JPH0370423A - Digital protective relay device - Google Patents
Digital protective relay deviceInfo
- Publication number
- JPH0370423A JPH0370423A JP1201331A JP20133189A JPH0370423A JP H0370423 A JPH0370423 A JP H0370423A JP 1201331 A JP1201331 A JP 1201331A JP 20133189 A JP20133189 A JP 20133189A JP H0370423 A JPH0370423 A JP H0370423A
- Authority
- JP
- Japan
- Prior art keywords
- output
- circuit
- time
- automatic inspection
- outputs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000001681 protective effect Effects 0.000 title description 4
- 238000007689 inspection Methods 0.000 claims abstract description 28
- 238000012545 processing Methods 0.000 claims abstract description 10
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000012360 testing method Methods 0.000 abstract description 14
- 238000011990 functional testing Methods 0.000 abstract 1
- 238000005316 response function Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 6
- 230000007257 malfunction Effects 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 5
- 238000012790 confirmation Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004092 self-diagnosis Methods 0.000 description 2
- 208000032368 Device malfunction Diseases 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000012026 site acceptance test Methods 0.000 description 1
Landscapes
- Emergency Protection Circuit Devices (AREA)
Abstract
Description
【発明の詳細な説明】
［発明の目的］
〈産業上の利用分野）
本発明は自動監視回路を有するディジタル保護リレー装
置に関する。DETAILED DESCRIPTION OF THE INVENTION OBJECTS OF THE INVENTION Field of Industrial Application The present invention relates to a digital protection relay device with an automatic monitoring circuit.
（従来の技＃ｉ）
電力系統では保護リレー装置が万一不具合動作をした場
合、その影響が大きく、Ｉ＆悪の場合系統崩壊にもつな
がりかねないため、なによりも動作信頼度の向上が重要
である。(Conventional Technique #i) In the event that a protective relay device malfunctions in a power system, it will have a large impact, and in the case of I&W, it may even lead to system collapse, so it is important to improve operational reliability above all else. It is.
保護リレー装置の不良は、その影響と対策面から克て分
類すると
■動作すべきときに動作しない不良（誤不動作不良〉
■動作してはいけないときに動作する不良（誤動作不良
）
とに分けられる。そこで、保護リレー装置では、誤不動
作間の不良を発見することを主目的とした自動点検機能
と、誤動作側の不良発見を目的とした常時監視機能を具
備するのが一般的である。そして、これらの両機能を総
称して自動監視機能と呼んでいる。Malfunctions in protective relay devices can be categorized based on their effects and countermeasures: ■Failures that do not operate when they should (malfunctions); ■Failures that operate when they should not (malfunctions) Therefore, protective relay devices are generally equipped with an automatic inspection function whose main purpose is to detect defects between malfunctions and non-operations, and a constant monitoring function whose purpose is to discover defects on the malfunction side. Both of these functions are collectively called the automatic monitoring function.
ディジタル保護リレー装置は、リレー演算処理部がマイ
クロプロセッサ（以下ＣＰｕという）を中心に構成され
ているため、その演算処理機能を活用することにより、
リレー装置を構成する大部分のハードウェアブロックの
健否を自己診断技術によってチエツクすることが可能で
ある。The digital protection relay device has a relay calculation processing unit mainly composed of a microprocessor (hereinafter referred to as CPU), so by utilizing its calculation processing function,
It is possible to check the health of most of the hardware blocks that make up the relay device using self-diagnosis technology.
この診［ｉ機能の個々の手法のうち、リレー機能を中継
せずに行なうものを常時監視、リレー機能を中断しトリ
ップロックした上で行なうものを自動点検と呼んでいる
。Among the individual methods of this diagnosis [i function], those that are performed without relaying the relay function are called constant monitoring, and those that are performed after interrupting the relay function and trip-locking are called automatic inspection.
ディジタル保護リレー装置は前述のように、大部分の装
置不良は自己診断技術の活用による常時監視で検出でき
る。このためリレー機能を中断してしか実施できない自
動点検の適用は、通常アナログ入力回路部に点検電流を
印加し、内部に演算処理機能をもつことから、データの
最小分解能の精度でのハードウェアブロックの点検と、
引外し回路用接点のような常時開路している回路につい
て演算処理ＣＰｕより強制動作出力を発し、最終段接点
情報をＣＰｕ部へ取り込んで、点検を行なう方法がとら
れている。As mentioned above, most device failures in digital protection relay devices can be detected through constant monitoring using self-diagnosis technology. For this reason, automatic inspection, which can only be performed by interrupting the relay function, is usually applied to the analog input circuit by applying an inspection current, and since it has an internal arithmetic processing function, it is possible to perform automatic inspection using a hardware block with the accuracy of the minimum data resolution. inspection and
For a circuit that is always open, such as a contact for a tripping circuit, a forced operation output is issued from the arithmetic processing CPU, and final stage contact information is taken into the CPU for inspection.
