JPS5665577A - Solidstate image sensor - Google Patents

Solidstate image sensor

Info

Publication number
JPS5665577A
JPS5665577A JP14152479A JP14152479A JPS5665577A JP S5665577 A JPS5665577 A JP S5665577A JP 14152479 A JP14152479 A JP 14152479A JP 14152479 A JP14152479 A JP 14152479A JP S5665577 A JPS5665577 A JP S5665577A
Authority
JP
Japan
Prior art keywords
substrate
concentration
region
depletion layer
impurity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14152479A
Other languages
Japanese (ja)
Inventor
Hiroshi Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP14152479A priority Critical patent/JPS5665577A/en
Publication of JPS5665577A publication Critical patent/JPS5665577A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/148Charge coupled imagers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

PURPOSE:To reduce the balck level signal at photo emission, by making the impurity concentration for the substrate thinner at the surface and dense at the inside, and reducing the component, among the carrier produced, going to the charge transfer section by light. CONSTITUTION:A high concentration impurity region 13 is located beneath a depletion layer 10. Thus, the trapping center increases much and the diffusion length of carrier is shorter inversely proportional to the concentration of impurity, allowing to avoid the light production carrier from being reached to the depletion layer of the charge transfer section. Accordingly, even if a substrate less in the crystal failure is used, the black level signal the same as at dark can be output. As a method to provide the region 13, a 5 volt of voltage is fed to the gate electrode 9 at the substrate concentration, and the spread of a depletion layer 10 is about 0.1mum from the surface of the substrate, then boron can be ion-injected with 400KeV and about 1X10<12>/cm<2> in dose. This high concentration region need to be provided at a region deeper than 17mum from the surface of the substrate 5 at least.
JP14152479A 1979-11-01 1979-11-01 Solidstate image sensor Pending JPS5665577A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14152479A JPS5665577A (en) 1979-11-01 1979-11-01 Solidstate image sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14152479A JPS5665577A (en) 1979-11-01 1979-11-01 Solidstate image sensor

Publications (1)

Publication Number Publication Date
JPS5665577A true JPS5665577A (en) 1981-06-03

Family

ID=15293964

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14152479A Pending JPS5665577A (en) 1979-11-01 1979-11-01 Solidstate image sensor

Country Status (1)

Country Link
JP (1) JPS5665577A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5710985A (en) * 1980-06-25 1982-01-20 Hitachi Ltd Solid image pickup element
JPS5870685A (en) * 1981-10-22 1983-04-27 Nec Corp Solid-state image pickup device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4933582A (en) * 1972-07-26 1974-03-28
JPS5481094A (en) * 1977-11-25 1979-06-28 Hewlett Packard Yokogawa Semiconductor photodetector
JPS5538023A (en) * 1978-09-11 1980-03-17 Toshiba Corp Semiconductor device
JPS55128972A (en) * 1979-03-28 1980-10-06 Hitachi Ltd Solid state pickup device
JPS5618475A (en) * 1979-07-23 1981-02-21 Toshiba Corp Charge storage type semiconductor device and manufacture thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4933582A (en) * 1972-07-26 1974-03-28
JPS5481094A (en) * 1977-11-25 1979-06-28 Hewlett Packard Yokogawa Semiconductor photodetector
JPS5538023A (en) * 1978-09-11 1980-03-17 Toshiba Corp Semiconductor device
JPS55128972A (en) * 1979-03-28 1980-10-06 Hitachi Ltd Solid state pickup device
JPS5618475A (en) * 1979-07-23 1981-02-21 Toshiba Corp Charge storage type semiconductor device and manufacture thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5710985A (en) * 1980-06-25 1982-01-20 Hitachi Ltd Solid image pickup element
JPS6229913B2 (en) * 1980-06-25 1987-06-29 Hitachi Ltd
JPS5870685A (en) * 1981-10-22 1983-04-27 Nec Corp Solid-state image pickup device

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