JPS5450277A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5450277A
JPS5450277A JP11632277A JP11632277A JPS5450277A JP S5450277 A JPS5450277 A JP S5450277A JP 11632277 A JP11632277 A JP 11632277A JP 11632277 A JP11632277 A JP 11632277A JP S5450277 A JPS5450277 A JP S5450277A
Authority
JP
Japan
Prior art keywords
window
region
corners
type region
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11632277A
Other languages
Japanese (ja)
Other versions
JPS6156631B2 (en
Inventor
Kenichiro Ryono
Kazuo Tokuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP11632277A priority Critical patent/JPS5450277A/en
Publication of JPS5450277A publication Critical patent/JPS5450277A/en
Publication of JPS6156631B2 publication Critical patent/JPS6156631B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Element Separation (AREA)

Abstract

PURPOSE: To form a PN junction in the central part of the circumference of a diffusion window and make the element of normal zener voltage-current characteristics by so forming the window that the corner parts thereof is not included in a P type diffused region.
CONSTITUTION: A P type region 14 is provided in an N epitaxial layer 13, and the opposing sides of the diffusion window of the layer 14 forms an N- type region 15 through a much larger window 12. The regions 14, 15 diffuse laterally up to positions 11', 12' and zener voltage is determined by the junction near the position E-E'. In this way, the corners F, F' of the diffusion window 12 of the region 15 are positioned more than 15μ outer of the P type region 14. Next, electrode windows are provided in the surface insulation film 16 and metal wiring is applied. With this constitution, the corners of the N type diffusion window are on the outside of the P type region and therefore the effect of crystal defects caused by stress based on the difference in the coefficients of expansion between SiO2 and Si concentrating at the corners may be eliminated and the normal zener diode current-voltage characteristics obtained
COPYRIGHT: (C)1979,JPO&Japio
JP11632277A 1977-09-27 1977-09-27 Semiconductor device Granted JPS5450277A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11632277A JPS5450277A (en) 1977-09-27 1977-09-27 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11632277A JPS5450277A (en) 1977-09-27 1977-09-27 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS5450277A true JPS5450277A (en) 1979-04-20
JPS6156631B2 JPS6156631B2 (en) 1986-12-03

Family

ID=14684103

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11632277A Granted JPS5450277A (en) 1977-09-27 1977-09-27 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5450277A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58108776A (en) * 1981-12-23 1983-06-28 Toshiba Corp Junction diode
JPS6136980A (en) * 1984-07-18 1986-02-21 ゼネラル・エレクトリック・カンパニイ Diode
JPS62291163A (en) * 1986-06-11 1987-12-17 Oki Electric Ind Co Ltd Semiconductor integrated circuit device
JPS63191655U (en) * 1988-05-25 1988-12-09
US6002144A (en) * 1997-02-17 1999-12-14 Sony Corporation Zener diode semiconductor device with contact portions
US6555894B2 (en) * 1998-04-20 2003-04-29 Intersil Americas Inc. Device with patterned wells and method for forming same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5228548A (en) * 1975-08-30 1977-03-03 Matsushita Electric Works Ltd Caulking material

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5228548A (en) * 1975-08-30 1977-03-03 Matsushita Electric Works Ltd Caulking material

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58108776A (en) * 1981-12-23 1983-06-28 Toshiba Corp Junction diode
JPS6136980A (en) * 1984-07-18 1986-02-21 ゼネラル・エレクトリック・カンパニイ Diode
JPH0578952B2 (en) * 1984-07-18 1993-10-29 Gen Electric
JPS62291163A (en) * 1986-06-11 1987-12-17 Oki Electric Ind Co Ltd Semiconductor integrated circuit device
JPS63191655U (en) * 1988-05-25 1988-12-09
US6002144A (en) * 1997-02-17 1999-12-14 Sony Corporation Zener diode semiconductor device with contact portions
US6555894B2 (en) * 1998-04-20 2003-04-29 Intersil Americas Inc. Device with patterned wells and method for forming same
US6979885B2 (en) 1998-04-20 2005-12-27 Intersil Americas Inc. Devices with patterned wells and method for forming same

Also Published As

Publication number Publication date
JPS6156631B2 (en) 1986-12-03

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