JPH0235339A - Measuring apparatus for glossiness - Google Patents
Measuring apparatus for glossinessInfo
- Publication number
- JPH0235339A JPH0235339A JP18413588A JP18413588A JPH0235339A JP H0235339 A JPH0235339 A JP H0235339A JP 18413588 A JP18413588 A JP 18413588A JP 18413588 A JP18413588 A JP 18413588A JP H0235339 A JPH0235339 A JP H0235339A
- Authority
- JP
- Japan
- Prior art keywords
- light
- measured
- measurement
- light source
- case
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims abstract description 38
- 238000012790 confirmation Methods 0.000 claims description 7
- 239000003990 capacitor Substances 0.000 abstract description 6
- 230000000694 effects Effects 0.000 abstract description 3
- 230000010355 oscillation Effects 0.000 description 4
- 229910052721 tungsten Inorganic materials 0.000 description 4
- 239000010937 tungsten Substances 0.000 description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- DZSYJVXGONVNKA-UHFFFAOYSA-L NIR-1 dye Chemical compound [K+].[K+].C1=CC2=C(S([O-])(=O)=O)C=C(S([O-])(=O)=O)C=C2C(C2(C)C)=C1[N+](CC)=C2C=CC=CC=CC=C1C(C)(C)C2=CC(C(O)=O)=CC=C2N1CCCCS([O-])(=O)=O DZSYJVXGONVNKA-UHFFFAOYSA-L 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 150000003657 tungsten Chemical class 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、床表面等物体の表面の光沢を測定する装置に
関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for measuring the gloss of the surface of an object such as a floor surface.
従来の光沢測定装置においては、被測定個所を照射する
ための光源としてタングステンランプを用いていたが、
このタングステンランプからの光は可視光であるため、
測定時に周囲の迷光の影響を受は易いところから、第５
図に示すように、タングステンランプ５１及び検出器５
２からなる光学系部分５３の側面をケース５４によって
完全に覆い、そして、被測定個所を判り易くするため、
被測定個所を表すマーク５５をケース側面に設けていた
。Conventional gloss measuring equipment uses a tungsten lamp as a light source to illuminate the area to be measured.
Since the light from this tungsten lamp is visible light,
Because measurement is easily affected by surrounding stray light, the fifth
As shown in the figure, a tungsten lamp 51 and a detector 5
In order to completely cover the side surface of the optical system part 53 consisting of 2 with the case 54, and to make it easy to see the part to be measured,
A mark 55 indicating the location to be measured was provided on the side of the case.
しかしながら、上述のように被測定部分を表すマーク５
５をケース側面に設けても、被測定個所を直接目視する
のではないから、大体の位置しか把握することができず
、正確な位置の確認は困難であった。However, as mentioned above, the mark 5 representing the part to be measured
5 on the side of the case, it was difficult to confirm the exact position because the measurement point was not directly visible, so only the approximate position could be determined.
本発明は、上述の事柄に留意してなされたもので、その
目的とするところは、測定時に被測定個所を直接目視に
よって確認することができ、しかも、周囲の迷光の影響
を受けることなく測定を行うことができる光沢測定装置
を擢供することにある。The present invention has been made with the above-mentioned considerations in mind, and its purpose is to enable direct visual confirmation of the location to be measured during measurement, and to enable measurement without being affected by surrounding stray light. The object of the present invention is to provide a gloss measuring device that can perform the following.
上述の目的を達成するため、本発明に係る光沢測定装置
は、測定用光源として近赤外パルス光を発するものを用
いると共に、ケースの側面に切り欠き部を形成し、更に
、前記ケースに、被測定個所に対して可視光を照射する
確認用光源を設けている。In order to achieve the above-mentioned object, the gloss measuring device according to the present invention uses a light source that emits near-infrared pulsed light as a measurement light source, and also has a notch formed in the side surface of the case, and further includes: A confirmation light source is provided that irradiates visible light onto the area to be measured.