第４図に主検出リレー（Ｍ＞とフェイルセーフリレー（
Ｆ）により構成されるディジタル保護りレー装置の自動
点検のタイムチャートの例を示す。Figure 4 shows the main detection relay (M>) and fail-safe relay (
An example of a time chart for automatic inspection of the digital protection relay device configured by F) is shown.
自動点検時のトリップロック指令によるトリップロック
を確認後、主検出リレー（Ｍ）のアナログ入力回路と出
力回路に同時に入力を印加して動作側の確認を行ない、
確認時点で入力を切り復帰側の確認を行なう。この確認
時点からフェイルセーフリレー（Ｆ）についても、アナ
ログ入力回路と出力回路の動作側及び復帰側の確認を並
列して行なう。After confirming the trip lock by the trip lock command during automatic inspection, apply input to the analog input circuit and output circuit of the main detection relay (M) at the same time to confirm the operation side.
At the time of confirmation, turn off the input and check the return side. From this point of confirmation, the operation side and recovery side of the analog input circuit and output circuit of the fail-safe relay (F) are also confirmed in parallel.
このため、点検所要時間Ｔｃは大幅に短縮されており、
２００ｍ５程度以内で全てを完了し、通常運用状態に戻
すことが可能な保護リレー装置が多い。For this reason, the inspection time Tc has been significantly shortened,
Many protection relay devices can complete all operations within about 200m5 and return to normal operating conditions.
また、自動点検中に系統事故が発生した場合には、直ち
に点検を中止し、所定時間経過後にトリップロックを解
除する事故対応機能を設けている。In addition, if a system accident occurs during automatic inspection, an accident response function is provided that immediately stops the inspection and releases the trip lock after a predetermined period of time.
この機能は、被点検装置と他装置、例えば被点検中の母
線分離装置と他の端子の距離継電装置の第２段との時間
協調をとること、及び被点検装置が点検の入力と系統事
故の入力とにより正常な点検の確認ができず、点検不良
となることを防止する目的で設けている。This function enables time coordination between the equipment being inspected and other equipment, such as the second stage of the distance relay device between the busbar separation device being inspected and other terminals, and the ability of the equipment being inspected to input and This is provided to prevent incorrect inspections from being made due to accident inputs that prevent normal inspections from being confirmed.
（発明が解決しようとする課題〉
上記の構成を有するディジタル保護リレー装置の試験時
の問題点について説明する。(Problems to be Solved by the Invention) Problems encountered during testing of the digital protection relay device having the above configuration will be explained.
現地受入れ試験時等で１、上述の事故対応機能の試験を
実施する必要があるが、点検所要時間が２００ｒｍｓ程
度以内と短く、人為的に事故を模擬することが困難であ
った。また、この！Ａ擬のために専用に模擬試験器を製
作納入することも経済性から見て問題であった。During on-site acceptance tests, etc. 1. It is necessary to test the accident response function mentioned above, but the required inspection time is short, about 200 rms or less, and it is difficult to artificially simulate an accident. Also, this! Producing and delivering a mock test device exclusively for the A simulation was also problematic from an economic standpoint.
本発明では、上記問題を解決するためになされるもので
あり、ディジタル保護リレー装置の特徴を生かした上で
、事故対応機能の試験を容易に行なえるディジタル保護
リレー装置を提供することを目的としている。The present invention has been made in order to solve the above problem, and an object of the present invention is to provide a digital protection relay device that makes use of the characteristics of the digital protection relay device and allows easy testing of the accident response function. There is.
［発明の構成］
〈課題を解決するための手段）
上記目的を達成するため本発明では、自動点検中のソフ
トウェアの任意の処理タイミングを出力する回路を設け
、この出力によりアナログ入力用試験器（虚負荷試験器
等）の入力印加タイミングを任意に行なえるように構成
した。[Structure of the Invention] <Means for Solving the Problems> In order to achieve the above object, the present invention provides a circuit that outputs arbitrary processing timing of software during automatic inspection, and uses this output to control the analog input tester ( The input application timing of the imaginary load tester (such as an imaginary load tester) can be adjusted arbitrarily.
