JPH06263479A - Glass for seal bonding and circuit device using the same - Google Patents

Glass for seal bonding and circuit device using the same

Info

Publication number
JPH06263479A
JPH06263479A JP7620993A JP7620993A JPH06263479A JP H06263479 A JPH06263479 A JP H06263479A JP 7620993 A JP7620993 A JP 7620993A JP 7620993 A JP7620993 A JP 7620993A JP H06263479 A JPH06263479 A JP H06263479A
Authority
JP
Japan
Prior art keywords
oxide
glass
weight
sealing
circuit device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7620993A
Other languages
Japanese (ja)
Inventor
Kazuo Sunahara
一夫 砂原
Katsuhisa Nakayama
勝寿 中山
Toshihiro Ohashi
俊寛 大橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP7620993A priority Critical patent/JPH06263479A/en
Publication of JPH06263479A publication Critical patent/JPH06263479A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/24Fusion seal compositions being frit compositions having non-frit additions, i.e. for use as seals between dissimilar materials, e.g. glass and metal; Glass solders

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Glass Compositions (AREA)
  • Joining Of Glass To Other Materials (AREA)

Abstract

PURPOSE:To provide glass for seal bonding excellent in deflective strength and water resistance and having such a low dielectric constant as <=7. CONSTITUTION:This-glass for seal bonding consists of, by weight, 20-80% silica, 5-40% alumina, 5-40% boron oxide, 1-20% lead oxide, 1-5% barium oxide, 0.1-1% alkali metal oxide, 0-1% iron oxide and 0.1-1%, in total, of iron oxide, manganese oxide and nickel oxide.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、封着用ガラス及びそれ
を使用した回路装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glass for sealing and a circuit device using the glass.

【0002】[0002]

【従来の技術】従来、封着用ガラスとしては亜鉛・ホウ
ケイ酸ガラス、鉛・亜鉛・ホウケイ酸ガラス、鉛・ホウ
ケイ酸ガラスなどが用いられている。さらには、金属と
の密着性を向上させるため、遷移金属、特にチタンを添
加した鉛・チタンガラス、鉛・チタンガラスセラミック
スなどが用いられている。
2. Description of the Related Art Conventionally, zinc / borosilicate glass, lead / zinc / borosilicate glass, lead / borosilicate glass and the like have been used as glass for sealing. Furthermore, in order to improve the adhesion with metals, transition metals, particularly lead / titanium glass, and lead / titanium glass ceramics to which titanium is added are used.

【0003】しかし、これらの封着用ガラスの抗折強度
は、たかだか300〜1000kg/cm2 であり応用
範囲を狭める原因となっていた。また、回路装置の金属
製リード端子を封着した場合、封着用ガラスの抗折強度
が低いため、リード端子の曲げ加工などリード端子の周
辺に応力が加わるような加工時には、ガラスにクラック
などの欠陥が生じて気密性が低下するという課題があっ
た。
However, the bending strength of these sealing glasses is at most 300 to 1000 kg / cm 2, which is a cause of narrowing the range of application. In addition, when the metal lead terminals of the circuit device are sealed, the bending strength of the sealing glass is low, so cracking or other damage to the glass may occur during processing such as bending the lead terminals when stress is applied to the periphery of the lead terminals. There has been a problem that defects are generated and the airtightness is lowered.

【0004】[0004]

【発明が解決しようとする課題】本発明は、従来技術の
上記課題を解消しようとするもので、抗折強度が大き
く、回路装置の金属製リード端子を封着した場合、リー
ド端子の曲げ加工などリード端子の周辺に応力が加わる
ような加工時にも、ガラスにクラックなどの欠陥が生じ
て気密性が低下することのない封着用ガラス、及び、そ
れを使用した回路装置の提供を目的とする。
DISCLOSURE OF THE INVENTION The present invention is intended to solve the above-mentioned problems of the prior art and has a large bending strength, and when a metal lead terminal of a circuit device is sealed, the lead terminal is bent. An object of the present invention is to provide a sealing glass that does not deteriorate the airtightness due to defects such as cracks in the glass even when processing is applied to the periphery of the lead terminal, etc., and a circuit device using the sealing glass. .

