JPH0570954B2 - - Google Patents

Info

Publication number
JPH0570954B2
JPH0570954B2 JP3416384A JP3416384A JPH0570954B2 JP H0570954 B2 JPH0570954 B2 JP H0570954B2 JP 3416384 A JP3416384 A JP 3416384A JP 3416384 A JP3416384 A JP 3416384A JP H0570954 B2 JPH0570954 B2 JP H0570954B2
Authority
JP
Japan
Prior art keywords
aln
circuit board
thermal conductivity
paste
thick film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3416384A
Other languages
Japanese (ja)
Other versions
JPS60178687A (en
Inventor
Nobuo Iwase
Kazuo Anzai
Kazuo Shinozaki
Mitsuo Kasori
Akihiko Tsuge
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP3416384A priority Critical patent/JPS60178687A/en
Priority to DE85102159T priority patent/DE3587481T2/en
Priority to EP85102159A priority patent/EP0153737B1/en
Priority to US06/706,280 priority patent/US4659611A/en
Publication of JPS60178687A publication Critical patent/JPS60178687A/en
Publication of JPH0570954B2 publication Critical patent/JPH0570954B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】[Detailed description of the invention]

〔発明の技術分野〕 本発明は窒化アルミニウムセラミツクス基体
(以下AlN基体という)を用いた高熱伝導性回路
基板に関する。 〔発明の技術的背景とその問題点〕 従来から回路基板として用いられているもの
に、Al2O3等のセラミツク基板、樹脂基板等の各
種のものがある。なかでもAl2O3基板は、機械的
強度、電気的絶縁性に優れており、又、グリーン
シート化が容易であるため多層配線等の高密度配
線が可能であり、各所で用いられている。 又、近年電子機器の小型化等が進むにつれ、回
路基板上の電気素子(IC等)の実装密度が高く
なつてきている。さらにパワー半導体等の搭載も
考慮すると、電気素子等からの発熱量が大きくな
り、放熱を効率的に行なうことが要求される。 しかしながらAl2O3基板の熱伝導率(K(W/
m・K))は20程度と低く、発熱量が多い場合に
基板側からの放熱があまり期待できない。従つて
高密度実装、パワー半導体搭載モジユール等を考
慮すると、機械的強度、電気的絶縁性等の基板と
して要求される特性を備え、かつ熱伝導性の良好
な回路基板の開発が望まれている。 一方、近年のフアインセラミツクス技術の進展
に伴ない、SiC、AlN等の機械的強度に優れたセ
ラミツクス材料が開発されている。これらの材料
は、熱伝導性も優れ、構造材等としての応用が研
究されている。又、SiCの良好な熱伝導性を利用
してこれを回路基板として用いようという動きも
あるが、誘電率が高く絶縁耐圧が低いため、高周
波、高電圧が印加される素子の適用を考えた場合
に問題がある。 〔発明の目的〕 本発明は以上の点を考慮してなされたもので、
高電気抵抗、高絶縁耐圧等の回路基板として要求
される電気的特性を満足し、かつ熱伝導性に優れ
た高熱伝導性回路基板を提供することを目的とす
る。 〔発明の概要〕 本発明はAlN基体上に厚膜ペーストからなる
導体路を形成することを基本とするものである。 本発明者等は耐圧特性等に優れかつAl2O3等に
比べ熱伝導率の良好なAlN基体を回路基板に応
用することを検討した。しかしながらAlNは金
属との濡れ性が悪く、そのまま回路基板として用
いることは困難である。本発明者等は特定の厚膜
ペーストを用いることにより、AlN基体上に直
接導体路を形成できることを見い出した。 すなわち本発明は、窒化アルミニウムセラミツ
クス基体に酸化銅を含有する厚膜導電ペーストか
らなる導体路が形成された高熱伝導性回路基板で
ある。 厚膜導電ペーストは、Ag、Ag−Pt、Ag−Pd
等を主体としたAgペースト、Cuペースト、Auペ
ースト等各種のものがあるが、この厚膜ペースト
が酸化銅を含有していれば良い。この酸化銅を含
む厚膜導電ペーストは、他のペーストに比べ非常
に大きな接合強度を示す。実用上は1Kg/mm2以上
程度あれば十分であり、本発明においては十分に
この値を満足することができる。酸化銅は、少々
でその効果を発揮するが、実質的に0.1wt%
(Cu2O換算)以上が好ましく、またあまり多いと
抵抗値が大きくなるため、30wt%以下が好まし
い。 接合のメカニズムは明らかではないが、酸化銅
を含むペーストは、焼成時、接合部にCuAlO2
はCuAl2O4等の複合酸化物層が形成されるため強
固な接合状態を実現すると思われる。 AlN基体は実質的に窒化アルミニウムのみか
らなるものを用いる。焼結助剤として添加物をい
れて常圧焼結を行なつたAlN基体もあるが、熱
伝導性を考慮した場合、AlN単体の理論値は
300w/m・K程度と非常に良好であるため、実
質的にAlNのみからなるAlN基体を用いる。こ
のようなAlN基体は、ホツトプレス法により形
成することができる。 又、AlN基体表面を空気中加熱等により酸化
させることにより、接合強度をあげることもでき
る。 〔発明の効果〕 以上説明したように本発明によれば、高熱伝導
性、高耐圧性等の優れた特性を有するAlN基体
を回路基板として用いることができ、高熱伝導性
回路基板を得ることができる。 この回路基板としては、高密度実装用、パワー
半導体搭載用等として好適である。 また、厚膜ペーストにより導体路を形成するこ
とができるため、微細な回路パターンにも対応で
きる。 〔発明の実施例〕 本発明の実施例を以下に説明する。 AlN原料粉末を成形の後、N2ガス中1800℃、
300Kg/℃のホツトプレス焼結を行ない2t×40×
20mmのAlN基体を得た。この基体に、Cu2O含有
のケミカルボンド型導体ペーストとしてAg−Pd
系ペースト(ESL 9601)を用い、325mesh、乳
剤厚20μmのステンレススクリーンを用いて2×
2mm、3×3mm、4×4mmのパツドを印刷形成し
た。その後120℃で20分間乾燥し、930℃のピーク
温度をもつトンネル炉にて焼成した。 次いでパツド上にロジン系のフラツクスを塗布
し240℃のハンダ槽(Ag 2 Sn 63 Pb 35)に
浸漬し、予備ハンダを施した後、試験用ワイヤ
(新興和電子製#MT7179A6、引張強度限界8Kg
程度)をハンダ付し、密着強度を調べた。 密着強度は、引張速度0.5cm/minでインスト
ロン引張試験機を用いて行なつた。 この結果を第1表に示す。なお4×4及び3×
3のパツドの場合はワイカ切れで測定不能であつ
たため、2×2の場合のみを示す。
[Technical Field of the Invention] The present invention relates to a highly thermally conductive circuit board using an aluminum nitride ceramic substrate (hereinafter referred to as an AlN substrate). [Technical background of the invention and its problems] Various types of circuit boards have been conventionally used, such as ceramic substrates such as Al 2 O 3 and resin substrates. Among these, Al 2 O 3 substrates have excellent mechanical strength and electrical insulation, and because they can be easily made into green sheets, high-density wiring such as multilayer wiring is possible, and they are used in various places. . Furthermore, as electronic devices have become more compact in recent years, the packaging density of electrical elements (ICs, etc.) on circuit boards has become higher. Furthermore, considering the mounting of power semiconductors and the like, the amount of heat generated from electric elements and the like increases, and efficient heat dissipation is required. However, the thermal conductivity (K(W/