（作 用）
本発明では自動点検中の任意のタイミングで試験器の入
力印加タイミングが設定できるので、自動点検中の任意
の時点での事故対応機能試験ができる。(Function) In the present invention, since the input application timing of the tester can be set at any timing during automatic inspection, an accident response function test can be performed at any time during automatic inspection.
（実施例）
本発明の一実施例を第１図の出力構成図を用いて説明す
る。(Example) An example of the present invention will be described using the output configuration diagram shown in FIG.
本実施例は自動点検中のワンポイントでの事故対応機能
試験可能とするもので、１は本機能を使用するか否かを
選択する端子である。トリップロック確認信号は第４図
に示すタイミングで発生する信号であり、上記１の使用
条件とが共に成立すればＡＮＤゲート２が出力し、所定
時間出力を出すワンショット回路３によって出力回路４
を動作させる。Ｘは出力回路４の出力により閉路する接
点で、ワンショット回路３が出力している開閉路する。This embodiment enables a one-point accident response function test during automatic inspection, and 1 is a terminal for selecting whether or not to use this function. The trip lock confirmation signal is a signal that is generated at the timing shown in FIG. 4, and if both of the conditions for use in 1 above are satisfied, the AND gate 2 outputs it, and the one-shot circuit 3 that outputs the output for a predetermined time outputs it to the output circuit 4.
make it work. X is a contact that is closed by the output of the output circuit 4, and is opened and closed by the output of the one-shot circuit 3.
このＸ接点を試験器の入力印加制御に使用することで、
トリップロックｉ認時点から任意のワンポイントで事故
対応機能の試験が可能となる。By using this X contact to control the input application of the tester,
It is possible to test the accident response function at any point from the time Trip Lock i is approved.
第２図は他の実施例による構成図である。FIG. 2 is a configuration diagram according to another embodiment.
本実施例では自動点検中の各ステップ毎に事故対応機能
試験を可能とするよう構成したものである。This embodiment is configured so that an accident response function test can be performed at each step during automatic inspection.
第２図のステップ■は第４図のトリップロック確認のタ
イミングで発生する信号、以下第２図の■〜■は第４図
の■〜■のタイミングで発生する信号に対応する。１１
〜１５はステップ■〜■のどのタイミングで事故対応機
能試験を行なうかを選択する端子で、それぞれのへＮＯ
ゲート１６〜２０で判定される。２１はＯＲゲートでＡ
ＮＤゲート１６〜２０を入力条件とし、所定時間出力を
出すワンショット回路２２に対して出力を出す。この出
力により出力回路２３を動作させる。Ｘは出力回路２３
の出力により閉路する接点で、ワンショット回路２２が
出力している開閉路する。このＸ接点を試験器の入力印
加制御に使用することにより自動点検中の各ステップ毎
に事故対応機能試験が可能となる。Step (2) in FIG. 2 corresponds to a signal generated at the timing of trip lock confirmation in FIG. 4, and below (2) to (2) in FIG. 2 correspond to signals generated at timing (1) to (4) in FIG. 4. 11
~15 are terminals for selecting at which timing in steps ■~■ the accident response function test is to be performed.
Determined at gates 16-20. 21 is A at OR gate
Using the ND gates 16 to 20 as input conditions, an output is output to a one-shot circuit 22 that outputs an output for a predetermined period of time. This output causes the output circuit 23 to operate. X is the output circuit 23
The contact that is closed by the output of the one-shot circuit 22 opens and closes the circuit outputted by the one-shot circuit 22. By using this X contact to control the input application of the tester, it becomes possible to test the accident response function at each step during automatic inspection.
第３図は他の応用例による構成図である。FIG. 3 is a block diagram of another application example.
第３図において第１図と同一の部品には同一符号を付し
ている。In FIG. 3, the same parts as in FIG. 1 are given the same reference numerals.
本応用例では自動点検中の全てのポイントでの事故対応
機能試験を可能とするよう構成したものである。This application example is configured to enable accident response function tests at all points during automatic inspection.
第３図の１，２は第１図の１．２と同一機能を有し、３
１は可変タイマで任意の時間設定が可能である。３．４
．Ｘは第１図の３．４．Ｘと同一機能を有する。よって
トリップロック確認時点から可変タイマ３１を任意の時
間に設定すれば、任意のポイントでの事故対応機能試験
が可能となる。1 and 2 in Figure 3 have the same functions as 1.2 in Figure 1, and 3
1 is a variable timer, and any time can be set. 3.4
．． X is 3.4 in Figure 1. It has the same function as X. Therefore, by setting the variable timer 31 to an arbitrary time from the time when the trip lock is confirmed, it becomes possible to test the accident response function at an arbitrary point.
