JP7061416B2 - 電気試験測定装置及びプロセッサ制御による方法 - Google Patents
電気試験測定装置及びプロセッサ制御による方法 Download PDFInfo
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- JP7061416B2 JP7061416B2 JP2017075554A JP2017075554A JP7061416B2 JP 7061416 B2 JP7061416 B2 JP 7061416B2 JP 2017075554 A JP2017075554 A JP 2017075554A JP 2017075554 A JP2017075554 A JP 2017075554A JP 7061416 B2 JP7061416 B2 JP 7061416B2
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/44—Modifications of instruments for temperature compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
110 電気試験装置
111 主電源回路
112 信号入力部
114 冷却ファン
116 プロセッサ
118 測定回路
120 被測定デバイス
Claims (3)
- 被測定デバイスからの電気信号を受けるように構成された信号入力部と、
動作中に周期的な機械的振動が生じる冷却機構と、
商用電源から電力を受ける主電源回路と、
プロセッサと
を具え、
上記プロセッサが、
上記冷却機構が動作すべき周波数を特定の周波数に決定し、
上記冷却機構を決定された上記特定の周波数で動作させ、
決定された上記特定の周波数に基づいてフィルタを選択し、
上記フィルタを上記電気信号に適用して上記冷却機構の上記機械的振動から生じる上記電気信号への干渉を低減するよう構成される電気試験測定装置。 - 上記特定の周波数が、上記商用電源の周波数の整数倍である請求項1記載の電気試験測定装置。
- プロセッサ制御による方法であって、
電気試験装置の中の動作中に周期的な機械的振動の生じる冷却機構が動作すべき周波数を特定の周波数に決定するステップと、
決定された上記特定の周波数で上記冷却機構を動作させるステップと、
決定された上記特定の周波数に基づいて信号フィルタを選択するステップと、
上記電気試験装置によって測定される電気信号に上記信号フィルタを適用し、上記冷却機構の上記機械的振動から生じる上記電気信号への影響を低減するステップと
を具えるプロセッサ制御による方法。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201662318680P | 2016-04-05 | 2016-04-05 | |
US62/318680 | 2016-04-05 | ||
US15/476679 | 2017-03-31 | ||
US15/476,679 US10656181B2 (en) | 2016-04-05 | 2017-03-31 | Rejection of mechanical vibration induced noise in electrical measurements |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017187495A JP2017187495A (ja) | 2017-10-12 |
JP7061416B2 true JP7061416B2 (ja) | 2022-04-28 |
Family
ID=59961513
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017075554A Active JP7061416B2 (ja) | 2016-04-05 | 2017-04-05 | 電気試験測定装置及びプロセッサ制御による方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10656181B2 (ja) |
EP (1) | EP3264107B1 (ja) |
JP (1) | JP7061416B2 (ja) |
CN (1) | CN107677867B (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11973566B2 (en) * | 2020-10-09 | 2024-04-30 | Schweitzer Engineering Laboratories, Inc. | Wireless radio repeater for electric power distribution system |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002190506A (ja) | 2000-12-20 | 2002-07-05 | Sony Corp | プローブカード |
JP2002257868A (ja) | 2001-03-05 | 2002-09-11 | Hioki Ee Corp | 電気測定器のハムノイズ除去方法 |
JP2006337148A (ja) | 2005-06-01 | 2006-12-14 | Jtekt Corp | 機上形状測定器、加工機 |
US20070047212A1 (en) | 2005-08-29 | 2007-03-01 | Fendley Tracy W | Self contained, liquid to air cooled, memory test engineering workstation |
JP2010096607A (ja) | 2008-10-16 | 2010-04-30 | Yazaki Corp | 基板の冷却器及び高周波信号の測定器 |
JP2012062044A (ja) | 2010-08-20 | 2012-03-29 | Tokai Rika Co Ltd | 通信制御システム |
JP2014048202A (ja) | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50160721A (ja) * | 1974-06-18 | 1975-12-26 | ||
JPH10282192A (ja) * | 1997-04-08 | 1998-10-23 | Toshiba Microelectron Corp | 半導体集積回路装置 |
JPH11316153A (ja) * | 1998-05-01 | 1999-11-16 | Ishida Co Ltd | 計量方法および装置 |
JP5134369B2 (ja) | 2004-10-15 | 2013-01-30 | エックスエイエックス ケイエフティ | 動作時又は外部励起に応答して測定可能な信号を放出するシステムの信号を測定および検査する装置および方法 |
US7616312B2 (en) | 2005-06-29 | 2009-11-10 | Dcg Systems, Inc. | Apparatus and method for probing integrated circuits using laser illumination |
US8159160B2 (en) * | 2008-12-30 | 2012-04-17 | International Business Machines Corporation | Apparatus, system, and method for improved fan control in a power supply |
US20130076286A1 (en) * | 2011-09-23 | 2013-03-28 | Apple Inc. | Reducing tonal excitations in a computer system |
US9625495B2 (en) * | 2013-08-22 | 2017-04-18 | Tektronix, Inc. | Isolated probe with digital multimeter or digital voltmeter |
ITMI20131668A1 (it) | 2013-10-09 | 2015-04-09 | Cnr Consiglio Naz Delle Ric Erche | High voltage fiber optic sensor for the measurement of an alternating electric field |
CN105606933A (zh) * | 2016-01-13 | 2016-05-25 | 中国南方电网有限责任公司超高压输电公司 | 一种基于振动噪声的换流变压器在线监测*** |
-
2017
- 2017-03-31 US US15/476,679 patent/US10656181B2/en active Active
- 2017-04-05 JP JP2017075554A patent/JP7061416B2/ja active Active
- 2017-04-05 EP EP17165119.3A patent/EP3264107B1/en not_active Not-in-force
- 2017-04-05 CN CN201710218637.1A patent/CN107677867B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002190506A (ja) | 2000-12-20 | 2002-07-05 | Sony Corp | プローブカード |
JP2002257868A (ja) | 2001-03-05 | 2002-09-11 | Hioki Ee Corp | 電気測定器のハムノイズ除去方法 |
JP2006337148A (ja) | 2005-06-01 | 2006-12-14 | Jtekt Corp | 機上形状測定器、加工機 |
US20070047212A1 (en) | 2005-08-29 | 2007-03-01 | Fendley Tracy W | Self contained, liquid to air cooled, memory test engineering workstation |
JP2010096607A (ja) | 2008-10-16 | 2010-04-30 | Yazaki Corp | 基板の冷却器及び高周波信号の測定器 |
JP2012062044A (ja) | 2010-08-20 | 2012-03-29 | Tokai Rika Co Ltd | 通信制御システム |
JP2014048202A (ja) | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2017187495A (ja) | 2017-10-12 |
US10656181B2 (en) | 2020-05-19 |
CN107677867B (zh) | 2021-01-26 |
CN107677867A (zh) | 2018-02-09 |
EP3264107A1 (en) | 2018-01-03 |
US20170285070A1 (en) | 2017-10-05 |
EP3264107B1 (en) | 2019-03-20 |
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