上記構成によれば、測定に際しては、可視光によって照
射された被測定個所を、ケースの側面に形成された切り
欠き部を通して見ることができるので、被測定個所を目
視によって直接確認することができる。又、測定用光源
として近赤外ノマルス光を用いているので、測定時、切
り欠き部から他の光が測定部分にはいっても、何の影響
を受けることなく正確に測定することができる。According to the above configuration, during measurement, the part to be measured illuminated with visible light can be seen through the notch formed on the side of the case, so the part to be measured can be directly confirmed visually. . Further, since near-infrared normal light is used as the measurement light source, even if other light enters the measurement part from the notch during measurement, accurate measurement can be performed without any influence.
以下、本発明の一実施例を、１面を参照しながら説明す
る。Hereinafter, one embodiment of the present invention will be described with reference to the first page.
第１図乃至第３図は本発明の一実施例を示し、第１図及
び第２回において、１は例えば合成樹脂よりなるケース
で、このケース１の底面（被４［す定面に当接する面）
２には、平面紙が例えば長方形の凹部３が形成されると
共に、前記底面２に隣接する一方の側面４は切り開かれ
て前記四部３に連なる切り欠き部５に形成しである。1 to 3 show an embodiment of the present invention, and in FIG. contact surface)
2, a plane paper is formed with, for example, a rectangular recess 3, and one side 4 adjacent to the bottom surface 2 is cut out to form a notch 5 that is connected to the four parts 3.
前記凹部３において、その長手方向の面３ａ、 ３ｂは
、底面２に垂直な直線に対して互いに対称なように傾斜
させてあり、これらの面３ａ、 ３ｂには測定用光源６
．検出器７が設けである。測定用光源６は被測定個所（
第１図における点Ｐ）を照射するもので、例えば発光ピ
ーク波長０．８８μ亀の近赤外光を発する近赤外光ダイ
オード（以下、近赤外Ｌ Ｅ Ｄと云う）よりなる。又
、検出器７は前記被測定個所Ｐにおいて反射した光を検
出するもので、例えば感度ピーク波長０．９μ真のフォ
トダイオードよりなる。更に、凹部３の底面２と平行な
面３ｃには確認用光源８としての例えば可視光ＬＥＤが
設けてあり、この可視光ＬＥＤ８からの光は前記被測定
個所Ｐを照射するようにしである。In the recess 3, the longitudinal surfaces 3a and 3b are inclined symmetrically with respect to a straight line perpendicular to the bottom surface 2, and a measurement light source 6 is provided on these surfaces 3a and 3b.
．． A detector 7 is provided. The measurement light source 6 is located at the measurement point (
It irradiates point P) in FIG. 1, and is composed of a near-infrared light diode (hereinafter referred to as near-infrared LED) that emits near-infrared light with an emission peak wavelength of 0.88 μm, for example. The detector 7 detects the light reflected at the measurement point P, and is made of, for example, a photodiode with a peak sensitivity wavelength of 0.9 μm. Furthermore, a visible light LED, for example, is provided as a confirmation light source 8 on a surface 3c parallel to the bottom surface 2 of the recess 3, and the light from this visible light LED 8 is designed to illuminate the measurement point P.
第３図は近赤外１．、 Ｅ Ｄ ６を駆動する回路を示
し、図示例においては、特に、可視光Ｌ Ｅ Ｄ ８を
も駆動できるようにしている。Figure 3 shows near-infrared 1. , ED 6, and in the illustrated example, it is particularly capable of driving visible light ED 8 as well.