［発明の効果］
以上説明したように、本発明によれば、自動点検中のソ
フトウェアにおける任意の処理タイミングを出力する回
路を設け、この出力を試験器の入力印加制御に使用する
ことにより、点検所要時間が雉い装置の事故対応機能試
験が容易に可能となるディジタル保護リレー装置を得る
ことができる。[Effects of the Invention] As explained above, according to the present invention, a circuit is provided that outputs arbitrary processing timing in software during automatic inspection, and this output is used to control the input application of the tester. It is possible to obtain a digital protection relay device that can easily perform an accident response function test of a device in a short period of time.
第１図は本発明によるディジタル保護リレー装置の一実
施例の出力構成図、第２図は他の実施例の出力構成図、
第３図は更に他の応用例の出力構成図、第４図はディジ
タル保護リレー装置の自動点検タイミングである。
１．１１〜１５・・・選択端子
２．１６〜２０・・・へＮＯゲート
３．２２・・・ワンショット回路
４．２３・・・出力回路 ２１・・・ＯＲゲート３
１・・・可変タイマ Ｘ・・・接点第１図FIG. 1 is an output configuration diagram of one embodiment of the digital protection relay device according to the present invention, FIG. 2 is an output configuration diagram of another embodiment,
FIG. 3 is an output configuration diagram of yet another application example, and FIG. 4 is an automatic inspection timing of a digital protection relay device. 1.11-15...Selection terminal 2.16-20...NO gate 3.22...One-shot circuit 4.23...Output circuit 21...OR gate 3
1...Variable timer X...Contact Figure 1
Claims (1)
このマイクロプロッセサの演算処理により自動点検の制
御及び結果判定を行なうディジタル保護リレー装置にお
いて、前記自動点検制御の演算処理の所定のタイミング
と当該条件を導出するか否かを選択する条件回路とによ
り出力する第１の回路と、第１の回路の出力を導入し所
定時間出力する第２の回路と、第２の回路の出力により
マイクロプロセッサの外部へ出力を出す第３の回路とを
備えたことを特徴とするディジタル保護リレー装置。The relay calculation processing section is composed of a microprocessor,
In this digital protection relay device that controls automatic inspection and determines the results through arithmetic processing of a microprocessor, a predetermined timing of the arithmetic processing of automatic inspection control and a condition circuit that selects whether or not to derive the condition are provided. A first circuit that outputs an output, a second circuit that introduces the output of the first circuit and outputs it for a predetermined time, and a third circuit that outputs an output to the outside of the microprocessor based on the output of the second circuit. A digital protection relay device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1201331A JP2763146B2 (en) | 1989-08-04 | 1989-08-04 | Digital protection relay device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1201331A JP2763146B2 (en) | 1989-08-04 | 1989-08-04 | Digital protection relay device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0370423A true JPH0370423A (en) | 1991-03-26 |
| JP2763146B2 JP2763146B2 (en) | 1998-06-11 |
Family
ID=16439245
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1201331A Expired - Lifetime JP2763146B2 (en) | 1989-08-04 | 1989-08-04 | Digital protection relay device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2763146B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007018877A (en) * | 2005-07-07 | 2007-01-25 | Matsushita Electric Works Ltd | Luminaire |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60128820A (en) * | 1983-12-13 | 1985-07-09 | 株式会社東芝 | Protecting relaying device |
| JPS60245419A (en) * | 1984-05-18 | 1985-12-05 | 株式会社東芝 | Protecting relaying device |
| JPS63242118A (en) * | 1987-03-30 | 1988-10-07 | 株式会社東芝 | Automatic checker of protective relay |
| JPH01117621A (en) * | 1987-10-29 | 1989-05-10 | Toshiba Corp | Digital protective relay |
-
1989
- 1989-08-04 JP JP1201331A patent/JP2763146B2/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60128820A (en) * | 1983-12-13 | 1985-07-09 | 株式会社東芝 | Protecting relaying device |
| JPS60245419A (en) * | 1984-05-18 | 1985-12-05 | 株式会社東芝 | Protecting relaying device |
| JPS63242118A (en) * | 1987-03-30 | 1988-10-07 | 株式会社東芝 | Automatic checker of protective relay |
| JPH01117621A (en) * | 1987-10-29 | 1989-05-10 | Toshiba Corp | Digital protective relay |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007018877A (en) * | 2005-07-07 | 2007-01-25 | Matsushita Electric Works Ltd | Luminaire |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2763146B2 (en) | 1998-06-11 |
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