JPH06204219A - 半導体装置のコンタクト構造形成方法 - Google Patents

半導体装置のコンタクト構造形成方法

Info

Publication number
JPH06204219A
JPH06204219A JP5254414A JP25441493A JPH06204219A JP H06204219 A JPH06204219 A JP H06204219A JP 5254414 A JP5254414 A JP 5254414A JP 25441493 A JP25441493 A JP 25441493A JP H06204219 A JPH06204219 A JP H06204219A
Authority
JP
Japan
Prior art keywords
pattern
material layer
forming
layer
contact structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5254414A
Other languages
English (en)
Japanese (ja)
Inventor
Yunheub Song
潤洽 宋
Kyeong-Tae Kim
▲火▼台 金
Heon-Jong Shin
憲宗 申
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of JPH06204219A publication Critical patent/JPH06204219A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
JP5254414A 1992-10-13 1993-10-12 半導体装置のコンタクト構造形成方法 Pending JPH06204219A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1992P18788 1992-10-13
KR1019920018788A KR940010196A (ko) 1992-10-13 1992-10-13 반도체장치의 콘택구조 형성방법

Publications (1)

Publication Number Publication Date
JPH06204219A true JPH06204219A (ja) 1994-07-22

Family

ID=19341068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5254414A Pending JPH06204219A (ja) 1992-10-13 1993-10-12 半導体装置のコンタクト構造形成方法

Country Status (2)

Country Link
JP (1) JPH06204219A (ko)
KR (1) KR940010196A (ko)

Also Published As

Publication number Publication date
KR940010196A (ko) 1994-05-24

Similar Documents

Publication Publication Date Title
JPH09181180A (ja) 半導体集積回路及びその製造方法
JPH09205145A (ja) 集積回路及びその製造方法
JP3532134B2 (ja) 半導体装置の製造方法
JP2771057B2 (ja) 半導体装置の製造方法
KR100252044B1 (ko) 반도체소자의 콘택홀 형성방법
JPH10189709A (ja) 集積回路装置の製造方法
JPH06204219A (ja) 半導体装置のコンタクト構造形成方法
JP3483090B2 (ja) 半導体装置の製造方法
KR100230349B1 (ko) 금속배선 콘택형성방법
KR100333539B1 (ko) 반도체소자의미세콘택홀형성방법
JP3172229B2 (ja) 半導体装置の製造方法
JPH08153795A (ja) コンタクト孔の形成方法
JPH05226333A (ja) 半導体装置の製造方法
JP3007994B2 (ja) Mos半導体装置の製造方法
JP3227722B2 (ja) 半導体装置の製造方法
KR950009935B1 (ko) 반도체장치의 제조방법
KR100413043B1 (ko) 반도체 장치의 게이트 전극 형성 방법
KR100237758B1 (ko) 반도체 소자의 금속라인 형성 방법
KR950014268B1 (ko) 콘택형성방법
JP3175307B2 (ja) 半導体装置の製造方法
JPH0244753A (ja) 半導体装置の製造方法
KR20000003342A (ko) 반도체 장치의 자기정렬 콘택홀 형성방법
KR100277883B1 (ko) 반도체 소자의 제조 방법
KR100223825B1 (ko) 반도체 소자의 격리영역 형성방법
KR100219055B1 (ko) 반도체 장치의 미세 콘택홀 형성 방법