JPS5655845A - Method and device for dynamic time resolving measurement of xxray spectral absorption - Google Patents

Method and device for dynamic time resolving measurement of xxray spectral absorption

Info

Publication number
JPS5655845A
JPS5655845A JP13310379A JP13310379A JPS5655845A JP S5655845 A JPS5655845 A JP S5655845A JP 13310379 A JP13310379 A JP 13310379A JP 13310379 A JP13310379 A JP 13310379A JP S5655845 A JPS5655845 A JP S5655845A
Authority
JP
Japan
Prior art keywords
sample
sspa
rays
xxray
perturbation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13310379A
Other languages
Japanese (ja)
Other versions
JPH0132459B2 (en
Inventor
Toshihiko Nagamura
Koichi Oka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UNION GIKEN KK
Original Assignee
UNION GIKEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UNION GIKEN KK filed Critical UNION GIKEN KK
Priority to JP13310379A priority Critical patent/JPS5655845A/en
Publication of JPS5655845A publication Critical patent/JPS5655845A/en
Publication of JPH0132459B2 publication Critical patent/JPH0132459B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To perform highly-precise measurement of the change in the state of a sample caused by perturbation by a method wherein X-rays having a pulse-form continuous wavelength are applied to the sample and scattered to form a one-dimensional absorption spectrum image and are detected for each pulse thereof by an SSPA detector. CONSTITUTION:The divergent X-rays 3 given by an X-ray tube 2 pass the sample in a holder 4, are scattered angularly into the respective wavelength in accordance with the incident angle thereof at a spectral crystal 5, are sent to the SSPA detector 6 as the one-dimensional X-ray absorption spectrum image, are transduced into the charge quantity in each single photodiode of SSPA, and are read out as an analog quantity by a scanning circuit. The data thus obtained, passing through a control circuit 8, are sent to a processing device controlled by a timing circuit 11 and, stored there once, are subjected to operational processing. Accordingly, by continuous and repeated application of the divergent X-rays 3, the change in the state of the sample caused by the perturbation can be followed and thus highly-precise measurement can be performed.
JP13310379A 1979-10-15 1979-10-15 Method and device for dynamic time resolving measurement of xxray spectral absorption Granted JPS5655845A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13310379A JPS5655845A (en) 1979-10-15 1979-10-15 Method and device for dynamic time resolving measurement of xxray spectral absorption

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13310379A JPS5655845A (en) 1979-10-15 1979-10-15 Method and device for dynamic time resolving measurement of xxray spectral absorption

Publications (2)

Publication Number Publication Date
JPS5655845A true JPS5655845A (en) 1981-05-16
JPH0132459B2 JPH0132459B2 (en) 1989-06-30

Family

ID=15096880

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13310379A Granted JPS5655845A (en) 1979-10-15 1979-10-15 Method and device for dynamic time resolving measurement of xxray spectral absorption

Country Status (1)

Country Link
JP (1) JPS5655845A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49106393A (en) * 1973-02-09 1974-10-08
JPS5180277A (en) * 1975-01-06 1976-07-13 Kogyo Gijutsuin KEIKOSUPEKUTORUBUNPUJIDOKOSOKUDOSOKUTEISOCHI
JPS522538A (en) * 1975-06-16 1977-01-10 Ibm Spectrum analyzer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49106393A (en) * 1973-02-09 1974-10-08
JPS5180277A (en) * 1975-01-06 1976-07-13 Kogyo Gijutsuin KEIKOSUPEKUTORUBUNPUJIDOKOSOKUDOSOKUTEISOCHI
JPS522538A (en) * 1975-06-16 1977-01-10 Ibm Spectrum analyzer

Also Published As

Publication number Publication date
JPH0132459B2 (en) 1989-06-30

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