JPS5697819A - Error correcting device of profile-shape measuring instrument - Google Patents

Error correcting device of profile-shape measuring instrument

Info

Publication number
JPS5697819A
JPS5697819A JP17066179A JP17066179A JPS5697819A JP S5697819 A JPS5697819 A JP S5697819A JP 17066179 A JP17066179 A JP 17066179A JP 17066179 A JP17066179 A JP 17066179A JP S5697819 A JPS5697819 A JP S5697819A
Authority
JP
Japan
Prior art keywords
profile
arm
measuring instrument
error correcting
shape measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17066179A
Other languages
Japanese (ja)
Inventor
Minoru Numamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP17066179A priority Critical patent/JPS5697819A/en
Publication of JPS5697819A publication Critical patent/JPS5697819A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

PURPOSE: To make error corrections easily and securely by determining an arc error corrected value by performing prescribed arithmetic on the basis of the extent of the displacement of a measuring arm fulcrum, shifting in position according to a profile, from a reference surface.
CONSTITUTION: According to the profile of object 5 to be measured, probe arm 3 having arm length L2 from reference surface 8 and arm length L1 across fulcrum 2 oscillates. In this case, displacement extent e2 from surface 8 varying with the profile is measured by the 2nd detector 7 and then multiplied by arm ratio L1/L2 to determine arc error corrected value e1. Therefore, the profile having the arc error corrected is recorded on X-Y recorder 10 easily and securely.
COPYRIGHT: (C)1981,JPO&Japio
JP17066179A 1979-12-30 1979-12-30 Error correcting device of profile-shape measuring instrument Pending JPS5697819A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17066179A JPS5697819A (en) 1979-12-30 1979-12-30 Error correcting device of profile-shape measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17066179A JPS5697819A (en) 1979-12-30 1979-12-30 Error correcting device of profile-shape measuring instrument

Publications (1)

Publication Number Publication Date
JPS5697819A true JPS5697819A (en) 1981-08-06

Family

ID=15909018

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17066179A Pending JPS5697819A (en) 1979-12-30 1979-12-30 Error correcting device of profile-shape measuring instrument

Country Status (1)

Country Link
JP (1) JPS5697819A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007303837A (en) * 2006-05-08 2007-11-22 Mitsutoyo Corp Measuring method and measuring instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007303837A (en) * 2006-05-08 2007-11-22 Mitsutoyo Corp Measuring method and measuring instrument

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