即ち、同図に示すように、前記ＬＥＤ６，８は極性が互
いに逆になるように並列接続した所謂逆並列状態に接続
しである。そして、これらＬ Ｅ Ｄ６．８は、充・放
電用コンデンサ（その容量をＣとする）９と抵抗（その
抵抗値をＲ，とする）１０を介して電源１１に接続され
ている。又、コンデンサ９と抵抗１０との間の接続点Ａ
は、抵抗（その抵抗値をＲ２とする）１２を介してスイ
チング素子としてのトランジスタ１３のエミッタに接続
されている。That is, as shown in the figure, the LEDs 6 and 8 are connected in parallel so that their polarities are opposite to each other, so-called anti-parallel state. These LEDs 6.8 are connected to a power source 11 via a charging/discharging capacitor (its capacity is C) 9 and a resistor (its resistance value is R) 10. Also, the connection point A between the capacitor 9 and the resistor 10
is connected to the emitter of a transistor 13 as a switching element via a resistor 12 (its resistance value is R2).
更に、このトランジスタ１３のベースには抵抗１４を介
して発振回路１５が接続しである。この発振回路１５は
例えばデユーティ１／１０のパルスを出力する。Furthermore, an oscillation circuit 15 is connected to the base of this transistor 13 via a resistor 14. This oscillation circuit 15 outputs a pulse with a duty of 1/10, for example.
尚、図示してないが、ケース１内には、フォトダイオー
ド７の出力を適宜増幅するアンプ、バイパスフィルタ、
ピークホールド回路、出力調整回路、Ａ／Ｄコンバータ
、電源部等が設けである。Although not shown, the case 1 includes an amplifier for appropriately amplifying the output of the photodiode 7, a bypass filter,
A peak hold circuit, an output adjustment circuit, an A/D converter, a power supply section, etc. are provided.
又、ケース１の底面２と反対側の上面には、電源オンオ
スインチ、表示値ホールト′スイッチ、ゼロ点ｆｉｌｉ
＋整・感度調整用ポリウＪ・、デイスプレィ等が設けで
ある。In addition, on the top surface opposite to the bottom surface 2 of the case 1, there are a power on male inch, a display value halt' switch, and a zero point fili switch.
+ Polyurethane J. for adjustment and sensitivity adjustment, display, etc. are provided.
次に、上記構成の光沢測定装置の動作について、第４図
をも参照しながら説明する。Next, the operation of the gloss measuring device having the above configuration will be explained with reference to FIG. 4.
今、第３図において、発振回路１５からのパルス出力が
ローレベルのときは、トランジスタ１３がオフであるか
ら、充電サイクル（第４図において、符号Ｊ・・・で示
す区間）となり、充・放電用コンデンサ９は抵抗１０を
経た電源１１からの電流によって、時定数Ｒ＋ Ｃで充
電され、そのときの充電電流ｌ、によって可視光Ｌ Ｅ
Ｄ ８のみが発光する。Now, in FIG. 3, when the pulse output from the oscillation circuit 15 is at a low level, the transistor 13 is off, so it is a charging cycle (the section indicated by the symbol J in FIG. 4). The discharging capacitor 9 is charged by the current from the power supply 11 through the resistor 10 with a time constant R+C, and the charging current l at that time causes visible light L E to be charged.
Only D8 emits light.
そして、発振回路１５からのパルス出力がハイレヘルに
なると、トランジスタ１３がオンするので、放電サイク
ル（第４図において、符号Ｈ・・・で示す区間）となり
、コンデンサ９に蓄えられた電荷は抵抗１２を介して時
定数Ｒ２Ｃで放電し、そのときの放電電流Ｉｈによって
近赤外Ｌ Ｂ Ｄ ６のみが発光する。When the pulse output from the oscillation circuit 15 reaches a high level, the transistor 13 turns on, resulting in a discharge cycle (the period indicated by the symbol H... in FIG. 4), and the charge stored in the capacitor 9 is transferred to the resistor 12. is discharged with a time constant R2C, and only the near-infrared LB D 6 is emitted by the discharge current Ih at that time.
尚、抵抗１２の抵抗値Ｒ２を抵抗１０の抵抗値Ｒに比べ
て十分に小さくしておけば、近赤外Ｌ Ｅ Ｄ６は尖頭
値の高い発光（パルス発光）させるごとができる。Note that if the resistance value R2 of the resistor 12 is made sufficiently smaller than the resistance value R of the resistor 10, the near-infrared LED 6 can emit light with a high peak value (pulse light emission).
