JP7411984B2 - 検査装置 - Google Patents
検査装置 Download PDFInfo
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- JP7411984B2 JP7411984B2 JP2019172807A JP2019172807A JP7411984B2 JP 7411984 B2 JP7411984 B2 JP 7411984B2 JP 2019172807 A JP2019172807 A JP 2019172807A JP 2019172807 A JP2019172807 A JP 2019172807A JP 7411984 B2 JP7411984 B2 JP 7411984B2
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- 238000007689 inspection Methods 0.000 title claims description 120
- 238000012545 processing Methods 0.000 claims description 134
- 239000002131 composite material Substances 0.000 claims description 23
- 238000000034 method Methods 0.000 claims description 11
- 238000010801 machine learning Methods 0.000 claims description 9
- 238000001514 detection method Methods 0.000 description 22
- 238000010586 diagram Methods 0.000 description 21
- 238000012986 modification Methods 0.000 description 11
- 230000004048 modification Effects 0.000 description 11
- 230000005540 biological transmission Effects 0.000 description 10
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- 238000004519 manufacturing process Methods 0.000 description 7
- 230000005856 abnormality Effects 0.000 description 5
- 238000012790 confirmation Methods 0.000 description 4
- 230000002068 genetic effect Effects 0.000 description 3
- 238000013528 artificial neural network Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 235000021485 packed food Nutrition 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000013527 convolutional neural network Methods 0.000 description 1
- 238000013135 deep learning Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012706 support-vector machine Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/401—Imaging image processing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/618—Specific applications or type of materials food
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30168—Image quality inspection
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
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- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
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- Computer Vision & Pattern Recognition (AREA)
- Software Systems (AREA)
- Quality & Reliability (AREA)
- Toxicology (AREA)
- Artificial Intelligence (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Computation (AREA)
- Medical Informatics (AREA)
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- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
Claims (4)
- 電磁波の照射ライン上を通過する被検査物の一次元の透過信号を、メモリ上で二次元の画像に展開する画像生成部と、
前記画像生成部において前記被検査物の一部分である部分画像が生成される度に、当該部分画像を対象として画像処理を行う画像処理部と、
前記画像処理部の複数回の処理結果に基づいて、複数の画像処理後の前記部分画像を結合することによって得られる合成画像の品質を検査する検査部と、を備え、
前記画像処理部は、前回画像処理した部分画像の少なくとも一部を今回画像処理する部分画像に加えて画像処理し、前記合成画像を生成する、検査装置。 - 前記画像処理部による前記画像処理と並行して、前記検査部が画像処理後の部分画像に対して検査する、請求項1に記載の検査装置。
- 前記電磁波はX線であり、
前記品質は、異物混入の有無、割れ欠けの有無、及び欠品の有無の少なくとも一つである、請求項1または2に記載の検査装置。 - 前記画像処理部及び前記検査部の少なくとも一方は、機械学習によって自動設定されるプログラムを備える、請求項1~3のいずれか一項に記載の検査装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019172807A JP7411984B2 (ja) | 2019-09-24 | 2019-09-24 | 検査装置 |
EP20868778.0A EP4040141A4 (en) | 2019-09-24 | 2020-07-14 | INSPECTION DEVICE |
KR1020227011526A KR20220062035A (ko) | 2019-09-24 | 2020-07-14 | 검사 장치 |