【0005】[0005]

【課題を解決するための手段】本発明は、重量%表示で
実質的に シリカ20〜80% アルミナ5〜40% 酸化ほう素5〜40% 酸化鉛1〜20% 酸化バリウム1〜5% アルカリ金属酸化物0.1〜1% 鉄の酸化物0〜1% マンガンの酸化物0〜1% ニッケルの酸化物0〜1% 鉄の酸化物+マンガンの酸化物+ニッケルの酸化物0.
1〜1% からなる封着用ガラス、及び、この封着用ガラスにより
リード端子を封着してなる回路装置である。
The present invention is substantially in terms of weight% silica 20 to 80% alumina 5 to 40% boron oxide 5 to 40% lead oxide 1 to 20% barium oxide 1 to 5% alkali Metal oxide 0.1-1% Iron oxide 0-1% Manganese oxide 0-1% Nickel oxide 0-1% Iron oxide + manganese oxide + nickel oxide
A sealing glass comprising 1 to 1%, and a circuit device obtained by sealing a lead terminal with the sealing glass.

【0006】本発明の封着用ガラスの組成限定理由を以
下に述べる。シリカ(SiO2 )は、ガラスを構成する
基本成分であり、20重量%未満では誘電率が大きくな
り、80重量%超では抗折強度が低下する。望ましくは
30〜60重量%であり、特に望ましくは40〜55重
量%である。アルミナ(Al23 )は、ガラスを構成
する基本成分であり、5重量%未満では抗折強度が低下
し、40重量%では誘電率が大きくなるのみならず溶融
しにくくなる。望ましくは10〜30重量%であり、特
に望ましくは15〜25重量%である。
The reasons for limiting the composition of the glass for sealing of the present invention will be described below. Silica (SiO 2 ) is a basic component constituting glass, and if it is less than 20% by weight, the dielectric constant becomes large, and if it exceeds 80% by weight, the bending strength is lowered. It is preferably 30 to 60% by weight, and particularly preferably 40 to 55% by weight. Alumina (Al 2 O 3 ) is a basic component constituting glass, and if it is less than 5% by weight, the flexural strength is lowered, and if it is 40% by weight, not only the dielectric constant becomes large but also it becomes difficult to melt. It is preferably 10 to 30% by weight, particularly preferably 15 to 25% by weight.

【0007】酸化ほう素(B23 )は、フラックス成
分であり、5重量%未満では溶融しにくくなり、かつ焼
結性が低下するため抗折強度が低下し、40重量%超で
は耐水性が低下する。望ましくは10〜30重量%であ
り、特に望ましくは15〜25重量%である。酸化鉛
(PbO)は、改質成分であり、1重量%未満では溶融
しにくくなり、かつ焼結性が低下するため抗折強度が低
下し、20重量%超では誘電率が増大する。望ましくは
3〜12重量%であり、特に望ましくは5〜8重量%で
ある。
Boron oxide (B 2 O 3 ) is a flux component, and if it is less than 5% by weight, it becomes difficult to melt, and the sinterability is lowered, so that the flexural strength is lowered, and if it exceeds 40% by weight, it is water resistant. Sex decreases. It is preferably 10 to 30% by weight, particularly preferably 15 to 25% by weight. Lead oxide (PbO) is a modifying component, and if it is less than 1% by weight, it becomes difficult to melt and the sinterability is lowered, so that the flexural strength is lowered, and if it exceeds 20% by weight, the dielectric constant is increased. It is preferably 3 to 12% by weight, and particularly preferably 5 to 8% by weight.