m・K)) is as low as around 20, so when the amount of heat generated is large, it is not expected that much heat will be dissipated from the board side. Therefore, in consideration of high-density packaging, modules with power semiconductors, etc., it is desired to develop a circuit board that has the characteristics required for a board, such as mechanical strength and electrical insulation, and has good thermal conductivity. . On the other hand, with the recent progress in fine ceramics technology, ceramic materials with excellent mechanical strength, such as SiC and AlN, have been developed. These materials also have excellent thermal conductivity and are being studied for application as structural materials. There is also a movement to utilize SiC's good thermal conductivity to use it as a circuit board, but due to its high dielectric constant and low dielectric strength, it has been considered to use SiC in devices to which high frequencies and high voltages are applied. There is a problem in this case. [Object of the invention] The present invention has been made in consideration of the above points, and
It is an object of the present invention to provide a highly thermally conductive circuit board that satisfies the electrical characteristics required for a circuit board, such as high electrical resistance and high dielectric strength, and has excellent thermal conductivity. [Summary of the Invention] The present invention is based on forming a conductor track made of thick film paste on an AlN substrate. The present inventors have studied the application of an AlN substrate, which has excellent voltage resistance properties and has better thermal conductivity than Al 2 O 3 and the like, to circuit boards. However, AlN has poor wettability with metals, making it difficult to use it as is as a circuit board. The inventors have discovered that by using certain thick film pastes, conductor tracks can be formed directly on AlN substrates. That is, the present invention is a highly thermally conductive circuit board in which a conductor path made of a thick film conductive paste containing copper oxide is formed on an aluminum nitride ceramic substrate. Thick film conductive paste is Ag, Ag-Pt, Ag-Pd
There are various types of pastes such as Ag paste, Cu paste, and Au paste, which mainly contain copper oxide, but it is sufficient if this thick film paste contains copper oxide. This thick film conductive paste containing copper oxide exhibits extremely high bonding strength compared to other pastes. Practically speaking, it is sufficient to have a thickness of about 1 kg/mm 2 or more, and this value can be fully satisfied in the present invention. Copper oxide exhibits its effect with a small amount, but in reality 0.1wt%
(Cu 2 O equivalent) or more is preferable, and if too much, the resistance value increases, so 30wt% or less is preferable. Although the bonding mechanism is not clear, it is thought that paste containing copper oxide achieves a strong bond because a complex oxide layer such as CuAlO 2 or CuAl 2 O 4 is formed at the bonding portion during firing. The AlN substrate used is one made essentially only of aluminum nitride. There are AlN substrates that are sintered under pressure with additives added as sintering aids, but when considering thermal conductivity, the theoretical value of AlN alone is
Since it has a very good performance of about 300 w/m·K, an AlN substrate consisting essentially only of AlN is used. Such an AlN substrate can be formed by hot pressing. Furthermore, the bonding strength can be increased by oxidizing the surface of the AlN substrate by heating in air or the like. [Effects of the Invention] As explained above, according to the present invention, an AlN substrate having excellent properties such as high thermal conductivity and high pressure resistance can be used as a circuit board, and a highly thermally conductive circuit board can be obtained. can. This circuit board is suitable for high-density packaging, power semiconductor mounting, and the like. Furthermore, since conductor paths can be formed using thick film paste, it is possible to handle fine circuit patterns. [Embodiments of the Invention] Examples of the present invention will be described below. After molding the AlN raw material powder, it was heated to 1800℃ in N2 gas.
Hot press sintering at 300Kg/℃ 2t ×40×
A 20 mm AlN substrate was obtained. Ag-Pd was added to this substrate as a chemical bond type conductor paste containing Cu 2 O.
2× using a stainless steel screen with 325mesh and emulsion thickness of 20μm using a type paste (ESL 9601).
Pads of 2 mm, 3 x 3 mm, and 4 x 4 mm were printed and formed. It was then dried at 120°C for 20 minutes and fired in a tunnel furnace with a peak temperature of 930°C. Next, a rosin-based flux was applied to the pad, immersed in a soldering bath (Ag 2 Sn 63 Pb 35) at 240°C, and after preliminary soldering, a test wire (#MT7179A6 manufactured by Shinko Wa Denshi, tensile strength limit 8 kg) was applied.
degree) was soldered and the adhesion strength was examined. Adhesion strength was measured using an Instron tensile tester at a tensile speed of 0.5 cm/min. The results are shown in Table 1. Note that 4×4 and 3×
In the case of pad No. 3, it was impossible to measure because the pad was broken, so only the case of 2×2 is shown.

