JP7223756B2 - 分光器、天体望遠鏡および分光器の製造方法 - Google Patents
分光器、天体望遠鏡および分光器の製造方法 Download PDFInfo
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- JP7223756B2 JP7223756B2 JP2020528852A JP2020528852A JP7223756B2 JP 7223756 B2 JP7223756 B2 JP 7223756B2 JP 2020528852 A JP2020528852 A JP 2020528852A JP 2020528852 A JP2020528852 A JP 2020528852A JP 7223756 B2 JP7223756 B2 JP 7223756B2
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- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 2
- 229910001374 Invar Inorganic materials 0.000 description 2
- 229910000502 Li-aluminosilicate Inorganic materials 0.000 description 2
- 229910052878 cordierite Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- JSKIRARMQDRGJZ-UHFFFAOYSA-N dimagnesium dioxido-bis[(1-oxido-3-oxo-2,4,6,8,9-pentaoxa-1,3-disila-5,7-dialuminabicyclo[3.3.1]nonan-7-yl)oxy]silane Chemical compound [Mg++].[Mg++].[O-][Si]([O-])(O[Al]1O[Al]2O[Si](=O)O[Si]([O-])(O1)O2)O[Al]1O[Al]2O[Si](=O)O[Si]([O-])(O1)O2 JSKIRARMQDRGJZ-UHFFFAOYSA-N 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 229920006332 epoxy adhesive Polymers 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910000531 Co alloy Inorganic materials 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 238000004497 NIR spectroscopy Methods 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- GTFLXERTAGJFBN-UHFFFAOYSA-K P(=O)([O-])([O-])[O-].[Zr+4].[K+] Chemical compound P(=O)([O-])([O-])[O-].[Zr+4].[K+] GTFLXERTAGJFBN-UHFFFAOYSA-K 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- GNKTZDSRQHMHLZ-UHFFFAOYSA-N [Si].[Si].[Si].[Ti].[Ti].[Ti].[Ti].[Ti] Chemical compound [Si].[Si].[Si].[Ti].[Ti].[Ti].[Ti].[Ti] GNKTZDSRQHMHLZ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
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- 229910052737 gold Inorganic materials 0.000 description 1
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- 239000010703 silicon Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/006—Filter holders
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0202—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0262—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Astronomy & Astrophysics (AREA)
- Spectrometry And Color Measurement (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Description
1a 第1面
1b 第2面
2 第2の基材
2a 第3面
2b 第4面
3 ホルダ
3a 蓋
3b 側板
3d 第1の穴
3e 第2の穴
4 姿勢調整機構
5 姿勢調整部材
6 固定部材
7 板状部材
8 可動部材(マイクロメータヘッド)
10 天体望遠鏡
100 分光器
Claims (7)
- 回折格子が形成された第1面と前記第1面の裏面である第2面とを有する第1の基材と、
回折格子が形成された第3面と前記第3面の裏面である第4面とを有する第2の基材と、
前記第4面と対向する第1の穴と第2の穴とを有する蓋を有し、前記第1の基材と前記第2の基材とを配列して固定するホルダと、
前記第2の穴に配置され、前記第4面と前記蓋とを接続して固定する固定部材とを備える分光器の製造方法であって、
前記第1の基材を、前記ホルダに固定する工程と、
前記第2の基材を、前記ホルダに配置する工程と、
姿勢調整機構の一部である姿勢調整部材を前記第1の穴に通して前記第4面に接続する工程と、
前記姿勢調整機構を用いて前記第2の基材の位置を前記第1の基材の位置に合わせて調整する工程と、
前記第2の穴に固定部材を配置する工程と、
前記第4面と前記蓋とを、前記固定部材を介して固定する工程と、
前記姿勢調整部材の、少なくとも一部を取り除く工程と
を備える、分光器の製造方法。 - 前記第1の基材と前記第2の基材は40℃~400℃における平均線膨張率がいずれも±2×10-6/K以内であるガラスで形成し、前記ホルダおよび前記固定部材は、40℃~400℃における平均線膨張率がいずれも±2×10-6/K以内であるセラミックスで形成する、請求項1に記載の分光器の製造方法。
- 前記第1面および前記第3面を平面視したときに、前記第1面および前記第3面を取り囲む前記ホルダの外表面を、アクリル樹脂を主成分とする黒色塗料で被覆する工程を備える、請求項1または2に記載の分光器の製造方法。
- 前記ホルダの内表面を、前記第1面および前記第3面から深さ方向に少なくとも1mmまで、アクリル樹脂を主成分とする黒色塗料で被覆する工程を備える、請求項1から3のいずれかに記載の分光器の製造方法。
- 前記第1の穴と前記第2の穴がそれぞれ複数形成されている、請求項1から4のいずれかに記載の分光器の製造方法。
- 前記固定部材と前記第4面、前記固定部材と前記蓋をそれぞれ接着剤により固定する、請求項1から5のいずれかに記載の分光器の製造方法。
- 請求項1から6のいずれかに記載の分光器の製造方法を用いた、天体望遠鏡の製造方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018126124 | 2018-07-02 | ||
JP2018126124 | 2018-07-02 | ||
PCT/JP2019/026101 WO2020009061A1 (ja) | 2018-07-02 | 2019-07-01 | 分光器、天体望遠鏡および分光器の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2020009061A1 JPWO2020009061A1 (ja) | 2021-07-15 |
JP7223756B2 true JP7223756B2 (ja) | 2023-02-16 |
Family
ID=69060354
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2020528852A Active JP7223756B2 (ja) | 2018-07-02 | 2019-07-01 | 分光器、天体望遠鏡および分光器の製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20210333500A1 (ja) |
