JPS56111244A - Preparation of semiconductor device - Google Patents
Preparation of semiconductor deviceInfo
- Publication number
- JPS56111244A JPS56111244A JP1359280A JP1359280A JPS56111244A JP S56111244 A JPS56111244 A JP S56111244A JP 1359280 A JP1359280 A JP 1359280A JP 1359280 A JP1359280 A JP 1359280A JP S56111244 A JPS56111244 A JP S56111244A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- main surface
- gettering
- semiconductor device
- damage layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/761—PN junctions
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
Abstract
PURPOSE:To make it possible to perform a uniform gettering, by forming a damage layer in an isolation region or a dicing region on a main surface of a semiconductor device. CONSTITUTION:An N<-> epitaxial layer on a P type Si substrate having an N<+> type buried layer is isolated by BSG layer 4. The layer 4 is coated with resist film and etched for an opening 5 by B ion implantation and a damage layer 6 is formed. Then it is covered by an oxide film to form a bi-polar IC thereon by employing the existing method. With such an arrangement, unlike the hitherto method the damage layer is formed on the main surface of the device during the preparation process. And because the gettering direction is parallel with the main surface, the uniform gettering can be performed regardless of the thickness of the wafer or the disposition in the water. Thus the scattering of the properties between each lot is decreased.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1359280A JPS56111244A (en) | 1980-02-08 | 1980-02-08 | Preparation of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1359280A JPS56111244A (en) | 1980-02-08 | 1980-02-08 | Preparation of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56111244A true JPS56111244A (en) | 1981-09-02 |
Family
ID=11837462
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1359280A Pending JPS56111244A (en) | 1980-02-08 | 1980-02-08 | Preparation of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56111244A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6196740A (en) * | 1984-10-18 | 1986-05-15 | Matsushita Electronics Corp | Manufacture of semiconductor device |
JPS6373528A (en) * | 1986-09-16 | 1988-04-04 | Nec Corp | Gettering structure of semiconductor device |
-
1980
- 1980-02-08 JP JP1359280A patent/JPS56111244A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6196740A (en) * | 1984-10-18 | 1986-05-15 | Matsushita Electronics Corp | Manufacture of semiconductor device |
JPS6373528A (en) * | 1986-09-16 | 1988-04-04 | Nec Corp | Gettering structure of semiconductor device |
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