【表】 第1表から明らかなように、いずれの場合も1
Kg/mm2以上の密着強度を有し、回路基板として好
適である。従つてAlNの熱伝導性を生かし、熱
伝導性の良好な回路基板を得ることができる。 このときの接着界面を分析したところ、AlN
上にCuAlO2又はCuAl2O4層が生成され、この層
上にAg−Cuの共晶層が生じており、その上にAg
−Pd層が固着していた。 CuAlO2又はCuAl2O4層は、ペースト中のCuと
AlN基体中のAlとが結合してできたものと考え
られる。又、AlN基体表層には、酸化アルミニ
ウムが存在すると考えられ、この酸化アルミニウ
ムとペーストの中の銅、酸化銅が結合していると
も考えられる。さらにAg−Cu共晶層は、
CuAlO2又はCuAl2O4層及びAg−Pd層との固着
力が大であり、全体的に接着強度を高めていると
考えられる。 以上の結果から明らかなように、本発明によれ
ば実用的に十分な接着強度を有する導体パターン
をAlN基体上に形成することができる。従つて
アルミナ等に比べ優れた熱伝導性を有するAlN
を回路基板として用いることができ、電力用半導
体実装、高密度実装用等、発熱量の大きい場合の
回路基板として好適である。
[Table] As is clear from Table 1, in both cases 1
It has an adhesion strength of Kg/mm 2 or more and is suitable for use as a circuit board. Therefore, by taking advantage of the thermal conductivity of AlN, a circuit board with good thermal conductivity can be obtained. Analysis of the adhesive interface at this time revealed that AlN
A CuAlO 2 or CuAl 2 O 4 layer is formed on top, and an Ag-Cu eutectic layer is formed on this layer, and on top of that, Ag
-Pd layer was stuck. The CuAlO 2 or CuAl 2 O 4 layer is the same as the Cu in the paste.
It is thought that it was formed by bonding with Al in the AlN substrate. It is also believed that aluminum oxide exists on the surface layer of the AlN substrate, and that this aluminum oxide is combined with copper and copper oxide in the paste. Furthermore, the Ag-Cu eutectic layer is
It is thought that the adhesion strength with the CuAlO 2 or CuAl 2 O 4 layer and the Ag-Pd layer is large, increasing the overall adhesive strength. As is clear from the above results, according to the present invention, a conductor pattern having practically sufficient adhesive strength can be formed on an AlN substrate. Therefore, AlN has superior thermal conductivity compared to alumina etc.
can be used as a circuit board, and is suitable as a circuit board for cases where the amount of heat generated is large, such as for power semiconductor packaging or high-density packaging.

