JP2017187495A - 電気試験測定装置及びプロセッサ制御による方法 - Google Patents
電気試験測定装置及びプロセッサ制御による方法 Download PDFInfo
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- JP2017187495A JP2017187495A JP2017075554A JP2017075554A JP2017187495A JP 2017187495 A JP2017187495 A JP 2017187495A JP 2017075554 A JP2017075554 A JP 2017075554A JP 2017075554 A JP2017075554 A JP 2017075554A JP 2017187495 A JP2017187495 A JP 2017187495A
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- 238000012360 testing method Methods 0.000 title claims abstract description 71
- 238000005259 measurement Methods 0.000 title claims abstract description 65
- 238000000034 method Methods 0.000 title claims description 22
- 230000007246 mechanism Effects 0.000 claims description 38
- 230000000694 effects Effects 0.000 claims description 4
- 238000001816 cooling Methods 0.000 abstract description 45
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000002411 adverse Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
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- 230000014509 gene expression Effects 0.000 description 1
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- 230000008054 signal transmission Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/44—Modifications of instruments for temperature compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
110 電気試験装置
111 主電源回路
112 信号入力部
114 冷却ファン
116 プロセッサ
118 測定回路
120 被測定デバイス
Claims (2)
- 被測定デバイスからの電気信号を受けるように構成された信号入力部と、
振動発生機構と、
商用電源から電力を受ける主電源回路と、
プロセッサとを具え、
上記プロセッサが、上記振動発生機構が動作すべき周波数を上記商用電源の周波数の整数倍となるように決定し、上記振動発生機構を決定された上記周波数で動作させ、決定された上記周波数に基づいてフィルタを選択し、上記フィルタを上記電気信号に適用して上記振動発生機構の機械的振動から生じる上記電気信号への干渉を低減するよう構成される電気試験測定装置。 - プロセッサ制御による方法であって、
電気試験装置の振動発生機構が動作すべき周波数を、商用電源の周波数の整数倍となるように決定するステップと、
決定された上記周波数で上記振動発生機構を動作させるステップと、
決定された上記周波数に基づいて信号フィルタを選択するステップと、
上記電気試験装置によって測定される電気信号に上記信号フィルタを適用し、上記振動発生機構の機械的振動から生じる上記電気信号への影響を低減するステップと
を具えるプロセッサ制御による方法。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201662318680P | 2016-04-05 | 2016-04-05 | |
US62/318680 | 2016-04-05 | ||
US15/476679 | 2017-03-31 | ||
US15/476,679 US10656181B2 (en) | 2016-04-05 | 2017-03-31 | Rejection of mechanical vibration induced noise in electrical measurements |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017187495A true JP2017187495A (ja) | 2017-10-12 |
JP7061416B2 JP7061416B2 (ja) | 2022-04-28 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2017075554A Active JP7061416B2 (ja) | 2016-04-05 | 2017-04-05 | 電気試験測定装置及びプロセッサ制御による方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10656181B2 (ja) |
EP (1) | EP3264107B1 (ja) |
JP (1) | JP7061416B2 (ja) |
CN (1) | CN107677867B (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11973566B2 (en) * | 2020-10-09 | 2024-04-30 | Schweitzer Engineering Laboratories, Inc. | Wireless radio repeater for electric power distribution system |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS50160721A (ja) * | 1974-06-18 | 1975-12-26 | ||
JPH10282192A (ja) * | 1997-04-08 | 1998-10-23 | Toshiba Microelectron Corp | 半導体集積回路装置 |
JPH11316153A (ja) * | 1998-05-01 | 1999-11-16 | Ishida Co Ltd | 計量方法および装置 |
