JPS56133666A - Testing method of dielectric strength - Google Patents
Testing method of dielectric strengthInfo
- Publication number
- JPS56133666A JPS56133666A JP3795480A JP3795480A JPS56133666A JP S56133666 A JPS56133666 A JP S56133666A JP 3795480 A JP3795480 A JP 3795480A JP 3795480 A JP3795480 A JP 3795480A JP S56133666 A JPS56133666 A JP S56133666A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- electrode
- dividing
- electrodes
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
- G01R31/346—Testing of armature or field windings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE:To take a test of dielectric strength to a DC voltage as to a stator coil, cable etc., in rated voltage, by providing voltage-dividing electrodes at the coil end part of an electric-field reduction layer and by applying the voltage obtained by dividing a voltage applied to a conductor. CONSTITUTION:At the outer circumference of main insulating layer 5 of the coil end side part of electric field reduction layer 7, voltage-dividing electrodes 9a and 9b are provided and the 20% and 60% voltage taps of power source 8 are connected respectively. As the voltage-dividing electrodes, electrodes wound with usual conductive metallic foil of about 10mm. in width may be used. Consequently, the potential distribution of voltage reducing layer 7 is shown by (b) and the potentials of the voltage- dividing electrodes are forcibly held at the same potentials with the tap voltages of the DC high-voltage source. As a result, gradients of rises in potential from one terminal of the electric-field reduction layer to electrode 9a, electrode 9a to electrode 9b, and electrode 9b to the 100% potential are more gentle than usual, and no creeping discharge occurs on the surface of main insulating layer 5.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3795480A JPS56133666A (en) | 1980-03-24 | 1980-03-24 | Testing method of dielectric strength |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3795480A JPS56133666A (en) | 1980-03-24 | 1980-03-24 | Testing method of dielectric strength |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56133666A true JPS56133666A (en) | 1981-10-19 |
Family
ID=12511936
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3795480A Pending JPS56133666A (en) | 1980-03-24 | 1980-03-24 | Testing method of dielectric strength |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56133666A (en) |
-
1980
- 1980-03-24 JP JP3795480A patent/JPS56133666A/en active Pending
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