JPH0349160B2 - - Google Patents
Info
- Publication number
- JPH0349160B2 JPH0349160B2 JP59109463A JP10946384A JPH0349160B2 JP H0349160 B2 JPH0349160 B2 JP H0349160B2 JP 59109463 A JP59109463 A JP 59109463A JP 10946384 A JP10946384 A JP 10946384A JP H0349160 B2 JPH0349160 B2 JP H0349160B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- transistor
- defective
- address
- cmp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000002950 deficient Effects 0.000 claims description 28
- 238000001514 detection method Methods 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 description 11
- 238000007664 blowing Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Semiconductor Memories (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59109463A JPS60254499A (ja) | 1984-05-31 | 1984-05-31 | 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置 |
DE3588121T DE3588121T2 (de) | 1984-05-31 | 1985-05-30 | Halbleiterintegrierte Schaltung mit einer Ersatzredundanzschaltung |
EP85401065A EP0163580B1 (de) | 1984-05-31 | 1985-05-30 | Halbleiterintegrierte Schaltung mit einer Ersatzredundanzschaltung |
US06/739,159 US4752914A (en) | 1984-05-31 | 1985-05-30 | Semiconductor integrated circuit with redundant circuit replacement |
KR1019850003795A KR900008191B1 (ko) | 1984-05-31 | 1985-05-31 | 대치 용장회로를 가진 반도체집적회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59109463A JPS60254499A (ja) | 1984-05-31 | 1984-05-31 | 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60254499A JPS60254499A (ja) | 1985-12-16 |
JPH0349160B2 true JPH0349160B2 (de) | 1991-07-26 |
Family
ID=14510866
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59109463A Granted JPS60254499A (ja) | 1984-05-31 | 1984-05-31 | 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60254499A (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2922060B2 (ja) * | 1992-07-27 | 1999-07-19 | 富士通株式会社 | 半導体記憶装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59107497A (ja) * | 1982-12-13 | 1984-06-21 | Hitachi Ltd | 冗長回路を備えた半導体記憶装置 |
JPS59112500A (ja) * | 1982-12-18 | 1984-06-28 | Mitsubishi Electric Corp | 半導体メモリ装置 |
JPS59210596A (ja) * | 1983-05-13 | 1984-11-29 | Hitachi Ltd | 半導体記憶装置 |
-
1984
- 1984-05-31 JP JP59109463A patent/JPS60254499A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59107497A (ja) * | 1982-12-13 | 1984-06-21 | Hitachi Ltd | 冗長回路を備えた半導体記憶装置 |
JPS59112500A (ja) * | 1982-12-18 | 1984-06-28 | Mitsubishi Electric Corp | 半導体メモリ装置 |
JPS59210596A (ja) * | 1983-05-13 | 1984-11-29 | Hitachi Ltd | 半導体記憶装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS60254499A (ja) | 1985-12-16 |
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