-02-09
JPH0330802B2 JPH0330802B2 (ja) 1991-05-01

Family

ID=22567820

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8831181A Granted JPS5724810A (en) 1980-06-11 1981-06-10 Method of and apparatus for measuring contour of surface

Country Status (9)

Country Link
US (1) US4349277A (ja)
JP (1) JPS5724810A (ja)
CA (1) CA1164094A (ja)
DE (1) DE3122712A1 (ja)
FR (1) FR2484633B1 (ja)
GB (1) GB2078944B (ja)
IL (1) IL62959A (ja)
IT (1) IT1139362B (ja)
NL (1) NL8102813A (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58122409A (ja) * 1981-10-09 1983-07-21 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン 光セクシヨニング法
JPS60220808A (ja) * 1984-04-17 1985-11-05 Inax Corp 表面検査方法
WO1991000836A1 (en) * 1989-07-12 1991-01-24 Kyokuto Kaihatsu Kogyo Co., Ltd. Container loading/unloading vehicle
JP2005517165A (ja) * 2002-02-07 2005-06-09 ビーエフアイ・ブイデイイーエイチ−インステイテユト・フユア・アンゲバンテ・フオルシユンク・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング 表面形状の光学的測定及び圧延処理設備における運動中のストリップの光学的表面検査のための方法及び装置
JP2007121295A (ja) * 2005-10-24 2007-05-17 General Electric Co <Ge> 物体を検査する方法およびシステム
WO2022202198A1 (ja) * 2021-03-25 2022-09-29 ジャパンマリンユナイテッド株式会社 金属表面の粗面処理の評価方法および評価装置
JP2022173585A (ja) * 2018-12-28 2022-11-18 ヤマハ発動機株式会社 三次元計測装置、及び、ワーク作業装置

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US4491719A (en) * 1982-12-20 1985-01-01 General Electric Company Light pattern projector especially for welding
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NL8302228A (nl) * 1983-06-22 1985-01-16 Optische Ind De Oude Delft Nv Meetstelsel voor het onder gebruikmaking van een op driehoeksmeting berustend principe, contactloos meten van een door een oppervlakcontour van een objectvlak gegeven afstand tot een referentieniveau.
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DE3428718A1 (de) * 1984-08-03 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches geraet zur bestimmung der welligkeit von materialoberflaechen
US4641972A (en) * 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
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US4664514A (en) * 1984-11-06 1987-05-12 General Electric Company Method of enhancing surface features and detecting same
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US4645917A (en) * 1985-05-31 1987-02-24 General Electric Company Swept aperture flying spot profiler
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US6911638B2 (en) 1995-02-03 2005-06-28 The Regents Of The University Of Colorado, A Body Corporate Wavefront coding zoom lens imaging systems
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JPH0961132A (ja) * 1995-08-28 1997-03-07 Olympus Optical Co Ltd ３次元形状計測装置
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US6229619B1 (en) 1996-02-12 2001-05-08 Massachusetts Institute Of Technology Compensation for measurement uncertainty due to atmospheric effects
US6031612A (en) * 1996-02-12 2000-02-29 Massachusetts Institute Of Technology Apparatus and methods for contour measurement using movable sources
US5708498A (en) * 1996-03-04 1998-01-13 National Research Council Of Canada Three dimensional color imaging
FR2748322A1 (fr) * 1996-05-02 1997-11-07 Cohen Sabban Joseph Dispositif optoelectronique de triangulation spatiochromatique
JP3417222B2 (ja) * 1996-08-07 2003-06-16 松下電器産業株式会社 実時間レンジファインダ
FR2758076A1 (fr) * 1997-01-09 1998-07-10 Sabban Joseph Cohen Procede et dispositif optoelectroniques de retrodigitalisation en odontologie
US6252623B1 (en) 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58122409A (ja) * 1981-10-09 1983-07-21 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン 光セクシヨニング法
JPH0153721B2 (ja) * 1981-10-09 1989-11-15 Intaanashonaru Bijinesu Mashiinzu Corp
JPS60220808A (ja) * 1984-04-17 1985-11-05 Inax Corp 表面検査方法
WO1991000836A1 (en) * 1989-07-12 1991-01-24 Kyokuto Kaihatsu Kogyo Co., Ltd. Container loading/unloading vehicle
JP2005517165A (ja) * 2002-02-07 2005-06-09 ビーエフアイ・ブイデイイーエイチ−インステイテユト・フユア・アンゲバンテ・フオルシユンク・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング 表面形状の光学的測定及び圧延処理設備における運動中のストリップの光学的表面検査のための方法及び装置
JP2007121295A (ja) * 2005-10-24 2007-05-17 General Electric Co <Ge> 物体を検査する方法およびシステム
JP2022173585A (ja) * 2018-12-28 2022-11-18 ヤマハ発動機株式会社 三次元計測装置、及び、ワーク作業装置
WO2022202198A1 (ja) * 2021-03-25 2022-09-29 ジャパンマリンユナイテッド株式会社 金属表面の粗面処理の評価方法および評価装置
JP2022149261A (ja) * 2021-03-25 2022-10-06 ジャパンマリンユナイテッド株式会社 金属表面の粗面処理の評価方法および評価装置

Also Published As

Publication number Publication date
NL8102813A (nl) 1982-01-04
FR2484633B1 (fr) 1987-01-09
IT8122186A0 (it) 1981-06-08
DE3122712A1 (de) 1982-03-18
US4349277A (en) 1982-09-14
IL62959A0 (en) 1981-07-31
FR2484633A1 (fr) 1981-12-18
JPH0330802B2 (ja) 1991-05-01
IT1139362B (it) 1986-09-24
GB2078944A (en) 1982-01-13
CA1164094A (en) 1984-03-20
IL62959A (en) 1984-07-31
GB2078944B (en) 1984-03-28

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