【0008】酸化バリウム(BaO)は、改質成分であ
り、1重量%未満では溶融しにくくなり焼結性が低下す
るため抗折強度が低下し、5重量%超では誘電率が増大
する。望ましくは1.5〜4重量%であり、特に望まし
くは2〜3重量%である。アルカリ金属酸化物は、フラ
ックス成分であり、0.1重量%未満では溶融しにくく
なり焼結性が低下するため抗折強度が低下し、1重量%
超では耐水性が低下する。望ましくは0.3〜0.8重
量%であり、特に望ましくは0.5〜0.7重量%であ
る。アルカリ金属酸化物としては、Li2 O、Na2
O、K2 Oの1種又は2種以上が使用される。
[0008] Barium oxide (BaO) is a modifying component, and if it is less than 1% by weight, it is difficult to melt and the sinterability is lowered, so the flexural strength is lowered, and if it exceeds 5% by weight, the dielectric constant is increased. It is preferably 1.5 to 4% by weight, particularly preferably 2 to 3% by weight. Alkali metal oxide is a flux component, and if it is less than 0.1% by weight, it is difficult to melt and the sinterability is reduced, so that the flexural strength is reduced, and 1% by weight is obtained.
If it exceeds the limit, the water resistance will decrease. It is preferably 0.3 to 0.8% by weight, and particularly preferably 0.5 to 0.7% by weight. Examples of alkali metal oxides include Li 2 O and Na 2
One or more of O and K 2 O are used.

【0009】鉄の酸化物、マンガンの酸化物及びニッケ
ルの酸化物は、金属端子との接着性を向上させる成分で
あり1種又は2種以上が使用される。これら3種の酸化
物の総量が0.1重量%未満では接着強度が低下し、1
重量%超では誘電率が増大する。望ましくは0.3〜
0.8重量%であり。特に望ましくは0.5〜0.7重
量%である。
The iron oxide, manganese oxide, and nickel oxide are components that improve the adhesiveness to the metal terminal, and one or more of them are used. If the total amount of these three kinds of oxides is less than 0.1% by weight, the adhesive strength will decrease, and
If the content exceeds 50% by weight, the dielectric constant increases. Desirably 0.3-
0.8% by weight. It is particularly preferably 0.5 to 0.7% by weight.

【0010】なお、この封着用ガラスの一部は、結晶
質、非結晶質又はガラス質のいずれか1種又は2種以上
の相が、共存している場合でも本発明の効果にかわりは
ない。また、本発明の封着用ガラスに着色剤を添加して
も限定されるものではない。
It should be noted that a part of the glass for sealing does not change the effect of the present invention even if one or more phases of crystalline, amorphous or glassy coexist. . Further, the addition of a coloring agent to the glass for sealing of the present invention is not limited.

【0011】図1は、本発明による封着用ガラスを使用
した回路装置の断面図である。図のように、コバール合
金製基板1とコバール合金製シーリング2との間にコバ
ール合金製リードフレーム3を挟持し、上記封着用ガラ
ス4により、コバール合金製リードフレーム3を封着し
てある。コバール合金製リードフレーム3にはNiーA
uメッキが行われており、ICチップ5は、基板1の上
にダイボンドされている。また、コバール合金製リード
フレーム3とICチップ5とは、金線8により接続され
ている。コバール合金製上蓋6は、AuーSn合金7に
よりコバール合金製シーリング2に接着されている。
FIG. 1 is a sectional view of a circuit device using the glass for sealing according to the present invention. As shown in the figure, a Kovar alloy lead frame 3 is sandwiched between a Kovar alloy substrate 1 and a Kovar alloy ceiling 2, and the Kovar alloy lead frame 3 is sealed by the sealing glass 4. Ni-A on the lead frame 3 made of Kovar alloy
u-plating is performed, and the IC chip 5 is die-bonded on the substrate 1. The Kovar alloy lead frame 3 and the IC chip 5 are connected by a gold wire 8. The Kovar alloy upper lid 6 is bonded to the Kovar alloy sealing 2 with an Au—Sn alloy 7.

【0012】[0012]

【作用】本発明の作用メカニズムは必ずしも明確ではな
いが、本発明のガラス中でPbO系ガラスとBaO系ガ
ラスがミクロ的に共存し、圧縮応力が発生しガラスが強
化されるものと推定される。
Although the mechanism of action of the present invention is not always clear, it is presumed that PbO-based glass and BaO-based glass coexist microscopically in the glass of the present invention to generate compressive stress and strengthen the glass. .

