JPS5337077A - Probe for tester - Google Patents

Probe for tester

Info

Publication number
JPS5337077A
JPS5337077A JP11078276A JP11078276A JPS5337077A JP S5337077 A JPS5337077 A JP S5337077A JP 11078276 A JP11078276 A JP 11078276A JP 11078276 A JP11078276 A JP 11078276A JP S5337077 A JPS5337077 A JP S5337077A
Authority
JP
Japan
Prior art keywords
tester
probe
needle
contact
contacting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11078276A
Other languages
Japanese (ja)
Inventor
Hisayoshi Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11078276A priority Critical patent/JPS5337077A/en
Publication of JPS5337077A publication Critical patent/JPS5337077A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE: To enable to check the bad contact and to decrease the error of measurement, by contacting the probe for tester, provided the forcing needle and sensing needle, with the material to be measured by kelvin contact.
COPYRIGHT: (C)1978,JPO&Japio
JP11078276A 1976-09-17 1976-09-17 Probe for tester Pending JPS5337077A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11078276A JPS5337077A (en) 1976-09-17 1976-09-17 Probe for tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11078276A JPS5337077A (en) 1976-09-17 1976-09-17 Probe for tester

Publications (1)

Publication Number Publication Date
JPS5337077A true JPS5337077A (en) 1978-04-05

Family

ID=14544468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11078276A Pending JPS5337077A (en) 1976-09-17 1976-09-17 Probe for tester

Country Status (1)

Country Link
JP (1) JPS5337077A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4477774A (en) * 1980-02-28 1984-10-16 Electronique Marcel Dassault Electrical contact device for an electronic card processing apparatus
USRE32024E (en) * 1977-02-15 1985-11-05 Msi Electronics Inc. Mercury probe
US4605896A (en) * 1980-05-20 1986-08-12 Gao Gesellschaft Fur Automation Und Organisation Mbh Method of contacting the galvanic contacts of an identification card with an embedded IC-module
JPS63175771A (en) * 1987-01-14 1988-07-20 Rohm Co Ltd Probe structure for electronic component
US5625297A (en) * 1989-04-26 1997-04-29 Atg Electronic Gmbh Testing device for testing electrical or electronic test specimens
WO2006106876A1 (en) * 2005-03-31 2006-10-12 Octec Inc. Microstructure probe card, and microstructure inspecting device, method, and computer program

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE32024E (en) * 1977-02-15 1985-11-05 Msi Electronics Inc. Mercury probe
US4477774A (en) * 1980-02-28 1984-10-16 Electronique Marcel Dassault Electrical contact device for an electronic card processing apparatus
US4605896A (en) * 1980-05-20 1986-08-12 Gao Gesellschaft Fur Automation Und Organisation Mbh Method of contacting the galvanic contacts of an identification card with an embedded IC-module
JPS63175771A (en) * 1987-01-14 1988-07-20 Rohm Co Ltd Probe structure for electronic component
US5625297A (en) * 1989-04-26 1997-04-29 Atg Electronic Gmbh Testing device for testing electrical or electronic test specimens
WO2006106876A1 (en) * 2005-03-31 2006-10-12 Octec Inc. Microstructure probe card, and microstructure inspecting device, method, and computer program

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