JPS5337077A - Probe for tester - Google Patents
Probe for testerInfo
- Publication number
- JPS5337077A JPS5337077A JP11078276A JP11078276A JPS5337077A JP S5337077 A JPS5337077 A JP S5337077A JP 11078276 A JP11078276 A JP 11078276A JP 11078276 A JP11078276 A JP 11078276A JP S5337077 A JPS5337077 A JP S5337077A
- Authority
- JP
- Japan
- Prior art keywords
- tester
- probe
- needle
- contact
- contacting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
PURPOSE: To enable to check the bad contact and to decrease the error of measurement, by contacting the probe for tester, provided the forcing needle and sensing needle, with the material to be measured by kelvin contact.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11078276A JPS5337077A (en) | 1976-09-17 | 1976-09-17 | Probe for tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11078276A JPS5337077A (en) | 1976-09-17 | 1976-09-17 | Probe for tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5337077A true JPS5337077A (en) | 1978-04-05 |
Family
ID=14544468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11078276A Pending JPS5337077A (en) | 1976-09-17 | 1976-09-17 | Probe for tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5337077A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4477774A (en) * | 1980-02-28 | 1984-10-16 | Electronique Marcel Dassault | Electrical contact device for an electronic card processing apparatus |
USRE32024E (en) * | 1977-02-15 | 1985-11-05 | Msi Electronics Inc. | Mercury probe |
US4605896A (en) * | 1980-05-20 | 1986-08-12 | Gao Gesellschaft Fur Automation Und Organisation Mbh | Method of contacting the galvanic contacts of an identification card with an embedded IC-module |
JPS63175771A (en) * | 1987-01-14 | 1988-07-20 | Rohm Co Ltd | Probe structure for electronic component |
US5625297A (en) * | 1989-04-26 | 1997-04-29 | Atg Electronic Gmbh | Testing device for testing electrical or electronic test specimens |
WO2006106876A1 (en) * | 2005-03-31 | 2006-10-12 | Octec Inc. | Microstructure probe card, and microstructure inspecting device, method, and computer program |
-
1976
- 1976-09-17 JP JP11078276A patent/JPS5337077A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE32024E (en) * | 1977-02-15 | 1985-11-05 | Msi Electronics Inc. | Mercury probe |
US4477774A (en) * | 1980-02-28 | 1984-10-16 | Electronique Marcel Dassault | Electrical contact device for an electronic card processing apparatus |
US4605896A (en) * | 1980-05-20 | 1986-08-12 | Gao Gesellschaft Fur Automation Und Organisation Mbh | Method of contacting the galvanic contacts of an identification card with an embedded IC-module |
JPS63175771A (en) * | 1987-01-14 | 1988-07-20 | Rohm Co Ltd | Probe structure for electronic component |
US5625297A (en) * | 1989-04-26 | 1997-04-29 | Atg Electronic Gmbh | Testing device for testing electrical or electronic test specimens |
WO2006106876A1 (en) * | 2005-03-31 | 2006-10-12 | Octec Inc. | Microstructure probe card, and microstructure inspecting device, method, and computer program |
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