JPS57155778A - Manufacture of schottky barrier gate fet - Google Patents

Manufacture of schottky barrier gate fet

Info

Publication number
JPS57155778A
JPS57155778A JP4149681A JP4149681A JPS57155778A JP S57155778 A JPS57155778 A JP S57155778A JP 4149681 A JP4149681 A JP 4149681A JP 4149681 A JP4149681 A JP 4149681A JP S57155778 A JPS57155778 A JP S57155778A
Authority
JP
Japan
Prior art keywords
film
opening
gate
insulating film
fet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4149681A
Other languages
Japanese (ja)
Other versions
JPH0117271B2 (en
Inventor
Yoichiro Takayama
Hideaki Kozu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4149681A priority Critical patent/JPS57155778A/en
Publication of JPS57155778A publication Critical patent/JPS57155778A/en
Publication of JPH0117271B2 publication Critical patent/JPH0117271B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To produce Schottky barrier gate FET of high frequency and high speed processing device (MES FET) by reducing parasitic resistance. CONSTITUTION:An n type GaAs film 2 is formed on a semi-insulation type substrate of GaAs 1 and insulating film 3 of SiO2 or the like and an aluminium film 4 are further deposited on the former film respectively. Next, a bigger opening are made on the aluminum film 4 by side etching technique using a masking material 6 such as photoresist, etc. having an opening at a position for the gate 5 and then an opening is also made on the insulating film 3 by dry etching. After the masking material 6 is stripped, a film of heat resisting metal 7 is deposited. Then, the aluminum film 4 is removed and the gate of heat resisting metal 8 is formed by lift-off technique, and, using this as a mask, a carrier layer 9 of high density is produced by etching the insulating film 3 and by silicon ion implantation. After this, the source 10 and drain 11 electrodes are formed, and a MES FET is completed.
JP4149681A 1981-03-20 1981-03-20 Manufacture of schottky barrier gate fet Granted JPS57155778A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4149681A JPS57155778A (en) 1981-03-20 1981-03-20 Manufacture of schottky barrier gate fet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4149681A JPS57155778A (en) 1981-03-20 1981-03-20 Manufacture of schottky barrier gate fet

Publications (2)

Publication Number Publication Date
JPS57155778A true JPS57155778A (en) 1982-09-25
JPH0117271B2 JPH0117271B2 (en) 1989-03-29

Family

ID=12609957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4149681A Granted JPS57155778A (en) 1981-03-20 1981-03-20 Manufacture of schottky barrier gate fet

Country Status (1)

Country Link
JP (1) JPS57155778A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5873164A (en) * 1981-10-27 1983-05-02 Sumitomo Electric Ind Ltd Schottky gate field effect transistor and manufacture thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5873164A (en) * 1981-10-27 1983-05-02 Sumitomo Electric Ind Ltd Schottky gate field effect transistor and manufacture thereof
JPH0359578B2 (en) * 1981-10-27 1991-09-11 Sumitomo Electric Industries

Also Published As

Publication number Publication date
JPH0117271B2 (en) 1989-03-29

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