【0013】[0013]

【実施例】原料を調合し、白金坩堝に入れ、1400〜
1500℃で2〜4加熱撹拌溶融した。次いで、これを
水砕し、さらに粉砕装置にて平均粒径5μmに粉砕し、
表1、表2に記載した組成(単位:重量%)のガラス粉
末を得た。
Example: Raw materials are mixed and put in a platinum crucible, and 1400 to
The mixture was heated and stirred at 1500 ° C. for 2 to 4 to melt. Next, this is pulverized with water, and further pulverized with a pulverizer into an average particle size of 5 μm,
Glass powders having compositions (unit:% by weight) shown in Tables 1 and 2 were obtained.

【0014】このガラス粉末にバインダーとしてエチル
セルロース、溶剤としてブチルカルビトールアセテート
を加え、アルミナ乳鉢中で混練しペースト状に調整し
た。これを厚さ0.8mm、巾5mm、長さ30mmに
成形し、850℃で2時間焼成した。このガラス焼成品
の抗折強度、誘電率、耐水性(水和重量増加率)を測定
した。さらに、このガラスペーストを用いて、図1に示
した、外形10mm角、高さ2mm、端子数20の回路
装置を作製し、米国MIL.STD 883Cー200
4に従って、端子の3回曲げ試験を3回繰り返して行い
ガラス封着部のリークテスト(単位:10-9stdcc
/秒)を行った。これらの結果も表1、表2に記載し
た。また、比較例として、別の封着用ガラスを用い同様
の測定を行った。その結果を表3に示した。
Ethyl cellulose as a binder and butyl carbitol acetate as a solvent were added to this glass powder and kneaded in an alumina mortar to prepare a paste. This was molded into a thickness of 0.8 mm, a width of 5 mm and a length of 30 mm, and baked at 850 ° C. for 2 hours. The bending strength, dielectric constant, and water resistance (hydration weight increase rate) of this glass fired product were measured. Further, using this glass paste, a circuit device having an outer shape of 10 mm square, a height of 2 mm and 20 terminals shown in FIG. STD 883C-200
In accordance with No. 4, the bending test of the terminal was repeated three times and the leak test of the glass-sealed part (unit: 10 -9 stdcc
/ Sec). These results are also shown in Tables 1 and 2. As a comparative example, the same measurement was performed using another sealing glass. The results are shown in Table 3.

【0015】(特性評価方法) 1)抗折強度:東洋ボールドイン製強度試験機により測
定した。試験用サンプルを20mmの2支点上に置き、
支点間中央に、0.5mm/分の速度で荷重を加え破損
時の荷重を測定した。 2)誘電率:安藤電気製交流ブリッジにより100kH
zの特性を測定した。その際の雰囲気は、温度25±1
℃、湿度45±1%であった。 3)耐水性(水和重量増加率):サンプルを、温度90
℃±1℃、相対湿度95±1%の環境に24時間放置
し、重量増加率を測定した。 4)リークテスト:米国MIL.STD 883Cー1
014に従ってHeリークテストを行った。
(Characteristic Evaluation Method) 1) Bending Strength: Measured by a strength tester manufactured by Toyo Bold-in. Place the test sample on two fulcrums of 20 mm,
A load was applied to the center between the fulcrums at a speed of 0.5 mm / min and the load at break was measured. 2) Dielectric constant: 100kH by Ando Denki AC bridge
The characteristics of z were measured. At that time, the atmosphere is 25 ± 1
C., humidity 45 ± 1%. 3) Water resistance (rate of increase in hydrated weight): the sample was tested at a temperature of 90
The sample was left for 24 hours in an environment of ° C ± 1 ° C and relative humidity of 95 ± 1%, and the weight increase rate was measured. 4) Leak test: US MIL. STD 883C-1
A He leak test was conducted according to 014.