JP2002190506A (ja) * | 2000-12-20 | 2002-07-05 | Sony Corp | プローブカード |
JP2002257868A (ja) * | 2001-03-05 | 2002-09-11 | Hioki Ee Corp | 電気測定器のハムノイズ除去方法 |
JP2006337148A (ja) * | 2005-06-01 | 2006-12-14 | Jtekt Corp | 機上形状測定器、加工機 |
US20070047212A1 (en) * | 2005-08-29 | 2007-03-01 | Fendley Tracy W | Self contained, liquid to air cooled, memory test engineering workstation |
JP2010096607A (ja) * | 2008-10-16 | 2010-04-30 | Yazaki Corp | 基板の冷却器及び高周波信号の測定器 |
JP2012062044A (ja) * | 2010-08-20 | 2012-03-29 | Tokai Rika Co Ltd | 通信制御システム |
JP2014048202A (ja) * | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5134369B2 (ja) | 2004-10-15 | 2013-01-30 | エックスエイエックス ケイエフティ | 動作時又は外部励起に応答して測定可能な信号を放出するシステムの信号を測定および検査する装置および方法 |
US7616312B2 (en) | 2005-06-29 | 2009-11-10 | Dcg Systems, Inc. | Apparatus and method for probing integrated circuits using laser illumination |
US8159160B2 (en) * | 2008-12-30 | 2012-04-17 | International Business Machines Corporation | Apparatus, system, and method for improved fan control in a power supply |
US20130076286A1 (en) * | 2011-09-23 | 2013-03-28 | Apple Inc. | Reducing tonal excitations in a computer system |
US9625495B2 (en) * | 2013-08-22 | 2017-04-18 | Tektronix, Inc. | Isolated probe with digital multimeter or digital voltmeter |
ITMI20131668A1 (it) | 2013-10-09 | 2015-04-09 | Cnr Consiglio Naz Delle Ric Erche | High voltage fiber optic sensor for the measurement of an alternating electric field |
CN105606933A (zh) * | 2016-01-13 | 2016-05-25 | 中国南方电网有限责任公司超高压输电公司 | 一种基于振动噪声的换流变压器在线监测*** |
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2017
- 2017-03-31 US US15/476,679 patent/US10656181B2/en active Active
- 2017-04-05 JP JP2017075554A patent/JP7061416B2/ja active Active
- 2017-04-05 EP EP17165119.3A patent/EP3264107B1/en not_active Not-in-force
- 2017-04-05 CN CN201710218637.1A patent/CN107677867B/zh active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50160721A (ja) * | 1974-06-18 | 1975-12-26 | ||
JPH10282192A (ja) * | 1997-04-08 | 1998-10-23 | Toshiba Microelectron Corp | 半導体集積回路装置 |
JPH11316153A (ja) * | 1998-05-01 | 1999-11-16 | Ishida Co Ltd | 計量方法および装置 |
JP2002190506A (ja) * | 2000-12-20 | 2002-07-05 | Sony Corp | プローブカード |
JP2002257868A (ja) * | 2001-03-05 | 2002-09-11 | Hioki Ee Corp | 電気測定器のハムノイズ除去方法 |
JP2006337148A (ja) * | 2005-06-01 | 2006-12-14 | Jtekt Corp | 機上形状測定器、加工機 |
US20070047212A1 (en) * | 2005-08-29 | 2007-03-01 | Fendley Tracy W | Self contained, liquid to air cooled, memory test engineering workstation |
JP2010096607A (ja) * | 2008-10-16 | 2010-04-30 | Yazaki Corp | 基板の冷却器及び高周波信号の測定器 |
JP2012062044A (ja) * | 2010-08-20 | 2012-03-29 | Tokai Rika Co Ltd | 通信制御システム |
JP2014048202A (ja) * | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
Also Published As
Publication number | Publication date |
---|---|
US10656181B2 (en) | 2020-05-19 |
CN107677867B (zh) | 2021-01-26 |
CN107677867A (zh) | 2018-02-09 |
JP7061416B2 (ja) | 2022-04-28 |
EP3264107A1 (en) | 2018-01-03 |
US20170285070A1 (en) | 2017-10-05 |
EP3264107B1 (en) | 2019-03-20 |
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