JPH06232334A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH06232334A
JPH06232334A JP1648693A JP1648693A JPH06232334A JP H06232334 A JPH06232334 A JP H06232334A JP 1648693 A JP1648693 A JP 1648693A JP 1648693 A JP1648693 A JP 1648693A JP H06232334 A JPH06232334 A JP H06232334A
Authority
JP
Japan
Prior art keywords
semiconductor device
conductor layer
substrate
noise
pass capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1648693A
Other languages
Japanese (ja)
Other versions
JP2973261B2 (en
Inventor
Yoshifumi Nakamura
嘉文 中村
Yoshihiro Bessho
芳宏 別所
Sei Yuhaku
祐伯  聖
Yasuhiko Hakotani
靖彦 箱谷
Minehiro Itagaki
峰広 板垣
Kazuhiro Miura
和裕 三浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=11917618&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPH06232334(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP5016486A priority Critical patent/JP2973261B2/en
Publication of JPH06232334A publication Critical patent/JPH06232334A/en
Application granted granted Critical
Publication of JP2973261B2 publication Critical patent/JP2973261B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To reduce the pass capacitor components, one of countermeasures to the noise of a semiconductor device and required as a mounting component and called pass capacitors, and to contrive a reduction in the cost of the device. CONSTITUTION:A capacitance forming region consisting of an internal ground conductor layer 7 and an internal power supply conductor layer 8 is formed in the interior of a substrate of a semiconductor device constituted using the ceramic substrate 1 as its main body, whereby one pass capacitor can be made to have to one semiconductor element and the formation of a semiconductor device, which is effective as one of countermeasures to the noise of the semiconductor device, becomes possible.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体装置内部に容量発
生領域(パスコンデンサ)を持つ半導体装置に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device having a capacitance generating region (pass capacitor) inside the semiconductor device.

【0002】[0002]

【従来の技術】現在、製造されている回路基板内では様
々な雑音が発生している。この雑音は回路動作に悪影響
を及ぼし、回路の誤動作を起こす要因となっている。そ
こで回路設計者は、回路設計時に基板内雑音防止対策の
1つとして、半導体装置の近くにパスコンデンサを挿入
した回路を作製する。このパスコンデンサは半導体装置
のグランド電位部と電源電位部との間に挿入されるコン
デンサで、前記コンデンサを使用することで回路基板内
雑音の防止に対して大変有効である。そのため、一般的
によく利用される方法となっている。前記コンデンサの
実装部品のタイプはDPI部品,面実装部品などがあ
り、種類としてはセラミックコンデンサ,タンタルコン
デンサなどがある。
2. Description of the Related Art At present, various noises are generated in a circuit board being manufactured. This noise adversely affects the operation of the circuit and causes a malfunction of the circuit. Therefore, the circuit designer creates a circuit in which a pass capacitor is inserted near the semiconductor device as one of the measures for preventing the noise in the substrate when designing the circuit. This pass capacitor is a capacitor inserted between the ground potential part and the power supply potential part of the semiconductor device, and by using the capacitor, it is very effective in preventing noise in the circuit board. Therefore, it is a commonly used method. There are DPI parts, surface mount parts, and the like as the types of parts mounted on the capacitor, and types such as ceramic capacitors and tantalum capacitors.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、前記基
板内雑音防止対策の1つとして、半導体装置の近くにパ
スコンデンサを挿入する手段は、非常に有効な手段で一
般によく使われてはいるが、これは数個の半導体装置に
対して1つのパスコンデンサを接続する手段である。
However, as one of the measures for preventing the in-board noise, a means for inserting a pass capacitor near the semiconductor device is a very effective means and is generally used. This is a means for connecting one pass capacitor to several semiconductor devices.

【0004】ここで問題となるのは半導体装置が多数個
になった場合、パスコンデンサが多数個必要になるとい
うことである。そのため、回路動作に関係ない部品が多
くなり、部品コストがかかってしまうことになる。また
パスコンデンサという実装部品が増えるので、基板内に
余分な実装領域が必要になってしまう。そのため基板面
積を大きくする必要性もでてきてしまい、基板コストも
かかってしまうという問題があった。
The problem here is that when a large number of semiconductor devices are provided, a large number of pass capacitors are required. Therefore, the number of parts that are not related to the circuit operation increases, and the parts cost increases. Moreover, since the number of mounting components called pass capacitors increases, an extra mounting area is required in the substrate. Therefore, there is a problem in that it is necessary to increase the area of the substrate and the cost of the substrate increases.

【0005】本発明は、このような問題点を解決し、雑
音対策の1つであるパスコンデンサという実装部品の低
減とともに低コスト化を図ることを目的とする。
It is an object of the present invention to solve the above problems and to reduce the cost of mounting components such as a pass capacitor, which is one of the measures against noise, and to reduce the cost.