Claims (1)

【特許請求の範囲】[Claims] 1 実質的にAlNのみからなる窒化アルミニウ
ムセラミツクス基体に酸化銅を含有する厚膜導電
ペーストからなる導体路が形成されたことを特徴
とする高熱伝導性回路基板。
1. A highly thermally conductive circuit board characterized in that a conductive path made of a thick film conductive paste containing copper oxide is formed on an aluminum nitride ceramic substrate made essentially only of AlN.
JP3416384A 1984-02-27 1984-02-27 High thermal conductivity circuit board Granted JPS60178687A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP3416384A JPS60178687A (en) 1984-02-27 1984-02-27 High thermal conductivity circuit board
DE85102159T DE3587481T2 (en) 1984-02-27 1985-02-27 Circuit substrate with high thermal conductivity.
EP85102159A EP0153737B1 (en) 1984-02-27 1985-02-27 Circuit substrate having high thermal conductivity
US06/706,280 US4659611A (en) 1984-02-27 1985-02-27 Circuit substrate having high thermal conductivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3416384A JPS60178687A (en) 1984-02-27 1984-02-27 High thermal conductivity circuit board

Publications (2)

Publication Number Publication Date
JPS60178687A JPS60178687A (en) 1985-09-12
JPH0570954B2 true JPH0570954B2 (en) 1993-10-06

Family

ID=12406537

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3416384A Granted JPS60178687A (en) 1984-02-27 1984-02-27 High thermal conductivity circuit board

Country Status (1)

Country Link
JP (1) JPS60178687A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107573071A (en) * 2017-09-28 2018-01-12 东北大学 A kind of monodisperse spherical Y2O3And Al2O3Powder prepares (Y1‑xYbx) AG crystalline ceramics method

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6135555A (en) * 1984-07-27 1986-02-20 Nec Corp Thick film hybrid integrated circuit device
JPS6284595A (en) * 1985-10-08 1987-04-18 日本電気株式会社 Multilayer ceramic wiring substrate
JPH0680747B2 (en) * 1986-03-31 1994-10-12 イビデン株式会社 Wiring board made of aluminum nitride sintered material and method for manufacturing the same
JPS63291303A (en) * 1987-05-22 1988-11-29 Matsushita Electric Ind Co Ltd Metallized constituent
JPS63291304A (en) * 1987-05-22 1988-11-29 Matsushita Electric Ind Co Ltd Metallized constituent
JPH0638553B2 (en) * 1987-10-29 1994-05-18 イビデン株式会社 Aluminum Nitride Multilayer Substrate
JP2765885B2 (en) * 1988-11-14 1998-06-18 新光電気工業株式会社 Aluminum nitride circuit board and method of manufacturing the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107573071A (en) * 2017-09-28 2018-01-12 东北大学 A kind of monodisperse spherical Y2O3And Al2O3Powder prepares (Y1‑xYbx) AG crystalline ceramics method
CN107573071B (en) * 2017-09-28 2020-05-12 东北大学 Monodisperse spherical Y2O3And Al2O3Powder preparation (Y)1-xYbx) Method for preparing AG transparent ceramic

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