JPS57151874A - Testing device for logic circuit - Google Patents

Testing device for logic circuit

Info

Publication number
JPS57151874A
JPS57151874A JP56036976A JP3697681A JPS57151874A JP S57151874 A JPS57151874 A JP S57151874A JP 56036976 A JP56036976 A JP 56036976A JP 3697681 A JP3697681 A JP 3697681A JP S57151874 A JPS57151874 A JP S57151874A
Authority
JP
Japan
Prior art keywords
test
signals
timing
coincident
units under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56036976A
Other languages
English (en)
Inventor
Yasushi Matsukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56036976A priority Critical patent/JPS57151874A/ja
Publication of JPS57151874A publication Critical patent/JPS57151874A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56036976A 1981-03-13 1981-03-13 Testing device for logic circuit Pending JPS57151874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56036976A JPS57151874A (en) 1981-03-13 1981-03-13 Testing device for logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56036976A JPS57151874A (en) 1981-03-13 1981-03-13 Testing device for logic circuit

Publications (1)

Publication Number Publication Date
JPS57151874A true JPS57151874A (en) 1982-09-20

Family

ID=12484782

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56036976A Pending JPS57151874A (en) 1981-03-13 1981-03-13 Testing device for logic circuit

Country Status (1)

Country Link
JP (1) JPS57151874A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58182566A (ja) * 1982-04-19 1983-10-25 Ando Electric Co Ltd Ｉｃ試験装置
JPH0238979A (ja) * 1988-07-29 1990-02-08 Fujitsu Ltd 試験装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53141582A (en) * 1977-05-16 1978-12-09 Toshiba Corp Character test system of semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53141582A (en) * 1977-05-16 1978-12-09 Toshiba Corp Character test system of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58182566A (ja) * 1982-04-19 1983-10-25 Ando Electric Co Ltd Ｉｃ試験装置
JPH0238979A (ja) * 1988-07-29 1990-02-08 Fujitsu Ltd 試験装置

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