【0006】[0006]

【課題を解決するための手段】本発明は上記目的を達成
するため、セラミック多層基板に半導体素子を実装して
なる半導体装置の外層または内層に導体層を有し、前記
導体層を複数層、相互に重なり合わせ容量発生領域を形
成したことを特徴とする。この半導体装置のグランド電
位と電源電位の導体層で容量発生領域を形成するもので
ある。
In order to achieve the above-mentioned object, the present invention has a conductor layer as an outer layer or an inner layer of a semiconductor device in which a semiconductor element is mounted on a ceramic multi-layer substrate, and the conductor layer comprises a plurality of layers. It is characterized in that the capacitance generating regions are formed so as to overlap each other. The capacitance generating region is formed by the conductor layer of the ground potential and the power source potential of this semiconductor device.

【0007】[0007]

【作用】本発明によれば、雑音対策に有効なパスコンデ
ンサをパッケージ内に内蔵した半導体装置を使用するこ
とにより、マザー基板上にパスコンデンサを実装する必
要がなくなり、プリント回路基板作製時にコンデンサ部
品を減らすことができ、部品のコストを削減できる。ま
た、部品の実装面積が縮小でき、マザー基板を小さく作
製できる。
According to the present invention, by using a semiconductor device having a pass capacitor effective for noise suppression built in a package, it is not necessary to mount the pass capacitor on a mother board, and a capacitor component is produced when a printed circuit board is manufactured. Can be reduced, and the cost of parts can be reduced. In addition, the mounting area of components can be reduced, and the mother substrate can be made small.

【0008】[0008]

【実施例】図1は本発明の一実施例におけるセラミック
多層基板を本体とする半導体装置の斜視図、図2は図1
の断面図(1)と各層における透視平面図(2)を示す。図1
および図2において、1は半導体素子、2はセラミック
基板、3は内部ベタ領域、4は配線パターン、5はサイ
ド電極、6はセラミック部、7は内部グランド導体層、
8は内部電源導体層である。
1 is a perspective view of a semiconductor device having a ceramic multi-layer substrate as a main body in an embodiment of the present invention, and FIG.
A cross-sectional view (1) and a perspective plan view (2) of each layer are shown. Figure 1
In FIG. 2, 1 is a semiconductor element, 2 is a ceramic substrate, 3 is an internal solid region, 4 is a wiring pattern, 5 is a side electrode, 6 is a ceramic part, 7 is an internal ground conductor layer,
Reference numeral 8 is an internal power supply conductor layer.

【0009】上記構成において、セラミック部6を介し
て内部グランド導体層7と内部電源導体層8で容量発生
領域が形成される。
In the above structure, the capacitance generating region is formed by the internal ground conductor layer 7 and the internal power supply conductor layer 8 with the ceramic portion 6 interposed therebetween.

【0010】次に本実施例の半導体装置内部に容量発生
領域(パスコンデンサ)を持つ半導体装置の作製について
説明する。セラミック基板2となる基板組成セラミック
粉を無機成分とし、有機バインダとしてポリビニルブチ
ラール、可塑剤としてジ−n−ブチルフタレート、溶剤
としてトルエンとイソプロピルアルコールの混合液(30
対70重量比)を混合しスラリーとした。このスラリーを
ドクターブレード法で有機フィルム上にシート形成し
た。このとき、造膜から乾燥,打ち抜きを行う各工程を
連続的に行うシステムを使用した。このグリーンシート
にコンデンサとすべく、導体ペーストをベタ印刷し、熱
圧着して積層体を形成した。
Next, fabrication of a semiconductor device having a capacitance generating region (pass capacitor) inside the semiconductor device of this embodiment will be described. The substrate composition ceramic powder to be the ceramic substrate 2 is used as an inorganic component, polyvinyl butyral as an organic binder, di-n-butyl phthalate as a plasticizer, and a mixed liquid of toluene and isopropyl alcohol as a solvent (30
(70 weight ratio) was mixed to form a slurry. This slurry was formed into a sheet on an organic film by the doctor blade method. At this time, a system was used in which the steps of drying and punching from the film formation were continuously performed. A conductor paste was solid-printed on this green sheet to form a capacitor and thermocompression bonded to form a laminate.