US17/642,943 US12013351B2 (en) | 2019-09-24 | 2020-07-14 | Inspection device |
CN202080066160.XA CN114467023A (zh) | 2019-09-24 | 2020-07-14 | 检查装置 |
PCT/JP2020/027339 WO2021059681A1 (ja) | 2019-09-24 | 2020-07-14 | 検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019172807A JP7411984B2 (ja) | 2019-09-24 | 2019-09-24 | 検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2021050961A JP2021050961A (ja) | 2021-04-01 |
JP7411984B2 true JP7411984B2 (ja) | 2024-01-12 |
Family
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019172807A Active JP7411984B2 (ja) | 2019-09-24 | 2019-09-24 | 検査装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US12013351B2 (ja) |
EP (1) | EP4040141A4 (ja) |
JP (1) | JP7411984B2 (ja) |
KR (1) | KR20220062035A (ja) |
CN (1) | CN114467023A (ja) |
WO (1) | WO2021059681A1 (ja) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006071423A (ja) | 2004-09-01 | 2006-03-16 | Ishida Co Ltd | X線検査装置 |
JP2009264915A (ja) | 2008-04-24 | 2009-11-12 | Panasonic Electric Works Co Ltd | 透明フィルムの外観検査方法およびその装置 |
JP2010101692A (ja) | 2008-10-22 | 2010-05-06 | Kyodo Printing Co Ltd | シート状物品の検査方法及びその検査装置 |
JP2011242374A (ja) | 2010-05-21 | 2011-12-01 | Anritsu Sanki System Co Ltd | X線検査装置 |
JP2012208084A (ja) | 2011-03-30 | 2012-10-25 | Anritsu Sanki System Co Ltd | X線異物検出装置 |
JP2017125800A (ja) | 2016-01-15 | 2017-07-20 | 株式会社イシダ | 光検査装置 |
JP6537008B1 (ja) | 2018-02-14 | 2019-07-03 | 株式会社イシダ | 検査装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58159245A (ja) * | 1982-03-18 | 1983-09-21 | Matsushita Electric Ind Co Ltd | テ−プレコ−ダ |
JP4184694B2 (ja) * | 2002-04-05 | 2008-11-19 | 株式会社ブリヂストン | タイヤのx線検査方法及びその装置 |
JP5453350B2 (ja) * | 2011-06-23 | 2014-03-26 | 株式会社 システムスクエア | 包装体の検査装置 |
WO2017168469A1 (ja) * | 2016-03-28 | 2017-10-05 | パナソニックIpマネジメント株式会社 | 外観検査装置と外観検査方法 |
WO2018235266A1 (ja) | 2017-06-23 | 2018-12-27 | 株式会社Rist | 検査装置、検査方法及び検査プログラム |
-
2019
- 2019-09-24 JP JP2019172807A patent/JP7411984B2/ja active Active
-
2020
- 2020-07-14 US US17/642,943 patent/US12013351B2/en active Active
- 2020-07-14 WO PCT/JP2020/027339 patent/WO2021059681A1/ja unknown
- 2020-07-14 CN CN202080066160.XA patent/CN114467023A/zh active Pending
- 2020-07-14 EP EP20868778.0A patent/EP4040141A4/en active Pending
- 2020-07-14 KR KR1020227011526A patent/KR20220062035A/ko not_active Application Discontinuation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006071423A (ja) | 2004-09-01 | 2006-03-16 | Ishida Co Ltd | X線検査装置 |
JP2009264915A (ja) | 2008-04-24 | 2009-11-12 | Panasonic Electric Works Co Ltd | 透明フィルムの外観検査方法およびその装置 |
JP2010101692A (ja) | 2008-10-22 | 2010-05-06 | Kyodo Printing Co Ltd | シート状物品の検査方法及びその検査装置 |
JP2011242374A (ja) | 2010-05-21 | 2011-12-01 | Anritsu Sanki System Co Ltd | X線検査装置 |
JP2012208084A (ja) | 2011-03-30 | 2012-10-25 | Anritsu Sanki System Co Ltd | X線異物検出装置 |
JP2017125800A (ja) | 2016-01-15 | 2017-07-20 | 株式会社イシダ | 光検査装置 |
JP6537008B1 (ja) | 2018-02-14 | 2019-07-03 | 株式会社イシダ | 検査装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20220062035A (ko) | 2022-05-13 |
WO2021059681A1 (ja) | 2021-04-01 |
EP4040141A1 (en) | 2022-08-10 |
US12013351B2 (en) | 2024-06-18 |
EP4040141A4 (en) | 2023-10-04 |
JP2021050961A (ja) | 2021-04-01 |
CN114467023A (zh) | 2022-05-10 |
US20220365003A1 (en) | 2022-11-17 |
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