このように、充電時に流れる電流を利用して可視光ＬＥ
Ｄ８を発光させることができ、これによって被測定個所
Ｐを、測定に先立って照射することができる。そして、
ケース１の側面には切り欠き部５が形成しであるから、
上記可視光Ｌ Ｅ Ｄ ８によって照射された被測定個
所Ｐを目視によって直接確認することができる。又、測
定に用いる光は近赤外Ｌ Ｅ Ｄ ６が発するパルス発
光であるから、測定時、切り欠き部５から他の光が侵入
してきても、何の影響を受けることなく所定の光沢の測
定を行うことができる。In this way, visible light LE is generated using the current flowing during charging.
D8 can be made to emit light, thereby making it possible to irradiate the measurement point P prior to measurement. and,
Since the notch portion 5 is formed on the side surface of the case 1,
The measurement point P irradiated with the visible light L E D 8 can be directly confirmed visually. In addition, since the light used for measurement is pulsed light emitted by the near-infrared LED 6, even if other light enters from the notch 5 during measurement, it will not be affected by the predetermined gloss. Measurements can be taken.
そして、従来のタングステンランプを連続発光させる場
合に比べて比べて消費電力が格段に少なくて済むと共に
、可視光ＬＥＤ８を駆動するための別回路を設けなくて
もよく、しかも、コンデンサの充電時に流れる電流によ
って可視光ＬＥＤ８を発光させることができるので、構
成が簡単になると共に、消費電力が少なくて済むといっ
た利点がある。In addition, power consumption is significantly lower than when a conventional tungsten lamp is used to emit light continuously, and there is no need to provide a separate circuit to drive the visible light LED 8. Since the visible light LED 8 can be caused to emit light by an electric current, there are advantages in that the configuration is simple and power consumption is low.
本発明は、上述の実施例に限られるものではなく、例え
ば底面２に隣接する他方の側面（側面４に対応する側面
）を切り開き、凹部３が第１図における紙面の上下方向
に貫通ずるように形成してあってもよい。The present invention is not limited to the above-mentioned embodiments, and the present invention is not limited to the above-mentioned embodiments. may be formed.
そして、測定用光源６は赤外光を発するものであればよ
く、半導体レーザを用いてもよい。The measuring light source 6 only needs to emit infrared light, and a semiconductor laser may also be used.
又、検出器７は近赤外光に感度を示すものであればよく
、従って、フォトダイオード以外の受光素子を用いても
よい。Further, the detector 7 only needs to be sensitive to near-infrared light, and therefore a light-receiving element other than a photodiode may be used.
更に、確認用光源８は被測定個所Ｐを確実に照射すれば
よく、従って、第１図に示す以外の部位に設けてあって
もよい。Furthermore, the confirmation light source 8 only needs to reliably illuminate the measurement point P, and therefore may be provided at a location other than that shown in FIG.
そして又、ケース１の凹部３の内面に被測定個所を示す
マークを設けてあってもよい。Furthermore, a mark indicating the location to be measured may be provided on the inner surface of the recess 3 of the case 1.
以」二説明したように、本発明に係る光沢測定装置は、
測定用光源として近赤外パルス光を発するものを用いる
と共に、ケースの側面に切り欠き部を形成し、更に、前
記ケースに、被測定個所に対して可視光を照射するＩＩ
ｔｖ用光源を設けているので、測定に際しては、可視
光によって照射された被測定個所を、ケースの側面に形
成された切り欠き部を通して見ることができる、従って
、被測定個所を目視によって直接確認することができる
。As explained below, the gloss measuring device according to the present invention includes:
In addition to using a light source that emits near-infrared pulsed light as a measurement light source, a notch is formed on the side surface of the case, and the case is further irradiated with visible light to the part to be measured.
Since it is equipped with a TV light source, during measurement, the part to be measured illuminated with visible light can be seen through the notch formed on the side of the case. Therefore, the part to be measured can be directly confirmed visually. can do.
