FI20075975L - Rainan mittaus - Google Patents

Rainan mittaus Download PDF

Info

Publication number
FI20075975L
FI20075975L FI20075975A FI20075975A FI20075975L FI 20075975 L FI20075975 L FI 20075975L FI 20075975 A FI20075975 A FI 20075975A FI 20075975 A FI20075975 A FI 20075975A FI 20075975 L FI20075975 L FI 20075975L
Authority
FI
Finland
Prior art keywords
trajectory
measuring
Prior art date
Application number
FI20075975A
Other languages
English (en)
Swedish (sv)
Other versions
FI20075975A0 (fi
Inventor
Marko Avikainen
Petri Niemi
Heikki Kettunen
Markku Maentylae
Heimo Keraenen
Original Assignee
Metso Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metso Automation Oy filed Critical Metso Automation Oy
Priority to FI20075975A priority Critical patent/FI20075975L/fi
Publication of FI20075975A0 publication Critical patent/FI20075975A0/fi
Priority to EP08868623.3A priority patent/EP2232247A4/en
Priority to PCT/FI2008/050793 priority patent/WO2009083655A1/en
Priority to US12/810,365 priority patent/US8444821B2/en
Publication of FI20075975L publication Critical patent/FI20075975L/fi

Links

Classifications

    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21F—PAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
    • D21F7/00—Other details of machines for making continuous webs of paper
    • D21F7/06—Indicating or regulating the thickness of the layer; Signal devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • D21G9/0027—Paper-making control systems controlling the forming section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Paper (AREA)
FI20075975A 2007-12-31 2007-12-31 Rainan mittaus FI20075975L (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20075975A FI20075975L (fi) 2007-12-31 2007-12-31 Rainan mittaus
EP08868623.3A EP2232247A4 (en) 2007-12-31 2008-12-30 BAND MEASUREMENT CONTINUES
PCT/FI2008/050793 WO2009083655A1 (en) 2007-12-31 2008-12-30 Measuring of web
US12/810,365 US8444821B2 (en) 2007-12-31 2008-12-30 Measuring of web

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20075975A FI20075975L (fi) 2007-12-31 2007-12-31 Rainan mittaus

Publications (2)

Publication Number Publication Date
FI20075975A0 FI20075975A0 (fi) 2007-12-31
FI20075975L true FI20075975L (fi) 2009-07-01

Family

ID=38951670

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20075975A FI20075975L (fi) 2007-12-31 2007-12-31 Rainan mittaus

Country Status (4)

Country Link
US (1) US8444821B2 (fi)
EP (1) EP2232247A4 (fi)
FI (1) FI20075975L (fi)
WO (1) WO2009083655A1 (fi)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
WO2010086044A1 (en) * 2009-01-30 2010-08-05 Siemens Aktiengesellschaft Measurement of vibration characteristics of an object
DE102009038965A1 (de) * 2009-08-20 2011-03-03 Carl Zeiss Oim Gmbh Vorrichtung und Verfahren zum optischen Inspizieren einer Oberfläche an einem Gegenstand
EP2375227A1 (en) * 2010-04-09 2011-10-12 Siemens Aktiengesellschaft Measurement of three-dimensional motion characteristics
WO2012098287A1 (en) * 2011-01-19 2012-07-26 Teknologian Tutkimuskeskus Vtt Method and system for determining particle size information
EP2500687A3 (en) * 2011-03-14 2013-02-20 Heliotis SA Structured light projector
DE102013111761B4 (de) * 2013-10-25 2018-02-15 Gerhard Schubert Gmbh Verfahren und Scanner zum berührungslosen Ermitteln der Position und dreidimensionalen Form von Produkten auf einer laufenden Fläche
EP3088874B1 (en) 2013-12-27 2023-03-15 JFE Steel Corporation Surface defect detection method and surface defect detection device
JP6646339B2 (ja) * 2015-06-25 2020-02-14 Ｊｆｅスチール株式会社 表面欠陥検出方法、表面欠陥検出装置、及び鋼材の製造方法
CN107735674B (zh) * 2015-06-25 2021-09-17 杰富意钢铁株式会社 表面缺陷检测装置、表面缺陷检测方法及钢材的制造方法
DE102016220759A1 (de) * 2016-10-21 2018-04-26 Texmag Gmbh Vertriebsgesellschaft Verfahren und Vorrichtung zur Kompensation eines Materialbahnversatzes bei der Materialbahninspektion
KR102046229B1 (ko) * 2016-12-22 2019-11-18 주식회사 포스코 이송되는 원료의 입도 및 건습 측정 장치 및 혼합 원료의 입도 측정 장치
CN106998420B (zh) * 2017-05-23 2019-07-30 橄享成都科技有限责任公司 农业种植用环境监测装置
US20200371040A1 (en) * 2019-05-21 2020-11-26 Industrial Maintenance Engineering, Inc. d/b/a AIS Gauging Static full width measurement system