【0011】サイド電極5を作製すべく、前記積層体の
外形に沿って所望の数のスルーホールを形成し、前記ス
ルーホールの内壁に導体層を形成すべく、スクリーン印
刷法で導体ペーストをスルーホール上に積層体の下から
吸引しながら印刷した。半導体素子1のグランド端子と
電源端子が接続するパッドは内部グランド導体層7と内
部電源導体層8に接続された任意のスルーホールに接続
されるようにスクリーン印刷法で導体印刷した。
In order to form the side electrode 5, a desired number of through holes are formed along the outer shape of the laminated body, and a conductor paste is passed through by a screen printing method to form a conductor layer on the inner wall of the through hole. Printing was performed on the holes while sucking from below the laminate. Conductor printing was carried out by the screen printing method so that the pad connecting the ground terminal and the power supply terminal of the semiconductor element 1 was connected to an arbitrary through hole connected to the internal ground conductor layer 7 and the internal power supply conductor layer 8.

【0012】導体ペーストは、CuO粉末(平均粒径3μ
m)に接着強度を得るためのガラスフリット(日本電気硝
子社製 LS−0803ガラス粉末,平均粒径3μm)を2.5w
t%加えたものを無機成分とし、有機バインダであるエ
チルセルロースをターピネオールに溶かしたビヒクルを
加えて、3段ロールにより適度な粘度になるように混合
したものを用いた。
The conductor paste is CuO powder (average particle size 3 μm).
2.5 w of glass frit (LS-0803 glass powder manufactured by Nippon Electric Glass Co., Ltd., average particle size 3 μm) for obtaining adhesive strength
A vehicle prepared by dissolving ethyl cellulose, which is an organic binder, in terpineol was added to the mixture containing t% as an inorganic component, and the mixture was mixed by a three-stage roll so as to have an appropriate viscosity.

【0013】このようにして印刷の終わった積層体を空
気中、600℃の温度で脱バインダを行った。その後、前
記積層体を水素ガス100%雰囲気中で300℃−5時間で還
元した。このときのCu層をX線回折により分析したと
ころ、100%Cuであることを確認した。最後に純窒素中
900℃のメッシュベルト炉で焼成した。
The thus printed laminate was debindered in air at a temperature of 600 ° C. Then, the laminated body was reduced in an atmosphere of 100% hydrogen gas at 300 ° C. for 5 hours. When the Cu layer at this time was analyzed by X-ray diffraction, it was confirmed to be 100% Cu. Finally in pure nitrogen
It was baked in a mesh belt furnace at 900 ° C.

【0014】次に焼成した基板のスルーホール上にレー
ザーカッターでスクライブラインを入れ、スルーホール
を分割した。
Next, a scribe line was put on the through hole of the fired substrate with a laser cutter to divide the through hole.

【0015】セラミック基板2の面積は20mm×20mmと
し、サイド電極5のスルーホール径は0.8mmとした。内
部グランド導体層7と内部電源導体層8の内部ベタ領域
3の面積は17mm×17mm、基板誘電率7.9、基板層間厚み
0.1mmとした。
The area of the ceramic substrate 2 was 20 mm × 20 mm, and the through hole diameter of the side electrode 5 was 0.8 mm. The area of the inner solid area 3 of the inner ground conductor layer 7 and the inner power conductor layer 8 is 17 mm × 17 mm, the board permittivity is 7.9, and the board interlayer thickness is
It was set to 0.1 mm.

【0016】その結果、内部グランド導体層7と内部電
源導体層8の間に約20pFの容量を持たせることができ
た。これによって、20pFの容量を持つパスコンデンサ内
蔵の半導体装置を作製し、前記半導体装置により回路基
板内で発生する雑音に対処できる。
As a result, a capacitance of about 20 pF could be provided between the internal ground conductor layer 7 and the internal power supply conductor layer 8. As a result, a semiconductor device with a built-in pass capacitor having a capacitance of 20 pF can be manufactured, and the semiconductor device can cope with noise generated in the circuit board.

【0017】[0017]

【発明の効果】以上説明したように本発明の半導体装置
は、パスコンデンサを半導体装置内に持たせることで、
雑音対策に有効である。また、半導体装置を使用する際
に、マザー基板上に必要であったパスコンデンサをなく
すことが可能になり、マザー基板上のコンデンサの部品
数を削減することができ、部品数が減ることでマザー基
板上での部品配置が容易になる。
As described above, in the semiconductor device of the present invention, by providing the pass capacitor in the semiconductor device,
Effective for noise suppression. In addition, when using a semiconductor device, it is possible to eliminate the pass capacitor that was required on the mother board, and it is possible to reduce the number of capacitor parts on the mother board. The parts can be easily placed on the board.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例におけるセラミック多層基板
を本体とする半導体装置の斜視図である。
FIG. 1 is a perspective view of a semiconductor device having a ceramic multilayer substrate as a main body in an embodiment of the present invention.