EP (1) | EP3819614A4 (ja) |
JP (1) | JP7223756B2 (ja) |
KR (1) | KR20210013139A (ja) |
CN (1) | CN112400100A (ja) |
WO (1) | WO2020009061A1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US5172390A (en) | 1989-04-20 | 1992-12-15 | Massachusetts Institute Of Technology | Pre-aligned diode laser for external cavity operation |
JP2003255206A (ja) | 2002-02-28 | 2003-09-10 | Ando Electric Co Ltd | 平面回折格子の調整機構及びその製造方法 |
JP2004280116A (ja) | 2003-03-18 | 2004-10-07 | Lucent Technol Inc | 光学格子マウント |
WO2006075400A1 (ja) | 2005-01-17 | 2006-07-20 | Mitsubishi Denki Kabushiki Kaisha | セグメントグレーティングアライメント装置 |
JP2019012030A (ja) | 2017-06-30 | 2019-01-24 | 京セラ株式会社 | 分光器 |
Family Cites Families (17)
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JPS4527426B1 (ja) * | 1966-08-26 | 1970-09-08 | ||
US5040889A (en) * | 1986-05-30 | 1991-08-20 | Pacific Scientific Company | Spectrometer with combined visible and ultraviolet sample illumination |
JPH01277727A (ja) * | 1988-04-30 | 1989-11-08 | Shimadzu Corp | 回折格子分光器 |
JPH0694527A (ja) | 1992-09-10 | 1994-04-05 | Nikon Corp | 分光光学系 |
JPH06331850A (ja) * | 1993-05-25 | 1994-12-02 | Matsushita Electric Ind Co Ltd | 光フィルタおよび光フィルタに用いる回折素子 |
JP3719811B2 (ja) * | 1997-03-27 | 2005-11-24 | ソマール株式会社 | 反射防止フィルム |
JP2001343286A (ja) * | 2000-05-31 | 2001-12-14 | Shimadzu Corp | ミラーユニット及びこれを用いた光分析装置 |
JP4556620B2 (ja) * | 2004-11-02 | 2010-10-06 | 株式会社ニコン | 分光装置 |
US7936455B2 (en) * | 2007-10-05 | 2011-05-03 | Burt Jay Beardsley | Three mirror anastigmat spectrograph |
CN201322813Y (zh) * | 2008-11-26 | 2009-10-07 | 中国科学院上海光学精密机械研究所 | 拼接光栅位移偏差监测*** |
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CN101699328B (zh) * | 2009-10-28 | 2011-04-13 | 中国科学院安徽光学精密机械研究所 | 一种空间外差干涉仪中光栅胶合的装调机构 |
JP5873775B2 (ja) * | 2012-07-25 | 2016-03-01 | 株式会社日立ハイテクノロジーズ | 回折格子ホルダ、回折格子評価装置、および測定装置 |
US8873050B1 (en) * | 2012-08-16 | 2014-10-28 | Kla-Tencor Corp. | Selective diffraction with in-series gratings |
US9435689B2 (en) * | 2012-10-31 | 2016-09-06 | Corning Incorporated | Hyperspectral imaging system, monolithic spectrometer and methods for manufacturing the monolithic spectrometer |
WO2018085863A1 (en) * | 2016-11-07 | 2018-05-11 | California Institute Of Technology | Monolithic assembly of reflective spatial heterodyne spectrometer |
DE102018205401B4 (de) * | 2018-04-10 | 2022-06-15 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Spektralanalysesystem zum Aufnehmen eines Spektrums |
-
2019
- 2019-07-01 KR KR1020207036723A patent/KR20210013139A/ko not_active Application Discontinuation
- 2019-07-01 EP EP19830321.6A patent/EP3819614A4/en not_active Withdrawn
- 2019-07-01 CN CN201980042501.7A patent/CN112400100A/zh active Pending
- 2019-07-01 WO PCT/JP2019/026101 patent/WO2020009061A1/ja unknown
- 2019-07-01 JP JP2020528852A patent/JP7223756B2/ja active Active
- 2019-07-01 US US17/255,896 patent/US20210333500A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5172390A (en) | 1989-04-20 | 1992-12-15 | Massachusetts Institute Of Technology | Pre-aligned diode laser for external cavity operation |
JP2003255206A (ja) | 2002-02-28 | 2003-09-10 | Ando Electric Co Ltd | 平面回折格子の調整機構及びその製造方法 |
JP2004280116A (ja) | 2003-03-18 | 2004-10-07 | Lucent Technol Inc | 光学格子マウント |
WO2006075400A1 (ja) | 2005-01-17 | 2006-07-20 | Mitsubishi Denki Kabushiki Kaisha | セグメントグレーティングアライメント装置 |
JP2019012030A (ja) | 2017-06-30 | 2019-01-24 | 京セラ株式会社 | 分光器 |
Also Published As
Publication number | Publication date |
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WO2020009061A1 (ja) | 2020-01-09 |
EP3819614A4 (en) | 2022-04-13 |
KR20210013139A (ko) | 2021-02-03 |
CN112400100A (zh) | 2021-02-23 |
US20210333500A1 (en) | 2021-10-28 |
EP3819614A1 (en) | 2021-05-12 |
JPWO2020009061A1 (ja) | 2021-07-15 |
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