又、測定用光源として赤外光を用いパルス発光している
ので、測定時、切り欠き部から他の光が測定部分にはい
っても、何の影響を受けることなく正確に測定すること
ができる。従って、被測定個所を目視により直接確認し
ながら、物体表面の光沢の測定を正確に行うことができ
る。In addition, since infrared light is used as a measurement light source and emits pulsed light, even if other light enters the measurement part from the notch during measurement, accurate measurements can be made without any influence. . Therefore, it is possible to accurately measure the gloss of the object surface while directly visually confirming the location to be measured.
第１図乃至第４図は本発明の一実施例を示し、第１図は
光沢測定装置の要部を破断して示す正面図、第２図は光
沢測定装置の全体を示す斜視図、第３図は測定用光源及
び確認用光源を駆動するための電気回路図、第４図（Ａ
）、 （Ｂ）は前記両光源の発光状態を示す図である。
第５図は従来の光沢測定装置を示す斜視図であ１・・・
ケース、５・・・切り欠き部、６・・・測定用光源、７
・・・検出器、８・・・確認用光源、Ｐ・・・被測定個
所。1 to 4 show an embodiment of the present invention, in which FIG. 1 is a front view with the main parts of the gloss measuring device cut away, FIG. 2 is a perspective view showing the entire gloss measuring device, and FIG. Figure 3 is an electric circuit diagram for driving the measurement light source and confirmation light source, and Figure 4 (A
) and (B) are diagrams showing the light emitting states of both the light sources. FIG. 5 is a perspective view showing a conventional gloss measuring device.
Case, 5... Notch, 6... Light source for measurement, 7
...detector, 8...light source for confirmation, P...point to be measured.
Claims (1)
用光源と前記被測定個所で反射した光を検出する検出器
とを備えてなる光沢測定装置において、前記測定用光源
として近赤外パルス光を発するものを用いると共に、前
記ケースの側面に切り欠き部を形成し、更に、前記ケー
スに、前記被測定個所に対して可視光を照射する確認用
光源を設けたことを特徴とする光沢測定装置。In a gloss measuring device comprising a measurement light source that irradiates measurement light onto a measurement point in a case and a detector that detects light reflected from the measurement point, the measurement light source is a near-infrared light source. In addition to using a light source that emits pulsed light, a notch is formed in the side surface of the case, and the case is further provided with a confirmation light source that irradiates visible light to the point to be measured. Gloss measurement device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18413588A JPH0235339A (en) | 1988-07-23 | 1988-07-23 | Measuring apparatus for glossiness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18413588A JPH0235339A (en) | 1988-07-23 | 1988-07-23 | Measuring apparatus for glossiness |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0235339A true JPH0235339A (en) | 1990-02-05 |
Family
ID=16147987
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18413588A Pending JPH0235339A (en) | 1988-07-23 | 1988-07-23 | Measuring apparatus for glossiness |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0235339A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH058448U (en) * | 1991-04-19 | 1993-02-05 | 日本電色工業株式会社 | Optical measuring device |
| JP2009236909A (en) * | 2008-03-10 | 2009-10-15 | Byk-Gardner Gmbh | Measuring device of optical surface property of workpiece |
| US9116123B2 (en) | 2012-03-26 | 2015-08-25 | Konica Minolta Business Technologies, Inc. | Gloss measuring device and image forming device including same |
-
1988
- 1988-07-23 JP JP18413588A patent/JPH0235339A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH058448U (en) * | 1991-04-19 | 1993-02-05 | 日本電色工業株式会社 | Optical measuring device |
| JP2009236909A (en) * | 2008-03-10 | 2009-10-15 | Byk-Gardner Gmbh | Measuring device of optical surface property of workpiece |
| US9116123B2 (en) | 2012-03-26 | 2015-08-25 | Konica Minolta Business Technologies, Inc. | Gloss measuring device and image forming device including same |
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