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US4092068A (en) * 1976-05-05 1978-05-30 Domtar Inc. Surface sensor
JPS54151067A (en) * 1978-05-19 1979-11-27 Oki Electric Ind Co Ltd Ultrasonic sounding and measuring system of water bottom and topography
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
DE3170315D1 (en) 1981-10-09 1985-06-05 Ibm Deutschland Interpolating light section process
US4490618A (en) * 1982-04-12 1984-12-25 Canadian Patents & Development Limited Optical system for analyzing the surface of a fibrous web
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
CA2112792A1 (en) * 1993-01-29 1994-07-30 Donald F. Rogowski Paper surface roughness analyzer
US5684707A (en) * 1994-10-03 1997-11-04 Westvaco Corporation Apparatus and method for analyzing paper surface topography
US5608527A (en) * 1995-03-08 1997-03-04 Optical Dimensions, Llc Apparatus and method for dynamic measurement of surface roughness
US5654799A (en) * 1995-05-05 1997-08-05 Measurex Corporation Method and apparatus for measuring and controlling the surface characteristics of sheet materials such as paper
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US20030132387A1 (en) * 1998-02-12 2003-07-17 Metso Paper Automation Oy Method and device for measuring the amount of coating on a moving substrate
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FI991071A0 (fi) * 1999-05-10 1999-05-10 Valmet Automation Inc Menetelmä ja mittausjärjestely mitata paperin pintaa
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FI115856B (fi) * 2000-02-10 2005-07-29 Metso Automation Oy Menetelmä ja laite päällysteen mittaamiseksi
FI20001568A (fi) 2000-06-30 2001-12-31 Thermo Radiometrie Oy Pinnan muotojen määrittäminen
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FI121240B (fi) * 2001-03-23 2010-08-31 Metso Paper Automation Oy Sovitelma paperikoneen yhteydessä ja puhalluslaatikko
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JP3884321B2 (ja) * 2001-06-26 2007-02-21 オリンパス株式会社 ３次元情報取得装置、３次元情報取得における投影パターン、及び、３次元情報取得方法
DE10151332B4 (de) * 2001-10-22 2007-12-06 Jenoptik Surface Inspection Gmbh Vorrichtung zur optischen Messung von Oberflächeneigenschaften
FI20021973A (fi) * 2002-11-05 2004-05-06 Sr Instr Oy Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite
EP1668316B1 (en) * 2003-09-16 2010-12-22 Paper Australia PTY Ltd. Sheet-surface analyser and method of analysing a sheet-surface
CN101287960A (zh) * 2004-10-13 2008-10-15 阿克罗米特里克斯有限责任公司 测量连续移动样品的样品表面平整度的***与方法
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Also Published As

Publication number Publication date
US8444821B2 (en) 2013-05-21
US20100319866A1 (en) 2010-12-23
FI20075975A0 (fi) 2007-12-31
EP2232247A1 (en) 2010-09-29
WO2009083655A1 (en) 2009-07-09
EP2232247A4 (en) 2016-08-10

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