【図2】図1の断面図(1)と各層における透視平面図(2)
である。
FIG. 2 is a cross-sectional view (1) of FIG. 1 and a perspective plan view (2) of each layer.
Is.

【符号の説明】[Explanation of symbols]

1…半導体素子、 2…セラミック基板、 3…内部ベ
タ領域、 4…配線パターン、 5…サイド電極、 6
…セラミック部、 7…内部グランド導体層、8…内部
電源導体層。
DESCRIPTION OF SYMBOLS 1 ... Semiconductor element, 2 ... Ceramic substrate, 3 ... Internal solid region, 4 ... Wiring pattern, 5 ... Side electrode, 6
... ceramic part, 7 ... internal ground conductor layer, 8 ... internal power supply conductor layer.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 箱谷 靖彦 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 板垣 峰広 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 三浦 和裕 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yasuhiko Hakotani 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (72) Inventor Kazuhiro Miura 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 セラミック多層基板に半導体素子を実装
してなる半導体装置の外層または内層に導体層を有し、
前記導体層を複数層、相互に重なり合わせ容量発生領域
を形成したことを特徴とする半導体装置。
1. A semiconductor device in which a semiconductor element is mounted on a ceramic multilayer substrate has a conductor layer as an outer layer or an inner layer,
A semiconductor device, wherein a plurality of conductor layers are overlapped with each other to form a capacitance generation region.
【請求項2】 グランド電位と電源電位の導体層で容量
発生領域を形成することを特徴とする請求項1記載の半
導体装置。
2. The semiconductor device according to claim 1, wherein the capacitance generation region is formed by a conductor layer having a ground potential and a power supply potential.
JP5016486A 1993-02-03 1993-02-03 Semiconductor device Expired - Fee Related JP2973261B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5016486A JP2973261B2 (en) 1993-02-03 1993-02-03 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5016486A JP2973261B2 (en) 1993-02-03 1993-02-03 Semiconductor device

Publications (2)

Publication Number Publication Date
JPH06232334A true JPH06232334A (en) 1994-08-19
JP2973261B2 JP2973261B2 (en) 1999-11-08

Family

ID=11917618

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5016486A Expired - Fee Related JP2973261B2 (en) 1993-02-03 1993-02-03 Semiconductor device

Country Status (1)

Country Link
JP (1) JP2973261B2 (en)

Also Published As

Publication number Publication date
JP2973261B2 (en) 1999-11-08

Similar Documents

Publication Publication Date Title
US8720050B2 (en) Method for manufacturing multilayer substrate with built-in chip-type electronic component
US6432239B1 (en) Method of producing ceramic multilayer substrate
US6036798A (en) Process for producing electronic part with laminated substrates
JP2785544B2 (en) Method for manufacturing multilayer ceramic substrate
JP2004134806A (en) Ceramic capacitor baked at same time, and method for forming ceramic capacitor to use in printed circuit board
KR100713731B1 (en) Printed wiring boards having low inductance embedded capacitors and methods of making same
JP3351043B2 (en) Method for manufacturing multilayer ceramic substrate
JP3062413B2 (en) Semiconductor device and manufacturing method thereof
JPH06237081A (en) Manufacture of multilayer ceramic substrate
JPH06302760A (en) Semiconductor device
JPH05327218A (en) Manufacture of multilayer ceramic base
JPH06232334A (en) Semiconductor device
WO2017069093A1 (en) Multilayer ceramic substrate and method for manufacturing same
JP3082475B2 (en) Method for manufacturing multilayer ceramic substrate
JPH0878912A (en) Multi-layer circuit board provided with strip line
JPH06302714A (en) Semiconductor device
JP2007184314A (en) Method for manufacturing ceramic multilayer substrate and ceramic multilayer substrate
JP3188086B2 (en) Ceramic wiring board, its manufacturing method and its mounting structure
JPH05136572A (en) Manufacture of multilayered ceramic board
JPH0786739A (en) Manufacture of multilayer ceramic board
JPH05327220A (en) Manufacture of multilayer ceramic base
JPH05167253A (en) Manufacture of multilayer ceramic board
JP2009147160A (en) Manufacturing method of multilayer ceramic substrate, multilayer ceramic substrate, and electronic component using the same
WO2023199695A1 (en) Multilayer ceramic electronic component
JP2812605B2 (en) Method for manufacturing multilayer ceramic substrate

Legal Events

Date Code Title Description
FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080903

Year of fee payment: 9

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 9

Free format text: PAYMENT UNTIL: 20080903

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 10

Free format text: PAYMENT UNTIL: 20090903

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090903

Year of fee payment: 10

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100903

Year of fee payment: 11

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110903

Year of fee payment: 12

LAPS Cancellation because of no payment of annual fees