【0016】[0016]

【表1】 [Table 1]

【0017】[0017]

【表2】 [Table 2]

【0018】[0018]

【表3】 [Table 3]

【0019】[0019]

【発明の効果】これらの結果より明かな如く、本発明の
封着用ガラスは、抗折強度1600kg/cm2 以上、
誘電率7以下、耐水性(水和重量増加率)0.3%以下
と従来の封着用ガラスでは得られなかった優れた特性を
示す。さらに、本発明の封着用ガラスを用いて作製した
回路装置は曲げ試験後のリーク不良はなく、優れた信頼
性を示す。よってその工業的な価値は多大である。
As is clear from these results, the sealing glass of the present invention has a bending strength of 1600 kg / cm 2 or more,
Dielectric constant of 7 or less and water resistance (rate of increase in hydrated weight) of 0.3% or less exhibit excellent properties not obtained by conventional sealing glass. Furthermore, the circuit device produced using the glass for sealing of the present invention has no leakage failure after the bending test and exhibits excellent reliability. Therefore, its industrial value is enormous.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のガラス組成物を用いて作製した回路装
置の断面図
FIG. 1 is a cross-sectional view of a circuit device produced by using the glass composition of the present invention.

【符号の説明】[Explanation of symbols]

1:コバール合金製基板 2:コバール合金製シールリング 3:コバール合金製リードフレーム 4:封着用ガラス 1: Kovar alloy substrate 2: Kovar alloy seal ring 3: Kovar alloy lead frame 4: Sealing glass

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】重量%表示で実質的に シリカ20〜80% アルミナ5〜40% 酸化ほう素5〜40% 酸化鉛1〜20% 酸化バリウム1〜5% アルカリ金属酸化物0.1〜1% 鉄の酸化物0〜1% マンガンの酸化物0〜1% ニッケルの酸化物0〜1% 鉄の酸化物+マンガンの酸化物+ニッケルの酸化物0.
1〜1% からなる封着用ガラス。
1. Wt% substantially silica 20-80% Alumina 5-40% Boron oxide 5-40% Lead oxide 1-20% Barium oxide 1-5% Alkali metal oxide 0.1-1 % Iron oxide 0-1% Manganese oxide 0-1% Nickel oxide 0-1% Iron oxide + manganese oxide + nickel oxide 0.
Glass for sealing consisting of 1 to 1%.
【請求項2】請求項1記載の封着用ガラスによりリード
端子を封着してなる回路装置。
2. A circuit device in which lead terminals are sealed with the sealing glass according to claim 1.
JP7620993A 1993-03-10 1993-03-10 Glass for seal bonding and circuit device using the same Pending JPH06263479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7620993A JPH06263479A (en) 1993-03-10 1993-03-10 Glass for seal bonding and circuit device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7620993A JPH06263479A (en) 1993-03-10 1993-03-10 Glass for seal bonding and circuit device using the same

Publications (1)

Publication Number Publication Date
JPH06263479A true JPH06263479A (en) 1994-09-20

Family

ID=13598786

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7620993A Pending JPH06263479A (en) 1993-03-10 1993-03-10 Glass for seal bonding and circuit device using the same

Country Status (1)

Country Link
JP (1) JPH06263479A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003324166A (en) * 2002-04-26 2003-11-14 Matsushita Electric Ind Co Ltd Glass terminal and manufacturing method thereof and air-tight terminal employing glass terminal
WO2021024620A1 (en) * 2019-08-08 2021-02-11 日本電気硝子株式会社 Glass powder, dielectric material, sintered body, and high frequency circuit member
JP2023051778A (en) * 2021-09-30 2023-04-11 富喬工業股▲分▼有限公司 Glass composition, glass, glass fiber and product containing the glass fiber

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003324166A (en) * 2002-04-26 2003-11-14 Matsushita Electric Ind Co Ltd Glass terminal and manufacturing method thereof and air-tight terminal employing glass terminal
WO2021024620A1 (en) * 2019-08-08 2021-02-11 日本電気硝子株式会社 Glass powder, dielectric material, sintered body, and high frequency circuit member
CN114206794A (en) * 2019-08-08 2022-03-18 日本电气硝子株式会社 Glass powder, dielectric material, sintered body, and high-frequency circuit member
CN114206794B (en) * 2019-08-08 2023-07-21 日本电气硝子株式会社 Glass powder, dielectric material, sintered body, and circuit component for high frequency
US11939258B2 (en) 2019-08-08 2024-03-26 Nippon Electric Glass Co., Ltd. Glass powder, dielectric material, sintered body, and high frequency circuit member
JP2023051778A (en) * 2021-09-30 2023-04-11 富喬工業股▲分▼有限公司 Glass composition, glass, glass fiber and product containing the glass fiber

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